Patents Examined by Hoa Q. Pham
  • Patent number: 10732106
    Abstract: Apparatus and associated methods relate to a gas detection apparatus including a main optical element configured to: (1) direct a first portion of light emitted from a light generating element (after the first portion of light has interacted with a target medium) to a primary detector via a second optical element, and (2) direct a second portion of light emitted from the light generating element to a reference detector via a third optical element. In various examples, the main optical element may be a reflector such as a mirror. The light generating element may, for example, be a red, green, and blue (RGB) light emitting diode(s) (LED(s)). The optical train may, for example, have a single/unitary molded transparent acrylic construction and internal reflective surfaces. A gas detection apparatus may standardize the optical path used by the light generating element and the primary/reference detectors, advantageously providing for reliable operation.
    Type: Grant
    Filed: January 4, 2019
    Date of Patent: August 4, 2020
    Assignee: Honeywell International Inc.
    Inventor: Richard Gorny
  • Patent number: 10725390
    Abstract: An inspection substrate for inspecting a component, such as a liquid confinement system, of an apparatus for processing production substrates is discussed. The inspection substrate includes a body having dimensions similar to a production substrate so that the inspection substrate is compatible with the apparatus, an illumination device, such as light emitting diodes, embedded in the body, a sensor, such as an imaging device or a pressure sensor, that is embedded in the body and configured to generate inspection information, such as image data, relating to a parameter of the component of the apparatus proximate to the inspection substrate, and a storage device embedded in the body and configured to store the inspection information.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: July 28, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Seerwan Saeed, Petrus Martinus Gerardus Johannes Arts, Harold Sebastiaan Buddenberg, Erik Henricus Egidius Catharina Eummelen, Giovanni Luca Gattobigio, Floor Lodewijk Keukens, Ferdy Migchelbrink, Jeroen Arnoldus Leonardus Johannes Raaymakers, Arnoldus Johannes Martinus Jozeph Ras, Gheorghe Tanasa, Jimmy Matheus Wilhelmus Van De Winkel, Daan Daniel Johannes Antonius Van Sommeren, Marijn Wouters, Miao Yu
  • Patent number: 10718604
    Abstract: A diffraction measurement target that has at least a first sub-target and at least a second sub-target, and wherein (1) the first and second sub-targets each include a pair of periodic structures and the first sub-target has a different design than the second sub-target, the different design including the first sub-target periodic structures having a different pitch, feature width, space width, and/or segmentation than the second sub-target periodic structure or (2) the first and second sub-targets respectively include a first and second periodic structure in a first layer, and a third periodic structure is located at least partly underneath the first periodic structure in a second layer under the first layer and there being no periodic structure underneath the second periodic structure in the second layer, and a fourth periodic structure is located at least partly underneath the second periodic structure in a third layer under the second layer.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: July 21, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Kaustuve Bhattacharyya, Henricus Wilhelmus Maria Van Buel, Christophe David Fouquet, Hendrik Jan Hidde Smilde, Maurits Van Der Schaar, Arie Jeffrey Den Boef, Richard Johannes Franciscus Van Haren, Xing Lan Liu, Johannes Marcus Maria Beltman, Andreas Fuchs, Omer Abubaker Omer Adam, Michael Kubis, Martin Jacobus Johan Jak
  • Patent number: 10712286
    Abstract: In an example, a method for non-destructive evaluation of a structure is described. The method comprises identifying a portion of a surface of the structure for evaluation. The method further comprises controlling an armature to align a two-dimensional array of sensors with the portion of the surface. The method further comprises causing the two-dimensional array of sensors to engage the portion of the surface. The method further comprises, responsive to determining that the two-dimensional array of sensors has engaged with the portion of the surface, (i) releasing the two-dimensional array of sensors from the armature, and (ii) scanning, the portion of the surface to collect sensor data. The method further comprises, after scanning the portion of the surface, (i) controlling the armature to couple to the two-dimensional array of sensors, and (ii) causing the two-dimensional array of sensors to disengage with the portion of the surface.
