Abstract: A scanning electron microscope (SEM) system includes an SEM objective that emits an electron beam toward a sample, causing emission of charged particles including secondary electrons, Auger electrons, backscattered electrons, anions and cations. The SEM system includes electron optics elements that are configured to establish electric fields around the sample that accelerate charged particles toward a detector. A two-dimensional distribution of locations of incidence of the charged particles on the detector is indicative of energies of the charged particles and their emission angles from the sample. A three-dimensional spatial distribution of charged particles emitted from the sample is recovered by performing an Abel transform over the distribution on the detector. The energies and emission angles of the charged particles are then determined from the three-dimensional spatial distribution.

Abstract: Typically, electron beam radiation therapy aims at delivering a uniform dose to a target volume containing cancer cells. Electron sources typically impinge a spatially uniform flux across the beam onto the patient; however, irregular patient and bolus surfaces, the latter encountered in bolus electron conformal therapy (ECT), scatter electrons unevenly creating non-homogeneous dose distributions in the target. However, spatially-modulated beam intensities can restore target dose homogeneity, as well as enable utilization of other advanced ECT methods. Unfortunately, present methods, which have attempted to spatially-modulate beam intensities, have been either impractical or ineffective. Here, a novel, passive method has been developed to spatially-modulate electron beam intensities by taking advantage of multiple Coulomb scattering. The method utilizes Island Blocks or Island Apertures, strategically located in ‘transparent’ or ‘opaque’ substrates, respectively, which are placed in the beam's path.

Abstract: The disclosed technology relates to a method and apparatus for correctly positioning a probe suitable for scanning probe microscopy (SPM). The probe is positioned relative to the apex region of a needle-shaped sample, such as a sample for atom probe tomography, in order to perform a SPM acquisition of the apex region to obtain an image of the region. In one aspect, the positioning takes place by an iterative process, starting from a position wherein one side plane of the pyramid-shaped SPM probe interacts with the sample tip. By controlled consecutive scans in two orthogonal directions, the SPM probe tip approaches and finally reaches a position wherein a tip area of the probe interacts with the sample tip's apex region.

Abstract: For a sample containing a target component, a product-ion scan measurement in which the m/z value of a known ion originating from the compound is designated as a precursor ion is performed in a measurement unit (1) to acquire profile spectrum data. A peak detector (22) in a data processing unit (2A) detects peaks on the profile spectrum. For each detected peak, a product-ion m/z-value acquirer (23) acquires an m/z value corresponding to the maximum intensity as the m/z value of a product ion. A pseudo MRM measurement data extractor (24) adopts the m/z value of the precursor ion and that of the product ion as an MRM transition, extracts the maximum intensity of the peak originating from the product ion as the signal intensity value on that MRM transition, and stores these data as pseudo MRM measurement data in a memory section (25).

Abstract: An electron beam transport system for controlling the position of two different electron beams comprises: a main electron beam transport module; a first input electron beam transport module; a second input electron beam transport module; and a controller. The main electron beam transport module comprises a beam monitoring device disposed at a measurement position. The first input electron beam transport module comprises a first actuator for applying a perturbation to a transverse position of a first electron beam at a first actuation point. The second input electron beam transport module comprises a second actuator for applying a perturbation to a transverse position of a second electron beam at a second actuation point. The controller is operable to receive a signal from the beam monitoring device and to send control signals to the first actuator and the second actuator.

Abstract: Provided is a measurement method for measuring, in an electron microscope including a segmented detector having a detection plane segmented into a plurality of detection regions, a direction of each of the plurality of detection regions in a scanning transmission electron microscope (STEM) image, the measurement method including: shifting an electron beam EB incident on a sample S under a state where the detection plane is conjugate to a plane shifted from a diffraction plane to shift the electron beam EB on the detection plane, and measuring a shift direction of the electron beam EB on the detection plane with the segmented detector; and obtaining the direction of each of the plurality of detection regions in the STEM image from the shift direction.

