Abstract: The invention generally relates to systems and methods for mass spectrometry analysis of samples. In certain embodiments, the invention provides a mass spectrometry probe including at least one porous material connected to a high voltage source, in which the porous material is discrete from a flow of solvent.

Abstract: It is arranged so that living tissue that has not been pretreated can be adopted as a sample of interest. A sample is introduced into at least a tip portion of a hollow insulated sample holder 11 having a small hole 11a in the tip portion. A slender metal wire 12, which has been inserted into the sample holder 11 from the rear, is projected outwardly from the sample holder 11 through the hole 11a while being brought into contact with the sample. A high voltage is applied to the slender metal wire 12 at least in a portion of a time period in which the tip of the slender metal wire 12 is being projected outwardly from the hole 11a, thereby ionizing, by electrospray, the sample adhering to the tip of the slender metal wire 12. The ions are introduced into an analyzing apparatus and are analyzed.

Abstract: A multi-element electrostatic chicane energy filter, with the addition of electrostatic quadrupole and hexapole excitations to the dipole elements. A charged particle energy filter according to the present invention with a combination of dipole, quadrupole, and hexapole elements capable of producing a line focus at an aperture reduces space-charge effects and aperture damage. A preferred embodiment allows the filter to act as a conjugate blanking system. The energy filter is capable of narrowing the energy spread to result in a smaller beam.

Abstract: An ion beam apparatus includes an ion source configured to emit an ion beam, a condenser lens electrode that condenses the ion beam, and a condenser lens power source configured to apply a voltage to the condenser lens electrode. A storage portion stores a first voltage value, a second voltage value, a third voltage value, and a fourth voltage value. A control portion retrieves the third voltage value from the storage portion and sets the retrieved third voltage value to the condenser lens power source when an observation mode is switched to a wide-range observation mode, and retrieves the fourth voltage value from the storage portion and sets the retrieved fourth voltage value to the condenser lens power source when a processing mode is switched to the wide-range observation mode.

Abstract: Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample.

Abstract: A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.

Abstract: A tandem mass spectrometer is provided in the present invention. The mass spectrometer includes an ion source, a quadrupole mass filter located at downstream side of the ion source, a linear ion trap disposed at downstream side of the mass filter and an ion detector placed on the side of the ion trap, all of which are placed in a vacuum environment. The instrument can obtain MS meeting the standard spectral library search criteria by the quadrupole mass filter cooperating with linear ion trap, realize any multi-stage MS under two modes of axial collision and resonance excitation, and predict and optimize the inflow amount and types of samples under the ion trap analysis mode by the quadrupole. A tandem MS analysis method is also provided, which can repeatedly provide precursor ion selection, ion acceleration, achieve high-energy collision dissociation, low product ion mass discrimination effect.

Abstract: A particle beam irradiation apparatus according to the present invention is provided with a vacuum duct that forms a vacuum region through which the charged particle beam passes, a vacuum window through which the charged particle beam is launched from the vacuum region, a scanning electromagnet that scans the charged particle beam; a monitoring apparatus including a position monitor that detects the passing position of a charged particle beam and the beam size thereof, a low-scattering gas filling chamber including the monitoring apparatus, and an irradiation management apparatus that controls irradiation of the charged particle beam; the particle beam irradiation apparatus is characterized in that the low-scattering gas filling chamber is changeably disposed in such a manner that the beam-axis-direction positional relationship between the monitoring apparatus and the vacuum window is a desired one and in that the low-scattering gas filling chamber is filled with a low-scattering gas.

Abstract: An electro-optical inspection apparatus is provided that is capable of preventing adhesion of dust or particles to the sample surface as much as possible. A stage (100) on which a sample (200) is placed is disposed inside a vacuum chamber (112) that can be evacuated to vacuum, and a dust collecting electrode (122) is disposed to surround a periphery of the sample (200). The dust collecting electrode (122) is applied with a voltage having the same polarity as a voltage applied to the sample (200) and an absolute value that is the same or larger than an absolute value of the voltage. Thus, because dust or particles such as particles adhere to the dust collecting electrode (122), adhesion of the dust or particles to the sample surface can be reduced. Instead of using the dust collecting electrode, it is possible to form a recess on a wall of the vacuum chamber containing the stage, or to dispose on the wall a metal plate having a mesh structure to which a predetermined voltage is applied.

Abstract: The invention relates to a charged particle optical system comprising a beamlet generator for generating a plurality of charged particle beamlets, an electrostatic deflection system for deflecting the beamlets, and a projection lens system for directing the beamlets from the beamlet generator towards the target. The electrostatic deflection system comprises a first electrostatic deflector and a second electrostatic deflector for scanning charged particle beamlets over the target. The second electrostatic deflector is located behind the first electrostatic deflector so that, during operation of the system, a beamlet generated by the beamlet generator passes both of the electrostatic deflectors. During operation of the first and second electrostatic deflectors the system is adapted to apply voltages on the first electrostatic deflector and the second electrostatic deflector of opposite sign.

Abstract: A method includes providing a capability to control divergence of a coherent light beam having an axially symmetrical distribution of intensity thereof through an optical divergence controller, and directing an output of the optical divergence controller related to the controlled divergence of the coherent light beam onto a glass prism. The glass prism includes a planar shape onto which a pyramidal structure is formed. The method also includes controlling a distance between maxima of an output light field of the glass prism and intensity thereof through controlling the divergence of the coherent light beam through the optical divergence controller and/or varying a distance between the optical divergence controller and the glass prism, and utilizing the output light field of the glass prism in controlling microparticles in a microtechnology or a nanotechnology application.

