Abstract: A pulse testing method and device, a testing apparatus, and a storage medium are disclosed, the pulse testing method includes: performing a pulse test on an optical fiber by using a plurality of pulses of different pulse widths respectively to obtain test data; and fitting the test data corresponding to the plurality of pulses of different pulse widths.

Abstract: An image sensor and well structure associated with and extending away from the surface of the image sensor are provided in various apparatuses, methods, and systems for determining the position of a light emitter located in object space. An exemplary method includes (i) providing the image sensor and structure associated therewith, the structure defining a field of view for each pixel within the array of pixels; (ii) determining a light intensity value for photoactivated pixels receiving light from the light emitter; (iii) identifying a first photoactivated pixel having a local maximum of light intensity; (iv) calculating a perpendicular distance between the first photoactivated pixel and the light emitter; and (v) constructing the position of the light emitter based on a position of the first photoactivated pixel in the array of pixels and the perpendicular distance between the first photoactivated pixel and the light emitter.

Abstract: A metrology system includes a controller communicatively coupled to one or more metrology tools, the controller including one or more processors configured to execute program instructions causing the one or more processors to receive one or more metrology measurements of one or more metrology targets of a metrology sample, a metrology target of the one or more metrology targets including one or more target designs with one or more cells, the one or more target designs being generated on one or more layers of the metrology sample; determine one or more errors based on the one or more metrology measurements; and determine one or more correctables to adjust one or more sources of error corresponding to the one or more errors, the one or more correctables being configured to reduce an amount of noise in the one or more metrology measurements generated by the one or more sources of errors.

Abstract: An optical metrology device uses a multi-wavelength beam of light that has azimuthally varying polarization states and/or phase states, referred to as a vortex beam. The metrology device focuses the vortex beam on a sample under test over a large range of angles of incidence. The metrology device may detect an image of the vortex beam reflected from the sample and measure the polarization state of the return light as function of the angle of incidence and the azimuth angle, which may be further measured at a plurality of different wavelengths. The vortex beam includes azimuthally varying polarization states, thereby enabling measurement of all desired polarization states without requiring the use of moving optical components. The polarization state information detected over multiple angles of incidence and wavelengths provides data with which an accurate determination of one or more characteristics of a sample may be determined.

Abstract: There are provided techniques for characterizing and testing a cable routing connection configuration connection arrangement comprising a plurality of optical fiber links connected between at least a first connection device at a first end and a second multi-fiber connection device at a second end. Test light is injected into one or more of the optical fiber links via corresponding optical fiber ports of the first connection device. At least one image of the second multi-fiber connection device is captured. Test light exiting the optical fiber link(s) through optical fiber port(s) of the second multi-fiber connection device is imaged as light spot(s) in the captured image. Positions on the second multi-fiber connection device that corresponds to the optical fiber port(s) are determined based on a pattern of the light spot(s) in the captured image. In some implementations, the provided techniques allow detection or verification of cable routing connection configurations at multi-fiber distribution panels.

Abstract: A system in an embodiment can comprise an optical assembly, an surface-plasmon-resonance (SPR) light source, and an SPR camera. The optical assembly can comprise a hemispherical prism comprising a top surface configured to support a SPR sensor; and a high numerical aperture (NA) lens located distal from the top surface of the hemispherical prism. The SPR light source can be configured to emit a light beam for SPR imaging. The SPR camera can be configured to capture an SPR image. The SPR sensor further can comprise a surface configured to contact a sample. The high NA lens can be configured to refract the light beam toward the hemispherical prism. The hemispherical prism can be configured to collimate the light beam, as refracted by the high NA lens, toward the SPR sensor. The high NA lens further can be configured to receive and refract the light beam toward the SPR camera, after the light beam is reflected by the surface of the SPR sensor. Other embodiments are disclosed.