Abstract: A water purifier that includes: a water storage tank that includes an interior area and a first opening to the interior area; a cover unit that is configured to cover the first opening and that includes: a frame body that includes a second opening, and a water storage tank cover that is coupled to the frame body and that is configured to rotate about an axis such that the water storage tank cover opens or closes the second opening; a sterilizer that is configured to sterilize water in the water storage tank; a switching module that is configured to control electric power supply to the sterilizer; and an operation member that is configured to control the switching module based on the water storage tank cover being opened or closed is disclosed.

Abstract: Systems and methods are proposed for accurate and efficient automatic measurement of jaw and leaf positioning in multi-leaf collimator imaging systems. Specifically, the method enables the automated and objective processing of images to determine characteristics of collimator jaws and MLC leaves. These novel techniques enable verification of collimator component positioning to ensure accurate beam modulation for radiation application procedures.

Abstract: A data independent acquisition method of mass spectrometry for analyzing a sample within a mass range of interest as it elutes from a chromatography system. The method comprises selecting precursor ions within a mass range of interest to be analyzed, performing at least one MS1 scan of the precursor ions using a Fourier Transform mass analyser and performing a set of MS2 scans by segmenting the precursor ions into a plurality of precursor mass segments, each precursor mass segment having a mass range of no greater than 5 amu, and for each precursor mass segment fragmenting the precursor ions within that precursor mass segment and performing an MS2 scan of the fragmented ions.

Abstract: A quadrupole ion trap apparatus includes a main electrode, a first end-cap electrode, a second end-cap electrode, and a phase-controlled waveform synthesizer. The phase-controlled waveform synthesizer generates a main RE waveform for the main electrode. The main RE waveform includes a plurality of sinuous waveform segments each of which is a part of a sine wave, and a plurality of phase conjunction segments each of which is non-sinuous. Each of the sinuous waveform segments is bridged to another sinuous waveform segment via one of the phase conjunction segments, so as to perform ordering of micro motions of sample ions trapped by the electrodes.

Abstract: Techniques are disclosed for stabilizing soft specimen traditionally considered too fragile for APT instruments. These specimens include biological samples, polymers and other fragile materials. For this purpose, a protective structure is disclosed that surrounds the sides of the specimen by supporting walls while only exposing the very end or terminus of the specimen to the electrostatic field of the APT instrument. The protective structure may take the form of a nanoscale conical grinder which continually machines the specimen to regenerate the terminus of the specimen in-situ. Alternately, the protective structure may take the form of a nanopipette in which the specimen is first frozen before undergoing field evaporation together with the tip of the nanopipette. Heretofore only routinely possible for rigid and hard materials, the design thus extends APT analysis to produce three-dimensional atomic-scale maps of soft specimens.

Abstract: The invention relates to an aberration correcting device for correcting aberrations of focusing lenses in an electron microscope. The device comprises a first and a second electron mirror, each comprising an electron beam reflecting face. Between said mirrors an intermediate space is arranged. The intermediate space comprises an input side and an exit side. The first and second electron mirrors are arranged at opposite sides of the intermediate space, wherein the reflective face of the first and second mirror are arranged facing said intermediate space. The first mirror is arranged at the exit side and the second mirror is arranged at the input side of the intermediate space. In use, the first mirror receives the electron beam coming from the input side and reflects said beam via the intermediate space towards the second mirror. The second mirror receives the electron beam coming from the first mirror, and reflects the electron beam via the intermediate space towards the exit side.

Abstract: Disclosed here is a scanning probe microscope system and method for operating the same for producing scanning probe microscope images at fast scan rates and reducing oscillation artifacts. In some embodiments, an inverse consistent image registration method is used to align forward and backward scan traces for each line of the scanning microscope image. In some embodiments, the aligned forward and backward scan traces are combined using a weighting factor favoring the scan trace with higher smoothness. In some embodiments, the scanning probe microscope image is a potentiometry map and a method is provided to extract from the potentiometry map a conductivity map.

