Abstract: Disclosed are devices, systems and methods for error correction decoding using an iterative decoding scheme. An error correction circuit includes a node processor to perform a plurality of iterations for updating values of one or more variable nodes and one or more check nodes using initial values assigned to the one or more variable nodes, respectively, a trapping set detector to detect a trapping set in at least one of the plurality of iterations by applying a predetermined trapping set determination policy, and a post processor to reduce at least one of the initial values or invert at least one of values of the variable nodes corresponding to an iteration in which the trapping set is detected, upon detection of the trapping set.

Abstract: An augmented simulation model can be created of an integrated circuit (IC) design by inserting a switch in a simulation model of the IC design between an output of a scan cell and an input of a combinational logic cloud. A simulation enable signal can be used to control the switch. Next, an IC design simulation environment can be generated based on the augmented simulation model. The IC design can be verified by using the IC design simulation environment. The simulation enable signal can be activated when the combinational logic cloud is desired to be simulated by the IC design simulation environment.

Abstract: This disclosure describes die test architectures that can be implemented in a first, middle and last die of a die stack. The die test architectures are mainly the same, but for the exceptions mentioned in this disclosure.

Abstract: A channel encoding method in a communication or broadcasting system is provided. The channel encoding method includes reading a first sequence corresponding to a parity check matrix, converting the first sequence to a second sequence by applying a certain rule to a block size corresponding to a parity check matrix and the first sequence, and encoding information bits based on the second sequence. The block size has at least two different integer values.

Abstract: Embodiments relate to a system, program product, and method for random generation of recoverable errors in the generated instruction stream for post-silicon validation testing. The intentional raising and handling of exceptions in post-silicon validation exercisers randomly creates recoverable errors in a generated instruction test stream. Multiple exceptions may be raised either in a single instruction or in multiple instructions, while the present instruction is permitted to fully execute. The errors responsible for raising the exceptions are automatically repaired.

Abstract: The described technology is generally directed towards reporting channel quality information from a wireless user equipment to the network, in a channel state information report that includes channel quality information based on a block error rate threshold value that corresponds to an ultra-reliable low latency communication when the user equipment is in the ultra-reliable low latency communication mode. The channel quality information corresponding to the ultra-reliable low latency communication mode block error rate threshold and the channel quality information corresponding to the enhanced mobile broadband mode block error rate threshold can be included in the same report. Alternatively, the user equipment is instructed to report either the channel quality information for-reliable low latency communication or for enhanced mobile broadband in the channel state information report.

Abstract: A memory system includes: a first error detection circuit suitable for generating a first error detection code using host data and a host address which are transferred from a host; a second error detection circuit suitable for generating a second error detection code using system data including one or more host data, a logical address corresponding to one or more host addresses, a physical address corresponding to the logical address and one or more first error detection codes; a third error detection code suitable for generating a third error detection code using the system data, the one or more first error detection codes and the second error detection code; and a first memory suitable for storing the system data, the one or more first error detection codes, the second error detection code and the third error detection code.

Abstract: A system includes a memory device having blocks of memory cells. A processing device is operatively coupled to the memory device, the processing device to detect an error event triggered within a source block of the memory cells. In response to detection of the error event, the processing device is to read data from the source block; write the data into a mitigation block that is different than the source block; and replace, in a block set map data structure, a first identifier of the source block with a second identifier of the mitigation block. The block set map data structure includes block location metadata for a data group, of the memory device, that includes the data.

Abstract: An inter-hamming difference analyzer for a memory array having a plurality of sections is provided. The inter-hamming difference analyzer includes a controller, a storage device and a comparator. The controller is configured to obtain contents of the plurality of sections operating in a first operating condition and a second operating condition. The storage device is configured to store the contents of the plurality of sections corresponding to the first operating condition. The comparator is configured to obtain a plurality of inter-hamming differences of the plurality of sections according to the number of unlike bits between the content of a first section of the plurality of sections corresponding to the second operating condition and the contents of a plurality of sections other than the first section stored in the storage device.

Abstract: Accordingly, an improved interposer connection testing technique is provided, employing parallel pseudo-random bit sequence (PRBS) generators to test all the interconnects in parallel and simultaneously detect any correctable defects. In one embodiment, a microelectronic assembly includes an interposer electrically connected in a flip-chip configuration to an originating IC (integrated circuit) die and to a destination IC die, the substrate having multiple conductive traces for a parallel communications bus between the IC dies. The originating IC die has a first parallel PRBS (pseudo-random binary sequence) generator to drive test PRBSs with different phases in parallel across the interposer traces. The destination IC die has a second parallel PRBS generator to create reference PRBSs with different phases, and a bitwise comparator coupled to receive the test PRBSs from the interposer traces and to compare them to the reference PRBSs to provide concurrent fault monitoring for each of the traces.

Abstract: Provided is a controller for controlling a memory device. The controller may include a media scanner suitable for performing a media scan operation of reading a predetermined size of data from the memory device in a predetermined cycle, detecting an error of the read data, generating corrected data of the read data, and storing the corrected data in the memory device, a period calculator suitable for calculating a power-off period, and a media scan controller suitable for changing the predetermined cycle according to the power-off period.

