Patents Examined by Kara Geisel
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Patent number: 7012693Abstract: A sensor comprising a light source for emitting a light beam, and a measuring chip. The measuring chip includes a dielectric block transparent to the light beam, a thin film layer formed on the dielectric block, and a liquid-sample holding mechanism for holding a liquid sample. The sensor also comprises an optical system for making the light beam enter the dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer. The sensor further comprises a photodetector for detecting the intensity of the light beam totally reflected at the interface, and a measuring section for measuring a state of attenuated total reflection, based on the result of detection obtained by the photodetector. The irradiation energy of the light beam at the interface is 100 mJ/mm2 or less.Type: GrantFiled: September 11, 2002Date of Patent: March 14, 2006Assignee: Fuji Photo Film Co., Ltd.Inventors: Nobufumi Mori, Takeharu Tani
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Patent number: 7009701Abstract: An optical element according to the invention constituted by a multilayer structure having a periodic structural portion as at least one region constituted by repetition of a predetermined period, wherein an end surface of the multilayer structure not parallel to layer surfaces of the multilayer structure is used as a light input surface whereas one or each of opposite surfaces of the multilayer structure parallel to the layer surfaces is used as a light output surface. There is an intermediate layer between a medium and a surface of the multilayer structure, the intermediate layer having a refractive index less than the refractive index of the medium. The periodic structural portion of the multilayer structure can be regarded as a one-dimensional photonic crystal. Refracted light from the one-dimensional photonic crystal has good directivity and the direction of the refracted light has strong dependence on wavelength.Type: GrantFiled: February 19, 2003Date of Patent: March 7, 2006Assignee: Nippon Sheet Glass Co., Ltd.Inventors: Shigeo Kittaka, Masatoshi Nara, Tatsuhiro Nakazawa, Kazuaki Oya, Keiji Tsunetomo
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Patent number: 7006221Abstract: An optical system includes both a microspot broadband spectroscopic ellipsometer and a photoacoustic film thickness measurement system that are supplied laser light by the same laser light source. One of the systems makes a measurement, the result of which is used to adjust a parameter of the other system; e.g. the ellipsometer measures thickness and the photoacoustic system uses the thickness result to measure the speed of sound. In one version, the ellipsometer converts the laser beam to a broad-spectrum beam that provides higher intensity.Type: GrantFiled: July 10, 2002Date of Patent: February 28, 2006Assignee: Rudolph Technologies, Inc.Inventors: Robert Gregory Wolf, Christopher Morath, Robin Mair
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Patent number: 7002681Abstract: A method of detecting a chemical species at a stand-off distance using a spectroscopy system, the method comprising the steps of providing a modulated light source emitting a first beam of light at a first wavelength incident to the chemical species, the first beam of light causing the chemical species to emit a signal, providing a spectral shifter a second beam of light at a second wavelength, the second beam of light causing a photochemical reaction in the chemical species to shift a spectrum of the light emitted from the chemical species, providing a detector positioned to detect the signal emitted from the chemical species, and providing a data processor system in communication with at least one of the detector and the modulated light source, the data processor system processing the signal to determine the identity of the chemical species.Type: GrantFiled: June 25, 2003Date of Patent: February 21, 2006Assignee: The United States of America as represented by the Secretary of the NavyInventors: Rodolfo T. Arrieta, Iris C. Paustian
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Patent number: 6999169Abstract: The present invention is intended to realize a spectrometer which improves the wavelength resolution without being affected by the pitch of the photodiode array. The present invention is characterized by a spectrometer which comprises a wavelength dispersion device spectrally dividing the measured light beam and a photodiode array composed of a plurality of photodiodes that detect the spectrally divided light beams by the wavelength dispersion device and output photocurrents, and performs measurement using the outputs of the photodiode array; providing a deflecting means that deflects the measured light beams and changes the position where the measured light beams are detected by the above photodiode array, and measuring the characteristics of the measured light beam from the measured results for different deflection amounts.Type: GrantFiled: December 26, 2002Date of Patent: February 14, 2006Assignee: Yokogawa Electric CorporationInventors: Yoshihiro Sanpei, Makoto Komiyama, Kenji Ogino, Yasuyuki Suzuki, Raiju Okada, Shuuhei Okada