Abstract: A mass spectrometer (MS) that is adapted to allow rapid gas-phase hydrogen/deuterium exchange (HDX) labeling of ions in one or more traveling wave ion guides (TWIGs) with or without ion mobility separation. The addition of isotopic labeling by gas-phase HDX offers a sensitive alternative dimension for conformational detection, which enables high resolution detection of gaseous conformations based on shape and surface reactivity. Gas-phase, isotopic HDX labeling or “curtain” labeling, can be performed by infusing a reactive, isotopic labeling gas, e.g., ND3, into one or more of the traveling-ion wave guides (TWIG) in the MS. Analyte ions retained in the potential wells of a traveling wave generated by one or more of the TWIGs can be isotopic labeled at adjustable gas pressures. Labeling times can also be controlled by adjusting the speed of the traveling wave and can be performed within milliseconds of ionizations, probing protein conformations present in solution.

Abstract: A machine includes a conveyor configured to receive and convey a circuit assembly treated with a UV curable coating material; a UV zone that includes one or more LED-based UV radiation sources; a heating zone; and a controller configured to control heating of a circuit assembly treated with a UV curable coating material in the heating zone to achieve a target temperature of the treated electronic assembly prior to the UV zone. Various other apparatuses, systems, methods, etc., are also disclosed.

Abstract: It is an object to balance suppression of a leakage magnetic field and driving performance. In a linear motor including a stator including a first yoke having an open face and two rows of permanent magnets linearly arrayed inside the first yoke so that S-poles and N-poles are alternate and a movable element arranged between the two rows of permanent magnets and linearly moving, a second yoke is connected to an open end of the first yoke so as to cover the open end of the first yoke and the permanent magnets when viewed from the open face of the first yoke.

Abstract: A multi charged particle beam writing apparatus of the present invention includes an aperture member to form multiple beams, a plurality of first deflectors to respectively perform blanking deflection of a corresponding beam, a second deflector to collectively deflect the multiple beams having passed through the plurality of openings of the aperture member so that the multiple beams do not reach the target object, a blanking aperture member to block each beam that has been deflected to be in the off state by the plurality of first deflectors, and a current detector, arranged at the blanking aperture member, to detect a current value of all beams in the on state in the multiple beams that have been deflected by the second deflector.

Abstract: A method of mass spectrometry is disclosed comprising passing ions through an ion mobility spectrometer and acquiring first ion mobility drift time data. A calibration function is applied to the first ion mobility drift time data to determine a physico-chemical property (e.g. CCS) of the ions. Second ion mobility drift time data is then acquired and the calibration function is applied to the second ion mobility drift time data to determine the physico-chemical property of one or more known or reference ions. The calibration function is then adjusted.

Abstract: An entangled photon pair source including: a quantum emitter having a ground state, two degenerate states that have one elementary excitation and different spins, and a state having two elementary excitations; a first optical cavity, wherein the quantum emitter is inserted; and a second optical cavity coupled with the first cavity. The geometry of the first and second cavities, and force of coupling thereof, are selected such that the whole formed by both coupled cavities has a first pair of polarization-degenerate modes, that are resonant with transitions between the state having two elementary excitations and the two degenerate states having one elementary excitation from the quantum emitter, and a second pair of polarization-degenerate modes that are resonant with transitions between the degenerate states, having one elementary excitation, and the ground state.

Abstract: A system for performing airport security screening of carry-on bags and other separately scanned carry-on items such as electronics. The system includes a number of airport divestment and luggage carts. Each of the carts includes a frame with a lower support for receiving carry-on luggage, and the frame further supports security bins for receiving separately scannable items (such as a computing device). The system includes a 3D scanner scanning items passed through a scanning tunnel. The system also includes a conveyance system engaging the carts and transporting the carts through the scanning tunnel for 3D scanning, with such scanning including the carry-on luggage and the separately scannable items in bins. Typically, the frame of each of the carts is formed of one or more non-metallic materials and is non-collapsible. Further, the carts may be oriented to be upright during transportation through the scanner.

Abstract: An interface, a scanning electron microscope and a method for observing an object that is positioned in a non-vacuum environment. The method includes: passing at least one electron beam that is generated in a vacuum environment through at least one aperture out of an aperture array and through at least one ultra thin membrane that seals the at least one aperture; wherein the at least one electron beam is directed towards the object; wherein the at least one ultra thin membrane withstands a pressure difference between the vacuum environment and the non-vacuum environment; and detecting particles generated in response to an interaction between the at least one electron beam and the object.

Abstract: The disclosed invention provides a sample holder capable of reducing or preventing the influence of a charged particle beam deflected by applying a magnetic field to a sample and provided with means for simply switching between a mode of observing a sample while applying a magnetic field to the sample, and a mode free of a magnetic field in which a magnetic field becomes zero completely. The sample holder includes a magnetic field generating element including three or more magnetic gaps for applying a magnetic field to a sample, a cantilever-beam-shaped sample holding element that holds a sample on one end thereof, and a moving mechanism that adjusts a relative position between a sample and a magnetic gap. The magnetic gaps can be placed along an optical axis of a charged particle beam.