Patents Examined by Sean M Luck
  • Patent number: 10276345
    Abstract: A phase shifting device for a charged particle imaging system includes means for passing an electric current in a direction that has a nonzero component parallel to at least one section of the imaging beam. Preferably, the electric current is passed parallel along the section of the imaging beam. The amount of phase shift then centrosymmetrically depends on the distance between the electric current axis and the imaging beam axis. The magnetic field produced by the electric current exhibits the same effect on the phase of the beam as a localized charge according to the prior art.
    Type: Grant
    Filed: July 30, 2014
    Date of Patent: April 30, 2019
    Assignee: Forschunszentrum Juelich GmbH
    Inventors: Amir Hossein Tavabi, Aleksei Savenko, Giulio Pozzi, Rafal Edward Dunin-Borkowski, Vadim Migunov
  • Patent number: 10253624
    Abstract: Methods may include emplacing a wellbore tool in a wellbore, the wellbore tool including a gas chromatograph and a mass spectrometer, wherein the mass spectrometer is configured to operate at a pressure greater than 10?2 Torr, measuring a sample from the wellbore using the wellbore tool, and determining a molecular weight of one or more components of the sample from the measured response of the wellbore tool. Methods may also include establishing a library of one or more chemical components, emplacing a wellbore tool in a wellbore, the wellbore tool including a gas chromatograph and a mass spectrometer, wherein the mass spectrometer is configured to operate at a pressure greater than 10?2 Torr, measuring a sample from the wellbore using the wellbore tool, comparing the measured response from the wellbore tool for the sample with results from the library of one or more chemical components, and determining a molecular weight of one or more components of the sample.
    Type: Grant
    Filed: October 5, 2016
    Date of Patent: April 9, 2019
    Assignee: Schlumberger Technology Corporation
    Inventors: Ronald E. G. van Hal, Albert Ballard Andrews, Jeffrey Crank
  • Patent number: 10256004
    Abstract: A particle-beam control electromagnet capable of shortening a transportation path of a particle beam and an irradiation treatment apparatus which contributes to miniaturization and weight reduction of the rotating gantry supporting this control electromagnet are provided. The electromagnet includes a first superconducting coil group, a second superconducting coil group, and a vacuum vessel. The first superconducting coil group forms at least one of a bending magnetic field and a focus/defocus magnetic field. The second superconducting coil group is placed around the trajectory of the particle beam at the end of the first superconducting coil group and forms correction magnetic fields for correcting the trajectory of the particle beam. The vacuum vessel hermetically houses the first superconducting coil group, the second superconducting coil group, and a cooling medium, and insulates from the outside air.
    Type: Grant
    Filed: June 17, 2016
    Date of Patent: April 9, 2019
    Assignees: KABUSHIKI KAISHA TOSHIBA, Toshiba Energy Systems & Solutions Corporation
    Inventors: Shigeki Takayama, Tomofumi Orikasa, Yoshifumi Nagamoto, Takeshi Yoshiyuki, Takashi Yazawa
  • Patent number: 10249471
    Abstract: The present invention relates to an automatic sequence for repeatedly performing SEM observation and FIB processing by using a low acceleration voltage for a long time. In order to realize very accurate three-dimensional structure/composition analysis, in the automatic sequence for repeatedly performing sample observation using a scanning electron microscope using a CFE electron source and sample processing using a FIB device, low temperature flushing using the CFE electron source is performed at predetermined timing except for a SEM observation time. According to the present invention, the automatic sequence for repeatedly performing the sample observation using the scanning electron microscope using the CFE electron source and the sample processing using the FIB device can be performed for a long time. Therefore, it is possible to acquire a SEM image which achieves high resolution and improved current stability while the low acceleration voltage is used.
    Type: Grant
    Filed: December 26, 2014
    Date of Patent: April 2, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Toshihide Agemura
  • Patent number: 10247648
    Abstract: The method is for quantification of sub-visible particles. A filter membrane is provided that has a plurality of pores defined therethrough. The filter membrane is in operational engagement with a vacuum chamber. The pores are sealed with a sealant. A sample droplet, containing a liquid and sub-visible particles, is applied onto the filter membrane. The liquid dissolves the sealant in pores disposed directly below the sample droplet. The liquid flows through the pores in which the sealant has been dissolved and the sub-visible particles remain on top of the filter membrane. The particles are enumerated in an electron microscopy.