Abstract: A light irradiation device includes a protective tube, which has a wire insertion path therein, a light source unit facing and disposed along an upper part of the protective tube, and a gutter-shaped concave reflection mirror facing the light source unit and provided below the protective tube. The concave reflection mirror is received in a gutter-shaped concave accommodating part provided in a holding body, and has flange portions extending from the outer surface in the horizontal direction. The convex reflection mirror is detachably affixed to the holding body with the flange portions.

Abstract: A data independent acquisition method of mass spectrometry for analysing a sample as it elutes from a chromatography system is disclosed. The method comprises the steps of: ionising the sample to produce precursor ions, selecting a precursor mass range for the sample to be analysed, performing a plurality of MS1 scans and performing at most two sets of MS2 scans. Each of the MS1 scans uses a mass analyser operated at a first, relatively higher resolution, for identification and/or quantitation of the sample in the MS1 domain across the precursor mass range. The set of MS2 scans comprises performing MS2 scans of fragmented mass range segments performed with the mass analyser, operated at a second, relatively lower resolution. In the method, the MS1 scans are interleaved throughout the performing of the set of MS2 scans such that the MS1 scans provide a mass chromatogram of the sample.

Abstract: A source assembly for ion beam production is disclosed herein. An example source assembly may include a pair of plates separated by a distance, with each plate having an aperture, and the respective apertures aligned, and an ionization space defined at least by the distance and the respective apertures, where a ratio of the distance to an ionic mean free path of a gas in the ionization space is greater than one.

Abstract: The present invention relates to a two-dimensional magnetic-optical trap system using frequency and phase modulation with an arbitrary waveform, including: a glass cell; a coil set; and a light source module, wherein the laser source module includes: a cooling laser; a re-pumping laser; a first acousto-optic modulator; a second acousto-optic modulator; and an electro-optical modulator.

Abstract: A glove assembly is provided for coupling an electrically-conductive glove to an enclosure wall of a radio frequency shielded enclosure. Exemplary embodiments of the glove assembly and associated shielded enclosure comprise a glove interface element, a glove and a glove securement element. The glove interface element has a cylindrical flange member, a wall securement portion extending laterally of the flange member, and a glove port extending through the flange member. The glove interface element is configured to be affixed to the enclosure wall. The glove securement element is configured to clampingly secure an open end of the glove to the flange member in mutual RF-signal-sealed engagement. Resultingly, the glove is also held in electrically-conductive communication with the shielding layer of the shielded enclosure by way of the glove interface element. The glove securement element is preferably actuatable to enable a user to selectively cause and release the clamped securement.

Abstract: A fluid sterilization device includes: a straight tube that defines a processing flow passage; a light source that radiates ultraviolet light toward the processing flow passage in an axial direction of the straight tube; and a light receiving part that receives a portion of the ultraviolet light output from the light source. The straight tube is made of a fluororesin. The straight tube includes a recess formed in a part of an outer wall surface of the straight tube such that a thin part is partly provided in the straight tube. The thin part has a radial thickness from an inner wall surface of the straight tube that is smaller than a thickness in other parts. The light receiving part is provided in the recess to receive the ultraviolet light transmitted through the thin part.

Abstract: Atmospheric pressure ion guides are provided. The atmospheric pressure ion guides can include a multi-ring electrode structure connecting a larger opening to a smaller opening and having a series of ring electrodes with decreasing diameter and voltage going from the larger opening to the smaller opening. The electrodes can be made from stainless steel or other suitable conductive material. The multi-ring electrode structure can be contained in a housing, such as a housing made from polyetheretherketone or other suitable thermosetting polymer. The atmospheric pressure ion guide can focus ions from an ion source for use with ion detection devices such as an ion mobility spectrometer or a mass spectrometer. Methods of using the atmospheric pressure ion guides are provided, for example to focus a plurality of ions to be injected into an ion detection device. The atmospheric pressure ion guides can increase the signal intensity of the ion detection device.