Abstract: Various implementations described herein are directed to an integrated circuit having a wordline driver coupled to a bitcell via a wordline. The integrated circuit may include a read assist transistor coupled to the wordline between the wordline driver and the bitcell. While activated, the read assist transistor may generate an adaptive underdrive on the wordline, the level of which depends on the process, temperature and voltage of operation of the memory, when the wordline is selected and driven by the wordline driver.

Abstract: Memory devices including a controller configured to cause the memory device to apply a positive first voltage level to a first data line selectively connected to a first string of series-connected memory cells while applying a second voltage level, higher than the first voltage level, to a second data line selectively connected to a second string of series-connected memory cells; while applying the first voltage level to the first data line and applying the second voltage level to the second data line, applying a third voltage level to a particular access line coupled to a memory cell of a first string of series-connected memory cells selected for programming, wherein a differential between the third voltage level and the first voltage level is configured to increase a threshold voltage of the memory cell selected for programming, as well as other apparatus containing similar memory devices.

Abstract: According to an embodiment, a magnetic storage device includes a magnetic member, a switch element, a shift control circuit, a base current control circuit, and a controller. The magnetic member includes a portion extending in a direction. The switch element is connected in series to the magnetic member, and maintains an on state in a case where a current equal to or larger than a holding current value continues to flow in the on state. The shift control circuit shifts magnetic domains retained in the magnetic member. The controller causes the base current control circuit to supply a base current to the switching element and causes the shift control circuit to supply a shift pulse current a plurality of times.

Abstract: Various implementations described herein are directed to an integrated circuit having multiple banks of memory cells and a local input/output (IO) component for each bank of the multiple banks. The integrated circuit may include multiple signal lines that are coupled to the multiple banks with the local IO components. At least one signal line of the multiple signal lines is wider than one or more of the other signal lines.

Abstract: An indication of a power loss can be received at a cross point array memory dual in-line memory module (DIMM) operation component of a memory sub-system. The cross point array memory DIMM operation component includes a volatile memory component and a non-volatile cross point array memory component. In response to receiving the indication of the power loss, a type of write operation for the non-volatile cross point array memory component of the cross point array memory DIMM operation component is determined based on a characteristic of the memory sub-system. Data stored at the volatile memory component of the cross point array memory DIMM operation component is retrieved and written to the non-volatile cross point array memory component of the cross point array memory DIMM operation component by using the determined type of write operation.

Abstract: Apparatuses and methods for determining a phase relationship between an input clock signal and a multiphase clock signal are disclosed. An example apparatus includes a clock path configured to receive a clock signal and provide internal clock signals and a command path configured to receive a command and propagate the command through the command path responsive to the internal clock signals and provide an internal command having a timing that reflects a timing of the clock signal. The example apparatus further includes a data clock path configured to receive a data clock signal and provide multiphase clock signals based on the data clock signal and provide a delayed multiphase clock signal, and further includes a clock synchronization circuit configured to receive the delayed multiphase clock signal and latch a logic level of the delayed multiphase clock signal responsive to the internal command.

Abstract: Methods of operating a memory, and apparatus configured to perform similar methods, include determining first states of a first sense node and a second sense node while a first voltage level is capacitively coupled to the first sense node and while a second voltage level is capacitively coupled to the second sense node, determining a second states of the first and second sense nodes while a third voltage level is capacitively coupled to the first sense node and while a fourth voltage level is capacitively coupled to the second sense node, determining a fifth voltage level in response to at least the first states of the first and second sense nodes and the second states of the first and second sense nodes, and determining third states of the first and second sense nodes while the fifth voltage level is capacitively coupled to the first and second sense nodes.

Abstract: A method of forming semiconductor memory device, the semiconductor memory device includes a substrate, plural gates, plural cell plugs, a capacitor structure and a stacked structure. The gates are disposed in the substrate, and the cell plugs are disposed on the substrate, to electrically connect the substrate at two sides of each gate. The capacitor structure includes plural capacitors, and each capacitor is electrically connected each cell plug. The stacked structure covers the capacitor structure, and the stacked structure includes a semiconductor layer, a conductive layer on the semiconductor layer and an insulating layer stacked on the conductive layer. Two gaps are defined respectively between a side portion of the insulating layer and a lateral portion of the conductive layer at two sides of the capacitor structure, and the two gaps have different lengths.

Abstract: A resistive memory device and a method of operation of the resistive memory device are provided. The resistance memory device includes a resistance change layer that has a tunneling film and has many states. The conductance is changed symmetrically in a SET operation and a RESET operation. Thus, the resistive memory device can be used for efficient and accurate data storage as a RRAM in a high-capacity memory array, and as a synaptic device controlling the connection strength of a synapse in a neuromorphic system.

