Patents Examined by Hoa Q. Pham
  • Patent number: 10634617
    Abstract: An installation for the optical inspection of surface regions of objects, such as painted vehicle bodies, includes a test light device, by which objects located in a test region can be irradiated with a test light and by which a test pattern can be generated on the surface region. A lighting system includes a plurality of lighting units, by which test light can be emitted. The light intensity of the test light or both the color of light and the light intensity of the test light can be optionally adjusted by the lighting units.
    Type: Grant
    Filed: June 14, 2016
    Date of Patent: April 28, 2020
    Assignee: EISENMANN SE
    Inventors: Jürgen Röckle, Jan Reiner Hammermann, Axel Halbmeyer
  • Patent number: 10627398
    Abstract: An analysis device optically scans a surface of a substrate to which particles are fixed, detects a pulse wave included in a detection signal obtained from an optical scanning unit when the optical scanning unit scans the substrate, and counts the particles based on pulse interval between two pulse waves each having pulse width less than first reference value determined depending on first pulse width when the optical scanning unit scans a plurality of particles adjacent to each other when the two pulse waves are detected consecutively.
    Type: Grant
    Filed: May 15, 2019
    Date of Patent: April 21, 2020
    Inventors: Masayuki Ono, Shingo Yagyu, Makoto Itonaga, Yuichi Hasegawa, Koji Tsujita
  • Patent number: 10627388
    Abstract: A method for detecting a deflection between a source module and a detection module in a scanning apparatus and configured as a sensor pair for scanning transmission measurement of sheet material being transported in a machine direction through a sensing gap formed between the source module and the detection module. The source module is arranged on a first side of the sensing gap and emits a sensing radiation or sensing energy radiation towards the sensing gap, and the detection module is arranged on a second side of the sensing gap opposite to the first side and detects the radiation from the source module and transmitted through the sensing gap. The method includes: attaching a removable blocking device to the detection module; and performing a partially-blocked scanning process during which the source module and the detection module are jointly moved in a cross direction of the scanning apparatus.
    Type: Grant
    Filed: September 27, 2017
    Date of Patent: April 21, 2020
    Assignee: ABB Schweiz AG
    Inventors: Shih-Chin Chen, Chang Yuan Liu, Ake A. Hellstrom
  • Patent number: 10620121
    Abstract: Disclosed herein are methods comprising illuminating a first location of a plasmonic substrate with electromagnetic radiation, wherein the electromagnetic radiation comprises a wavelength that overlaps with at least a portion of the plasmon resonance energy of the plasmonic substrate. The plasmonic substrate can be in thermal contact with a liquid sample comprising a plurality of particles, the liquid sample having a first temperature. The methods can further comprise generating a confinement region at a location in the liquid sample proximate to the first location of the plasmonic substrate, wherein at least a portion of the confinement region has a second temperature that is greater than the first temperature such that the confinement region is bound by a temperature gradient. The methods can further comprise trapping at least a portion of the plurality of particles within the confinement region.
    Type: Grant
    Filed: April 19, 2017
    Date of Patent: April 14, 2020
    Inventors: Yuebing Zheng, Linhan Lin, Xiaolei Peng
  • Patent number: 10605716
    Abstract: A particle counting apparatus is provided that includes: a droplet discharger configured to discharge a droplet containing at least one luminescent particle capable of emitting light upon receiving light; a light irradiator configured to irradiate the droplet discharged by the droplet discharger with light; at least one light receiver configured to receive light emitted by the at least one luminescent particle irradiated with the light emitted by the light irradiator; and circuitry configured to count luminescent particles contained in the droplet based on the light received by the at least one light receiver, the circuitry being configured to measure a presence or absence of the luminescent particles contained in the droplet; and to measure a number of the luminescent particles contained in the droplet.
    Type: Grant
    Filed: July 20, 2018
    Date of Patent: March 31, 2020
    Assignee: Ricoh Company, Ltd.
    Inventors: Ikuo Katoh, Manabu Seo, Yunong Ji, Nobuaki Toyoshima, Hiroki Somada, Ryuya Mashiko, Satoshi Izumi, Takahiko Matsumoto, Daisuke Takagi
  • Patent number: 10605698
    Abstract: Method for checking a tyre. The method includes associating first and second independent light sources with a camera, applying a first force against a first surface portion of the tyre to generate a first deformed surface portion, and illuminating the first deformed surface portion with a first light radiation emitted by the first light source while keeping the second light source deactivated. A first image of the first deformed surface portion is then acquired by the camera. The first force is removed and a second surface portion partially distinct from the first surface portion is illuminated with a second light radiation emitted by the second light source without deforming the second surface portion. A second image of the second surface portion is then acquired by the camera. The first and second images are processed for detection of possible defects in the first and second surface portions.
    Type: Grant
    Filed: December 16, 2016
    Date of Patent: March 31, 2020
    Assignee: PIRELLI TYRE S.P.A.
