Patents Examined by Tri T Ton
  • Patent number: 11493229
    Abstract: A detector assembly for a duct of a heating ventilation and air conditioning system includes an outer housing having at least one through hole formed therein, an inner sampling support receivable within a hollow interior of the outer housing, and at least one detector mounted to the inner sampling support. The at least one detector is axially aligned with the at least one through hole when the inner sampling support is installed within the hollow interior of the outer housing. The at least one detector is operable to sample air within the duct to detect a hazardous condition.
    Type: Grant
    Filed: March 16, 2020
    Date of Patent: November 8, 2022
    Assignee: CARRIER CORPORATION
    Inventors: David L. Lincoln, Marcin Piech, Slade R. Culp, Joseph Anthony Vidulich, Rick Wolf, Michael J. Birnkrant, Michael T Gorski, Kyle Aaron, Devis Dishnica
  • Patent number: 11493494
    Abstract: System and method for detecting the presence at a distance of materials utilizing the atomic structure and characteristics of the elements in the chemicals comprising the material.
    Type: Grant
    Filed: November 27, 2019
    Date of Patent: November 8, 2022
    Assignee: USA SANDS, LLC
    Inventors: Richard D. Wilson, Axel James Perez, Dennis Duke
  • Patent number: 11484282
    Abstract: Exemplary method and apparatus embodiments according to the applications can provide calibration of a dental scanning device. An exemplary dental apparatus can include a sensing apparatus including at least one lens and a sensor that is configured to obtain one or more images of at least one surface position, and a calibration target including a spatial light modulator configured to form a prescribed set of calibration patterns, and whose display plane corresponds to the at least one surface position.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: November 1, 2022
    Inventors: Victor Wong, Chuanmao Fan
  • Patent number: 11486834
    Abstract: Disclosed are a substrate inspection method and a method of fabricating a semiconductor device using the same. The inspection method may include measuring a target area of a substrate using a pulsed beam to obtain a first peak, measuring a near field ultrasound, which is produced by the pulsed beam in a near field region including the target area, using a first continuous wave beam different from the pulsed beam to obtain a second peak, and measuring a far field ultrasound, which is produced by the near field ultrasound in a far field region outside the near field region, using a second continuous wave beam to examine material characteristics of the substrate.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: November 1, 2022
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Younghoon Sohn, Yusin Yang, Chihoon Lee
  • Patent number: 11486819
    Abstract: A detection assembly and a method for producing a detection assemblies are disclosed. In an embodiment a detection arrangement includes an emitter configured to generate radiation having a peak wavelength in an infrared spectral range, a detector configured to receive the radiation, a mounting surface comprising at least a first contact surface and a second contact surface for external electrical connection of the detection arrangement, a form body adjoining the emitter and the detector at least in places and deflection optics, on which the radiation impinges during operation of the detection arrangement so that an optical path is formed between the emitter and the detector by the deflection optics, wherein the deflection optics include a scattering body into which the radiation enters during the operation through a surface of the scattering body facing the emitter.
    Type: Grant
    Filed: August 3, 2017
    Date of Patent: November 1, 2022
    Assignee: OSRAM OLED GMBH
    Inventors: Frank Singer, Matthias Sperl
  • Patent number: 11480522
    Abstract: A method and system for optical vortex transmissometry. The method uses optical orbital angular momentum (OAM) and optical vortices to discriminate coherent non-scattered light from incoherent scattered light. The system includes a laser which transmits a Gaussian laser beam through a medium. An OAM generating device is placed before a photodetector receiver. Coherent, non-scattered light passing through the OAM generating device forms an optical vortex, used to discriminate against the unwanted scattered signal that does not form a vortex. Alternatively, the system includes a transmitter, which generates one or more OAM modes, which are transmitted through a turbid medium. At the receiver, an OAM detection device analyzes the OAM mode spectrum of the received light. Coherent non-scattered light retains the OAM encoded at the transmitter, while scattered light does not. The attenuation of the channel is determined by comparison of the received OAM mode spectrum relative to the transmitted OAM mode spectrum.
    Type: Grant
    Filed: November 6, 2020
    Date of Patent: October 25, 2022
    Assignee: The United States of America, as represented by the Secretary of the Navy
    Inventors: Brandon Cochenour, Amanda Alley, Alan Edward Laux, Linda Mullen
  • Patent number: 11480068
    Abstract: A system for use in servicing a turbomachine, the system including a first tubular body including an interior channel, and a second tubular body. The first and second tubular bodies are bendable between a neutral shape and a biased shape. The bodies are bent when in the neutral shape. The second tubular body includes a tip end, and the second tubular body is translatable within the interior channel. The first tubular body and the second tubular body are rotatable to selectively orient the tip end in multiple degrees of freedom. The system also includes a steering cable extending from the tip end, wherein the steering cable biases the tip end for selective orientation in additional degrees of freedom.
