Patents Examined by Hoa Q. Pham
  • Patent number: 10928303
    Abstract: A concentration measuring device includes a measuring cell having a flow passage and a translucent window, a light source for emitting light to the measuring cell through the window, a reflective member for reflecting light propagating through the measuring cell to the window, a light detector for detecting the light exiting from the window, a calculation part for calculating the concentration of the fluid on the basis of a detection signal from the light detector, and an optical device for guiding the light from the light source to the window and guiding the light from the window to the light detector.
    Type: Grant
    Filed: July 25, 2017
    Date of Patent: February 23, 2021
    Assignees: TOKUSHIMA UNIVERSITY, FUJIKIN INCORPORATED
    Inventors: Yoshihiro Deguchi, Takashi Fukawa, Taiki Hattori, Masaaki Nagase, Kazuteru Tanaka, Kouji Nishino, Nobukazu Ikeda
  • Patent number: 10928486
    Abstract: A light detection and ranging (LIDAR) transmitter includes a plurality of light emitters that generate a plurality of optical beams. A first lens is positioned in an optical path of the plurality of optical beams at a distance from at least one of the plurality of light emitters that is less than a focal length of the first lens. The first lens converges the plurality of optical beams to a converged optical beam having a beam waist. A second lens is positioned in the optical path of the converged optical beam. The second lens projects the converged optical beam to a target range. The position of the second lens and an emission width of at least one of the plurality of light emitters are configured to provide a desired field-of-view of the LIDAR transmitter at the target range.
    Type: Grant
    Filed: November 17, 2019
    Date of Patent: February 23, 2021
    Assignee: OPSYS Tech Ltd.
    Inventor: Mark J. Donovan
  • Patent number: 10928191
    Abstract: A marker for achieving more accurate position and posture estimation, and a posture estimation method and a position and posture estimation method using this marker are provided. In order to solve this problem, the present invention provides a marker for estimating the posture of an object, wherein the marker includes standard variable moire patterns VS1 and VS2 for estimating a visual line angle around at least one axis with respect to the object and high-sensitivity variable moire patterns VH1 and VH2 that have a resolution of visual line angle higher than the standard variable moire patterns VS1 and VS2 and that are used to estimate the visual line angle around the axis.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: February 23, 2021
    Assignee: National Institute of Advanced Industrial Science and Technology
    Inventor: Hideyuki Tanaka
  • Patent number: 10921249
    Abstract: According to the present invention, an optical differential interrogation method for surface plasmon resonance imaging including: letting first incident light of a first wavelength and second incident light of a second wavelength to be incident on a sample while varying an incident angle; detecting intensity of first reflection light of the first incident light and intensity of second reflection light of the second incident light; and identifying the sample by using a difference between the intensity of the first reflection light and the intensity of the second reflection light, can be provided, and thus it is possible to obtain much better angular resolution while using a detector or a camera, which has a relative low receiving sensitivity and a sensor chip where samples having various characteristics are two-dimensionally arrayed and integrated can be effectively measured.
    Type: Grant
    Filed: July 9, 2019
    Date of Patent: February 16, 2021
    Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Jong Deog Kim, Yo Han Choi
  • Patent number: 10921115
    Abstract: The present invention teaches a punch and die measurement device which includes a linear array LED micrometer arranged so that the light beams and shadows pass vertically from transmitters to receivers, and further teaches a 1:1 ratio pantograph for transferring measurements from inside of a necker die to outside the die where it may then be measured by the linear array LED micrometers. The invention may include a precision alignment block, captive adjustment screws to adjust tilt plates angle of the linear array measurement carriage and lever arms to reduce motion of the adjustment screws as applied to the tilt plates.
    Type: Grant
    Filed: February 19, 2020
    Date of Patent: February 16, 2021
    Assignee: INTEGRATED PACKAGING SOLUTIONS, LLC
    Inventors: Christopher Dale Goldsmith, Richard Lamar Lord, Adam Brian Johnson, Ryan Caleb Wiebe
  • Patent number: 10921235
    Abstract: A system for in-situ monitoring of particles in a process fluid includes a flow channel having a window for flowing the process fluid therethrough. The window includes an inner surface having a coating thereon that reduces a buildup rate of the particles on the inner surface. A light source is for directing a polarized beam along a first beam path through the window into the process fluid such that an output beam emerges from the process fluid along a second beam path. A polarizing filter positioned in the second beam path is for filtering the output beam. A photodetector is for detecting the output beam after passing the polarizing filter that generates signals that represent images of the particles in the process fluid. A controller coupled to the photodetector is for analyzing the signals to determine at least one parameter related to the particles in the process fluid.
    Type: Grant
    Filed: August 21, 2019
    Date of Patent: February 16, 2021
    Assignee: Honeywell International Inc.