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Patent number: 6999166Abstract: Components, apparatus, and method for detecting emission signals from target molecules include a substrate having a plurality of pixel locations on a surface, each location including at least one target molecule; a reflecting plate disposed opposite a side of the substrate having the pixel location; and a lens array disposed between the substrate and the reflecting plate, including the first lens array on the substrate side, a medium layer, and the second lens array on the reflecting plate side. Each lens of the second lens array has its focus on each lens of the first lens array, and the first lens array and the second lens array focus into an image of each of the at least one target molecule on the reflecting plate.Type: GrantFiled: July 7, 2003Date of Patent: February 14, 2006Assignee: Omron CorporationInventors: Tomohiko Matsushita, Takeo Nishikawa, Shigeru Aoyama
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Patent number: 6995840Abstract: Method and apparatus for analyzing radiation using analyzers and encoders employing the spatial modulation of radiation dispersed by wavelength or imaged along a line.Type: GrantFiled: March 6, 2003Date of Patent: February 7, 2006Assignee: Aspectrics, Inc.Inventor: Thomas W. Hagler
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Patent number: 6995843Abstract: A method of simulating a clear coat applied over a color coat for use in color-matching is described. The method comprising the steps of (a) providing a spray-out card having a first major surface and second major surface; (b) applying a color coat to the first major surface of the spray-out card to form a color coat layer; (c) providing a clear coat simulation film comprising a transparent base film and a pressure sensitive adhesive; and (d) adhering the transparent base film of the clear coat simulation film to the color coat layer with the pressure sensitive adhesive to form a color-matching article. Color-matching article produced in accordance with the method are also described.Type: GrantFiled: March 4, 2003Date of Patent: February 7, 2006Assignee: 3M Innovative Properties CompanyInventors: Jeffrey J. Janssen, Gerald R. Franck
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Patent number: 6992760Abstract: A method of imaging a histological sample is provided which comprises stimulating autofluorescence in a sample using electromagnetic radiation of wavelength 750 nm. Detection of the autofluorescence is undertaken by a CCD camera, typically with an excitation filter of 510 nm disposed between the camera and the sample. The weak signal from autofluorescence is reinforced by manipulation of data acquired by the camera. Autofluorescence is detected from an upper face of the sample, an upper layer of the sample removed and a next face of the sample imaged. These steps are repeated to obtain information on autofluorescence throughout the sample. The method enables detection of features for virtually any thickness of slice, and in particular slices can range from 50 ?m to 1 ?m, with the method generally being used to analyse slices of thickness 5?1 ?m.Type: GrantFiled: December 11, 2001Date of Patent: January 31, 2006Assignee: Medical Research CouncilInventors: Timothy J. Mohun, Wolfgang Johann Weninger
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Patent number: 6992762Abstract: There is provided a method and system for collecting optical data for use in time resolved optical imaging wherein light is directionally propagated through free-space optics to impinge on a plurality of illumination at the surface of a biological tissue such as that comprised in small animals. Light re-emitted from the tissue is collected and directionally propagated through free space optics towards a detector to produce time resolved optical signals useful for optical image reconstructions.Type: GrantFiled: September 22, 2003Date of Patent: January 31, 2006Assignee: ART Advanced Research Technologies Inc.Inventors: William F. Long, Yves Bérubé-Lauzière, David J. Hall, Laura McIntosh
