Patents Examined by Hanway Chang
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Patent number: 11260244Abstract: A process for treating highly localized carcinoma cells that provides precise positioning of a therapeutic source of highly ionizing but weakly penetrating radiation, which can be shaped so that it irradiates essentially only the volume of the tumor. The intensity and duration of the radiation produced by the source can be activated and deactivated by controlling the neutron flux generated by an array of electrically controlled neutron generators positioned outside the body being treated. The energy of the neutrons that interact with the source element can be adjusted to optimize the reaction rate of the ionized radiation production by utilizing neutron moderating material between the neutron generator array and the body. The source device may be left in place and reactivated as needed to ensure the tumor is eradicated without exposing the patient to any additional radiation between treatments. The source device may be removed once treatment is completed.Type: GrantFiled: February 20, 2020Date of Patent: March 1, 2022Assignee: Westinghouse Electric Company LLCInventors: John H. Nelson, Michael D. Heibel
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Patent number: 11259394Abstract: Methods and systems for generating X-ray illumination from a laser produced plasma (LPP) employing a liquid sheet jet target are presented herein. A highly focused, short duration laser pulse is directed to a liquid sheet jet target. The interaction of the focused laser pulse with the sheet jet target ignites a plasma. In some embodiments, the liquid sheet jet is generated by a convergent capillary nozzle or a convergent, planar cavity nozzle. In some embodiments, the target material includes one or more elements having a relatively low atomic number. In some embodiments, the liquid sheet jet LPP light source generates multiple line or broadband X-ray illumination in a soft X-ray (SXR) spectral range used to measure structural and material characteristics of semiconductor structures. In some embodiments, Reflective, Small-Angle X-ray Scatterometry measurements are performed with a liquid sheet jet LPP illumination source as described herein.Type: GrantFiled: October 21, 2020Date of Patent: February 22, 2022Assignee: KLA CorporationInventors: Chao Chang, Will Schumaker, Jongjin Kim, Michael Friedmann
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Patent number: 11257655Abstract: The focused ion beam apparatus includes: an ion source configured to generate ions; a first electrostatic lens configured to accelerate and focus the ions to form an ion beam; a beam booster electrode configured to accelerate the ion beam to a higher level; one or a plurality of electrodes, which are placed in the beam booster electrode, and are configured to electrostatically deflect the ion beam; a second electrostatic lens, which is provided between the one or plurality of electrodes and a sample table, and is configured to focus the ion beam applied with a voltage; and a processing unit configured to obtain a measurement condition, and set at least one of voltages to be applied to the one or plurality of electrodes or a voltage to be applied to each of the first electrostatic lens and the second electrostatic lens, based on the obtained measurement condition.Type: GrantFiled: October 16, 2020Date of Patent: February 22, 2022Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Yasuhiko Sugiyama, Naoko Hirose
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Patent number: 11258224Abstract: A system, comprising an optical component that, in operational use of the optical component, optically interacts with a laser beam, an electrically conductive element disposed on or within the optical component that, in operational use of the optical component, is exposed to the laser beam, and a monitoring system operative to monitor a physical quantity representative of an electrical resistance of the electrically conductive element and to determine based on the physical quantity, a position of the laser beam relative to the optical component.Type: GrantFiled: January 24, 2019Date of Patent: February 22, 2022Assignee: ASML Netherlands B.V.Inventor: Szymon Dominik Smolarek