Abstract: According to one embodiment, a memory system includes a nonvolatile first memory, a volatile second memory, a capacitor, and a memory controller. The nonvolatile first memory includes a storage region that includes a plurality of memory cells. The capacitor is configured to accumulate electric power. The memory controller writes first data stored in the volatile second memory to the storage region in a first mode, using a power supply from outside. The first mode is a mode in which one-bit data is written to each of the memory cells. The memory controller writes, upon stop of the power supply from the outside, the first data to the storage region in a second mode, using the electric power accumulated in the capacitor. The second mode is a mode in which one-bit data is written to each of the memory cells and is different from the first mode.

Abstract: Subject matter disclosed herein may relate to correlated electron switches that are capable of asymmetric set or reset operations.

Abstract: A semiconductor device may include a plurality of memory banks arranged in a first direction; an address decoder arranged at one side of the memory banks; a plurality of local sense amplifier arrays arranged under each of the memory banks; a plurality of first input/output lines connected between the memory banks and the local sense amplifier arrays corresponding to each of the memory banks; and at least one second input/output line connected to the local sense amplifier arrays and extended in the first direction.

Abstract: Provided is a semiconductor device including a regulator that generates a first voltage and applying the first voltage to a first line; an external terminal that is connected to the first line and externally connects an external component; and a test circuit that inspects a connection state of the external component. The test circuit includes a test discharge execution unit that is configured, upon receiving a test start signal, to stop the operation of the regulator and discharge the external component by connecting the first line to a predetermined potential; and a discharge duration measurement unit that measures a time required from the reception of the test start signal to a drop of the voltage of the first line below a predetermined second voltage, as a discharge duration of the component, and generate discharge duration information about the discharge duration.

Abstract: Disclosed is a computer memory including a memory array, an address decoder, and a wordline enable circuit. The wordline enable circuit includes a plurality of memory cells, each cell corresponding to a memory row of the memory array. Each memory cell stores a flag indicating whether a data row of the corresponding memory row should have a value of zero. The wordline enable circuit additionally includes multiple outputs, each corresponding to a memory row of the memory array. The wordline enable circuit outputs a signal having the first value (e.g., 1 or HI) through an output corresponding to the input address in response to receiving an input signal having the first value and the flag being stored by the memory cell corresponding to the input address having a first flag value.

Abstract: Methods of operating a memory, and memory configured to perform similar methods, might include applying a particular multi-step programming pulse to a selected access line of a programming operation, and applying a next subsequent multi-step programming pulse to the selected access line, wherein the particular multi-step programming pulse has a first step having a first voltage level and a second step having a second voltage level different than the first voltage level, and wherein the next subsequent multi-step programming pulse has a first step having a third voltage level and a second step having a fourth voltage level different than the third voltage level and higher than the first voltage level.

Abstract: A memory system includes a controller that recognizes, as a command, a signal received immediately after a chip select signal is received from a host device, and a memory that includes a plurality of blocks. When the command is a first command, the controller outputs to the host device, information indicating whether at least one of a write operation and an erase operation with respect to at least one particular block is prohibited.

Abstract: Disclosed are systems and methods for providing programming of multi-level memory cells using an optimized multiphase mapping with a balanced Gray code. A method includes programming, in a first phase, a first portion of data into memory cells in a first-level cell mode. The method may also include reading, from the memory cells, the programmed first portion of the data. The method may also include programming, in a second phase, a second portion of the data into the memory cells in a second-level cell mode, wherein programming the second phase is based on applying, to the read first portion of the data, a mapping from the first-level cell mode to the second-level cell mode. The mapping may be selected based on minimizing an average voltage change of the memory cells from the first to second phase while maintaining a balanced Gray code.

Abstract: Methods and apparatuses of providing word line voltages are disclosed. An example method includes: activating and deactivating a word line. Activating the word line includes: rendering the first, second and third transistors conductive, non-conductive and non-conductive, respectively, wherein the first transistor is rendered conductive by supplying a gate of the first transistor with a first voltage; and supplying the first node with an active voltage. Deactivating the word line includes: changing a voltage of the first node from the active voltage to an inactive voltage; changing a voltage of the gate of the first transistor from the first voltage to a second voltage, wherein the first transistor is kept conductive by the second voltage; rendering the third transistor conductive during the gate of the first transistor being at the second voltage; and rendering the first and second transistors non-conductive and conductive, respectively, after the third transistor has been rendered conductive.

Abstract: Among other things, an apparatus comprises quantum units; and couplers among the quantum units. Each coupler is configured to couple a pair of quantum units according to a quantum Hamiltonian characterization of the quantum by the coupler.

Abstract: A nonvolatile memory cell includes a layered structure body formed by layering a storage layer that stores information in accordance with a magnetization direction and a magnetization fixed layer that defines a magnetization direction of the storage layer; and a heating layer that heats the magnetization fixed layer to control a magnetization direction of the magnetization fixed layer.