Patents Examined by Hoa Q. Pham
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Patent number: 12103456Abstract: A vehicle headlight aiming device is provided that includes, a device housing having an input drive gear, a screw chamber, an output screw having a screw shaft, a screw first end that is rotationally coupled at least indirectly with the input drive gear, and a screw second end. The device further including an indicator nut having a base with a nut indicator mark, a first leg and second leg extending from a base bottom portion, and an expandable threaded opening extending between a first threaded wall of the first leg and a second threaded wall of the second leg, the threaded walls selectively engageable with a threaded portion of the screw shaft, wherein the threaded opening is expandable to disengage the first threaded wall and the second threaded wall from the threaded portion to allow longitudinal movement of the indicator nut within the device housing without rotating the output screw.Type: GrantFiled: August 2, 2022Date of Patent: October 1, 2024Assignee: Asyst Technologies L.L.C.Inventors: Scott T. Fladhammer, Michael B. Grimm, Peter F. Schwichtenberg, Paul M. Sutenbach
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Patent number: 12099121Abstract: The present disclosure provides a method and an apparatus for trailer angle measurement, as well as a vehicle, applied in a vehicle including a tractor and a trailer. At least one LiDAR is provided on each of two sides of the tractor. The method includes: obtaining, an initial trailer model containing initial point cloud data; controlling the to emit laser light; controlling each of the LiDARs to receive a corresponding point cloud reflected by the surface of the trailer; and calculating a trailer angle based on the point cloud data and the initial point cloud data using a point cloud matching algorithm. With the embodiments of the present disclosure, fast and accurate measurement of a trailer angle can be achieved with a simple structure.Type: GrantFiled: June 9, 2021Date of Patent: September 24, 2024Assignee: Beijing Tusen Zhitu Technology Co., Ltd.Inventors: Yuhe Jin, Nan Wu, Yiming Li
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Patent number: 12100133Abstract: The purpose of the present invention is to provide an image evaluation device and method which can detect unknown defects and which can prevent misrecognition by a machine learning model. This image evaluation device, which uses a machine learning classifier to classify defect information in a defect image of an electronic device, is characterized by being provided with: an image storage unit which stores a defect image of an electronic device; a defect region storage unit which stores defect region information that is in the defect image; a classifier which classifies the defect information with machine learning; an image extraction unit which, in the course of the defect image classification processing, extracts image-of-interest information which the classifier will focus on; and an evaluation unit which compares the image-of-interest information and the defect region information to evaluate the classifiability of the defect image.Type: GrantFiled: October 11, 2019Date of Patent: September 24, 2024Assignee: Hitachi High-Tech CorporationInventors: Shuyang Dou, Yasutaka Toyoda, Fumihiro Bekku, Takefumi Kakinuma, Shinichi Shinoda
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Patent number: 12073584Abstract: A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a component. The monitoring platform is configured to monitor progression of the component throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the component.Type: GrantFiled: March 9, 2021Date of Patent: August 27, 2024Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, Vadim Pinskiy, Andrew Sundstrom, Aswin Raghav Nirmaleswaran, Eun-Sol Kim
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Patent number: 12066818Abstract: A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a component. The monitoring platform is configured to monitor progression of the component throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the component.Type: GrantFiled: June 18, 2021Date of Patent: August 20, 2024Assignee: Nanotronics Imaging, Inc.Inventors: Andrew Sundstrom, Eun-Sol Kim, Damas Limoge, Vadim Pinskiy, Matthew C. Putman
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Patent number: 12050176Abstract: An apparatus for estimating body water status includes a spectrometer having a light source configured to emit light onto an object, and a detector configured to measure a near-infrared (NIR) absorption spectrum by detecting light scattered or reflected from the object; and a processor configured to estimate an albumin concentration in the object based on the measured NIR absorption spectrum, and to estimate a body water index based on the estimated albumin concentration by using a body water index estimation model that represents a relationship between a change in the albumin concentration and a change in an amount of body water present in the object.Type: GrantFiled: July 29, 2022Date of Patent: July 30, 2024Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventor: June Young Lee
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Patent number: 12045975Abstract: A mask inspection method includes photographing a cell mask through which openings is formed to obtain an image, setting an area of the image adjacent to an edge of the cell mask as an inspection area, comparing a grayscale of the openings in the inspection area with a reference grayscale, and checking a defect of the cell mask according to a result of the comparing of the grayscale of the openings.Type: GrantFiled: June 29, 2021Date of Patent: July 23, 2024Assignee: SAMSUNG DISPLAY CO., LTD.Inventors: Ilha Song, Mihye Kwon, Jimin Woo, Sangdon Hwang