    Inventors: Tobias Nebel, Markku Kellomaki, Brendon Lyons, Meghan Elizabeth Charochak
  • Patent number: 10921367
    Abstract: Gain independent reference channel measurement system and method. A method of making robust, stable measurements, in a variety of different applications is disclosed. More specifically, this disclosure describes systems and methods relating to performing gain independent reference channel measurements by making two phase measurements of a device under test. Mathematically, the measurements are combined and many common mode parameters drop out. The result yields an analysis of a device under test analysis which mitigated errors, predominately arising from environmental variations and changes in circuit behavior stemming from swings in signal input.
    Type: Grant
    Filed: February 17, 2020
    Date of Patent: February 16, 2021
    Assignee: ANALOG DEVICES, INC.
    Inventor: Shrenik Deliwala
  • Patent number: 10921318
    Abstract: The present invention relates to the use of a control marker for implementing analysis methods on spots, in particular in the context of multiplex analyses. The present invention thus relates to solid supports containing said control marker, their preparation method and their use in analysis methods. The present invention makes it possible to verify the presence, location and/or integrity of the spots at the end of the analysis method, and thus to secure the obtained results while guaranteeing that the yielded result indeed results from a present, intact and localized spot.
    Type: Grant
    Filed: November 26, 2018
    Date of Patent: February 16, 2021
    Assignee: BIO-RAD EUROPE GMBH
    Inventors: Agnes Roseline Claude Pouzet, Vincent Doury, Laurent Emmanuel Fournier, Christophe Rene Roger Vedrine
  • Patent number: 10914671
    Abstract: Flow cytometers having an enclosed particle sorting module are provided. Aspects of the flow cytometers include, in addition to the enclosed particle sorting modules, a sample input module fluidically coupled to an inlet of the enclosed particle sorting module, a waste reservoir fluidically coupled to first outlet of the enclosed particle sorting module and a first sorted particle collection system fluidically coupled to a second outlet of the enclosed particle sorting module. Flow cytometers as described herein are configured to control aerosol content in the enclosed particle sorting modules, including the sort chambers of such modules. Also provided are methods of using the flow cytometers, as well as kits that include one or more components of the flow cytometers are consumables for use therewith.
    Type: Grant
    Filed: April 22, 2019
    Date of Patent: February 9, 2021
    Assignee: BECTON, DICKINSON AND COMPANY
    Inventors: Pierce Norton, Kyle Dembski, Henry Lankila
  • Patent number: 10914913
    Abstract: A flow cytometer, laser optics assembly thereof, and methods of assembling the same are provided. The flow cytometer is capable of yielding consistent and accurate results despite exposure to adverse environmental conditions such as, for example, temperature changes within a relatively wide temperature range and/or a relatively large amount of random-axis mechanical vibration. The flow cytometer of the present disclosure is additionally or alternatively relatively insensitive to real or apparent core stream shifts, employs a slowly converging beam along the axis perpendicular to core stream flow, and provides the ability to precisely measure time-of-flight.
    Type: Grant
    Filed: March 28, 2019
    Date of Patent: February 9, 2021
    Assignee: IDEXX LABORATORIES, INC.
    Inventors: Garland Christian Misener, Michael Ryan Moon, Spencer Franklin McElwain, Alan Papale
  • Patent number: 10901134
    Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: January 26, 2021
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hiroshi Ohno, Takahiro Kamikawa, Takehiro Hato, Hiroya Kano
  • Patent number: 10895532
    Abstract: An airborne microorganism measurement device includes a housing including a first body and a second body, an air passage formed between the first body and the second body such that air containing airborne microorganisms pass therethrough, a charging part and a collecting part disposed in the air passage to charge and collect the airborne microorganisms, a high voltage generating device provided in the first body to supply a high voltage to the charging part and the collecting part, and a light emitting unit and a light receiving part provided in the second body to detect a fluorescent signal generated by irradiating the airborne microorganisms collected in the collecting unit with light.
    Type: Grant
    Filed: December 6, 2017
    Date of Patent: January 19, 2021
    Assignee: LG ELECTRONICS INC.
    Inventors: Sujin Lee, Bongjo Sung, Ilna Son, Sanggu Lee
  • Patent number: 10890516
    Abstract: Embodiments relate generally to systems and methods for detecting particulate matter in the air. A particulate matter sensor may comprise an airflow channel; a light source configured to pass light through the airflow channel; an airflow generator configured to generate airflow into the airflow channel; a waveguide configured to direct light from the light source after it passes through the airflow channel and scatters off of particulate matter within the airflow channel; a photodiode configured to receive light scattered by the waveguide; and a computing device coupled to the photodiode having a processor and a memory storing instructions which, when executed by the processor, determines a mass concentration of particles in the airflow channel based on an output of the photodiode.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: January 12, 2021
    Assignee: Honeywell International Inc.
