Patents Examined by Hoa Q. Pham
  • Patent number: 11327022
    Abstract: The present invention provides for a novel series of accessories for Raman and/or luminescence spectral acquisitions for many different applications and methods for making such accessories. The invention further provides sample holders that enhance sample handling ability and sample sensitivity, reduce fluorescence and Raman background, as well as sample size and consumption, and thereby improve resulting spectral analyses.
    Type: Grant
    Filed: February 24, 2018
    Date of Patent: May 10, 2022
    Inventor: Dongmao Zhang
  • Patent number: 11320371
    Abstract: Evaluation of a rotating wheel is described. The evaluation utilizes information acquired by radiation reflecting off of one or more regions of the rotating wheel. An imaging device can acquire image data which is processed to evaluate the wheel. The radiation can comprise diffuse and/or coherent radiation. Image data for substantially an entire circumference of the wheel can be used in the evaluation.
    Type: Grant
    Filed: September 14, 2018
    Date of Patent: May 3, 2022
    Assignee: International Electronic Machines Corp.
    Inventors: Zahid F. Mian, Ronald W. Gamache
  • Patent number: 11315234
    Abstract: An object of the present invention is to accurately measure the heights of wire loops densely disposed in a power module. A semiconductor manufacturing inspection system includes: an single-color illumination unit including a plurality of LED chips to emit light beams to a plurality of wire loops connected to surfaces of semiconductor elements; a camera to capture images of the wire loops; and an image processor to recognize an imaging region of each of the wire loops from the images, based on a luminance value and to measure the height of each of the wire loops based on the imaging region of the wire loop in the images. The LED chips emit the light beams to the separate wire loops, and the light beams emitted from two of the LED chips to adjacent two of the wire loops differ in luminance.
    Type: Grant
    Filed: May 22, 2020
    Date of Patent: April 26, 2022
    Assignee: Mitsubishi Electric Corporation
    Inventor: Motoki Iinuma
  • Patent number: 11313810
    Abstract: A method for verifying semiconductor wafers includes receiving a semiconductor wafer including a plurality of layers. A first set of measurement data is obtained for at least one layer of the plurality of layers, where the first set of measurement data includes at least one previously recorded thickness measurement for one or more portions of the at least one layer. The first set of measurement data is compared to a second set of measurement data for the at least one layer. The second set of measurement data includes at least one new thickness measurement for the one or more portions of the at least one layer. The semiconductor wafer is determined to be an authentic wafer based on the second set of measurement data corresponding to the first set of measurement data, otherwise the semiconductor is determined to not be an authentic wafer.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: April 26, 2022
    Assignee: International Business Machines Corporation
    Inventor: Effendi Leobandung
  • Patent number: 11300493
    Abstract: Embodiments of a continuous dust accumulation monitoring system comprise an enclosure adapted for use in electrical hazardous locations, a sample area for collecting ambient dust, a dust accumulation sensor assembly installed in the enclosure configured to generate a signal based on the amount of ambient dust collected on the sample area and a circuit board within the enclosure configured to receive the signal from the dust accumulation sensor assembly. The continuous dust accumulation monitoring system may be connected to system control hardware.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: April 12, 2022
    Assignee: Industrial Intelligence, Inc.
    Inventors: George T. Armbruster, Jr., Bruce Ferris, Shane Diller, Slava Orlov
  • Patent number: 11293920
    Abstract: A method for making a plasmonic mushroom array includes: forming a plurality of metal nano-islands each having nanometer-range dimensions on a surface of a glass substrate; and subjecting to the glass substrate having the plurality of metal nano-islands formed thereon to reactive ion etching such that the plurality of metal nano-islands are converted to a plurality of mushroom-shaped structures each having a metal cap supported by a pillar made of a material of the glass substrate and each having dimensions smaller than the dimensions of the nano-islands, the plurality of mushroom-shaped structures being arranged in a substantially regular pattern with intervals smaller than average intervals between the nano-islands, thereby forming the plurality of nano-scale mushroom-shaped structures on the glass substrate that can exhibit localized surface plasmon resonance.