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Patent number: 12038442Abstract: The disclosure provides a sample testing method and a sample analyzer, the method including: providing a sample and a reagent, the reagent including at least two fluorescent dyes for staining particles in the sample, wherein an absolute value of a difference between wavelengths corresponding to peaks of emission spectra of the two fluorescent dyes is greater than 30 nanometers and less than 80 nanometers, and an overlap between the emission spectra of the two fluorescent dyes is not greater than 50%; mixing the sample and the reagent to form a sample solution; flowing the sample solution in a flow cell in a single test, irradiating the particles flowing in the flow cell using light with a single wavelength; detecting at least fluorescence signals generated by the particles; and obtaining a test result of the sample based on at least the fluorescence signals.Type: GrantFiled: September 20, 2021Date of Patent: July 16, 2024Assignee: Shenzhen Mindray Bio-Medical Electronics Co., Ltd.Inventors: Gengwen Chen, Ziqian Zhang
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Patent number: 12038379Abstract: A sanitary device for the urine glucose test includes a urine container formed on an inner wall of a main body, and a measuring module with an inner space mounted at a bottom of the urine container. Within the inner space, a lens attaches to the bottom of the urine container, a rail faces a bottom surface of the lens, and a driving module moves a light unit shooting a detection beam to a measuring surface of the lens along the rail. The measuring surface contacts urine in the urine container, and reflects the detection beam out of the bottom surface into a sensor. The sensor is electrically connected to a processor. The processor determines a urine glucose level and generates a urine glucose level data instantly from an angle of incidence of the detection beam on the measuring surface and from a beam intensity signal from the sensor.Type: GrantFiled: May 18, 2021Date of Patent: July 16, 2024Assignee: Taiwan RedEye Biomedical Inc.Inventors: Shuo-Ting Yan, Tsung-Jui Lin, Yu-Hsun Chen, Kuan-Wei Su
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Patent number: 12039750Abstract: A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a component. The monitoring platform is configured to monitor progression of the component throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the component.Type: GrantFiled: March 9, 2021Date of Patent: July 16, 2024Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, Vadim Pinskiy, Andrew Sundstrom, Aswin Raghav Nirmaleswaran, Eun-Sol Kim
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Patent number: 12031879Abstract: An aberration estimating method includes acquiring a light intensity distribution of an optical image of an object formed via a target optical system, acquiring an approximated aberration of the target optical system based on the light intensity distribution, determining an initial value of the aberration of the target optical system based on the approximated aberration, and estimating an aberration of the target optical system using the initial value.Type: GrantFiled: July 6, 2022Date of Patent: July 9, 2024Assignee: CANON KABUSHIKI KAISHAInventor: Akira Eguchi
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Patent number: 12026866Abstract: Provided are a method and an apparatus for rechecking a defective product. The method includes: a display terminal receives sent image information of at least one detection image corresponding to the defective product (S110). The image information includes: an ID of the at least one detection image, and defect information corresponding to the at least one detection image. The defect information includes: a defect type of a defect in the at least one detection image, and defect coordinates of the defect in the at least one detection image. The display terminal displays the at least one detection image that is pre-stored corresponding to the defective product and marks the defect information corresponding to the at least one detection image according to the image information (S120).Type: GrantFiled: December 29, 2020Date of Patent: July 2, 2024Assignees: BOE Hyundai LCD Inc., BOE Technology Group Co., Ltd.Inventors: Shunan Zhang, Haifeng Sheng, Xuedong Zhang, Hao Su
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Patent number: 12025982Abstract: An optical sensor for an aircraft includes two detectors, a light source, and a controller. The detectors are oriented along detector paths and have tilt angles and fields of view. The detectors are configured to detect light reflected from an illumination volume and to generate detector signals that correspond to intensities of detected light. The tilt angles are equal such that each detector is oriented in an opposite direction within a plane containing a light source path and the detector paths. The light source is oriented along the light source path and is configured to illuminate the illumination volume which overlaps with the fields of view within a predetermined distance range. The controller is configured to receive the detector signals, detect whether a cloud is present based upon the detector signals, determine a cloud phase, and calculate a density of the detected cloud.Type: GrantFiled: October 18, 2021Date of Patent: July 2, 2024Assignee: Rosemount Aerospace Inc.Inventors: Mark Ray, Kent Allan Ramthun, Kaare Josef Anderson
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Patent number: 12025559Abstract: Minimizing image sensor input/output pads in a pulsed laser mapping imaging system is disclosed. A system includes an emitter for emitting pulses of electromagnetic radiation and an image sensor comprising a pixel array for sensing reflected electromagnetic radiation. The system includes a plurality of bidirectional pads comprising an output state for issuing data and an input state for receiving data. The system includes a controller configured to synchronize timing of the emitter and the image sensor. The system is such that at least a portion of the pulses of electromagnetic radiation emitted by the emitter comprises a laser mapping pattern.Type: GrantFiled: May 6, 2021Date of Patent: July 2, 2024Assignee: Cilag GmbH InternationalInventors: Joshua D. Talbert, Donald M. Wichern