    Inventors: Ouyang Yang, Lu Tian, Chen Feng, Lu Jinnan, Rui Hou, Tao Chen
  • Patent number: 10883823
    Abstract: A method of determining dimensional information of a target surface includes generating a first point cloud corresponding to a first plurality of reconstructed surface points of the target surface generated by a first imaging system-illumination source pair of a phase profilometry system; generating a second point cloud corresponding to a second plurality of reconstructed surface points of the target surface generated by a second imaging system-illumination source pair of the phase profilometry system; generating an initial estimate of the target surface based on the first and second point clouds; and refining the initial surface estimate using positions of the first and second point clouds and geometry of the first and second imaging system-illumination source pairs to generate a final point cloud.
    Type: Grant
    Filed: October 17, 2019
    Date of Patent: January 5, 2021
    Assignee: CyberOptics Corporation
    Inventors: Paul R. Haugen, Evan J. Ribnick, Carl E. Haugan, Eric P. Rudd
  • Patent number: 10882135
    Abstract: An apparatus for additively manufacturing three-dimensional objects includes a scanning unit configured to scan an energy beam over a build plane, and a focusing unit that includes an optical lens or lens system. The focusing unit may be configured to control a focal position of the energy beam based on calibration information. The focal position may be controlled by moving the focusing unit in the z-direction relative to the build plane without changing the focal length of the energy beam. Methods of calibrating such an apparatus may include moving a focusing unit in the z-direction relative to a build plane based on calibration information and scanning an energy beam over at least a portion of the build plane using a scanning unit, with the focusing unit being configured to control a focal position of the energy beam without changing the focal length of the energy beam.
    Type: Grant
    Filed: July 20, 2018
    Date of Patent: January 5, 2021
    Assignee: Concept Laser GmbH
    Inventors: Maximilian Bauer, Kai Hertel
  • Patent number: 10883820
    Abstract: A method of performing metrology analysis of a thin film includes coupling a radiation into an optical element disposed adjacent to a surface of the thin film. The radiation is coupled such that the radiation is totally internally reflected at an interface between the optical element and the thin film. An evanescent radiation generated at the interface penetrates the thin film. The method furthers include analyzing the evanescent radiation scattered by the thin film to obtain properties of the thin film.
    Type: Grant
    Filed: February 28, 2018
    Date of Patent: January 5, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Baohua Niu, Ji-Feng Ying, David Hung-I Su
  • Patent number: 10876948
    Abstract: A particle sensing device according to one embodiment comprises: a light-emitting unit for emitting light; a first flow path unit arranged under the light-emitting unit so as to be vertical to an optical shaft of the light-emitting unit, and through which air including particles flows; a light-receiving unit arranged at the optical shaft under the first flow path unit, and on which light that has passed through the first flow path is incident; and a light-absorbing unit arranged at the optical shaft under the light-receiving unit and absorbing light that has passed through the light-receiving unit.
    Type: Grant
    Filed: March 29, 2018
    Date of Patent: December 29, 2020
    Assignee: LG INNOTEK CO., LTD.
    Inventors: Jae Hyun Kim, Ji Hoon Kim
  • Patent number: 10876955
    Abstract: Apparatus include an illumination source configured to produce and direct a multi-wavelength illumination beam to a microfluidic target that can include nanotags, a detector configured to receive a multi-wavelength detection beam from the microfluidic target and to produce a detection signal, wherein the multi-wavelength detection beam comprises light that is elastically side-scattered by an interaction between the multi-wavelength illumination beam and the nanotags in the microfluidic target, and a processor configured to receive the detection signal and to determine the presence of the nanotags in the microfluidic target by comparing multiple wavelength side-scatter intensity characteristics of the detection signal with predetermined multi-wavelength elastic side-scatter intensity profiles of one or more nanotag types.
    Type: Grant
    Filed: October 23, 2018
    Date of Patent: December 29, 2020
    Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY, DEPARTMENT OF HEALTH AND HUMAN SERVICES
    Inventors: Joshua Aden Welsh, Jennifer C. Jones, William G. Telford, Jay A. Berzofsky, Ari Rosner
  • Patent number: 10876961
    Abstract: This disclosure relates generally to a sampling device, and more particularly, a sampling device that facilitates spectroscopic measurements with a variable path length and the necessary software controlled algorithms and methods for such a device.
    Type: Grant
    Filed: April 6, 2018
    Date of Patent: December 29, 2020
    Inventors: Mark Salerno, I-Tsung Shih, Craig Harrison
  • Patent number: 10876921
    Abstract: Some demonstrative embodiments include apparatuses, systems and/or methods of determining one or more optical parameters of a lens of eyeglasses. For example, a product may include one or more tangible computer-readable non-transitory storage media including computer-executable instructions operable to, when executed by at least one computer processor, enable the at least one computer processor to process at least one captured image of at least one reflection of a flash on a lens of eyeglasses; and determine one or more optical parameters of the lens based at least on the at least one captured image.
    Type: Grant
    Filed: January 27, 2020
    Date of Patent: December 29, 2020
    Inventors: Ofer Limon, Shahar Levy, Alexander Zlotnik, Maya Aviv