Patents Examined by Robert Kim
  • Patent number: 9384943
    Abstract: Provided is an ion generating apparatus. The ion generating apparatus includes opposed electrodes connected to a high-frequency power supply, and hence, even in a case where a cathode filament is broken, hydride gas can be ionized to generate hydrogen ion. Thus, a fluorine compound deposited in a source housing is reduced in vacuum, and gas containing fluorine generated due to the above-mentioned reduction reaction is discharged with a vacuum pump.
    Type: Grant
    Filed: September 15, 2010
    Date of Patent: July 5, 2016
    Assignee: SII Semiconductor Corporation
    Inventor: Kiyohiro Tsuru
  • Patent number: 9380988
    Abstract: An electronic cassette for radiographic imaging includes a radiation imaging detector for detecting X-rays from an object and creating an X-ray image of the object. A battery supplies the radiation imaging detector with power. A power receiver wirelessly receives power from a wireless power transmission apparatus for charging the battery. A housing is formed from an electrical conductor, for containing the radiation imaging detector and the power receiver. A path opening is formed in the housing, and disposed between the power receiver and the wireless power transmission apparatus. A cover device is formed from a material having electrical insulating property and thermal conductivity, for closing the path opening, and conducting heat of the power receiver to the housing for dissipation. Preferably, the cover device contains synthetic resin. Also, a profile line of the path opening is at least partially curved.
    Type: Grant
    Filed: January 30, 2014
    Date of Patent: July 5, 2016
    Assignee: FUJIFILM Corporation
    Inventor: Kouichi Kitano
  • Patent number: 9377445
    Abstract: In order to achieve an ionization method of high robustness with a small carry-over or less crosstalk, an ionization method is disclosed. A method includes the steps of: joining an ionization unit to a tube; sucking the sample from a sample container into a sample holder of the ionization unit to hold the sample; moving the ionization unit holding the sample to near the ionization unit using an ionization unit drive unit; and applying a voltage to the ionization unit using a power supply to ionize the sample by electrostatically spraying the sample from the holding unit.
    Type: Grant
    Filed: August 27, 2012
    Date of Patent: June 28, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Satake, Hideki Hasegawa, Yuichiro Hashimoto, Masao Suga, Izumi Waki
  • Patent number: 9375191
    Abstract: A computer-implemented method for determining a 3D surface reconstruction of an object, which comprises generating a first 3D surface reconstruction of the object from a plurality of 2D images of the object obtained from different perspectives. A region of interest of the object is specified. At least one viewing direction is determined for viewing the specified region of interest. At least one 2D image of the object corresponding to the at least one viewing direction is obtained. A second 3D surface reconstruction of the object is generated from all or part of the 2D images used to generate the first 3D surface reconstruction and the at least one 2D image of the object corresponding to the at least one viewing direction for the specified region of interest. A corresponding apparatus and computer program are also disclosed.
    Type: Grant
    Filed: September 11, 2012
    Date of Patent: June 28, 2016
    Assignee: Pie Medical Imaging B.V.
    Inventors: Boudewijn J. A. Verstraelen, Jean-Paul Aben, Rianne Reinartz
  • Patent number: 9373424
    Abstract: An electron beam writing apparatus comprising a stage that a sample is placed on, an electron optical column, an electron gun emitting an electron beam disposed in the optical column, an electrostatic lens provided with electrodes aligned in an axial direction of the electron beam disposed in the optical column, and a voltage supply device for applying positive voltage constantly to the electrostatic lens. A shield plate is disposed between the XY stage and the electron optical column to block reflected electrons or secondary electrons generated by irradiation to the sample with the electron beam. The electrostatic lens is disposed immediately above the shield plate to change a focal position of the electron beam. A voltage supply device applies a positive voltage constantly to the electrostatic lens.
    Type: Grant
    Filed: February 15, 2013
    Date of Patent: June 21, 2016
    Assignee: NuFlare Technology, Inc.
    Inventors: Takanao Touya, Takahito Nakayama
  • Patent number: 9370600
    Abstract: An ultraviolet (UV) light germicidal sanitizing system for use in an enclosed space comprises a room occupancy sensor, a door sensor, a UV light generating unit, and a control software application. The room occupancy sensor is positioned in the enclosed space and generates a first signal indicating that the enclosed space is either occupied or unoccupied. The room occupancy sensor is implemented with a door providing access to the enclosed space and generates a second signal indicating that the door is either open or closed. The UV light generating unit receives the first and second signals and generates UV light into the enclosed space if the first signal indicates that the enclosed space is unoccupied and the second signal indicates that the door is closed. The control software application generates commands for the UV light generating unit to start generating UV light and to stop generating UV light.
