Abstract: A method includes determining an alignment error between a discrete component of a discrete component assembly mounted in a laser-assisted transfer system and a target position on a target substrate, the discrete component assembly including the discrete component adhered to a support by a dynamic release layer; based on the alignment error, determining a beam offset characteristic; and providing a signal indicative of the beam offset characteristic to an optical element of the laser-assisted transfer system, the optical element being configured to adjust a position of a beam pattern relative to the discrete component according to the beam offset characteristic.

Abstract: The present invention generally relates to the field of replicating or copying keys. More specifically, the present invention relates to creating a copy of a master key based on a captured image of the master key by using a laser scanning of the master key and decoding the master key based on the captured image. The present invention identifies a set of target key information based on the image of the master key to provide for the cutting of a duplicate key blade copy using a key scanning and cutting system located at a retail or end location. Additional key information may also be captured along with the image of the master key.

Abstract: Embodiments relate to predicting height information for an object. First distance data is determined at a first time when an object is at a first position that is only partially within the field-of-view. Second distance data is determined at a second, later time when the object is at a second, different position that is only partially within the field-of-view. A distance measurement model that models a physical parameter of the object within the field-of-view is determined for the object based on the first and second distance data. Third distance data indicative of an estimated distance to the object prior to the object being entirely within the field-of-view of the distance sensing device is determined based on the first distance data, the second distance data, and the distance measurement model. Data indicative of a height of the object is determined based on the third distance data.

Abstract: Wafer inspection apparatuses and methods are described. The wafer inspection apparatus includes an optical module, at least one wafer holder for carrying a plurality of wafers, and a plurality of optical sensors. The optical module is configured to emit a plurality of light beams for simultaneously scanning the plurality of wafers carried by the at least one wafer holder. The plurality of optical sensors is configured to receive the light beams reflected by the plurality of wafers.

Abstract: Implementations disclosed describe a system including a light source, an optical sensor, and a processing device. The light source directs, during a first time, a probe light into a processing chamber through a window. The light source ceases, during a second time, directing the probe light into the processing chamber through the window. The optical sensor detects, during the first time, a first intensity of a first light. The first light includes a portion of the probe light reflected from the window and a light transmitted from an environment of the processing chamber through the window. The optical sensor detects, during the second time, a second intensity of a second light. The second light includes the light transmitted from the environment of the processing chamber through the window. The processing device determines, using the first intensity and the second intensity, a transmission coefficient of the window.

Abstract: A radiation carrier for carrying at least a radiation beam has, on a surface thereof, at least one excitation grating, for directing at least an excitation radiation beam directionally out of the radiation carrier, thereby illuminating a region of interest; and at least one structure for redirecting emission radiation emanating from the region of interest. Further a sensor is provided comprising at least one such radiation carrier and at least one detector, the structure being adapted for redirecting radiation from the region of interest into the at least one detector.

Abstract: A specimen holding and positioning apparatus operable to substantially non-movably maintain a specimen (e.g., an excised tissue specimen) in a fixed or stable orientation with respect to the apparatus during imaging operations (e.g., x-ray imaging), transport (e.g., from a surgery room to a pathologist's laboratory), and the like for use in facilitating accurate detection and diagnosis of cancers and/or other abnormalities of the specimen.

Abstract: The invention relates to a system and a method for determining the color of teeth or tooth surfaces, wherein the system comprises a 2D or 3D camera and an attachment on said camera, which sets a geometry of a captured image in such a way that, compared to capturing an image without the attachment, the distance, spatial angle and orientation of tooth surfaces relative to the camera are restricted. The attachment according to the invention can in particular be fitted to the camera in a simple manner.

Abstract: A quality detection method for porous metal material is provided, and the method includes: acquiring a sectional image of a porous metal material, converting the sectional image to a grayscale image; obtaining a shadow region of each of pore regions and a correction weight value of the shadow region to determine a first qualification index; acquiring an optimal preset clustering K value, and determining a pore diameter distribution uniformity index, and determining a second qualification index based on the pore diameter distribution uniformity index; determining a quality evaluation index of the porous metal material based on the first qualification index and the second qualification index; and determining whether quality of the porous metal material is qualified based on the quality evaluation index. The method realizes the quality detection of the porous metal material and effectively improves the accuracy of the quality detection result of the porous metal material.

Abstract: The disclosure discloses a high-flux and ultra-sensitive detection dot array enhancement chip, and belongs to the field of food safety detection. In the disclosure, single-layer Au nano-particles are chemically bonded onto a hydrophilic substrate, an Au nano-material is naturally deposited in holes of the chip under an electrostatic adsorption action, and a regular dot array is formed. Au particles distributed in the holes are separated with a particle surfactant (CTAB) to form plasma gaps so as to enhance the self-assemble of Au nano-particles distributed on hot-spots for a long range effect, thereby improving the sensing signal in detection efficiency and sensitivity of the chip.