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Patent number: 12013337Abstract: An example apparatus for determining dryness of an agent on print media includes an infrared prism, a source of infrared radiation to direct infrared radiation into the infrared prism, and a detector. The infrared prism includes a surface, the surface having an outer side to contact a portion of the agent on the print media, the infrared prism having a refractive index that is higher than a refractive index of the agent. The source of infrared radiation is to direct infrared radiation into the infrared prism and onto an inner side of the surface. The detector is to generate a signal based on infrared radiation reflected by the inner side of the surface to indicate the dryness of the portion of the agent.Type: GrantFiled: March 30, 2018Date of Patent: June 18, 2024Assignee: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.Inventors: Noam Meyuhas, Guy Nesher, Eviatar Golan
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Patent number: 12013602Abstract: A method of detecting a defect in an electronic display includes taking a digital image of the electronic display; and electronically determining if an area of the electronic display is defective based on data of the digital image.Type: GrantFiled: December 22, 2021Date of Patent: June 18, 2024Assignee: COMMUNICATIONS TEST DESIGN, INC.Inventors: Zachary Pixley, Nidhin Davis, Mark Parsons
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Patent number: 12002196Abstract: A method for marking defects of products implemented in an electronic device is provided. The method includes obtaining at least one detection image of a product to be marked; recognizing a position and a type of at least one defect on the product according to the at least one detection image; transmit the position and the type of the at least one apparent defect to a robot arm; controlling the robot arm to mark the at least one defect on an adhesive film according to the position and the type of the at least one defect; and controlling a film coating unit to apply the adhesive film which is marked to the product.Type: GrantFiled: August 6, 2021Date of Patent: June 4, 2024Assignee: HON HAI PRECISION INDUSTRY CO., LTD.Inventor: Chih-Yuan Chuang
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Patent number: 12001516Abstract: A method for parameterizing an anomaly detection method, which takes a multiplicity of sensor data points as a basis for performing a density-based cluster method, including a) mapping each sensor data point in a data space into a pixel data point in a pixel space, b) reproducing at least one operation of the density-based cluster method in the data space by means of at least one pixel operation in the pixel space, c) receiving at least one parameter value for each parameter of the density-based cluster method, d) applying the at least one pixel operation in accordance with the parameter values to the pixel data points e) outputting a cluster result in visual form in the pixel space, and f) providing the received parameter values for the anomaly detection method, and an assistance apparatus for parameterizing an anomaly detection apparatus that performs the anomaly detection method.Type: GrantFiled: August 30, 2019Date of Patent: June 4, 2024Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Johannes Kehrer, Christoph Paulitsch, Stefan Hagen Weber
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Patent number: 11994461Abstract: An optical probe includes an optical window for transmitting light therethrough, an ultrasonic transducer for applying ultrasonic vibrations to the optical window for cleaning the optical window, and one or more light guides for transmitting light through the optical window to a measurement region and/or receiving light transmitted through the optical window from the measurement region. The ultrasonic transducer is coupled to the optical window via an elongate body adapted to transmit ultrasonic vibrations from the ultrasonic transducer to the window. The light guides communicate with the optical window adjacent the elongate body. An additional lens or light filter may be mounted adjacent the measurement window and/or the window itself may be adapted to incorporate a lens and/or light filter.Type: GrantFiled: January 23, 2020Date of Patent: May 28, 2024Assignee: Inov8 Systems LimitedInventors: Khalid Thabeth, Raymond Acheson
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Patent number: 11986242Abstract: The invention relates to a full-field OCT method for generating an imaging of an ocular fundus (31), in which short-coherent light (22) is emitted and split into an object beam path (25) and a reference beam path (24). The object beam path (25) is directed onto the ocular fundus (33). The reference beam path (24) and a portion of the object beam path (25) reflected by the ocular fundus (31) are directed onto an image sensor (32), such that an interference between the reference beam path (24) and the object beam path (25) occurs on the image sensor (32), wherein the reference beam path (24) impinges on the image sensor (32) at an angle deviating from the object beam path (25). Before impinging on the image sensor (32), the reference beam path (24) impinges on an optical correction element (27) in order to reduce a chromatic aberration within the reference beam path (24). Intensity information and phase information is determined from a capturing of the image sensor.Type: GrantFiled: January 23, 2019Date of Patent: May 21, 2024Assignee: Visotec GmbHInventors: Peter Koch, Gereon Hüttmann, Helge Sudkamp, Hendrik Spahr, Dierck Hillmann, Michael Münst