    Type: Grant
    Filed: April 23, 2019
    Date of Patent: July 14, 2020
    Assignee: The Boeing Company
    Inventors: Barry A. Fetzer, Gary E. Georgeson
  • Patent number: 10713985
    Abstract: A method of inspecting light emitting elements includes disposing a first electrode and a second electrode on a substrate. A solution including a plurality of light emitting elements is applied on the first electrode and the second electrode. A first voltage is applied across the first electrode and the second electrode so as to cause the plurality of light emitting elements to emit light. The light emitted from the plurality of light emitting elements is photographed and first image data is generated therefrom. A density of the plurality of light emitting elements is determined using the first image data.
    Type: Grant
    Filed: July 25, 2018
    Date of Patent: July 14, 2020
    Assignee: SAMSUNG DISPLAY CO., LTD.
    Inventor: Sungbae Ju
  • Patent number: 10712265
    Abstract: A system for providing active real-time characterization of an article under test. A broadband infrared light source outputs a beam of infrared light. The infrared light source is configured to direct the beam of infrared light at a particular area on the article under test. A broadband IR light detector is configured to receive a first predetermined return beam of light from the particular area on the article under test. A processor receives signals from the broadband IR light detector and calculates in real time a spectrally sensitive signal. The processor analyzes the calculated signal to ensure that the article under test conforms to an expected value.
    Type: Grant
    Filed: February 22, 2018
    Date of Patent: July 14, 2020
    Assignee: THE BOEING COMPANY
    Inventor: Jeffrey H. Hunt
  • Patent number: 10684205
    Abstract: A method and an apparatus to improve the precision and reproducibility of particle size analysis by laser diffraction is presented. Powder particles are typically prepared for laser diffraction testing using an ultra-sound bath which will disperse particle agglomerates and allow a precise measurement. However, the precision and reproducibility of agglomerate dispersion is affected by ultra-sound probe wear, corrosion and age. Differences in sonication performance can be compensated by voltage adjustments to the ultra-sound probe, leading to substantial improvements in the precision and reproducibility of particle size determination.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: June 16, 2020
    Assignee: Hovione Technology Ltd
    Inventor: Leandro Martins
  • Patent number: 10684223
    Abstract: A device and a method for foam analysis. The device comprises a cylindrical sample container with a transparent wall, at least one illumination device and a camera, which. can be moved on a track. The curvature of the web runs parallel to the wall of the container. The illumination device directs a light beam onto the wall of the cylindrical sample container at an angle which deflects the light beam into the sample vessel when liquid is present on the inside of the sample container and causes a total reflection when air or another gas fills the foam pores. The camera and the illumination unit are moved along the path in the circumferential direction of the wall of the sample container such that a region to be examined is illuminated in steps or in a continuous progression and the camera records the totally reflected light in the region.
    Type: Grant
    Filed: March 27, 2019
    Date of Patent: June 16, 2020
    Assignee: SITA Messtechnik GmbH
    Inventors: Lars Schümann, Ralf Haberland
  • Patent number: 10677739
    Abstract: A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.
    Type: Grant
    Filed: October 31, 2017
    Date of Patent: June 9, 2020
    Assignee: Corning Incorporated
    Inventors: Uta-Barbara Goers, En Hong, Sung-chan Hwang, Ji Hwa Jung, Tae-ho Keem, Philip Robert LeBlanc, Rajeshkannan Palanisamy, Sung-jong Pyo, Correy Robert Ustanik
  • Patent number: 10670524
    Abstract: Systems and methods for increasing the accuracy of a turbidity sensor are disclosed. The systems include a turbidity sensor and a flow module with a specialized flow path, with the turbidity sensor engaging with the flow module such that a measurement zone of the turbidity sensor is disposed within a flow path of the flow module and a bypass path of the flow module does not pass through the measurement zone. The methods include flowing a fluid containing bubbles into a system that separates the fluid in the flow module into a first stream of fluid containing relatively more bubbles and a second stream of fluid containing relatively fewer bubbles, the first stream flowing through a bypass path that does not pass through the measurement zone, and the second stream flowing through the measurement zone of the turbidity sensor.