Abstract: A system for measuring a periodic array of structures on a sample is provided. The system includes an optical source configured to produce an optical beam; an optical system configured to control the polarization of the optical beam and to focus the optical beam with a first NA1 on a sample surface and to sweep the angle of incidence across a range of angles with an approximately fixed focal position on a sample surface with a second NA2 wherein NA2>NA1; additional optical components configured to receive the optical beam reflected from the sample surface and to focus the reflected beam onto a detector; and a recording system to record the reflectivity of the sample surface as a function of the angle of incidence.

Abstract: Aspects of the present disclosure include methods for detecting events in a flow cytometer. Also provided are methods of detecting cells in a flow cytometer. Other aspects of the present disclosure include methods for determining a level of contamination in a flow cell. Computer-readable media and systems, e.g., for practicing the methods summarized above, are also provided.

Abstract: An optical position-measuring device for sensing a relative position of two objects, each object being connected to a grating. The optical position-measuring device is configured such that, at one of the gratings, an illumination beam emitted from a light source is split into two sub-beams which, in respective scanning beam paths following the splitting, experience different polarization-optical effects and recombine at one of the gratings. After the differently polarized sub-beams are recombined, a plurality of phase-shifted, displacement-dependent scanning signals are generatable from a resulting signal beam in a detection unit. No separate polarization-optical components are disposed in the scanning beam paths of the sub-beams between splitting and recombination.

Abstract: A method and system for testing a liquid sample for an organic compound is disclosed, the method including the steps of collecting the liquid sample from a liquid source; transmitting light having a wavelength of between about 190 nanometers and about 310 nanometers into the liquid sample; measuring absorption/transmission of the light by the organic compound in the liquid sample; and determining a concentration of the organic compound within the liquid sample based on the absorption/transmission of the light by the organic compound. The system can include a spectrophotometer for measuring the absorption of UV light by the organic compound, an ion exchange column for removing ion contaminants from the liquid sample, and a vacuum degasser unit for removing gases and other impurities from the liquid sample.

Abstract: A metrology measurement apparatus may include one or more illumination sources, a beamsplitter configured to receive illumination from the one or more illumination sources from an illumination pathway and direct the illumination along a measurement pathway, and an objective lens. The objective lens may direct the illumination from the measurement pathway to a sample, collect light from the sample, and direct the collected light along the measurement pathway to the beamsplitter such that the beamsplitter may direct the collected light along a collection pathway to a detector. The apparatus may further include a pupil-plane scanner along the measurement pathway with a pupil relay and a deflector in a relayed pupil plane such that adjusting the deflector adjusts a position of the illumination spot on the sample without modifying a position of the illumination pupil distribution or a position of a distribution of the collected light along the collection pathway.

Abstract: A sample detection device includes a first polarizer configured to allow part of incident light to pass therethrough by polarizing the incident light, a stage disposed on a path of light having passed the first polarizer, the stage allowing a sample to be seated thereon, a second polarizer configured to polarize light and a detection unit configured to detect light having passed the second polarizer and to generate a detection signal. The first polarizer allows first polarized light oscillating in a first direction to proceed toward the sample when the incident light reaches the first polarizer. Emission light is emitted by an excitation of the sample when the first polarized light reaches the sample. The second polarizer allows second polarized light oscillating in a second direction to proceed toward the detection unit when the emission light reaches the second polarizer.

Abstract: A method for inspecting a semiconductor element includes steps of: a) providing an inspection apparatus including a supporting unit that includes a central seat and a plurality of positioning plates, and a camera unit that includes a first image capture device; b) positioning the semiconductor element onto the positioning plates; c) capturing a first bottom image of the semiconductor element; d) generating relative movement between the semiconductor element and the positioning plates; e) capturing a second bottom image of the semiconductor element; and f) synthesizing the first bottom image and the second bottom image to obtain a complete bottom image of the semiconductor element.