    Inventors: Alessandro Held, Vincenzo Boffa, Daniele Pecoraro, Valeriano Ballardini, Josef Engelsberger, Bernd Leitner
  • Patent number: 10598917
    Abstract: Aspects of the disclosure are directed to a borescope grip defined about a central longitudinal axis, comprising: a reaction case that includes a first flange having a first face that is substantially perpendicular to a central longitudinal axis of the grip, an o-ring that abuts the first face of the first flange, a plunger that includes a second flange having a second face that abuts the o-ring at a first axial position and is disengaged from the o-ring at a second axial position, and a spring that abuts the second flange.
    Type: Grant
    Filed: April 7, 2017
    Date of Patent: March 24, 2020
    Assignee: United Technologies Corporation
    Inventors: Michael D. Chowaniec, Antony J. Giunta
  • Patent number: 10591747
    Abstract: Disclosed is an inspection and system method and system for determining the orientation of a contact lens on a lens support, particularly in an automated contact lens manufacturing line.
    Type: Grant
    Filed: September 6, 2018
    Date of Patent: March 17, 2020
    Assignee: Alcon Inc.
    Inventors: Steffen Paulekuhn, Susanne Fechner, Sarah Unterkofler, Daniel Kessler, Evgeni Schumm, Matthias Schwab
  • Patent number: 10585193
    Abstract: The technology disclosed relates to determining positional information of an object in a field of view. In particular, it relates to calculating a distance of the object from a reference such as a sensor including scanning the field of view by selectively illuminating directionally oriented light sources and measuring one or more differences in property of returning light emitted from the light sources and reflected from the object. The property can be intensity or phase difference of the light. It also relates to finding an object in a region of space. In particular, it relates to scanning the region of space with directionally controllable illumination, determining a difference in a property of the illumination received for two or more points in the scanning, and determining positional information of the object based in part upon the points in the scanning corresponding to the difference in the property.
    Type: Grant
    Filed: March 26, 2018
    Date of Patent: March 10, 2020
    Assignee: Ultrahaptics IP Two Limited
    Inventor: David Holz
  • Patent number: 10578429
    Abstract: In order to quickly determine three-dimensional contours, for example, in real time for industrial processes, capturing and processing data, a method includes a step of initially determining a coarse position of a light line image by a position scan with reduced resolution and therefrom automatically defining windows on a sensor which include an entire line image so that the data only has to be read from the windows during the subsequent measuring scan which is performed with a higher resolution compared to the position scans.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: March 3, 2020
    Assignee: SmartRay GmbH
    Inventor: Mathias Reiter
  • Patent number: 10578515
    Abstract: Some demonstrative embodiments include apparatuses, systems and/or methods of determining one or more optical parameters of a lens of eyeglasses. For example, a product may include one or more tangible computer-readable non-transitory storage media including computer-executable instructions operable to, when executed by at least one computer processor, enable the at least one computer processor to process at least one captured image of at least one reflection of a flash on a lens of eyeglasses; and determine one or more optical parameters of the lens based at least on the at least one captured image.
    Type: Grant
    Filed: January 23, 2017
    Date of Patent: March 3, 2020
    Assignee: 6 OVER 6 VISION LTD.
    Inventors: Ofer Limon, Shahar Levy, Alexander Zlotnik, Maya Aviv
  • Patent number: 10571256
    Abstract: A three-dimensional measurement sensor based on line structured light, comprising a sensing head and a controller. The sensing head is used for collecting section data and attitude information of its own, and matching the section data with the self attitude information. The sensing head comprises a three-dimensional camera, an attitude sensor, a laser and a control sub-board, wherein the three-dimensional camera is installed at a certain angle relative to the laser, and acquires elevation and grey information about an object surface corresponding to laser rays using a triangulation principle. The attitude sensor, the three-dimensional camera and the laser are installed on the same rigid plane, and the attitude sensor reflects measurement attitude of the three-dimensional camera and the laser in real time. The controller is used for measuring and controlling the sensing head, performing data processing transmission and supporting external control.
    Type: Grant
    Filed: August 26, 2016
    Date of Patent: February 25, 2020
    Inventors: Qingquan Li, Dejin Zhang, Min Cao, Xinlin Wang, Hong Lin
  • Patent number: 10571351
    Abstract: A group and method for measuring the pressure in closed containers made from optically transparent material at least at a portion of a top space without contacting the containers, and a filling and/or packaging plant using the measuring group. The measuring group comprises an inspection area; a laser source with optical axis for the emission of a laser beam at a wavelength tunable with an absorption wavelength of a gas contained in a container top space; at least one detector to detect the laser beam once it has travelled through the inspection area to provide an absorption spectrum of said gas; a device for detecting the signal acquisition time period corresponding to the passage of a top space through the inspection area; having means for identifying signal contributions useful for the pressure measurement amongst the data representative of an absorption spectrum acquired during the signal acquisition time period.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: February 25, 2020
    Assignee: FT SYSTEM S.R.L.
