Patents Examined by Tri T Ton
  • Patent number: 11965834
    Abstract: A device for dark-field optical inspection of a substrate comprises: a light source for generating an incident beam that is projected onto an inspection zone of the substrate and that is capable of being reflected in the form of diffuse radiation; at least one first and one second collecting device; and a reflecting device for directing at least a portion of the diffuse radiation originating from a focal point of collection coincident with the inspection zone in the direction of the collecting devices, with a first and second reflective zone from which a first portion of the diffuse radiation is directed toward a first focal point, which is optically conjugated with the focal point of collection, and a second portion of the diffuse radiation is reflected toward a second focal point, which is optically conjugated with the collection focal point and distinct from the first focal point of detection.
    Type: Grant
    Filed: September 20, 2019
    Date of Patent: April 23, 2024
    Assignee: Unity Semiconductor
    Inventor: Mayeul Durand de Gevigney
  • Patent number: 11959738
    Abstract: An apparatus and method for inspecting an object by optical triangulation, where the signal of interest in a captured image corresponds to an interaction between a light beam and an environment surrounding the object rather than between a light beam and the object itself. The surrounding environment may be configured to interact in a manner that is detectable by filling it with a flowable scattering medium, e.g. a gas, mist or vapour comprising a suspension of fine particles in air. Light that is scattered by the flowable scattering medium is visible in a captured image. Where the flowable scattering medium is not present, e.g. because the object blocks it, the scattered signal is less. A boundary of a scattered signal region may thus provide information about the location of an object.
    Type: Grant
    Filed: September 15, 2021
    Date of Patent: April 16, 2024
    Assignee: Third Dimension Software Limited
    Inventors: Timothy Peter Monks, Jeremy William Riley, Michael Thomas Briggs
  • Patent number: 11953415
    Abstract: A method and a system for determining analyte content in a fluid in a treatment apparatus. The method comprises positioning a device for treatment in a treatment apparatus. A surface of the device is contacted with a fluid. An analyte content in the fluid is determined based on an electromagnetic property of the fluid following contacting the surface of the device with the fluid. More specifically, an electromagnetic property is measured. The measuring comprises emitting electromagnetic radiation into the fluid in the treatment apparatus and detecting electromagnetic radiation from the fluid. In another aspect, a system comprising a treatment apparatus and a detector for determining the analyte content in the fluid in the treatment apparatus is provided.
    Type: Grant
    Filed: November 11, 2019
    Date of Patent: April 9, 2024
    Assignee: ASP Global Manufacturing GMBH
    Inventors: Benjamin Fryer, Roger Vu, Joon Lee
  • Patent number: 11953449
    Abstract: A visual inspection device including a pinhole lens optically coupled to a sensor is provided. The pinhole lens has a pinhole placed at the distal end of the lens to capture the rays from an object to be inspected, a front optical group receiving the rays which cross the pinhole, and a rear optical group. The front optical group is configured to focus, on the rear optical group, the rays which cross the pinhole. The rear optical group is configured to focus, on the sensor, the rays received from the front optical group.
    Type: Grant
    Filed: July 18, 2022
    Date of Patent: April 9, 2024
    Assignee: Opto Engineering S.p.A.
    Inventor: Claudio Sedazzari
  • Patent number: 11950880
    Abstract: An intraoral scanner comprises a light source for generating light, an optics system for focusing the light, and a light-guiding part having an entrance and an exit. The light source, the optics system and the light-guiding part are arranged such that the light passes through the optics system, enters the light-guiding part via the entrance, and exits the light-guiding part via the exit. The optics system is configured such that, upon entering the light-guiding part, an outermost chief ray of the light with respect to an optical axis of the optics system is divergent to the optical axis and an outermost marginal ray of the light with respect to the optical axis is parallel or divergent to the optical axis.
    Type: Grant
    Filed: March 24, 2023
    Date of Patent: April 9, 2024
    Assignee: Align Technology, Inc.
    Inventors: Yossef Atiya, Tal Verker, Nir Makmel
  • Patent number: 11946858
    Abstract: The purpose of the present invention is to allow a clean airflow around a substrate to reliably move downward of the substrate in an examination device in which clean air is supplied to an inspection chamber. This examination device is provided with a rectifying plate (see FIG. 4A) which covers a part of the upper surface of a stage for mounting a substrate, and is disposed between a gas supply unit and the stage to block an airflow toward the substrate.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: April 2, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Yoshihiro Satou, Toshio Masuda, Hitoshi Matsuno, Kei Shibayama, Osamu Yoshimura, Yuichirou Iijima
  • Patent number: 11946733
    Abstract: An image rendering device and an image rendering method are disclosed. For the elements of the image rendering device, a first sensor and a second sensor are configured to sense a target object in a two-dimensional (2D) mode and three-dimensional (3D) mode to generate a first surface-color-signal, a first 3D-depth-signal, a second surface-color-signal and a second 3D-depth-signal respectively. An IR projector is configured to generate an IR-dot-pattern. A processor is configured to control the IR projector to project the IR-dot-pattern on the target object in the 3D mode, and configured to process the first surface-color-signal, the second surface-color-signal, the first 3D-depth-signal and the second 3D-depth-signal to obtain a color 3D model of the target object.