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Patent number: 11252810Abstract: A radiation source contains a collector module comprising an optical collector, positioned in a vacuum chamber with an emitting plasma, further comprising a means for debris mitigation which include at least two casings arranged to output debris-free homocentric beams of the short-wavelength radiation, coming to the optical collector preferably consisting of several identical mirrors. Outside each casing there are permanent magnets that create a magnetic field inside the casings to mitigate charged fraction of debris particles and provide the debris-free homocentric beams of short-wavelength radiation. Other debris mitigating techniques are additionally used. Preferably the plasma is laser-produced plasma of a liquid metal target supplied by a rotating target assembly to a focus area of a laser beam. The technical result of the invention is the creation of high-powerful high-brightness debris-free sources of short-wavelength radiation with large, preferably more than 0.25 sr, collection solid angle.Type: GrantFiled: November 19, 2020Date of Patent: February 15, 2022Assignees: Isteq B.V., RnD-ISAN. LtdInventors: Vladimir Vitalievich Ivanov, Aleksandr Yurievich Vinokhodov, Konstantin Nikolaevich Koshelev, Mikhail Sergeyevich Krivokorytov, Vladimir Mikhailovich Krivtsun, Aleksandr Andreevich Lash, Vyacheslav Valerievich Medvedev, Yury Viktorovich Sidelnikov, Oleg Feliksovich Yakushev, Oleg Borisovich Khristoforov, Denis Aleksandrovich Glushkov, Samir Ellwi
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Patent number: 11239002Abstract: A technique is disclosed for electro-optically inducing a force to fabricated samples and/or devices with laser light. The technique uses the interaction of the oscillating electric field of the laser beam in opposition with the electric field produced by an appropriate electric charge carrier to achieve a net repulsive (or attractive) force on the component holding the electric charge. In one embodiment, force is achieved when the field near the charge carrier is modulated at a subharmonic of the electric field oscillation frequency of the laser and the relative phases of the light field and electric charge carrier field are controlled to provide optimal repulsion/attraction. The effect is scalable by applying the technique to an array of charge carrier fields sequentially as well as using higher power lasers and higher carrier field voltages.Type: GrantFiled: August 24, 2020Date of Patent: February 1, 2022Inventor: Geoffrey James Germann
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Patent number: 11236996Abstract: Embodiments disclosed herein relate generally to methods for measuring a characteristic of a substrate. In an embodiment, the method includes scanning over the substrate with a scanning probe microscope, the substrate having fins thereon, the scanning obtaining images showing respective fin top regions of the fins, the scanning probe microscope interacting with respective portions of sidewalls of the fins by a scanning probe oscillated during the scanning, selecting images obtained at a predetermined depth below the fin top regions to obtain a line edge profile of the fins, by a processor-based system, analyzing the line edge profile of the fins using power spectral density (PSD) method to obtain spatial frequency data of the line edge profile of the fins, and by the processor-based system, calculating line edge roughness of the fins based on the spatial frequency data.Type: GrantFiled: July 13, 2020Date of Patent: February 1, 2022Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Wei-Shan Hu, Dong Gui, Jang Jung Lee, Che-Liang Li, Duen-Huei Hou, Wen-Chung Liu
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Patent number: 11239049Abstract: A transmission electron microscope is provided, including a column defining an object chamber, at least one ballistic material jet source outside the object chamber, and tightly attached to the column, facing an opening, referred to as a port, provided on the column; having at least one jet source arranged outside the column and including a collimator of the material jet towards a predetermined direction, passing through the port and leading into the object chamber so that a portion of the material jet exits the source in the object chamber.Type: GrantFiled: April 30, 2019Date of Patent: February 1, 2022Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUEInventors: Jean-Christophe Harmand, Laurent Travers, Yannick Ollivier
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Patent number: 11239069Abstract: When a Q-TOF type mass spectrometer is operated in an MS1 mode, a controller (40), at the time of measurement, controls voltage generators (31 to 33) such that only a V voltage (radio-frequency voltage for mass separation) and a direct-current bias voltage are applied to main rod electrodes of a quadrupole mass filter (12) without application of a U voltage (direct-current voltage for mass separation). During a measurement preparation period between a plurality of measurements to obtain one mass spectrum, the controller (40) controls a U voltage generator (31) so as to apply the U voltage to the main rod electrodes of the quadrupole mass filter (12). Accordingly, a direct-current electric field is formed between adjacent main rod electrodes around an ion optical axis (C) due to a potential difference, and electric charges accumulated in rod holders (122) holding the main rod electrodes are rapidly removed by an effect of this electric field.Type: GrantFiled: May 31, 2018Date of Patent: February 1, 2022Assignee: SHIMADZU CORPORATIONInventors: Kazuma Maeda, Daisuke Okumura