Abstract: An illumination system and method for illumination of a sample in a container is described herein. In some embodiments, the container includes a defined volume for receiving the sample. The illumination system includes, in some embodiments, at least one light source, a mask comprising an opaque portion, preventing light from passing through the mask, and an at least partially transparent portion, allowing light to pass through the mask. The illumination system can be adapted to be positioned such that the light generated by the light source, passing through the mask, illuminates the sample in the container. The light source and the mask are configured such that a shape, a size, and a position of a projection of the light passing through the mask, onto a plane of a bottom surface of the container, match a shape, a size, and a position of the bottom surface.

Abstract: Provided is a method for inspecting containers, wherein the containers are conveyed along a predetermined transport path by a transport device and wherein an image recording device takes at least one locally resolved inspection image of at least one area of the containers during transport of the containers. A triggering of the inspection image recording of this locally resolved image is controlled, wherein this controlling takes place in consideration of a triggering image recording of an image of the container.

Abstract: An illumination system for illuminating a lumen within a body of a patient comprising a tube having a proximal end and an opposed distal end and an internal chamber, the tube being configured for placement within a lumen of the body. The system also includes an illumination subsystem including an optical fiber that is sized and configured to seat within the internal chamber of the tube and a light source for generating light that is emitted by the fiber optic cable. The optical fiber, when mounted within the tube and when the light source generates light, emits light at the distal end of the tube so as to transilluminate the lumen and surrounding tissue so as to be able to locate the distal end of the tube within the lumen of the patient.

Abstract: Provided is an evaluation method of a semiconductor wafer having a polished surface, the method including a cleaning process of cleaning the semiconductor wafer with one or more kinds of cleaning liquid, measuring an LPD of the polished surface both before and after the cleaning process with a laser surface inspection device, and distinguishing the type of defect or foreign substance measured as the LPD, based on measurement results obtained in the measuring, according to distinguishing standards shown in Table A.

Abstract: A flow path device includes a first portion, and a second portion. The first portion includes a resin first body and a first reinforcement. In the first body, a first connector connects a first outer portion and a first joint having a groove pattern defining a first flow path. The first reinforcement is between and bonded to the first outer portion and the first joint, and includes first protrusions protruding from the first body and including two specific-shaped portions. The second portion includes a resin second body and a second reinforcement. In the second body, a second connector connects a second outer portion and a second joint, and through-holes connect to the first flow path. The second reinforcement is between and bonded to the second outer portion and the second joint, and includes second protrusions protruding from the second body and including two specific-shaped portions.

Abstract: Sample cells, light scattering detectors utilizing the sample cells, and methods for using the same are provided. The sample cell may include a body defining a flowpath extending axially therethrough. The flowpath may include a cylindrical inner section interposed between a first outer section and a second outer section. The first outer section may be frustoconical. A first end portion of the first outer section may be in direct fluid communication with the inner section and may have a cross-sectional area relatively smaller than a cross-sectional area at a second end portion thereof. The body may further define an inlet in direct fluid communication with the inner section. The inlet may be configured to direct a sample to the inner section of the flowpath.

Abstract: A method of foreign object debris discrimination includes illuminating a particle located within a sensing volume with a modulated electromagnetic radiation pulse emitted from a source; receiving one or more electromagnetic radiation return signals that have been scattered by the particle illuminated by the modulated electromagnetic radiation pulse at a detector; mixing, using a controller, the electromagnetic radiation return signal of amplitude IRS and frequency fRS with a reference signal of amplitude ILS and frequency fRS; analyzing, using the controller, an amplitude of the mixed signal ?{square root over (ILSIRS)}, and frequency of the mixed signal, fRS?fLS; and classifying, using the controller, a particle position, a velocity, and electromagnetic characteristic of the particle based on the amplitude, ?{square root over (ILSIRS)}, and frequency, fRS?fLS of the mixed signal.

Abstract: Methods and systems for monitoring the quality of a semiconductor measurement in a targeted manner are presented herein. Rather than relying on one or more general indices to determine overall measurement quality, one or more targeted measurement quality indicators are determined. Each targeted measurement quality indicator provides insight into whether a specific operational issue is adversely affecting measurement quality. In this manner, the one or more targeted measurement quality indicators not only highlight deficient measurements, but also provide insight into specific operational issues contributing to measurement deficiency. In some embodiments, values of one or more targeted measurement quality indicators are determined based on features extracted from measurement data.

Abstract: Systems and methods are described for securing fabric, paper, and film samples for analysis by laser ablation. A method embodiment includes, but is not limited to, securing a thin, solid sample with a sample holder system, the sample holder system configured to hold the thin, solid sample in a taut configuration between a piston and a sample holder base; transferring the sample holder system to a laser ablation system; and ablating at least a portion of the thin, solid sample in the taut configuration with the laser ablation system to provide an ablated sample.

Abstract: A utility pole deterioration detection system includes a cable (20) disposed in a utility pole (10), the cable (20) containing a communication optical fiber, a receiving unit (331) configured to receive an optical signal containing a pattern that changes according to a deterioration state of the utility pole (10) from at least one optical fiber contained in the cable (20), and a detection unit (332) configured to detect a deterioration state of the utility pole (10) based on the pattern.