    Type: Grant
    Filed: October 21, 2016
    Date of Patent: April 2, 2019
    Assignee: Intelligent Virus Imaging Inc.
    Inventors: Rickard Nordstrom, Ida-Maria Sintorn, Lars Haag
  • Patent number: 10241062
    Abstract: The purpose of the present invention is to eliminate the effort in placement and extraction of samples in observations using transmitted charged particles. A charged particle beam device (601) is characterized by having: a charged particle optical lens tube that irradiates a sample (6) with a primary charged particle beam; a sample stage on which a light emitting member (500) that emits light because of charged particles that have come by transmission internally in the sample (6) or scattering therefrom or a sample platform (600) having the light emitting member (500) is attachably and detachably disposed; and a detector (503) that detects the light emitted by the light emitting member.
    Type: Grant
    Filed: January 22, 2014
    Date of Patent: March 26, 2019
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yusuke Ominami, Mitsugu Sato, Kenko Uchida, Sadamitsu Aso, Taku Sakazume, Hideo Morishita, Sukehiro Ito, Takashi Ohshima
  • Patent number: 10224686
    Abstract: A laser apparatus may include: an optical amplifier configured to amplify a laser beam outputted from a master oscillator; an optical-amplifier power supply configured to supply an alternating current for optical amplification to the optical amplifier; and a laser controller. The optical-amplifier power supply may include: an alternating current generation circuit including an inverter circuit configured to change output amplitude in accordance with a duty cycle, the alternating current generation circuit being configured to generate the alternating current from an output of the inverter circuit; and a power supply control circuit configured to hold control information defining correspondence relations between command values from the laser controller and duty cycles of the inverter circuit, determine a duty cycle corresponding to a command value received from the laser controller based on the control information, and provide the determined duty cycle to the inverter circuit.
    Type: Grant
    Filed: November 21, 2016
    Date of Patent: March 5, 2019
    Assignee: Gigaphoton Inc.
    Inventors: Yasufumi Kawasuji, Naoya Takaoka, Toshio Yokozuka
  • Patent number: 10217599
    Abstract: When an emission current is changed, a decrease in brightness of an electron beam is prevented. An electron gun includes a cathode that emits thermoelectrons, a Wehnelt electrode that focuses the thermoelectrons, a control electrode that extracts the thermoelectrons from a distal end of said cathode, an anode that accelerates the thermoelectrons and irradiates a powder with the thermoelectrons as an electron beam, and an optimum condition collection controller that changes at least one of a bias voltage to be applied to the Wehnelt electrode and a control electrode voltage to be applied to the control electrode, and decides a combination of the bias voltage and the control electrode voltage at which the brightness of the electron beam reaches a peak.
    Type: Grant
    Filed: January 9, 2015
    Date of Patent: February 26, 2019
    Assignee: TECHNOLOGY RESEARCH ASSOCIATION FOR FUTURE ADDITIVE MANUFACTURING
    Inventor: Takashi Sato
  • Patent number: 10209216
    Abstract: The present invention provides an electrospray ionization source, which includes: a capillary, including a spray tip; a first electrode which provides the spray tip with a spray voltage; and a second electrode. The electrical potential difference between the first electrode and the second electrode forms a separation electric field, which allows the electric field separation and electrospray ionization of the sample to be accomplished simultaneously, thereby improving the sensitivity of detection.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: February 19, 2019
    Assignee: BEIJING INSTITUTE OF TECHNOLOGY
    Inventors: Wei Xu, Zezhen Zhang, Muyi He, Lili Hu
  • Patent number: 10172576
    Abstract: Radiation shield assemblies for attenuation of X-ray radiation between a patient and attending medical staff are attachable to an examination table for monitoring the patient during X-ray examination procedures.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: January 8, 2019
    Assignee: PLASTICRAFTSMEN LLC
    Inventor: Andrew Shealy