    Inventors: Fabio Forestelli, Massimo Fedel
  • Patent number: 10571405
    Abstract: A quality control station (2) for a sheet element processing machine, having at least one camera (6) arranged for capturing images of sheet elements (4) transported through the quality control station (2), and further having an illumination unit (5) with at least one light emitter (16) and two reflectors (12, 14), the illumination unit (5) directing light onto a viewing area of the camera (6) such that the illumination intensity is constant despite changing media thickness. An illumination unit for such quality control station is disclosed.
    Type: Grant
    Filed: May 17, 2017
    Date of Patent: February 25, 2020
    Assignee: BOBST MEX SA
    Inventors: Matthieu Richard, Francis Pilloud
  • Patent number: 10557943
    Abstract: Optical systems that may, for example, be used in light ranging and detection (LiDAR) applications, for example in systems that implement combining laser pulse transmission in LiDAR and that include dual transmit and receive systems. Receiver components of a dual receiver system in LiDAR applications may include a medium range (50 meters or less) receiver optical system with a medium entrance pupil and small F-number and with a medium to wide field of view. The optical system may utilize optical filters, scanning mirrors, and a nominal one-dimensional SPAD (or SPADs) to increase the probability of positive photon events.
    Type: Grant
    Filed: August 21, 2017
    Date of Patent: February 11, 2020
    Assignee: Apple Inc.
    Inventors: Robert S. Upton, Chandra S. Kakani, Alexander Shpunt, Yuval Gerson
  • Patent number: 10545099
    Abstract: Disclosed are apparatus and methods for detecting defects on a semiconductor sample. An optical inspector is first used to inspect a semiconductor sample with an aggressively predefined threshold selected to detect candidate defect and nuisance sites at corresponding locations across the sample. A high-resolution distributed probe inspector includes an array of miniature probes that are moved relative to the sample to scan and obtain a high-resolution image of each site to detect and separate the candidate defect sites from the nuisance sites. A higher-resolution probe is then used to obtain a higher-resolution image of each candidate site to obtain a high-resolution image of each site to separate real defects that adversely impact operation of any devices on the sample from the candidate defects.
    Type: Grant
    Filed: February 11, 2019
    Date of Patent: January 28, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Grace Chen, Lawrence Muray
  • Patent number: 10545098
    Abstract: A foreign substance inspection apparatus performs foreign substance detection processing of detecting a foreign substance present on a surface of a substrate. The apparatus includes a detector that includes a projector configured to project light onto the surface and an optical receiver configured to receive scattered light from the surface, a scanning mechanism configured to scan a position on the surface onto which the light is projected by the projector, and a controller configured to control the foreign substance detection processing so that detection of the foreign substance is performed on a detection region which is a region excluding, from the surface, an exclusion region where a step is present thereon, wherein the controller controls the projection by the projector so that light is not projected to the step.
    Type: Grant
    Filed: March 15, 2019
    Date of Patent: January 28, 2020
    Inventor: Kenichi Kobayashi
  • Patent number: 10539411
    Abstract: A sample shape measuring apparatus includes a light source unit, an illumination optical system, a detection optical system, a light detection element, and a processing apparatus. A scanning unit relatively moves a light spot and the sample. Illumination light applied to the sample is transmitted through the sample, and light transmitted through the sample is incident on the detection optical system. The light detection element receives light. The illumination optical system or the detection optical system includes an optical member. The processing apparatus obtains a quantity of light based on a received light, calculates at least one of a difference and a ratio between the quantity of light and a reference quantity of light, calculates an amount of tilt at a surface of the sample, and calculates a shape of the sample from the amount of tilt.
    Type: Grant
    Filed: May 8, 2019
    Date of Patent: January 21, 2020
    Inventors: Mayumi Odaira, Yoshimasa Suzuki
  • Patent number: 10533948
    Abstract: A carrier for use in single molecule detection is related. The carrier includes a substrate; a middle layer, on the substrate; and a metal layer, on the middle layer; wherein the substrate is a flexible substrate, the middle layer includes a base and a patterned bulge on the base, the patterned bulge includes a plurality of strip-shaped bulges, the metal layer is on the patterned bulge, the carrier further includes a carbon nanotube composite structure between the metal layer and the patterned bulge.
    Type: Grant
    Filed: August 31, 2018
    Date of Patent: January 14, 2020
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Ying-Cheng Wang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan
  • Patent number: 10534073
    Abstract: A method for characterizing an object using distance measurement includes: determining elevation profiles using distance measurement, and evaluating the determined elevation profiles for a characterization of the object, the characterization includes a position and/or at least one object-specific parameter of the object.
    Type: Grant
    Filed: February 15, 2018
    Date of Patent: January 14, 2020
    Assignee: Phenospex B. V.
    Inventors: Uladzimir Zhokhavets, Grégoire Martin Hummel, Stefan Schwartz