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Patent number: 6989897Abstract: The disclosed methods and apparatus concern Raman spectroscopy using metal coated nanocrystalline porous silicon substrates. Porous silicon substrates may be formed by anodic etching in dilute hydrofluoric acid. A thin coating of a Raman active metal, such as gold or silver, may be coated onto the porous silicon by cathodic electromigration or any known technique. In certain alternatives, the metal coated porous silicon substrate comprises a plasma-oxidized, dip and decomposed porous silicon substrate. The metal-coated substrate provides an extensive, metal rich environment for SERS, SERRS, hyper-Raman and/or CARS Raman spectroscopy. In certain alternatives, metal nanoparticles may be added to the metal-coated substrate to further enhance the Raman signals. Raman spectroscopy may be used to detect, identify and/or quantify a wide variety of analytes, using the disclosed methods and apparatus.Type: GrantFiled: October 7, 2003Date of Patent: January 24, 2006Assignee: Intel CorporationInventors: Selena Chan, Andrew A. Berlin, Sunghoon Kwon, Narayanan Sundararajan, Mineo Yamakawa
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Patent number: 6987567Abstract: A spectral distribution error evaluation apparatus is used to evaluate precision of color matching between evaluation and target colors. A first weighting function generator generates a first weighting function on the basis of color matching functions, wavelength characteristics which are independent of a light source of the target color, and visual characteristics which depend on wavelengths. A second weighting function generator generates a second weighting function on the basis of light source information of selected light sources. A difference calculator calculates error values between the evaluation and target colors for respective frequencies. An evaluation value calculator applies the first and second weighting functions to the error values, and calculates the sum total of the error values as an evaluation value.Type: GrantFiled: May 9, 2003Date of Patent: January 17, 2006Assignee: Canon Kabushiki KaishaInventors: Kosei Takahashi, Osamu Yamada
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Patent number: 6985230Abstract: A system comprising a plurality of comparison samples each having a reflectance spectrum and being configured to substantially simulate a color of a keratinous element having a reflectance system. The reflectance spectrum of each comparison sample may be substantially similar to the reflectance spectrum of a respective keratinous element such that the comparison sample and the keratinous element appear to an observer to have substantially the same color under at least two differing illuminants.Type: GrantFiled: December 10, 2001Date of Patent: January 10, 2006Assignee: L'Oreal S.A.Inventors: Jean De Rigal, Christophe Dauga
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Patent number: 6985223Abstract: A Raman imaging and sensing apparatus is described. The apparatus employs a nanoantenna structure which includes a metal tip spaced from a metal surface or particle. A light beam impinges upon the nanoantenna and causes plasmon resonance. The plasmon resonance excites a sample resulting in dramatically enhanced Raman scattering of the sample. The Raman scatter is collected by a spectrophotometer which provides an output signal indicative of the composition of the sample.Type: GrantFiled: January 6, 2004Date of Patent: January 10, 2006Assignee: Purdue Research FoundationInventors: Vladimir P. Drachev, Vladimir M. Shalaev, Andrey K. Sarychev
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Patent number: 6975394Abstract: An apparatus for measuring the lifetime of an excited state in a specimen is disclosed. The apparatus comprises an electromagnetic energy source (1) that emits light (3) of one wavelength. Also provided are a means (5) for dividing the light (3) into at least a first and a second partial light beam (7, 9) and an intermediate element (23) in at least one partial light beam to influence the transit time.Type: GrantFiled: November 14, 2001Date of Patent: December 13, 2005Assignee: Leica Microsystems Heidelberg GmbHInventor: Johann Engelhardt
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Patent number: 6975397Abstract: The invention describes a method to eliminate instrumental offset in measurement of optically active scattering and circular dichroism. The method uses the time-average measurement of the light that is systematically transformed by a series of optical devices. The optical devises perform the function of rotating linearly polarized light, interconverting left and right circular polarized light, converting circular polarized light to rotating linear polarized light and converting linear polarized light to alternating left and right circular polarized light.Type: GrantFiled: February 27, 2003Date of Patent: December 13, 2005Assignee: BioTools, Inc.Inventor: Werner Hug