Abstract: A device (100) for determining orientation of an object (101) is disclosed. The device (100) comprises of a housing (1) configured with a plurality of sensors (4), wherein the plurality of sensors (4) are provided on a surface of the housing. At least one light source (2), is fixed within the housing (1), wherein the at least one light source is configured to emit a continuous light beam (3) on at least one of the plurality of sensors (4) at an initial position (IP) of the object (101). The speed of the continuous light beam emitted by the at least one light source is less than a speed of light. The continuous slow light beam (3) is configured to momentarily impinge on one or more of the plurality of sensors (4) in the same incident ray, when the object (101) is displaced to a displaced position (DP).

Abstract: Metrology methods and tools are provided, which enhance the accuracy of the measurements and enable simplification of the measurement process as well as improving the correspondence between the metrology targets and the semiconductor devices. Methods comprise illuminating the target in a Littrow configuration to yield a first measurement signal comprising a ?1st diffraction order and a 0th diffraction order and a second measurement signal comprising a +1st distraction order and a 0th diffraction order, wherein the ?1st diffraction order of the first measurement signal and the +1st diffraction order of the second measurement signal are diffracted at 180° to a direction of the illumination, performing a first measurement of the first measurement signal and a second measurement of the second measurement signal, and deriving metrology metric(s) therefrom. Optionally, a reflected 0th diffraction order may be split to yield components which interact with the ?1st and +1st diffraction orders.

Abstract: An inspection tool for allowing visual inspection of an end face of a fiber optic ferrule. The inspection tool includes a passage for allowing a camera to view the end face. The inspection tool also includes light directing structure for first directing ferrule illumination light axially along the inspection tool, and then reflecting the axial light across the end face of the fiber optic ferrule.

Abstract: There is therefore provided an OTDR method for characterizing an optical fiber link, wherein a receive device comprising a reflective optical signature and a receive fiber is connected at a remote end of the optical fiber link under test. The reflective optical signature is detected using an OTDR acquisition and link continuity is verified. Because detection of the reflective optical signature rely on high-intensity reflective peaks of the reflective optical signature and not on RBS level, dynamic range constraints are relaxed and so is the averaging time. Advantageously, the method may be employed to detect the reflective optical signature, verify link continuity, measure total link length, measure total insertion loss and/or determine a polarity of a multi-fiber array cable link.

Abstract: A process including the following steps: injecting in an optical fiber a first optical pump at a first optical frequency that evolves in time or not, and a second optical pump at a second optical frequency that evolves in time or not, the first optical frequency and the second optical frequency being different at each given time; a first detection of a first Rayleigh backscattered signal at the first optical frequency from the optical fiber; a second detection, separated from the first detection, of a second Rayleigh backscattered signal at the second optical frequency from the optical fiber; and analyzing the detected first Rayleigh backscattered signal and the detected second Rayleigh backscattered signal.

Abstract: A photonic resonator analyzer characterizes a photonic resonator and incudes a light source that provides a probe light; a photonic resonator that receives the probe light and produces product light; an optical detector that receives the product light and produces a product signal; a mode analyzer that receives the product signal and produces a resonator spectrum; and a spectral analyzer that receives the resonator spectrum, performs regression by fitting a non-parametric model to the resonator spectrum, and produces a thermal response function of the photonic resonator from fitting the non-parametric model to the resonator spectrum to characterize the photonic resonator.

Abstract: A method for photoluminescence measurement of a sample that includes a front face and a rear face linked by a contour, the sample resting, via the rear face of same, on a receiving face of an active base. The sample also includes a first region partially delimited by the contour and that emits a photoluminescence signal of an intensity, referred to as the first intensity, that is lower at any point to the average intensity of the photoluminescence signal of the sample, referred to as the reference intensity, the active base emitting a photoluminescence signal of an intensity, referred to as the secondary intensity, that is at least equal to the reference intensity. The active base includes an edge that is set apart from the contour by an overlap distance and that delimits, with said contour, a peripheral section of the active base.