Patents Examined by Hoa Q. Pham
  • Patent number: 11867603
    Abstract: A mold sensor is configured with an enclosed chamber in which a nutrient-treated substrate is positioned. The mold sensor includes an optical sensor that is configured to measure optical properties in the enclosed chamber. A controller operates the optical sensor and is programmed to detect a presence of mold growing in the chamber based on the optical properties measured by the optical sensor.
    Type: Grant
    Filed: December 12, 2019
    Date of Patent: January 9, 2024
    Assignee: Robert Bosch GmbH
    Inventors: Seow Yuen Yee, Franz Laermer, Christian Peters, Oliver Peters, Robert Duerichen, Ning Wang, Thomas Rocznik
  • Patent number: 11867818
    Abstract: A method for performing a simultaneous location and mapping of a scanner device includes detecting a set of lines in a point cloud, and identifying a semantic feature based on the set of lines. The method further includes assigning a first scan position of the scanner device in the surrounding environment at the present time t1 as a landmark, and linking the landmark with the portion of the map. The method further includes determining that the scanner device has moved, at time t2, to the scan position that was marked as the landmark based on identifying said semantic feature in another scan-data. In response, a second scan position at time t2 is determined. Also, a displacement vector is determined for the map based on a difference between the first scan position and the second scan position. Subsequently, a revised second scan position is computed based on the displacement vector.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: January 9, 2024
    Assignee: FARO Technologies, Inc.
    Inventors: Mark Brenner, Aleksej Frank, Ahmad Ramadneh, Oliver Zweigle
  • Patent number: 11860084
    Abstract: The present invention relates to an analytical method that includes providing a sample potentially containing a chiral analyte that can exist in stereoisomeric forms, and providing a probe selected from the group consisting of metal salts. The sample is contacted with the probe under conditions that permit coordination of the probe to the analyte, if present in the sample; and, based on any coordination that occurs, the absolute configuration of the analyte in the sample, and/or the concentration of the analyte in the sample, and/or the enantiomeric composition of the analyte in the sample is/are determined.
    Type: Grant
    Filed: September 11, 2019
    Date of Patent: January 2, 2024
    Assignee: GEORGETOWN UNIVERSITY
    Inventors: Christian Wolf, Zeus A. O. De Los Santos, Ciaran Lynch
  • Patent number: 11852593
    Abstract: In an embodiment, a system includes: a broadband light source; a wafer with a first side facing the broadband light source; a first light sensor configured to detect reflected light from the broadband light source emanating from the first side; a second light sensor configured to detect emergent light emanating from a second side of the wafer opposite the first side, wherein the emergent light originates from the broadband light source; and a detector module configured to analyze the reflected light and the emergent light to identify wafer defects.
    Type: Grant
    Filed: July 8, 2021
    Date of Patent: December 26, 2023
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Nai-Han Cheng, Hsing-Piao Hsu
  • Patent number: 11852524
    Abstract: An optical measurement apparatus having an improved light intensity detection performance is provided. The optical measurement apparatus includes a light receiving element capable of converting a light intensity of light to be analyzed into an electrical signal; an input terminal to which the electrical signal is input; a first amplifier and a nonlinear element configuring a logarithmic amplifier; offset resistors; a switch unit; and a controller. An inverting input terminal of the first amplifier is electrically connected to the input terminal. The offset resistors have different resistance values. The switch unit can switch an offset resistor electrically connected between the voltage source and the input terminal, of the offset resistors. An offset current is input to the input terminal by the offset resistor electrically connected between the voltage source and the input terminal. The controller measures the light intensity based on an output voltage value of the first amplifier.
