Patents Examined by Tri T Ton
  • Patent number: 11913888
    Abstract: A solid immersion lens unit includes a solid immersion lens having a contact surface for coming into contact with semiconductor device formed of a silicon substrate and a spherical surface to be disposed to face an objective lens; a holder holding the solid immersion lens; and an optical element held by the holder to be positioned between the objective lens and the solid immersion lens. The solid immersion lens transmits light having at least a part of wavelength in a range of 200 nm or greater and 1100 nm or lower. The optical element corrects aberration caused by a difference in refractive indices between the silicon substrate and the solid immersion lens.
    Type: Grant
    Filed: April 9, 2019
    Date of Patent: February 27, 2024
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Xiangguang Mao, Masanori Kobayashi, Hirotoshi Terada, Ikuo Arata, Masataka Ikesu
  • Patent number: 11912974
    Abstract: An assembly and method to precisely and concurrently control the concentration, release, and depletion of chemical and biochemical species in localized regions in a three-dimensional volume of material using spatially patterned light. The system includes a container for holding a material comprising photo-responsive substance; the container is mounted to a motorized rotation stage that rotates the container along the z-axis at a predetermined rate; and a projector configured to project radiations at predefined wavelengths along an r-axis into the container while the container is rotating, wherein the radiations from multiple angles intersect to form localized photoreactive regions within a volume of the material.
    Type: Grant
    Filed: October 25, 2022
    Date of Patent: February 27, 2024
    Inventor: Hossein Heidari
  • Patent number: 11913775
    Abstract: The present invention provides an intra-hoistway measurement system automatically measuring dimensions within an elevator hoistway prior to elevator installation to reduce labor of workers. An intra-hoistway measurement system according to the present invention includes: a reference laser device that is mounted to a structure on a ceiling or in an upper portion of the hoistway for an elevator and emits a laser beam toward a lowermost part; a mobile measuring device that has a plane measuring device to measure horizontal dimensions within the hoistway; and a moving device that is mounted to the structure on the ceiling or in the upper portion of the hoistway and moves the mobile measuring device up and down. The mobile measuring device has a reference laser detection device that detects the laser beam emitted from the reference laser device, and an attitude detection device that detects its own attitude.
    Type: Grant
    Filed: October 7, 2019
    Date of Patent: February 27, 2024
    Assignee: HITACHI BUILDING SYSTEMS CO., LTD.
    Inventors: Toshiaki Hatano, Daisuke Matsuka, Makoto Hattori, Yuta Hamada, Hirofumi Taguchi, Masato Itou
  • Patent number: 11908123
    Abstract: An object inspection apparatus according to an embodiment disclosed herein includes: a first flipper apparatus configured to rotate a first object; a second flipper apparatus configured to rotate a second object; and a single camera device configured to move from a position corresponding to one of the first flipper apparatus and the second flipper apparatus to a position corresponding to the other, the camera device being configured to inspect object surfaces of the first object and the second object. Each of the first flipper apparatus and the second flipper apparatus includes at least one flipper unit.
    Type: Grant
    Filed: April 16, 2019
    Date of Patent: February 20, 2024
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Choung Min Jung, Ho Jun Lee, Nam Kyu Park, Han Rim Kim
  • Patent number: 11908967
    Abstract: A light-emitting device includes one or more light-emitting units each including a light-emitting element including a function of a thyristor; an electrode for light emission to which a first voltage is applied for light emission of the light-emitting unit; and one or more light emission permission thyristors that permit the light-emitting element to emit light by a second voltage that is lower than the first voltage and set irrespective of the first voltage.
    Type: Grant
    Filed: August 19, 2021
    Date of Patent: February 20, 2024
    Assignee: FUJIFILM Business Innovation Corp.
    Inventors: Takashi Kondo, Seiji Ono, Daisuke Iguchi, Tomoaki Sakita
  • Patent number: 11906407
    Abstract: Provided is a flow analyzer and a flow analysis method each of which makes it possible to stably and continuously measure a sample. The flow analyzer and the flow analysis method each include: a marker introducing device (2) which is for introducing a marker into a tube (3); and a marker detecting device (5) which detects the marker and outputs a detection signal to an analyzing device (4), the analyzing device (4) acquiring analysis data on the basis of the detection signal.
    Type: Grant
    Filed: March 31, 2021
    Date of Patent: February 20, 2024
    Assignee: BL TEC K.K.
    Inventors: Takashi Nishimura, Kazuo Masaki
  • Patent number: 11906442
    Abstract: An exemplary embodiment of the present invention provides a foreign substance inspection system for a display unit, including: a lighting unit configured to provide incident light to a display unit having an organic light emitting display panel; and a foreign substance detecting unit configured to receive incident light that is reflected by the display unit and detect whether a foreign substance is introduced into the display unit.