    Type: Grant
    Filed: December 22, 2014
    Date of Patent: June 21, 2016
    Assignee: Elevated Health System, LLC
    Inventors: Ann Alexander DuPuis, John DuPuis
  • Patent number: 9373493
    Abstract: A mass spectrometer and method capable of optimizing the opening time of a collision cell includes: an ion source (10) for ionizing a sample; a first mass analyzer (30) for selecting first desired ions from the ions generated in the ion source (10); a collision cell (40) for fragmenting some or all of the first desired ions into product ions; a second mass analyzer (50) for selecting second desired ions from the first desired ions and the product ions; a detector (60) for detecting the second desired ions; and a control section (200) for controlling the collision cell (40) in such a way that the cell performs a storing operation for storing the first desired ions and the product ions for a given storage time and then performs an opening operation for ejecting the stored ions for a given opening time based on information about settings in an adjustment mode.
    Type: Grant
    Filed: November 20, 2013
    Date of Patent: June 21, 2016
    Assignee: JEOL Ltd.
    Inventor: Junkei Kou
  • Patent number: 9373474
    Abstract: An ion source is provided with a push-out electrode, a pull-out electrode, and a pull-in electrode all for ionizing a sample and accelerating generated ions in a pulsed manner, wherein the push-out electrode and/or the pull-in electrode has a curved surface shape having a depression curved in the direction opposite to the direction of travel of the ions. As a result, a compact ion source capable of temporally and spatially focusing ions and outputting the ions, and a compact time-of-flight mass spectroscope with good detection resolution and detection sensitivity which is provided with the compact ion source can be provided.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: June 21, 2016
    Assignees: Osaka University, MSI. Tokyo, Inc.
    Inventors: Michisato Toyoda, Jun Aoki, Shinichi Miki
  • Patent number: 9357972
    Abstract: A radiological image sensor has an electronic substrate and an imaging chip held within a housing, the imaging chip having electronics that create a dead space, with a cable attached to the housing at a cable button connector, the dead space being at a short distal side of the generally rectangular sensor opposite the short mesial side at which the cable exits the cable button connector. The mesial side of the sensor either does not have a dead space created by electronics of the imaging chip or the dead space found on the mesial side of the sensor is less than approximately 4 mm, and, preferably, approximately 2 mm or less. The cable can be a flat cable with a length of approximately one meter or less that can be connected to a round cable.
    Type: Grant
    Filed: July 16, 2013
    Date of Patent: June 7, 2016
    Inventors: Adam Chen, Douglas C Yoon
  • Patent number: 9363878
    Abstract: A device is provided for controlling a laser beam. The device may include a first wavefront adjuster provided in a beam path of a laser beam outputted from a laser apparatus, a beam delivery unit provided in a beam path of the laser beam from the first wavefront adjuster, a second wavefront adjuster provided in a beam path of the laser beam from the beam delivery unit, a beam monitor provided in a beam path of the laser beam from the second wavefront adjuster, and a controller configured to control the first and second wavefront adjusters based on a detection result of the beam monitor. An extreme ultraviolet light apparatus including the device is also provided.
    Type: Grant
    Filed: July 9, 2014
    Date of Patent: June 7, 2016
    Assignee: GIGAPHOTON INC.
    Inventors: Masato Moriya, Osamu Wakabayashi
  • Patent number: 9362088
    Abstract: Provided is a charged particle beam device provided with: a charged particle source; an objective lens for focusing a charged particle beam emitted from the charged particle source onto a sample; a detector for detecting a secondary charged particle emitted from the sample; a probe capable of coming into contact with the sample; a gas nozzle for emitting conductive gas to the sample; and a control unit for controlling the drive of the probe and gas emission from the gas nozzle, wherein before bringing the probe into contact with the sample after applying the charged particle beam to the sample to machine the sample, the control unit emits gas toward a machining position from the gas nozzle and applies the charged particle beam to form a conductive film on a machining portion of the sample, and the charged particle beam device is provided with a contact detection unit for determining that the conductive film formed on the machining portion and the probe have come into contact with each other.
    Type: Grant
    Filed: October 9, 2013
    Date of Patent: June 7, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takahiro Sato, Akinari Morikawa, Isamu Sekihara
  • Patent number: 9355818
    Abstract: One embodiment disclosed relates to an apparatus for reflection electron beam lithography. The apparatus includes an electron source, a patterned electron reflector generator structure, a stage, a demagnifying electron lens, and an ExB separator. The ExB separator configured to bend a trajectory of the electron beam towards the dynamic pattern generator structure. The patterned electron reflector structure is configured to reflect select portions of the electron beam so as to form a patterned electron beam. The ExB separator is further configured to allow the patterned electron beam to pass straight through towards the demagnifying electron lens. The demagnifying electron lens is configured to demagnify the patterned electron beam and project the demagnified patterned electron beam onto the target substrate. The apparatus disclosed herein has a straight projection axis and substantially reduces the electron beam path by a factor of three-to-one (compared to a prior apparatus which uses a magnetic prism).