    Type: Grant
    Filed: October 15, 2019
    Date of Patent: October 25, 2022
    Assignee: General Electric Company
    Inventors: Deepak Trivedi, Don Mark Lipkin, Rebinth Jose Robin, Shivakumar Basavanna, Andrew Crispin Graham
  • Patent number: 11474095
    Abstract: A device for assessing changes in erythrocyte deformability, such as erythrocyte sickling tendency in a controlled hypoxic atmosphere, comprising: an at least partially transparent inner wall, an at least partially transparent outer wall extending parallel with the inner wall, wherein a gap is present between the inner and outer walls for receiving a blood sample, wherein one of said walls is movable parallel to and relative to the other one of said walls so as to exert a shear force to the sample in the gap, a light source arranged to emit light in a perpendicular direction through overlapping transparent parts of the inner and outer walls, a camera arranged to observe the light from the light source after it is emitted through said transparent parts of the inner and outer walls in order to detect and assess a diffraction pattern therein when a blood sample is present in said gap and the movable wall is being moved, and an oxygen sensor arranged to be in contact with the blood sample in the gap between the i
    Type: Grant
    Filed: October 24, 2018
    Date of Patent: October 18, 2022
    Assignee: R&R Mechatronics International B.V.
    Inventors: Sisto Hendriks, Juan Pedro De Zoeten, Hans Van De Bospoort
  • Patent number: 11460391
    Abstract: A particle collection cartridge includes a first side having a particle intake region, a second side having a particle inspection region, supply and uptake reels, a tape guide, tape, a first pin, and a second pin. The tape is wound about the supply reel, extends to the first pin, across the tape guide, to the second pin, and terminates at the uptake reel. The tape includes an adhesive surface to collect particles entering the particle intake region. The first and second pins are fixed to not rotate.
    Type: Grant
    Filed: April 30, 2020
    Date of Patent: October 4, 2022
    Assignee: SCANIT TECHNOLOGIES, INC.
    Inventors: Pedro Manautou, Felix Wynn, Keith Nordman, Dave Graham
  • Patent number: 11460577
    Abstract: A distance measuring device comprises a measuring head, the measuring head having an optical measuring system for carrying out an optical measurement process on a measurement object by means of at least one measuring light beam formed from a broad-band measuring light. The measuring head further has a liquid guide with a liquid inlet and a liquid outlet for producing a jet of liquid directed at the measurement object, the liquid guide being designed such that in certain sections at least the measuring light beam runs essentially along the jet of liquid. The measuring head further has a flow element with a laminar flow channel, the flow element being designed such that the at least one measuring light beam is able to reach the measurement object by passing through the laminar flow channel.
    Type: Grant
    Filed: November 8, 2018
    Date of Patent: October 4, 2022
    Inventor: Christoph Dietz
  • Patent number: 11454594
    Abstract: The invention discloses a method for identifying frostbite condition of grain seeds using the spectral feature wavebands of the grain seed embryo hyperspectral images. At first, hyperspectral image of the grain seed in the embryo side is collected, and the hyperspectral image in the embryo region of the grain seed is obtained. Then the average spectra is calculated and the wavebands containing noise are eliminated, the spectral feature wavebands are extracted by using related algorithm and the spectra value corresponding with the waveband is obtained. Next, the feature waveband spectral value and the category label of the known frostbite category grain seed are input into the classification model for obtaining the optimal training classification model. Finally, the feature waveband spectral value of each unknown frostbite category grain seed is input into the established model, the frostbite condition of seed is identified.
    Type: Grant
    Filed: March 12, 2019
    Date of Patent: September 27, 2022
    Assignee: ZHEJIANG UNIVERSITY
    Inventors: Fang Cheng, Jun Zhang, Limin Dai
  • Patent number: 11448498
    Abstract: A three-dimensional reconstruction system and a three-dimensional reconstruction method, the system includes: a carrier device which includes a rotatable support and a carrier arranged on the rotatable support, the rotatable support is provided with a rotational axis; a data acquisition device spaced apart from the carrier and configured to collect reflective light data of an object on the carrier when the rotatable support rotates to a corresponding angle and to obtain single-visual-angle data of the object at the corresponding angle; and a data processing device connected with the data acquisition device and configured to perform three-dimensional reconstruction according to the single-visual-angle data and a reconstruction algorithm.