    Type: Grant
    Filed: June 17, 2019
    Date of Patent: June 2, 2020
    Assignee: FloDesign Sonics, Inc.
    Inventors: Jason Barnes, Dane Mealey, Jeffrey King
  • Patent number: 10670516
    Abstract: Provided is an optical concentration sensor protective casing, including an outer cover and a bubble isolation shield. The bubble isolation shield is embedded on the inner side of the outer cover. The outer cover is provided with a convection hole. The bubble isolation shield is provided with a liquid intake hole. Further provided is an optical concentration testing device including the protective casing.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: June 2, 2020
    Assignee: DONGGUAN ZHENGYANG ELECTRONIC MECHANICAL CO., LTD.
    Inventor: Yi-Hsin Ku
  • Patent number: 10670494
    Abstract: Some demonstrative embodiments include apparatuses, systems and/or methods of determining one or more optical parameters of a lens of eyeglasses. For example, a product may include one or more tangible computer-readable non-transitory storage media including computer-executable instructions operable to, when executed by at least one computer processor, enable the at least one computer processor to process at least one captured image of at least one reflection of a flash on a lens of eyeglasses; and determine one or more optical parameters of the lens based at least on the at least one captured image.
    Type: Grant
    Filed: January 23, 2017
    Date of Patent: June 2, 2020
    Assignee: 6 OVER 6 VISION LTD.
    Inventors: Ofer Limon, Shahar Levy, Alexander Zlotnik, Maya Aviv
  • Patent number: 10670537
    Abstract: A inspection system includes an illumination source to generate an illumination beam, focusing elements to direct the illumination beam to a sample, a detector, collection elements configured to direct radiation emanating from the sample to the detector, a detection mode control device to image the sample in two or more detection modes such that the detector generates two or more collection signals based on the two or more detection modes, and a controller. Radiation emanating from the sample includes at least radiation specularly reflected by the sample and radiation scattered by the sample. The controller determines defect scattering characteristics associated with radiation scattered by defects on the sample based on the two or more collection signals. The controller also classifies the one or more particles according to a set of predetermined defect classifications based on the one or more defect scattering characteristics.
    Type: Grant
    Filed: March 18, 2019
    Date of Patent: June 2, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Guoheng Zhao, J. K. Leong, Michael Kirk
  • Patent number: 10670495
    Abstract: A method for assessing the similarity between a power profile of a manufactured optic device and a nominal power profile upon which the power profile of the manufactured optic device is based. The method comprises measuring the power profile of manufactured optic device, identifying a region of interest from the measured power profile of manufactured optic device, and applying an offset to the measured power profile to substantially minimize a statistical quantifier for quantifying the similarity between the nominal power profile and the offset measured power profile. The method further comprises comparing the offset and the statistical quantifier to predefined quality control metrics, determining whether the measured power profile meets the predefined quality control metrics based, at least in part on the comparison.
    Type: Grant
    Filed: June 3, 2019
    Date of Patent: June 2, 2020
    Assignee: Brien Holden Vision Institute Limited
    Inventors: Fabian Conrad, Ravi Chandra Bakaraju, Klaus Ehrmann
  • Patent number: 10670538
    Abstract: A probe driver may include a coupling that interfaces with a conduit section at a first position of the conduit section. A probe driver may also have one or more positioning elements to reposition the conduit section to interface with the coupling at a second position of conduit section in response to one or more commands based on a recorded inspection, where through completing the one or more commands is configured to initiate a second inspection identical to the recorded inspection.
    Type: Grant
    Filed: April 30, 2018
    Date of Patent: June 2, 2020
    Assignee: General Electric Company
    Inventor: Bryan Christopher Morris
  • Patent number: 10663398
    Abstract: A system for determining the characteristics of a gas is described, comprising at least one beam of coherent and monochromatic light, detecting means of scattered light comprising at least one photo-detector, at least one measuring chamber within which the beam and the detecting means are operating, and control means operatively connected to the photo-detector for recording an amount of scattered light according to the Rayleigh scattering principle depending on the physical characteristics of the gas molecule and on a wavelength of the coherent and monochromatic light, the beam of coherent and monochromatic light being emitted by at least one laser with continuous wave. A method for measuring the characteristics of a gas through such system is further described.