    Type: Grant
    Filed: May 28, 2010
    Date of Patent: May 31, 2016
    Assignee: KLA-Tencor Corporation
    Inventor: Paul F. Petric
  • Patent number: 9345443
    Abstract: A method of generating a bone and a soft tissue image of an object includes a dual energy radiography technique wherein weight parameters for calculating these images as a weighted sum of a low energy image PL and a high energy image PH are deduced from a ratio image Log(Pn)/Log(PL).
    Type: Grant
    Filed: September 4, 2012
    Date of Patent: May 24, 2016
    Assignee: Agfa HealthCare NV
    Inventor: Tom Bertens
  • Patent number: 9343266
    Abstract: A charged particle beam pattern writing method according to an embodiment, includes measuring a position displacement amount of a stage above which a target object is placed, in a rotation direction; and writing a pattern of a beam image on the target object above the stage while the beam image is rotated, by using a plurality of electrostatic lenses at least one of which is arranged in a magnetic field of each of the plurality of electromagnetic lenses whose magnetic fields are in opposite directions, to avoid a focus displacement of a charged particle beam passing through the plurality of electromagnetic lenses and to correct the position displacement amount measured, in the rotation direction of the stage.
    Type: Grant
    Filed: July 25, 2013
    Date of Patent: May 17, 2016
    Assignee: NuFlare Technology, Inc.
    Inventors: Munehiro Ogasawara, Takanao Touya, Shuichi Tamamushi
  • Patent number: 9330882
    Abstract: A particle beam detector is disclosed. The particle beam detector can include a particle beam receiving portion configured to convert particle beam energy to heat, and a plurality of temperature measuring devices disposed about the particle beam receiving portion. A location of a particle beam on the particle beam receiving portion can be determined by a temperature difference between at least two of the plurality of temperature measuring devices.
    Type: Grant
    Filed: August 4, 2014
    Date of Patent: May 3, 2016
    Assignee: Raytheon Company
    Inventors: Bruce Chignola, Timothy M. Norcott, Brandon W. Blackburn, Paul F. Martin, Kenneth A. Levenson
  • Patent number: 9324547
    Abstract: A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyzer; the batch of ions accumulated in the mass analyzer is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyzer is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyzer; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyzer.
    Type: Grant
    Filed: May 18, 2012
    Date of Patent: April 26, 2016
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Jan-Peter Hauschild, Oliver Lange, Ulf Froehlich, Andreas Wieghaus, Alexander Kholomeev, Alexander Makarov
  • Patent number: 9324178
    Abstract: A system comprises an electron beam directed toward a three-dimensional object with one tilting angle and at least two azimuth angles, a detector configured to receive a plurality of scanning electron microscope (SEM) images from the three-dimensional object and a processor configured to calculate a height and a sidewall edge of the three-dimensional object.
    Type: Grant
    Filed: November 7, 2014
    Date of Patent: April 26, 2016
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Wen-Hao Cheng, Chih-Chiang Tu, Chung-Min Fu, Ajay Nandoriya
  • Patent number: 9321658
    Abstract: In various embodiments, a fluid is treated by flowing the fluid through a flow cell having (i) a fluid entry, (ii) a fluid exit, (iii) a treatment region disposed between the fluid entry and exit, and (iv) an interior surface reflective to ultraviolet (UV) light, and diffusively reflecting UV light emitted from one or more UV light sources to illuminate the treatment region substantially uniformly, thereby treating the fluid.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: April 26, 2016
    Assignee: CRYSTAL IS, INC.
    Inventors: Jianfeng Chen, Rajul V. Randive, Craig Moe
  • Patent number: 9318303
    Abstract: A charged particle beam apparatus includes an electron beam irradiation unit that irradiates a sample with electron beams along a first irradiation axis. A rotation stage holds the sample and has a rotation axis in a direction perpendicular to the first irradiation axis. An ion beam irradiation unit irradiates the sample with ion beams along a second irradiation axis that is substantially parallel to the rotation axis to process the sample into a needle shape. A detection unit detects at least one of charged particles and X rays generated via the sample by the irradiation with the ion beams or the electron beams, and a gaseous ion beam irradiation unit irradiates the sample with gaseous ion beams.
    Type: Grant
    Filed: August 27, 2014
    Date of Patent: April 19, 2016
    Inventors: Xin Man, Tatsuya Asahata, Atsushi Uemoto
  • Patent number: 9313869
    Abstract: A radiation image detection apparatus includes a control unit, during a irradiation detection mode, stops supplying of an operating power to a data processing unit until irradiation of radiation is detected by an irradiation detection unit, and when the irradiation of radiation is detected by the irradiation detection unit, the control unit proceeds to a photographing mode and begins supplying the operating power to the data processing unit.
    Type: Grant
    Filed: November 20, 2012
    Date of Patent: April 12, 2016
    Inventors: Yasufumi Takahashi, Naoto Iwakiri