    Type: Grant
    Filed: December 14, 2021
    Date of Patent: December 26, 2023
    Assignees: YOKOGAWA ELECTRIC CORPORATION, Yokogawa Test & Measurement Corporation
    Inventor: Atsushi Horiguchi
  • Patent number: 11835447
    Abstract: A method for measuring a characteristic of a thin film is disclosed. The method includes a) obtaining a measured spectrum from a target region on the substrate by using a spectroscopic ellipsometer, b) obtaining a physical model capable of obtaining an estimated parameter value related to the characteristic of the thin film through regression analysis of the measured spectrum, c) obtaining a machine learning model capable of obtaining a reference parameter value related to the characteristic of the thin film by using the measured spectrum, and d) obtaining an integrated model which uses an integrated error function capable of considering both of a first error function and a second error function, and obtaining an optimum parameter value through regression analysis of the integrated model.
    Type: Grant
    Filed: August 8, 2023
    Date of Patent: December 5, 2023
    Assignee: AUROS TECHNOLOGY, INC.
    Inventor: Tae Dong Kang
  • Patent number: 11832550
    Abstract: An agricultural nutrient applicator includes a container and a nutrient distribution assembly operably coupled to the container to deliver a nutrient from the container. A spectroscopic reflectance crop sense system is provided that includes an optical window. A presentation assembly is mounted to the agricultural nutrient applicator and is configured to position live plants in a field proximate the optical window of the spectroscopic reflectance crop sense system as the agricultural nutrient applicator moves. A controller is coupled to the spectroscopic reflectance crop sense system and the nutrient distribution assembly. The controller is configured to obtain, from the spectroscopic reflectance crop sense system, information indicative of a measured nutrient level in the live plants and determine a remedial nutrient amount based on the measured nutrient level and a target nutrient level. The controller controls the nutrient distribution assembly based on the remedial amount.
    Type: Grant
    Filed: November 3, 2020
    Date of Patent: December 5, 2023
    Assignee: Deere & Company
    Inventors: Kevin J. Goering, Yancy E. Wright
  • Patent number: 11828852
    Abstract: A method for performing a simultaneous location and mapping of a scanner device includes detecting a set of lines in a point cloud, and identifying a semantic feature based on the set of lines. The method further includes assigning a first scan position of the scanner device in the surrounding environment at the present time t1 as a landmark, and linking the landmark with the portion of the map. The method further includes determining that the scanner device has moved, at time t2, to the scan position that was marked as the landmark based on identifying said semantic feature in another scan-data. In response, a second scan position at time t2 is determined. Also, a displacement vector is determined for the map based on a difference between the first scan position and the second scan position. Subsequently, a revised second scan position is computed based on the displacement vector.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: November 28, 2023
    Assignee: FARO Technologies, Inc.
    Inventors: Mark Brenner, Aleksej Frank, Ahmad Ramadneh, Oliver Zweigle
  • Patent number: 11808686
    Abstract: This invention relates to the field of microfluidic flow cytometry and more generally microfluidic techniques for analysis of particulate-containing fluids. It deals with the improvements to such technologies in order to identify subsets of particles or sub-populations of cells that differ in their properties, and, if necessary, separate the said identified sub-populations of cells, e.g. sex of semen cells, alive cells from the dead ones, cancerous cells from the healthy ones, subsets of viruses, bacteria or subsets of particles. This invention disclosure deals with the apparatus and the method for detection of cells or particles based on measurements of complex AC impedance between electrodes across the flow of fluid containing such cells or particles.
    Type: Grant
    Filed: June 25, 2018
    Date of Patent: November 7, 2023
    Assignee: Cellix Limited
    Inventors: Dmitry Kashanin, Igor Shvets
  • Patent number: 11808628
    Abstract: A sunlight exposure indicator device is disclosed that can determine the amount of time (e.g., hours) of PAR sunlight that occurs in a specific area for the optimal growth of a plant, as corresponds to the plant industry common designations of Full Shade, Partial Shade, Partial Sun and Full Sun. These designations can be used to determine plant selection for all types of plants including grasses, shrubs, flowers, vegetables and herbs, and trees. This device utilizes irreversible, slow-reacting, photochromic pigments applied to a substrate. Using multiple instances of this device will allow someone to easily test and accurately determine the amount of PAR sunlight (hours) received during a one-day sunlight cycle in multiple spots simultaneously. The sunlight exposure indicator device is a one-time-use, non-electronic, disposable device.
