Abstract: A clock control system for a scan chain generates two clock signals. During a shift phase of a testing mode of the scan chain, one clock signal is an inverted version of the other clock signal. The clock control system provides the clock signal and the inverted clock signal to two different scan flip-flops of the scan chain, respectively. Each of the two scan flip-flops performs a flip-flop operation when the received clock signal transitions from a de-asserted state to an asserted state. Thus, the two flip-flop operations are mutually exclusive during the shift phase. As a result, a dynamic voltage drop across the scan chain during the shift phase is reduced.

Abstract: An integrated circuit for transition fault testing comprises a synchronizing circuit including a first set of shift registers coupled to receive a scan enable signal and to provide a synchronizing signal based on the scan enable signal; a clock leaker circuit coupled to the synchronizing circuit and including a second set of shift registers coupled to receive a first clock signal based on the synchronizing signal and to provide a second clock signal that includes a set of pulses; and a multiplexer (MUX) that includes a first input coupled to receive a shift clock, a second input coupled to the clock leaker circuit to receive the second clock signal, and an output configured to provide an output clock signal that includes a second set of pulses.

Abstract: Examples of the present disclosure provide apparatuses and methods for error code calculation. The apparatus can include an array of memory cells that are coupled to sense lines. The apparatus can include a controller configured to control a sensing circuitry, that is coupled to the sense lines, to perform a number of operations without transferring data via an input/output (I/O) lines. The sensing circuitry can be controlled to calculate an error code for data stored in the array of memory cells and compare the error code with an initial error code for the data to determine whether the data has been modified.

Abstract: A method for real-time firmware configuration and a debugging apparatus are provided. When a demand for updating or debugging a target processor raises, in the method, a computer system generates a firmware debugging request that is attached with a firmware data with a specific debugging function. The computer system then loads the firmware data to a programmable logic unit of the debugging apparatus. After the real-time firmware configuration is completed, the computer system issues a debugging command to the programmable logic unit. The programmable logic unit obtains at least one debugging action after resolving the debugging command. The at least one debugging action is performed in the target processor when the target processor receives the at least one debugging action. A debugging result is returned after the at least one debugging action is completed.

Abstract: A method of receipt status reporting in a communication device, comprising configuring (S1) said communication device for periodic receipt status reporting by associating a first status report type with a value of a first reporting periodicity parameter and associating a second status report type with a value of second reporting periodicity parameter, said first status report type being different from said second status report type and said first reporting periodicity parameter being different from said second reporting periodicity parameter, and periodically (S2) sending receipt status reports of said first type according to said associated value of said first reporting periodicity parameter and receipt status reports of said second type according to said associated value of said second reporting periodicity parameter.

Abstract: The disclosure discloses a method and device in UE and a base station for channel coding. A first node first determines a first bit block and then transmits a first radio signal, wherein bits of the first bit block are used to generate bits of a second bit block, a third bit block comprises bits of the second bit block and the first bit block, and the third bit block is used to generate the first radio signal. The first bit block, the second bit block and the third bit block comprise P1, P2 and P3 bits, respectively.

Abstract: A channel encoding method in a communication or broadcasting system is provided. The channel encoding method includes reading a first sequence corresponding to a parity check matrix, converting the first sequence to a second sequence by applying a certain rule to a block size corresponding to a parity check matrix and the first sequence, and encoding information bits based on the second sequence. The block size has at least two different integer values.

Abstract: The present disclosure relates to a 5G or pre-5G communication system for supporting a higher data transfer rate beyond a 4G communication system, such as LTE. One embodiment of the present invention provides a method for channel encoding in a communication system, the method comprising: encoding second data, using an outer channel code; determining a value corresponding to first data, arranging the encoded second data in a block size unit corresponding to the second data, based on the determined value; and encoding the arranged second data, using an inner channel code.

Abstract: Provided are scan device and method of diagnosing scan chain fault. The scan device for diagnosing a fault includes a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade. In the scan partition, connection paths of the scan flipflops are controllable. The connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.

Abstract: Testing of die on wafer is achieved by; (1) providing a tester with the capability of externally communicating JTAG test signals using simultaneously bidirectional transceiver circuitry, (2) providing die on wafer with the capability of externally communicating JTAG test signals using simultaneously bidirectional transceiver circuitry, and (3) providing a connectivity mechanism between the bidirectional transceiver circuitry's of the tester and a selected group or all of the die on wafer for communication of the JTAG signals.