    Type: Grant
    Filed: June 21, 2019
    Date of Patent: February 20, 2024
    Assignee: LG CHEM, LTD
    Inventors: Beom Seok Lee, Chan Soo Kim, Eung Jin Jang, Sung Hyun Baek, Yu Jin Lim
  • Patent number: 11898964
    Abstract: A can lid inspection device includes an illuminator to illuminate a can lid. A camera includes a lens holding cylinder. A pedestal base includes a circular inspection hole formed at a center. The pedestal base mounts the camera to position the lens holding cylinder. A support pole includes a lower end to fix the illuminator and an upper portion supporting the pedestal base. A camera positioning jig includes a ring-shaped body. A flange portion protrudes from an outer peripheral surface of the ring-shaped body. An outer diameter portion of the ring-shaped body fits in the inspection hole. The inner diameter portion of the ring-shaped body fits the lens holding cylinder. An illumination center calibration jig detachably mounts on a lower surface of the illuminator and has a mark indicating a center of the illuminator. An analysis device analyzes an image of the can lid captured by the camera.
    Type: Grant
    Filed: September 6, 2019
    Date of Patent: February 13, 2024
    Assignee: SHOWA ALUMINUM CAN CORPORATION
    Inventor: Toshio Kogure
  • Patent number: 11892350
    Abstract: A device for measuring two-dimensional flicker of the present application includes a plurality of two-dimensional sensors having a partial readout function of reading out only a pixel value of some of photoelectric conversion elements included in set partial readout regions, among a plurality of photoelectric conversion elements. In the device for measuring two-dimensional flicker, a plurality of measurement regions are set two-dimensionally on a measurement target object. Each pixel in the plurality of measurement regions is individually acquired, by setting each of the plurality of partial readout regions of the plurality of two-dimensional sensors in each of a plurality of partial imaging regions obtained by dividing an entire imaging region including entirely the measurement target object. A flicker value of the plurality of measurement regions is individually obtained based on each pixel value in the plurality of measurement regions.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: February 6, 2024
    Assignee: KONICA MINOLTA, INC.
    Inventor: Satoshi Masuda
  • Patent number: 11892396
    Abstract: A gas sensor (2) distinguishes between a target gas and a contaminant and includes a light source (8), a measurement volume (4), a detector (22), and an adaptable filter system (20) with a first optical filter and a second optical filter. The filter system switches between a first composite state, with both filters in a reference state, a second composite state, with the first filter in a first reference state and the second filter in a second measurement state, a third composite state with the first filter in a first measurement state and the second filter in a second reference state, and a fourth composite state, with both filters in a measurement state. The gas sensor detects a target gas and makes a determination as to a presence of the contaminant by comparing the respective detector signals, generated during at least three of the composite states, with each other.
    Type: Grant
    Filed: December 12, 2019
    Date of Patent: February 6, 2024
    Assignee: Dräger Safety AG & Co. KGaA
    Inventors: Håkon Sagberg, Britta Greenberg-Fismen, Thor Christian Hobæk
  • Patent number: 11885706
    Abstract: A method of determining the transmittance of a contact lens (200) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected by ocular surface (100) with an intensity measuring device (400), positioning the contact lens (200) in direct contact with the ocular surface (100), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the contact lens (200) that is reflected a region (110) of the ocular surface (100) that is covered by the contact lens (200) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.
    Type: Grant
    Filed: May 2, 2022
    Date of Patent: January 30, 2024
    Assignees: Transitions Optical, Ltd., Johnson & Johnson Vision Care, Inc.
    Inventors: Forrest R. Blackburn, Joshua Hazle, Patricia Martin
  • Patent number: 11879840
    Abstract: A method of calibrating an optical detector includes installing a calibration system within at least one sensing volume of the optical detector, filling a chamber of the calibration system with a material to achieve a known obscuration, and measuring an obscuration of the material within the chamber.
    Type: Grant
    Filed: November 27, 2019
    Date of Patent: January 23, 2024
    Assignee: CARRIER CORPORATION
    Inventors: Urcan Guler, David L. Lincoln
  • Patent number: 11879853
    Abstract: An inspection system may include an illumination source to generate an illumination beam, illumination optics to direct the illumination beam to a sample at an off-axis angle along an illumination direction, and collection optics to collect scattered light from the sample in a dark-field mode, where the scattered light from the sample includes surface haze associated with light scattered from a surface of the sample, and where at least a at least a portion of the surface haze has elliptical polarizations. The system may further include pupil-plane optics to convert the polarizations of the surface haze across the pupil to linear polarization that is aligned parallel to a selected haze orientation direction. The system may include a linear polarizer to reject the surface haze aligned parallel to this haze orientation direction and a detector to generate a dark-field image of the sample based on light passed by the linear polarizer.
    Type: Grant
    Filed: February 16, 2022
    Date of Patent: January 23, 2024
    Assignee: KLA Corporation
    Inventors: Xuefeng Liu, Jenn-Kuen Leong, Yung-Ho Alex Chuang, John Fielden
  • Patent number: 11879725
    Abstract: The invention relates to an optical measuring method for three-dimensionally capturing the surface of an object by means of an optical capturing unit, wherein the optical capturing unit is moved relative to the object during a first measurement time period, the object is illuminated by the capturing unit with an illumination beam having a light intensity, height images are captured by the capturing unit in succession at a capturing frequency, at least some of the captured height images during the measurement time period are added to form a total height image and the total height image is displayed, and the light intensity and/or the capturing frequency are controlled during the measurement time period by control signals, the control signals being produced at time intervals during the measurement time period and each control signal being produced on the basis of at least one sensor signal of a temperature sensor.