    Type: Grant
    Filed: March 27, 2018
    Date of Patent: September 20, 2022
    Assignee: SKYVERSE LIMITED
    Inventors: Lu Chen, Qinggele Li, Song Zhang, Su Lv, Zike Han
  • Patent number: 11441970
    Abstract: A measurement apparatus (10) for measuring a wavefront aberration of an imaging optical system (12) includes (i) a measurement wave generating module (24) which generates a measurement wave (26) radiated onto the optical system and which includes an illumination system (30) illuminating a mask plane (14) with an illumination radiation (32), as well as coherence structures (36) arranged in the mask plane, and (ii) a wavefront measurement module (28) which measures the measurement wave after passing through the optical system and determines from the measurement result, with an evaluation device (46), a deviation of the wavefront of the measurement wave from a desired wavefront. The evaluation device (46) determines an influence of an intensity distribution (70) of the illumination radiation in the region of the mask plane on the measurement result and, when determining the deviation of the wavefront, utilizes the influence of the intensity distribution.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: September 13, 2022
    Assignee: CARL ZEISS SMT GMBH
    Inventors: Albrecht Ehrmann, Helmut Haidner, Michael Samaniego
  • Patent number: 11442025
    Abstract: An interferometer and an imager may include a tunable light source, a beam splitter, a digital imager, and a processor system. The tunable light source may be configured to emit a beam. The beam splitter may be configured to direct the beam toward a sample with a floor surface and a raised surface feature. The digital imager may be configured to receive a reflected beam and to generate an image based on the reflected beam. The reflected beam may be a coherent addition of a first reflection of the beam off a reference plate and a second reflection of the beam off the raised surface feature and third reflection of the beam off the floor surface. The processor system may be coupled to the digital imager and may be configured to determine a distance between the reference surface and the feature surface based on the image.
    Type: Grant
    Filed: March 25, 2022
    Date of Patent: September 13, 2022
    Inventor: Arun Anath Aiyer
  • Patent number: 11441992
    Abstract: Examples disclosed herein generally relate to systems and methods for detecting the size of a particle in a fluid. In one example, a system for imaging a particle includes a first imaging device. The first imaging device includes a lens and a digital detector. The system further includes a laser source. He laser source is configured to emit a first laser beam and a second laser beam. The digital detector is configured to accumulate a metric of an intensity of an accumulated light that passes through the lens. The accumulated light is scattered from the particle. The accumulated light includes light from the first laser beam and the second laser beam.
    Type: Grant
    Filed: May 27, 2020
    Date of Patent: September 13, 2022
    Assignee: Applied Materials, Inc.
    Inventors: Mehdi Vaez-Iravani, Todd Egan, Guoheng Zhao
  • Patent number: 11435298
    Abstract: In some examples, a system receives a first image of a circuit board produced by a first production stage, and compares the first image to a second image of the circuit board acquired at a second production stage for the circuit board. The system indicates an anomaly with the circuit board based on the comparing.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: September 6, 2022
    Assignee: Hewlett Packard Enterprise Development LP
    Inventors: David A. Moore, Jonathon Hughes, Michael L. Mixon, Gretchen La Fontaine Otero, Niysaan E. Vlasak
  • Patent number: 11435278
    Abstract: Various embodiments include an exemplary design of a high-temperature condensation particle counter (HT-CPC) having particle-counting statistics that are greatly improved over prior art systems since the sample flow of the disclosed HT-CPC is at least eight times greater than the prior art systems. In one embodiment, the HT-CPC includes a saturator block to accept directly a sampled particle-laden gas flow, a condenser block located downstream and in fluid communication with the saturator block, an optics block located downstream and in fluid communication with the condenser block, and a makeup-flow block having a concentric-tube design located in fluid communication with and between the condenser block and the optics block. The makeup-flow block being configured to reduce volatile contents from re-nucleating in the optics block. Other designs and apparatuses are disclosed.
    Type: Grant
    Filed: September 20, 2019
    Date of Patent: September 6, 2022
    Assignee: TSI Incorporated
    Inventor: Hee-Siew Han
  • Patent number: 11421981
    Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.
    Type: Grant
    Filed: September 10, 2019
    Date of Patent: August 23, 2022
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Hung-Yu Chou, Chien-Hao Wang, Tse-Tsun Chiu, Fu-Kang Lee, Liang-Kang Su
  • Patent number: 11422089
    Abstract: A method of determining the transmittance of a transparent article (250) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected or emitted by reference surface (80) with an intensity measuring device (400), positioning the transparent article (250) over the reference surface (80), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the transparent article (250) that is reflected or emitted by a region (110) of the reference surface (80) that is covered by the transparent article (250) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: August 23, 2022
    Assignee: Transitions Optical, Ltd.
    Inventors: Forrest R. Blackburn, Joshua Hazle
  • Patent number: 11415526
    Abstract: An inspection system is disclosed. The inspection system includes a shared memory configured to receive image data from a defect inspection tool and a controller communicatively coupled to the shared memory. The controller includes a host image module configured to apply one or more general-purpose defect-inspection algorithms to the image data using central-processing unit (CPU) architectures, a results module configured to generate inspection data for defects identified by the host image module, and secondary image module(s) configured to apply one or more targeted defect-inspection algorithms to the image data. The secondary image module(s) employ flexible sampling of the image data to match a data processing rate of the host image module within a selected tolerance. The flexible sampling of the image data is adjusted responsive to the inspection data generated by the results module and the host image module.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: August 16, 2022
    Assignee: KLA Corporation
    Inventors: Brian Duffy, Mark Roulo, Ashok Mathew, Jing Zhang, Kris Bhaskar