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Patent number: 11240904Abstract: Provided is an apparatus for and method of controlling formation of droplets (102a, b) used to generate EUV radiation that comprise an arrangement producing a laser beam directed to an irradiation region and a droplet source. The droplet source (92) includes a fluid exiting an nozzle (98) and a sub-system having an electro-actuatable element (104) producing a disturbance in the fluid (96). The droplet source produces a stream (100) that breaks down into droplets that in turn coalesce into larger droplets as they progress towards the irradiation region. The electro-actuatable element is driven by a hybrid waveform that controls the droplet generation/coalescence process. Also disclosed is a method of determining the transfer function for the nozzle.Type: GrantFiled: January 3, 2019Date of Patent: February 1, 2022Assignee: ASML Netherlands B.V.Inventors: Joshua Mark Lukens, Bob Rollinger, Pooriya Beyhaghi
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Patent number: 11239052Abstract: The scanning charged particle beam microscope according to the present application is characterized in that, in acquiring an image of the FOV (field of view), interspaced beam irradiation points are set, and then, a deflector is controlled so that a charged particle beam scan is performed faster when the charged particle beam irradiates a position on the sample between each of the irradiation points than when the charged particle beam irradiates a position on the sample corresponding to each of the irradiation points (a position on the sample corresponding to each pixel detecting a signal). This allows the effects from a micro-domain electrification occurring within the FOV to be mitigated or controlled.Type: GrantFiled: June 12, 2020Date of Patent: February 1, 2022Assignee: Hitachi High-Tech CorporationInventors: Toshiyuki Yokosuka, Chahn Lee, Hideyuki Kazumi, Hajime Kawano, Shahedul Hoque, Kumiko Shimizu, Hiroyuki Takahashi
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Patent number: 11232927Abstract: The present invention is to generate a spatially phase modulated electron wave. A laser radiating apparatus, a spatial light phase modulator, and a photocathode are provided. The photocathode has a semiconductor film having an NEA film formed on a surface thereof, and a thickness of the semiconductor film is smaller than a value obtained by multiplying a coherent relaxation time of electrons in the semiconductor film by a moving speed of the electrons in the semiconductor film. According to the configuration, a spatial distribution of phase and a spatial distribution of intensity of spatial phase modulated light are transferred to an electron wave, and the electron wave emitted from an NEA film is modulated into the spatial distribution of phase and the spatial distribution of intensity of the light.Type: GrantFiled: January 21, 2019Date of Patent: January 25, 2022Assignee: Hitachi High-Tech CorporationInventors: Makoto Kuwahara, Koh Saitoh
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Patent number: 11222733Abstract: A device for protection of a body from radiation includes at least one flexible garment. Each section of the flexible garment is configured to shield a region of a surface of the body. Each section complementarily attenuates self-shielding by internal structure between the region and an interior region of the body such that radiation at the interior region is attenuated to a predefined attenuation level.Type: GrantFiled: September 28, 2020Date of Patent: January 11, 2022Assignee: StemRad Ltd.Inventors: Oren Milstein, Gideon Waterman, Meytal Baron, Ethan Shiloh, Jonathan Roth, Tamar Nix
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Patent number: 11217426Abstract: An ion source can have: a multiplicity of electrodes, which are mounted electrically separated from one another and have: a first electrode, which has a depression; a second electrode, which is arranged in the depression; a third electrode, which partially covers the depression and through which a slit passes which exposes the second electrode; one or more than one magnet, which is designed to provide a magnetic field in the slit.Type: GrantFiled: May 26, 2021Date of Patent: January 4, 2022Assignee: VON ARDENNE Asset GmbH & Co. KGInventor: Tim Weichsel