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Patent number: 6972845Abstract: A collimator obtained by the alternate stacking of metal sheets 1 (40 ?m thick) having holes 4 with a width of 2200 ?m in the center thereof, and metal sheets 2 (10 ?m thick) devoid of holes (the metal sheets 1 with the holes 4 are shown in the state in which they exist before being cut in the manner described below, the metal sheets 1 in the upper portion of the figure and the metal sheets in the bottom portion are not connected with each other in the finished product). The opposite sides are held by metal pressing sheets 3 that are 2 mm thick. These metal sheets and pressing sheets are bonded by means of diffusion bonding based on thermocompression bonding. The portions with the vertical through-holes 4 (40 ?m×2000 ?m) thus become light-transmitting portions, the metal sheets 2 serve as partitions between adjacent holes 4, and light collimated to a width of 40 ?m can ultimately pass through. A compact collimator having high wavelength resolution without wavelength dependence can thus be achieved.Type: GrantFiled: October 2, 2002Date of Patent: December 6, 2005Assignee: Nireco CorporationInventors: Takeo Yamada, Tomoyuki Kobayashi
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Patent number: 6970239Abstract: The methods and apparatus 300 disclosed herein concern Raman spectroscopy using metal coated nanocrystalline porous silicon substrates 240, 340. In certain embodiments of the invention, porous silicon substrates 110, 210 may be formed by anodic etching in dilute hydrofluoric acid 150. A thin coating of a Raman active metal, such as gold or silver, may be coated onto the porous silicon 110, 210 by cathodic electromigration or any known technique. The metal-coated substrate 240, 340 provides an extensive, metal rich environment for SERS, SERRS, hyper-Raman and/or CARS Raman spectroscopy. In certain embodiments of the invention, metal nanoparticles may be added to the metal-coated substrate 240, 340 to further enhance the Raman signals. Raman spectroscopy may be used to detect, identify and/or quantify a wide variety of analytes, using the disclosed methods and apparatus 300.Type: GrantFiled: June 12, 2002Date of Patent: November 29, 2005Assignee: Intel CorporationInventors: Selena Chan, Andrew A. Berlin, Mineo Yamakawa
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Patent number: 6970236Abstract: An automated verification system for authenticating an object having an interference security device or feature includes an electromagnetic radiation source capable of generating one or more electromagnetic radiation beams, a transport staging apparatus adapted to position an object in the path of the one or more electromagnetic radiation beams, and an analyzing system adapted to receive the one or more electromagnetic radiation beams from the object and, based upon the characteristics of the received electromagnetic radiation, determine if the object is authentic. The analyzing system is configured to analyze the characteristics of electromagnetic radiation beams at varying angles and/or wavelengths from the object to verify the authenticity of the object. One exemplary method utilizes spectra representative of the electromagnetic radiation received from the object at one or more angles. The slope direction of the spectra is compared against reference data that represents spectra for an authentic object.Type: GrantFiled: August 19, 2002Date of Patent: November 29, 2005Assignee: JDS Uniphase CorporationInventors: Charles T. Markantes, Paul G. Coombs
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Patent number: 6970241Abstract: Disclosed is a device for enabling the slow and direct measurement of fluorescence polarization using a liquid crystal variable retardance modulator. A polarization module comprises in combination a sample holder for holding a sample; an input polarizer located intermediate the sample holder and a light source emitting an excitation light beam, the input polarizer being fixed in position and intersecting the excitation light beam prior to its entry into the sample; a modulator means located intermediate the sample and an output polarizer and intersecting a fluorescence emission beam exiting the sample, the modulator means comprising a liquid crystal retardance modulator operating at an arbitrarily slow speed; and, the output polarizer located intermediate the modulator and a detector, the output polarizer being fixed in position intermediate the modulator and the detector, and intersecting the fluorescence emission beam.Type: GrantFiled: August 24, 2004Date of Patent: November 29, 2005Inventor: Richard J. DeSa