    Type: Grant
    Filed: December 16, 2016
    Date of Patent: May 26, 2020
    Assignee: INRIM
    Inventor: Marco Pisani
  • Patent number: 10656070
    Abstract: A technique is presented for aligning, in a desired region within a flow chamber of a flow cell, a non-spherical biological entity carried in a sample. The flow chamber has a rectangular cross-section. A bottom flow input module, a top flow input module and a sample input module provide a viscoelastic first fluid, a second viscoelastic fluid, and the sample, respectively, to the flow chamber. The first and the second viscoelastic fluids laminarly flow along a bottom and a top wall of the flow chamber and the sample laminarly flows sandwiched between them. By controlling rate of flow of the first and/or the second viscoelastic fluids the sample flow, and thus the non-spherical biological entity, is focused in the desired region. A gradient of sheer within the sample flow set up due to the first and second viscoelastic fluids orients the non-spherical biological entity in the desired region.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: May 19, 2020
    Assignee: Siemens Healthcare GmbH
    Inventors: Oliver Hayden, Lukas Richter, Matthias Ugele
  • Patent number: 10648907
    Abstract: An optical system and method for quantifying total protein in whole blood or other multi-phase liquids and colloidal suspensions uses refractometry without preliminary steps such as cell separation or centrifugation. A refractometer is integrated with a flow cell to enable the refractive index of a flowing sample to be measured based on a substantially cell free boundary layer of the sample that is present under certain flow conditions. Dimensions of the flow cell are selected to produce a cell-free layer in a flow of whole blood in which the cell free layer is thick enough to reduce scattering of light from the refractometer light source. A numerical method is used to compensate for scattering artifacts. The numerical compensation method is based on the slope and width of a peak in the derivative curve of an angular spectrum image of the flowing sample produced by refractometry.
    Type: Grant
    Filed: May 3, 2019
    Date of Patent: May 12, 2020
    Assignee: Instrumentation Laboratory Company
    Inventors: Ethan Schonbrun, Lara Adib, Gert Blankenstein
  • Patent number: 10648898
    Abstract: Flow cytometer systems are provided having intermediate angle scatter detection capability. In some aspects, systems are provided that include an intermediate angle scatter (IAS) light detector positioned to measure intermediate angle scatter emitted from a flow cytometer. The system further includes a mask disposed across a portion of the IAS light detector and positioned between the flow cell and the IAS light detector to cover at least a central portion of the IAS light detector so as to block a diffraction pattern observed at the detector. In some instances, the diffraction pattern is created by a flat beam profile irradiating the sample. Methods are also provided for configuring a flow cytometer to block a diffraction pattern created by (1) a flat laser beam profile irradiating a flow cytometer liquid sample, or (2) a mismatched index of refraction between a sheath fluid and a liquid sample in a flow cytometer.
    Type: Grant
    Filed: December 13, 2018
    Date of Patent: May 12, 2020
    Assignee: Abbott Laboratories
    Inventor: Mahesh R. Junnarkar
  • Patent number: 10642169
    Abstract: An alignment system is equipped with: an alignment system having an objective optical system, an irradiation system and a beam receiving system; and a calculation system, the objective optical system including an objective transparent plate that faces a wafer movable in a Y-axis direction, the irradiation system irradiating a grating mark provided at the wafer with measurement beams via the objective transparent plate while scanning the measurement beams in the Y-axis direction, the beam receiving system receiving diffraction beams from the grating mark of the measurement beams via the objective optical system, and the calculation system obtaining positional information of the grating mark on the basis of the output of the beam receiving system, wherein the objective transparent plate deflects or diffracts the diffraction beams diffracted at the grating mark toward the beam receiving system.
    Type: Grant
    Filed: May 31, 2019
    Date of Patent: May 5, 2020
    Assignee: NIKON CORPORATION
    Inventor: Akihiro Ueda