    Type: Grant
    Filed: April 18, 2018
    Date of Patent: April 5, 2022
    Assignee: OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
    Inventors: Nikhil Bhalla, Amy Shen Fried, Kang-Yu Chu
  • Patent number: 11293800
    Abstract: The present disclosure includes a method for correcting a primary measurement signal detected by an optical detector. The method includes: emitting a first light signal from a light source to an active sensor layer such that the active sensor layer is stimulated and emits a second light signal, which is detected by an optical detector; determining the primary measurement signal of a primary measurement parameter based on the second light signal and/or the first light signal; determining a secondary measurement signal of a secondary measurement parameter that is different from the primary measurement parameter based on the first light signal or the second light signal; comparing the determined secondary measurement signal with a first limit value; and correcting the primary measurement signal when the secondary measurement signal exceeds the first limit value, wherein correcting the primary measurement signal comprises smoothing the primary measurement signal by filtering.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: April 5, 2022
    Inventors: Hermann G√ľnther, Ronny Michael, Stefan Paul
  • Patent number: 11293865
    Abstract: A detection system for measuring one or more conditions within a predetermined area includes a fiber harness having at least one fiber optic cable for transmitting light, the at least one fiber optic cable defining a node arranged to measure one or more conditions within the predetermined area. A control system is operably coupled to the fiber harness such that scattered light associated with the node is transmitted to the control system, wherein the control system analyzes the light transmitted from the node by comparing multiple wavelengths of scattered light to determine at least one of a presence and magnitude of the one or more conditions at the node.
    Type: Grant
    Filed: November 8, 2017
    Date of Patent: April 5, 2022
    Assignee: CARRIER CORPORATION
    Inventors: Michael J. Birnkrant, David L. Lincoln, Jennifer M. Alexander, Peter R. Harris
  • Patent number: 11293842
    Abstract: The present invention relates to a measuring system for investigating concentrated, larger aerosol particles of an aerosol in the gas phase, having a multi-stage aerosol particle concentrator and also a measuring chamber for analyzing the larger aerosol particles, with at least one measuring device for the qualitative and/or quantitative determination of the aerosol particles, in particular in real time. The aerosol particle concentrator separates a larger part of the aerosol with fine particles and concentrate the larger aerosol particles in the smaller part of the aerosol. The aerosol particle concentrator includes an aerosol suction pump generating a negative pressure in the virtual impactor stages and a circulating-flow channel in which a part of the separated aerosol with fine particles is returned in the circulating flow from the aerosol outlet to the aerosol inlet of the aerosol suction pump.
    Type: Grant
    Filed: August 27, 2019
    Date of Patent: April 5, 2022
    Assignee: SWISENS AG
    Inventors: David Roos Launchbury, Roger Waser, Erny Niederberger, Reto Abt, Philipp Burch
  • Patent number: 11275021
    Abstract: A substance testing method, a substance testing system, and a sensor module for a portable substance testing system is disclosed. The sensor module includes: a light source, configured to illuminate a lateral flow test strip of the portable substance testing system; a filter, comprising a plurality of apertures, configured to filter out light from the lateral flow test strip; and a sensor, for sensing the filtered light, and providing one or more signals indicative of an output of the test strip.
    Type: Grant
    Filed: September 1, 2017
    Date of Patent: March 15, 2022
    Assignee: Alcolizer Pty Ltd.