Abstract: A failure diagnostic apparatus includes a path calculation unit which calculates, for each input pattern to a diagnosis target cell, a path affecting an output value of the diagnosis target cell when a failure is assumed as an activation path, a path classification unit which classifies the activation path associated with the input pattern for which the diagnosis target cell has passed a test and the activation path associated with the input pattern for which the diagnosis target cell has failed the test, a path narrowing unit which calculates a first failure candidate path, a second failure candidate path and a normal path of the diagnosis target cell based on classified activation paths, and a result output unit which outputs information on the first failure candidate path, the second failure candidate path and the normal path.

Abstract: A method and a device of selecting a base graph of a low-density parity-check code are provided. The method includes: acquiring a data information length and a channel coding rate of to-be-encoded data; determining a target base graph selection strategy according to the data information length and an information length range of a base graph; determining a target base graph for the to-be-encoded data according to the target base graph selection strategy and the channel coding rate.

Abstract: A transmitting apparatus and a receiving apparatus are provided. The transmitting apparatus includes an encoder configured to generate a low density parity check (LDPC) codeword by performing LDPC encoding, an interleaver configured to interleave the LDPC codeword, and a modulator configured to modulate the interleaved LDPC codeword according to a modulation method to generate a modulation symbol. The interleaver performs interleaving by dividing the LDPC codeword into a plurality of groups, rearranging an order of the plurality of groups in group units, and dividing the plurality of rearranged groups based on a modulation order according to the modulation method.

Abstract: An error correction circuit includes a memory that stores at least one decoding parameter, a low density parity check (LDPC) decoder that includes a first variable node storing one bit of the data, receives the at least one decoding parameter from the memory, decides a degree of the first variable node based on the at least one decoding parameter, and decides a decoding rule necessary for decoding of the one bit based on the degree of the first variable node, and an adaptive decoding controller that outputs corrected data based on a decoding result of the LDPC decoder.

Abstract: A non-volatile (NV) memory accessing method using data protection with aid of look-ahead processing, and associated apparatus such as memory device, controller and encoding circuit thereof are provided. The NV memory accessing method may include: receiving a write command and data from a host device; obtaining at least one portion of data to be a plurality of messages, to generate a plurality of parity codes through look-ahead type encoding, wherein regarding a message: starting encoding a first partial message to generate a first encoded result; applying predetermined input response information to a second partial message to generate a second encoded result, and combining the first and the second encoded results to generate a first partial parity code; and starting encoding the message to generate a second partial parity code, and outputting the first and the second partial parity codes to generate a parity code; and writing into the NV memory.

Abstract: According to one general aspect, a system may include a data interface circuit configured to receive data access requests, wherein each data access request is associated with a data set. The system may include a plurality of storage devices each storage device configured to store data, and wherein the plurality of storage devices has an amount of available storage space, an amount of used storage space, and an amount of redundant storage space. The system may include a data management circuit configured to: monitor the amount of available storage space in the in the plurality of storage devices, determine, for one or more data set, a level of redundancy to be associated with the respective data set, generate, for a first data set of the data sets, a redundant data portion to be associated with the first data set, and dynamically adjust the level of redundancy associated with the first data set, based, at least in part, upon the amount of available storage space.

Abstract: A circuit comprises a scan chain comprising one or more multi-bit flip-flops, a plurality of multiplexers, and new scan enable signal generation circuitry. Each of the plurality of multiplexers is associated with a particular bit of the one or more multi-bit flip-flops with an output of the each of the plurality of multiplexers coupled to a data input of the particular bit, which is configured to select, based on a scan direction control signal, between an input signal from functional circuitry of the circuit and an input signal from a data output of a bit of the scan chain immediately following the particular bit in a normal scan shift direction. The new scan enable signal generation circuitry is configured to generate a new scan enable signal for the one or more multi-bit flip-flops based on the scan direction control signal and a scan enable signal for the scan chain.

Abstract: A system and method for supporting data protection across field programmable gate array (FPGA) solid state drives (SSDs) includes a storage system having a first group of solid state drives connected to a FPGA. The FPGA includes a first data protection controller configured to manage input/output requests to and from the first group of solid state disks according to a data protection configuration, generate parity bits according to the data protection configuration, and store the parity bits on at least parity solid state drive from the first group of solid state drives.

Abstract: A test access port circuit includes a data input terminal, a reset terminal, a mode selection terminal, at least one test data register set, an auxiliary data register set, an instruction register set, and a controller. The controller is coupled to the mode selection terminal and the instruction register set, and controls the at least one test data register set, the auxiliary data register set, and the instruction register set according to at least mode selection signal received by the mode selection terminal. In a reset terminal input mode, when the controller controls a test data register set of the at least one test data register set to store a first input data bit received by the data input terminal, the auxiliary data register set stores a second input data bit received by the reset terminal.