    Type: Grant
    Filed: October 14, 2021
    Date of Patent: April 2, 2024
    Assignee: EYS3D MICROELECTRONICS CO.
    Inventors: Kuan-Cheng Chung, Tsung-Yi Huang, Shi-Fan Chang
  • Patent number: 11940378
    Abstract: A spectrometer system comprises a housing provided with a window, an illumination source, a spectrometer and a standard for internal recalibration being disposed in said housing. Specific absorption bands of a filling gas present in the housing are identified in a reference spectrum, which was recorded using the standard, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the absorption bands. A test spectrum is recorded by the spectrometer using the standard. The specific absorption bands of the filling gas are identified in the test spectrum, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the specific absorption bands.
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: March 26, 2024
    Assignee: CARL ZEISS SPECTROSCOPY GMBH
    Inventors: Felix Kerstan, Juergen Gobel
  • Patent number: 11940322
    Abstract: The present invention relates to a device for classifying a light source, comprising: a sensor adapted to receive a luminous flux emitted by a light source, the sensor comprising a plurality of pixels grouped in sets, each set comprising a first pixel and a second pixel adjacent to the first pixel, each first pixel being adapted to generate a first signal relating to a first portion of luminous flux in a first spectral band received by said first pixel, each second pixel being adapted to generate a second signal relating to a second portion of luminous flux in a second spectral band received by said second pixel, a computer configured to compare the first and second signals and to classify the emitting light source according to the result of the comparison.
    Type: Grant
    Filed: July 15, 2020
    Date of Patent: March 26, 2024
    Assignee: THALES
    Inventors: Paul Thibout, Thierry Midavaine, Guillaume Bloom, Yves Courcol, Olivier Verdy
  • Patent number: 11933788
    Abstract: Determining a state of a fungal spore includes defining types of fluorescent biomolecules of interest within the spore. Color characteristics of fluorescent light corresponding to excitement of the fluorescent biomolecules of interest under UV light are stored. Air including the fungal spore is directed to a collection cartridge and trapped. The spore is illuminated with light including UV light. A color image of the spore is captured and analyzed to estimate concentrations of the fluorescent biomolecule of interest. The state of the spore is determined from the estimated concentrations.
    Type: Grant
    Filed: April 10, 2023
    Date of Patent: March 19, 2024
    Assignee: Scanit Technologies, Inc.
    Inventors: Pedro Manautou, Joel Kent
  • Patent number: 11933601
    Abstract: An automated method measures geometric curvature deviations between dished surfaces of a plurality of materials to be assessed and a dished surface of a reference material. The method calculates, by computer, at selected points, a difference between the curvature profiles of the dished surface of each material to be assessed and a relief height or curvature profile of the dished surface of the reference material.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: March 19, 2024
    Assignee: SAINT-GOBAIN GLASS FRANCE
    Inventors: Adrien Carlu, Alexandre Marlier
  • Patent number: 11920920
    Abstract: Described herein is a projector and illumination module configured for scene illumination and pattern projection. The projector and illumination module includes at least one array of a plurality of individual emitters and at least one optical system. Each of the individual emitters is configured for generating at least one illumination light beam. The at least one optical system includes at least one array of a plurality of transfer devices. The at least one array of the plurality of transfer devices includes at least one transfer device for each of the individual emitters. The at least one array of the plurality of transfer devices includes at least two groups of transfer devices. The transfer devices of one of the groups are configured for generating at least one illumination pattern. The transfer devices of the other group are configured for generating diverging light beams.
    Type: Grant
    Filed: June 22, 2021
    Date of Patent: March 5, 2024
    Assignee: TRINAMIX GMBH
    Inventors: Hamed Hamid Muhammed, Philipp Nils Raith, Benjamin Rein, Friedrich Schick
  • Patent number: 11920978
    Abstract: A method of detecting pulsed radiation comprising the steps of irradiating at least a portion of an array of sensor elements with pulsed radiation (71); addressing the array using a rolling shutter operation (72); reading the array to obtain a radiation image (73); and then applying a pulse detection operation (74) to the radiation image. The rolling shutter operation (72) is configured to address each element line of the array for a predetermined integration period. The predetermined integration period being calculated using an integration period function, itself a function of an anticipated pulse repetition interval of the pulsed radiation. The method and apparatus for the same enable low cost camera arrays to be used for pulse detection and for wider application in the field of low cost communications.