    Type: Grant
    Filed: November 8, 2022
    Date of Patent: November 7, 2023
    Inventor: Catherine M. Floam
  • Patent number: 11810284
    Abstract: To find repeater defects, optical-inspection results for one or more semiconductor wafers are obtained. Based on the optical-inspection results, a plurality of defects on the one or more semiconductor wafers is identified. Defects, of the plurality of defects, that have identical die locations on multiple die of the one or more semiconductor wafers are classified as repeater defects. Based on the optical-inspection results, unsupervised machine learning is used to cluster the repeater defects into a plurality of clusters. The repeater defects are scored. Scoring the repeater defects includes assigning respective scores to respective repeater defects based on degrees to which clusters in the plurality of clusters include multiple instances of the respective repeater defects. The repeater defects are ranked based on the respective scores.
    Type: Grant
    Filed: February 24, 2021
    Date of Patent: November 7, 2023
    Assignee: KLA Corporation
    Inventors: Jheng Sian Lin, Boon Kiat Tay
  • Patent number: 11802791
    Abstract: A method of optical device metrology is provided. The method includes providing a first type of light into a first optical device during a first time period; measuring a quantity of the first type of light transmitted from a first location on the top surface or the bottom surface during the first time period; coating at least a portion of an edge of the one or more edges with a first coating of optically absorbent material during a second time period that occurs after the first time period; providing the first type of light into the first optical device during a third time period that occurs after the second time period; and measuring a quantity of the first type of light transmitted from the first location on the top surface or the bottom surface during the third time period.
    Type: Grant
    Filed: November 24, 2021
    Date of Patent: October 31, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Jinxin Fu, Kazuya Daito, Ludovic Godet
  • Patent number: 11796440
    Abstract: Embodiments of a continuous dust accumulation monitoring system comprise an enclosure adapted for use in electrical hazardous locations, a sample area for collecting ambient dust, a dust accumulation sensor assembly installed in the enclosure configured to generate a signal based on the amount of ambient dust collected on the sample area and a circuit board within the enclosure configured to receive the signal from the dust accumulation sensor assembly. The continuous dust accumulation monitoring system may be connected to system control hardware.
    Type: Grant
    Filed: March 9, 2022
    Date of Patent: October 24, 2023
    Assignee: Industrial Intelligence, Inc.
    Inventors: George T. Armbruster, Jr., Bruce Ferris, Shane Diller, Slava Orlov
  • Patent number: 11796479
    Abstract: A material characterization system and method for characterizing a stream of material emanating from a material identification, exploration, extraction or processing activity, the system including a source of incident radiation configured to irradiate the stream of material in an irradiation region, one or more detectors adapted to detect radiation emanating from within or passing through the stream of material as a result of the irradiation by the incident radiation and thereby produce a detection signal, and one or more digital processors configured to process the detection signal to characterise the stream of material, wherein the source of incident radiation and the one or more detectors are adapted to be disposed relative to the stream of material so as to irradiate the stream of material and detect the radiation emanating from within or passing through the stream as the stream passes through the irradiation region.
    Type: Grant
    Filed: March 11, 2021
    Date of Patent: October 24, 2023
    Assignee: Southern Innovation International Pty Ltd
    Inventors: Paul Scoullar, Christopher McLean, Shane Michael Tonissen, Syed Khusro Saleem
  • Patent number: 11796441
    Abstract: A method for inspecting a pillar-shaped honeycomb structure including the steps of: imaging a pattern of transmitted light from the second end face according to arrangement of the plugged portions of first cells and second cells, with a camera via a light diffusing film placed parallel to a second end face of the pillar-shaped honeycomb structure in a non-contact state with the second end face, which pattern is obtained by irradiating a first end face with light; and detecting a defective plugged portion(s) of the second cells based on an image of the pattern of transmitted light imaged with the camera.
    Type: Grant
    Filed: December 21, 2020
    Date of Patent: October 24, 2023
    Assignee: NGK INSULATORS, LTD.