    Type: Grant
    Filed: June 11, 2019
    Date of Patent: January 23, 2024
    Assignee: DENTSPLY SIRONA INC.
    Inventors: Konrad Klein, Peter Fritz, Anders Adamson
  • Patent number: 11852592
    Abstract: An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanning system causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.
    Type: Grant
    Filed: April 27, 2023
    Date of Patent: December 26, 2023
    Inventors: Steven W. Meeks, Hung Phi Nguyen, Alireza Shahdoost Moghaddam
  • Patent number: 11852591
    Abstract: This inspection device comprises: image-capturing unit obtaining an evaluation workpiece image that is captured with a plurality of predetermined illumination light emission patterns; image area setting unit setting a plurality of image areas associated with a plurality of different labels; optimization calculation unit generating a first index of which the output value increases as a difference between an image area associated with a non-defective label and a defective label increases, and a second index of which the output value increases as a difference or contrast between the image areas associated with the non-defective label increases, and calculates an illumination light emission pattern for inspection such that the first index becomes larger and the second index becomes smaller; and determination unit performing image processing on an inspection workpiece image captured with the illumination light emission pattern for inspection, and determines a pass/fail label of a workpiece to be inspected.
    Type: Grant
    Filed: February 25, 2020
    Date of Patent: December 26, 2023
    Assignee: OMRON Corporation
    Inventor: Yosuke Naruse
  • Patent number: 11841330
    Abstract: A sensor probe assembly includes a probe, and a sensor assembly coupled to the probe. The sensor assembly measures a physical or electrical characteristic of a surface that the probe is near to or in contact with. The sensor assembly is symmetrically disposed around a center axis of the probe.
    Type: Grant
    Filed: June 17, 2019
    Date of Patent: December 12, 2023
    Assignee: Physik Instrumente (PI) GmbH & Co. KG
    Inventor: Scott Jordan
  • Patent number: 11841305
    Abstract: A system, device and method for deployment of one or more dust accumulation sensors receives a baseline measurement associated with no accumulation of dust in a target environment, receives a time-elapsed measurement associated with positive accumulation of dust in the target environment, determines a quantity of accumulated dust in the target environment based on the baseline measurement and the time-elapsed measurement, generates a spatial dust deposition distribution for the target environment based on the determined quantity of accumulated dust and determines a deployment for one or more dust accumulation sensors for the target environment based on the spatial dust deposition distribution.
    Type: Grant
    Filed: August 25, 2022
    Date of Patent: December 12, 2023
    Assignee: Industrial Intelligence, Inc.
    Inventors: George T Armbruster, Jr., Ali S. Rangwala, Laurence E. Moulis, Shane Diller
  • Patent number: 11835472
    Abstract: Disclosed are a device and method for detecting a subsurface defect of an optical component. According to the device and method, a spectral confocal technology, a laser scattering technology and a laser-induced ultrasonic technology are combined, excitation laser and detection laser are simultaneously focused to different depths of the optical component through a dispersion lens set, the excitation laser generates a transient thermal expansion effect on a subsurface of the optical component, the detection laser is used for observing and analyzing ultrasonic vibration of the subsurface defect under an action of the thermal expansion effect, and spatial distribution information and scattered spectral information of scattered light at a position of the subsurface defect are acquired by the spectral confocal technology. The device and method are suitable for nondestructive testing of a finished product of an ultra-precise optical component with a strict requirement on the subsurface defect.
    Type: Grant
    Filed: September 7, 2022
    Date of Patent: December 5, 2023
    Assignee: ZHEJIANG UNIVERSITY
    Inventors: Anyu Sun, Bingfeng Ju, Kaimin Guan, Li Zheng, Haoze Zhong, Yuanliu Chen, Wule Zhu
  • Patent number: 11835445
    Abstract: The present invention provides a welding seam tracking sensor, which belongs to the technical field of sensors, and alleviates the problem of detection performance reduction of a sensor. The welding seam tracking sensor comprises a sensor housing, a protection cover and a protection sheet; the protection cover is mounted on the bottom of the sensor housing, an air inlet is provided on the upper surface of the protection cover, and a blowing hole is provided on the bottom of the sensor housing. The air inlet and the blowing hole is closely connected; there is a visual hole and a laser hole in the bottom of the protection cover, a transverse slot is formed inside the protection cover, a socket is opened on the side wall of the protection cover, the protection sheet is inserted into the slot through the socket.
    Type: Grant
    Filed: April 11, 2022
    Date of Patent: December 5, 2023
    Assignee: TANGSHAN YINGLAI TECHNOLOGY CO., LTD.
    Inventors: Lei Yuan, Zhijun Zhao, Tongle Zang, Ensong Zheng, Wenhao Yao, Yanhui Wang