    Inventors: Roger Alan Hunt, James John Brown
  • Patent number: 11268908
    Abstract: An air dryer cartridge for reducing moisture of air supplied to an electronics housing has a cartridge housing containing a drying agent through which air is guided. A sensor unit of an optical measuring system is provided for determining the moisture content of the drying agent. The cartridge has a light-permeable casing surface section so that an optical signal emitted from the optical measuring system can pass through the casing surface section. In the method for determining a moisture content of the drying agent of the air dryer cartridge, an optical signal from a sending module is emitted onto or through the drying agent and received by a receiving module where a measured value is determined. The moisture content is determined by comparing the measured value with a data set of measured value-specific values for moisture contents or by a calculation rule for moisture content based on measured value.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: March 8, 2022
    Assignee: MANN+HUMMEL GmbH
    Inventors: Prasad Pore, Markus Beylich
  • Patent number: 11262661
    Abstract: A metrology tool for determining a parameter of interest of a structure fabricated on a substrate, the metrology tool comprising: an illumination optical system for illuminating the structure with illumination radiation under a non-zero angle of incidence; a detection optical system comprising a detection optical sensor and at least one lens for capturing a portion of illumination radiation scattered by the structure and transmitting the captured radiation towards the detection optical sensor, wherein the illumination optical system and the detection optical system do not share an optical element.
    Type: Grant
    Filed: June 5, 2019
    Date of Patent: March 1, 2022
    Assignee: ASML Netherlands B.V.
    Inventors: Nitesh Pandey, Arie Jeffrey Den Boef, Duygu Akbulut, Marinus Johannes Maria Van Dam, Hans Butler, Hugo Augustinus Joseph Cramer, Engelbertus Antonius Fransiscus Van Der Pasch, Ferry Zijp, Jeroen Arnoldus Leonardus Johannes Raaymakers, Marinus Petrus Reijnders
  • Patent number: 11255781
    Abstract: A visibility meter, a street light device and an operation method thereof are provided. The visibility measurement method includes: transmitting a visible laser through an optical transmitter; receiving the visible laser through an optical sensor to generate a sensed result; and calculating a visibility according to the sensed result.
    Type: Grant
    Filed: May 20, 2020
    Date of Patent: February 22, 2022
    Assignees: LITE-ON ELECTRONICS (GUANGZHOU) LIMITED, Lite-On Technology Corporation
    Inventors: Li-Ta Fan, Kuei-Ling Chen, Tsan-Li Chiu, Kuo-Hui Chang, Yao-Chi Peng
  • Patent number: 11255770
    Abstract: A measurement apparatus according to the present disclosure is a measurement apparatus capable of measuring particles in a fluid and comprises: a flow path device including a first flow path with translucency through which a first fluid including the particles passes and a second flow path with translucency through which a second fluid which does not include the particles passes; an optical sensor facing the flow path device, irradiating each of the first flow path and the second flow path with light, and receiving light passing through each of the first flow path and the second flow path; and a controller measuring the particles by comparing an intensity of light passing through the first flow path and an intensity of light passing through the second flow path, each of which is obtained by the optical sensor.
    Type: Grant
    Filed: July 30, 2018
    Date of Patent: February 22, 2022
    Assignee: KYOCERA CORPORATION
    Inventors: Yuji Masuda, Masashi Yoneta, Jumpei Nakazono
  • Patent number: 11249029
    Abstract: An electronic device for optically checking an appearance of a product for defects includes a first checking device checking a plane of a product and a second checking device checking side surfaces of the product. The first checking device includes a first camera device, a second camera device, and first white and red light sources. The second checking device includes a third camera device, at least one second white light source, and at least one second red light source. When the first white light source or the first red light source are activated, the first and second camera device capture at least one image of a plane. When the second white light source or the second red light source are activated, the third camera device captures at least one image of a side surface.
    Type: Grant
    Filed: August 24, 2020
    Date of Patent: February 15, 2022
    Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.
    Inventors: Liu-Bin Hu, Bin Zou, Zhi-Cheng Huang
  • Patent number: 11243167
    Abstract: Methods and systems for detecting the presence of irregularities in milk, and for assessing a health state of a lactating mammal, are provided. A sample of milk is illuminated with a light beam. Scattering data resulting from an interaction between the light beam and the sample of milk is collected. The scattering data is processed to detect the presence or absence of light scattered at a predetermined angle relative to a normal orientation, for instance to determine at least one characteristic of the sample of milk. Based on the presence or absence of light, the presence of irregularities in the sample of milk can be determined, for instance to assess the health state of the lactating mammal based on the at least one characteristic of the sample of milk.