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Patent number: 11202923Abstract: A mobile radiation oncology coach system is disclosed. The mobile radiation oncology coach system comprise a trailer having a control console area and a treatment area, the treatment area is equipped with a medical treatment facility. The mobile radiation oncology coach system further comprise an internal shielding provided between the control console area and the treatment area. The mobile radiation oncology coach system further comprise an external shielding provided at the outside of the trailer.Type: GrantFiled: February 26, 2020Date of Patent: December 21, 2021Assignee: Alliance Oncology, LLCInventors: David Chamberlain, Brent Murphy, Harry Freeman
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Patent number: 11199480Abstract: A thin-sample-piece fabricating device is provided with a focused-ion-beam irradiation optical system, a stage, a stage driving mechanism, and a computer. The focused-ion-beam irradiation optical system performs irradiation with a focused ion beam (FIB). The stage holds a sample piece (Q). The stage driving mechanism drives the stage. The computer sets a thin-piece forming region serving as a treatment region, as well as a peripheral section surrounding the entire periphery of the thin-piece forming region, on the sample piece (Q). The computer causes irradiation with the focused ion beam (FIB) from a direction crossing the irradiated face of the sample piece (Q) so as to perform etching treatment such that the thickness of the thin-piece forming region becomes less than the thickness of the peripheral section.Type: GrantFiled: February 28, 2019Date of Patent: December 14, 2021Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventor: Ikuko Nakatani
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Patent number: 11195708Abstract: Humidification systems and methods to introduce water vapor to a laser-ablated sample prior to introduction to an ICP torch are described. A system embodiment includes, but is not limited to, a water vapor generator configured to control production of a water vapor stream and to transfer the water vapor stream to at least one of a sample chamber of a laser ablation device or a mixing chamber in fluid communication with the laser ablation device, wherein the mixing chamber is configured to receive a laser-ablated sample from the laser ablation device and direct the laser-ablated sample to an inductively coupled plasma torch.Type: GrantFiled: August 19, 2020Date of Patent: December 7, 2021Assignee: Elemental Scientific, Inc.Inventors: Michael P. Field, Jude Sakowski, Jordan Krahn, Ciaran J. O'Connor
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Patent number: 11195691Abstract: A method of automatically focusing a charted particle beam on a surface region of a sample is provided. The method includes acquiring a plurality of images for a corresponding plurality of focusing strength values; calculating a plurality of sharpness values based on the plurality of images, the plurality of sharpness values are calculated with a sharpness function provided as a sum in a frequency space based on the plurality of images; and determining subsequent focusing strength values of the plurality of focusing strength values with a golden ratio search algorithm based one the calculated sharpness values.Type: GrantFiled: April 12, 2019Date of Patent: December 7, 2021Assignee: Applied Materials, Inc.Inventors: Robert Trauner, Bernhard Schüler, Bernhard G. Mueller, Nikolai Knaub, Kulpreet Singh Virdi
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Patent number: 11191495Abstract: A system of shields designed to provide substantially greater protection, head to toe, against radiation exposure to health care workers in a hospital room during procedures which require real-time imaging. The shields are placed around the patient and the x-ray table and provide protection even when the x-ray tube is moved to various angles around the patient.Type: GrantFiled: September 3, 2019Date of Patent: December 7, 2021Assignee: Egg Medical, Inc.Inventors: Robert F. Wilson, Uma S. Valeti, John P. Gainor
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Patent number: 11189476Abstract: Provided is a sample support body for ionization of a sample. The sample support body includes a substrate including a first surface and a second surface on sides opposite to each other, a first conductive layer provided on the first surface, and a second conductive layer provided on the second surface. A plurality of through-holes opening on the first surface and the second surface are formed in a predetermined region of the substrate, the predetermined region being for ionizing components of the sample. A width of a first opening on the first surface side is larger than a width of a second opening on the second surface side in each of the plurality of through-holes.Type: GrantFiled: January 16, 2019Date of Patent: November 30, 2021Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro Kotani, Takayuki Ohmura