    Inventors: Ryota Kurahashi, Yoshihiro Sato, Takafumi Terahai
  • Patent number: 11788928
    Abstract: A light intensity distribution measurement apparatus is presented that is capable of accurately measuring the intensity of light in each mode at each position of an optical fiber through which light is propagated in a plurality of modes.
    Type: Grant
    Filed: July 11, 2019
    Date of Patent: October 17, 2023
    Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATION
    Inventors: Tomokazu Oda, Yoshifumi Wakisaka, Daisuke Iida, Hiroyuki Oshida
  • Patent number: 11781966
    Abstract: The present invention discloses a three-dimensional diffraction tomography microscopy imaging method based on LED array coded illumination. Firstly, acquiring the raw intensity images, three sets of intensity image stacks are acquired at different out-of-focus positions by moving the stage or using electrically tunable lens. And then, after acquiring the intensity image stacks of the object to be measured at different out-of-focus positions, the three-dimensional phase transfer function of the microscopy imaging system with arbitrary shape illumination is derived. Further, the three-dimensional phase transfer function of the microscopic system under circular and annular illumination with different coherence coefficients is obtained as well, and the three-dimensional quantitative refractive index is reconstructed by inverse Fourier transform of the three-dimensional scattering potential function. The scattering potential function is converted into the refractive index distribution.
    Type: Grant
    Filed: July 5, 2019
    Date of Patent: October 10, 2023
    Assignee: NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
    Inventors: Chao Zuo, Qian Chen, Jiaji Li, Jiasong Sun, Yao Fan, Shijie Feng, Yuzhen Zhang
  • Patent number: 11781099
    Abstract: A number analyzing method, a number analyzing device, and a storage medium for number analysis are disclosed, which enable, with high accuracy, analysis of the number or number distribution of particulate or molecular analytes according to the kinds of the analytes. A computer control program is executed on the basis of a data group of particle-passage detection signals which are detected by a nanopore device in accordance with passage of subject particles through a through-hole. Also, a particle type distribution estimating program is executed, to estimate probability density on the basis of a data group based on feature values indicating feature of the waveforms of pulse signals which correspond to the passage of particles and which are obtained as the particle-passage detection signals. Thus, the number of particles can be derived for each particle type.
    Type: Grant
    Filed: January 19, 2023
    Date of Patent: October 10, 2023
    Assignee: AIPORE INC.
    Inventors: Takashi Washio, Tomoji Kawai, Masateru Taniguchi, Makusu Tsutsui, Kazumichi Yokota, Akira Ishi, Takeshi Yoshida
  • Patent number: 11774735
    Abstract: A system and method for automated analysis of a filter obtained from an air quality monitoring apparatus used for sampling airborne respirable particles such as asbestos fibres, synthetic mineral fibres, pollen or mould particles is described. The system comprises capturing images at a plurality of sample locations. At least one magnified phase contrast image is obtained at each sample location. An automated quality assessment is then performed using a computer vision method to assess one or more quality criteria. Failure may lead to the sample location being ignored for subsequent analysis, or the whole filter slide may be rejected if the overall quality is poor. The quality assessment may performed be in two stages comprising an overall filter quality assessment performed on a series of low power/magnification images captured over the filter and a field of view or graticule level quality assessment performed on high power/magnification images captured at individual sample locations on the filter.
    Type: Grant
    Filed: April 24, 2019
    Date of Patent: October 3, 2023
    Inventors: Jordan Gallagher-Gruber, Gabor Szijårtó
  • Patent number: 11774359
    Abstract: The present disclosure concerns a smoke detector (1) including: a detection chamber, a baffle system surrounding the chamber enabling to isolate the chamber from outer light and enabling air to flow from the outside to the inside of the chamber, and a mechanical actuator capable of cleaning, in case of an obstruction, intervals between the elements.
    Type: Grant
    Filed: September 28, 2020
    Date of Patent: October 3, 2023
    Assignee: Commissariat à l'Energie Atomique et aux Energies Alternatives
    Inventor: Roland Pelisson