    Type: Grant
    Filed: May 22, 2019
    Date of Patent: March 5, 2024
    Assignee: The Secretary of State for Defence
    Inventors: Sean Michael Tsi-Ong Tipper, Christopher David Burgess
  • Patent number: 11913775
    Abstract: The present invention provides an intra-hoistway measurement system automatically measuring dimensions within an elevator hoistway prior to elevator installation to reduce labor of workers. An intra-hoistway measurement system according to the present invention includes: a reference laser device that is mounted to a structure on a ceiling or in an upper portion of the hoistway for an elevator and emits a laser beam toward a lowermost part; a mobile measuring device that has a plane measuring device to measure horizontal dimensions within the hoistway; and a moving device that is mounted to the structure on the ceiling or in the upper portion of the hoistway and moves the mobile measuring device up and down. The mobile measuring device has a reference laser detection device that detects the laser beam emitted from the reference laser device, and an attitude detection device that detects its own attitude.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: February 27, 2024
    Assignee: HITACHI BUILDING SYSTEMS CO., LTD.
    Inventors: Toshiaki Hatano, Daisuke Matsuka, Makoto Hattori, Yuta Hamada, Hirofumi Taguchi, Masato Itou
  • Patent number: 11913888
    Abstract: A solid immersion lens unit includes a solid immersion lens having a contact surface for coming into contact with semiconductor device formed of a silicon substrate and a spherical surface to be disposed to face an objective lens; a holder holding the solid immersion lens; and an optical element held by the holder to be positioned between the objective lens and the solid immersion lens. The solid immersion lens transmits light having at least a part of wavelength in a range of 200 nm or greater and 1100 nm or lower. The optical element corrects aberration caused by a difference in refractive indices between the silicon substrate and the solid immersion lens.
    Type: Grant
    Filed: April 9, 2019
    Date of Patent: February 27, 2024
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Xiangguang Mao, Masanori Kobayashi, Hirotoshi Terada, Ikuo Arata, Masataka Ikesu
  • Patent number: 11912974
    Abstract: An assembly and method to precisely and concurrently control the concentration, release, and depletion of chemical and biochemical species in localized regions in a three-dimensional volume of material using spatially patterned light. The system includes a container for holding a material comprising photo-responsive substance; the container is mounted to a motorized rotation stage that rotates the container along the z-axis at a predetermined rate; and a projector configured to project radiations at predefined wavelengths along an r-axis into the container while the container is rotating, wherein the radiations from multiple angles intersect to form localized photoreactive regions within a volume of the material.
    Type: Grant
    Filed: October 25, 2022
    Date of Patent: February 27, 2024
    Inventor: Hossein Heidari
  • Patent number: 11908123
    Abstract: An object inspection apparatus according to an embodiment disclosed herein includes: a first flipper apparatus configured to rotate a first object; a second flipper apparatus configured to rotate a second object; and a single camera device configured to move from a position corresponding to one of the first flipper apparatus and the second flipper apparatus to a position corresponding to the other, the camera device being configured to inspect object surfaces of the first object and the second object. Each of the first flipper apparatus and the second flipper apparatus includes at least one flipper unit.
    Type: Grant
    Filed: April 16, 2019
    Date of Patent: February 20, 2024
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Choung Min Jung, Ho Jun Lee, Nam Kyu Park, Han Rim Kim
  • Patent number: 11908967
    Abstract: A light-emitting device includes one or more light-emitting units each including a light-emitting element including a function of a thyristor; an electrode for light emission to which a first voltage is applied for light emission of the light-emitting unit; and one or more light emission permission thyristors that permit the light-emitting element to emit light by a second voltage that is lower than the first voltage and set irrespective of the first voltage.
    Type: Grant
    Filed: August 19, 2021
    Date of Patent: February 20, 2024
    Assignee: FUJIFILM Business Innovation Corp.
    Inventors: Takashi Kondo, Seiji Ono, Daisuke Iguchi, Tomoaki Sakita
  • Patent number: 11906407
    Abstract: Provided is a flow analyzer and a flow analysis method each of which makes it possible to stably and continuously measure a sample. The flow analyzer and the flow analysis method each include: a marker introducing device (2) which is for introducing a marker into a tube (3); and a marker detecting device (5) which detects the marker and outputs a detection signal to an analyzing device (4), the analyzing device (4) acquiring analysis data on the basis of the detection signal.
    Type: Grant
    Filed: March 31, 2021
    Date of Patent: February 20, 2024
    Assignee: BL TEC K.K.
    Inventors: Takashi Nishimura, Kazuo Masaki
  • Patent number: 11906442
    Abstract: An exemplary embodiment of the present invention provides a foreign substance inspection system for a display unit, including: a lighting unit configured to provide incident light to a display unit having an organic light emitting display panel; and a foreign substance detecting unit configured to receive incident light that is reflected by the display unit and detect whether a foreign substance is introduced into the display unit.
    Type: Grant
    Filed: June 21, 2019
    Date of Patent: February 20, 2024
    Assignee: LG CHEM, LTD
    Inventors: Beom Seok Lee, Chan Soo Kim, Eung Jin Jang, Sung Hyun Baek, Yu Jin Lim