    Type: Grant
    Filed: August 17, 2018
    Date of Patent: February 8, 2022
    Assignee: SomaDetect Inc.
    Inventors: Bethany Deshpande, Nicholas Clermont, Satish Deshpande, Bharath Sudarsan, Bryan Wattie
  • Patent number: 11243159
    Abstract: A tunable colorimetric sensor/optical filter is based on a lithography-free, asymmetric Fabry-Perot cavity. The sensor has a thin-film structure formed by a lossy, porous nanoplasmonic top film deposited on an actively tunable spacer middle layer, and a reflective base layer (either a metal or semiconductor). The structure is fabricated using wafer-scale PVD processes, and the middle layer responds to the presence of a stimulus in the local environment, by expanding in thickness resulting in a shift in resonance wavelength and thus an obvious change in color of the sensor, which color change is detectable by the naked-eye. Such layered geometries exhibit vibrant, macroscopic structural coloration owing to the broadband optical absorption of the top film, enabling the change in spacer thickness to be transduced visually, circumventing the need for sophisticated optical equipment for signal readout to observe the presence of the environmental stimulus.
    Type: Grant
    Filed: February 6, 2020
    Date of Patent: February 8, 2022
    Inventors: Timothy J. Palinski, Gary W. Hunter, John Zhang
  • Patent number: 11237124
    Abstract: A measurement system is provided for predicting a future status of a refractory lining that is lined over an inner surface of an outer wall of a manufacturing vessel and exposed to an operational cycle during which the refractory lining is exposed to a high-temperature environment for producing a non-metal and the produced non-metal. The system includes one or more laser scanners and a processor. The laser scanners are configured to conduct one or more pre-operational laser scans of the refractory lining prior to the operational cycle to collect data related to pre-operational cycle structural conditions, and one or more post-operational laser scans of the refractory lining after the operational cycle to collect data related to post-operational cycle structural conditions of the refractory lining. The processor is configured to predict future status of the refractory lining after subsequent operational cycles based on the determined exposure impact of the operational cycle.
    Type: Grant
    Filed: November 4, 2020
    Date of Patent: February 1, 2022
    Assignee: HarbisonWalker International, Inc.
    Inventors: Tomas Richter, Corey Forster, Donald Abrino
  • Patent number: 11231364
    Abstract: An optical turbulence measurement system may include a camera assembly, a first optics assembly, a second optics assembly, and processing circuitry. The first optics assembly and the second optics assembly may be configured to magnify and direct a portion of a source beam received by a respective aperture to the camera assembly to be received as a two portions of a received beam. The processing circuitry may be configured to receive, from the camera assembly, a data representation of a first received beam from the first optics assembly and a second received beam from the second optics assembly, determine a focal spot displacement variance based on motion of a first focal spot corresponding to the first received beam relative to a second focal spot corresponding to the second received beam, and measure optical turbulence along a path of the source beam based on the focal spot displacement variance.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: January 25, 2022
    Assignee: The Johns Hopkins University
    Inventors: David M. Brown, Randall T. Hanna, Kevin C. Baldwin, Andrea M. Brown
  • Patent number: 11232551
    Abstract: A micro camera is placed in an appropriate image capturing position therefor on the basis of a center-to-center distance depending on a rotational angle of a holding table. Even in the case where the center C0 of a holding surface and the center C1 of a wafer are displaced out of alignment with each other, allowing a position in X-axis directions of an outer circumference of the wafer to vary as the holding table rotates, a control unit can make an image capturing range of the micro camera follow the varying position of the outer circumference of the wafer. Therefore, the image capturing range of the micro camera can be determined with ease. Both a surface of the wafer and the outer circumference of the wafer can be inspected simply when two cameras are moved along the X-axis directions by a single X-axis moving mechanism.
    Type: Grant
    Filed: July 2, 2020
    Date of Patent: January 25, 2022
    Assignee: DISCO CORPORATION
    Inventors: Shinji Yoshida, Koji Hashimoto, Yasukuni Nomura