Abstract: A system including a memory device having blocks of memory cells and a processing device operatively coupled to the memory device. The processing device to perform operations comprising: detecting an error event triggered within a source block of the memory cells; reading data from the source block; writing the data into a mitigation block that is different than the source block; and replacing, in a mapping data structure, a first identifier of the source block with a second identifier of the mitigation block.

Abstract: This disclosure describes die test architectures that can be implemented in a first, middle and last die of a die stack. The die test architectures are mainly the same, but for the exceptions mentioned in this disclosure.

Abstract: A real-time clock module includes an oscillation circuit, a storage unit that stores adjustment data used to adjust an oscillation frequency of the oscillation circuit, a data abnormality determination circuit that compares first data based on the adjustment data with second data based on the adjustment data to determine whether or not at least one of the first data and the second data is abnormal, and a flag register that holds a data abnormality flag in which a first value indicating that the first data and the second data are normal, or a second value indicating that at least one of the first data and the second data is abnormal is set, based on a signal from the data abnormality determination circuit.

Abstract: A transceiver is designed to share memory and processing power amongst a plurality of transmitter and/or receiver latency paths, in a communications transceiver that carries or supports multiple applications. For example, the transmitter and/or receiver latency paths of the transceiver can share an interleaver/deinterleaver memory. This allocation can be done based on the data rate, latency, BER, impulse noise protection requirements of the application, data or information being transported over each latency path, or in general any parameter associated with the communications system.

Abstract: In an embodiment a method for testing a digital electronic circuit includes coupling an external test equipment to a digital electronic circuit in order to apply an external voltage signal to the digital electronic circuit when an automatic test pattern generation (ATPG) procedure with a given test pattern is performed, wherein a value of the external voltage signal is controlled by the external test equipment and measuring, at the external test equipment, the digital supply voltage at an output of the voltage regulator and at an input of the internal digital circuitry, wherein the external voltage signal is applied to the differential inputs of the op-amp voltage regulator through an adaptation circuit to obtain determined values of the digital supply voltage.

Abstract: An error correction circuit includes a memory that stores at least one decoding parameter, a low density parity check (LDPC) decoder that includes a first variable node storing one bit of the data, receives the at least one decoding parameter from the memory, decides a degree of the first variable node based on the at least one decoding parameter, and decides a decoding rule necessary for decoding of the one bit based on the degree of the first variable node, and an adaptive decoding controller that outputs corrected data based on a decoding result of the LDPC decoder.

Abstract: A memory module includes a memory device configured to receive a first refresh command from a host, and perform a refresh operation in response to the first refresh command during a refresh time, and a computing unit configured to detect the first refresh command provided from the host to the memory device, and write a first error pattern at a first address of the memory device during the refresh time.

Abstract: A method performed by a controller of a solid state drive (SSD) comprising receiving from a host a write request to store write data in a nonvolatile semiconductor storage device of the SSD. The method also comprises identifying a first codeword and a second codeword stored in the nonvolatile storage device, the first codeword and the second codeword configured to store write data corresponding to the write request. Responsive to the write request, the method comprises writing a first portion of the write data to the first codeword and writing a second portion of the write data to the second codeword, and sending a message to the host once the write data has been written to the nonvolatile semiconductor storage device. The first and second codewords are adjacently stored, and the write data has a length that is greater than the length of the first and second codewords.

Abstract: The invention discloses an extended joint test action group based controller and a method for functional debugging using the extended joint test action group based controller. The object of the invention to lower the power dissipation (dynamic and leakage) but providing the same functionality of the testing and debugging procedures at the same time will be solved by an extended joint test action group (JTAG) controller for testing flip-flops of a register of an integrated circuit (IC) using a design for testing scan infrastructure on the IC which comprises at least one scan chain, wherein an external debugger is connected to the design for testing scan infrastructure via the JTAG controller which is extended by a debug controller, whereas a feedback loop is formed from an output of the scan chain to an input multiplexer of the scan chain which is activated according to the extended JTAG controller.

Abstract: A system includes a volatile storage device, a read-only memory (ROM), a memory built-in self-test (BIST) controller and a central processing unit (CPU). The CPU, upon occurrence of a reset event, executes a first instruction from the ROM to cause the CPU to copy a plurality of instructions from a range of addresses in the ROM to the volatile storage device. The CPU also executes a second instruction from the ROM to change a program counter. The CPU further executes the plurality of instructions from the volatile storage device using the program counter. The CPU, when executing the plurality of instructions from the volatile storage device, causes the ROM to enter a test mode and the memory BIST controller to be configured to test the ROM.