Abstract: A method of generating a three-dimensional topological surface representation of a tyre on a vehicle, the method comprising: using a tread depth measurement device to record tread depth data for a tyre surface moving relative to the tread depth measurement device; generating a movement profile of the tyre surface; and using the movement profile of the tyre surface to map the tread depth data onto a base tyre structure, thereby generating a three-dimensional topological surface representation of the tyre.

Abstract: A system and a method for dynamically optimizing an instrument system workflow based on operational monitoring and managing of a workflow for a hardware system. The system includes instrument resources and sample chambers, each resource and chamber with a dedicated sensor configured to acquire data. The system further includes a computing device communicatively connected to the instrument resources and sample chambers. The computing device includes a software application or program comprising a workflow builder, an execution engine, an analytics engine, a virtual system modeling engine, and an optional machine learning engine.

Abstract: A method for measuring multiple parameters of mixed gases based on broadband infrared light source is provided, including: filtering a broadband infrared laser, and forming a laser beam including three narrow-linewidth wavelengths; dividing the laser beam into a first sub-laser beam and a second sub-laser beam; focusing and transmitting the first sub-laser beam to a gas sample cell; focusing and transmitting the first sub-laser beam to a first reflector; reflecting and transmitting the first sub-laser beam; reflecting and transmitting the second sub-laser beam to the second beam splitter; combing the first sub-laser beam transmitted by the second beam splitter and the second sub-laser beam reflected by the second beam splitter, measuring the multiple parameters; combining and transmitting the second sub-laser beam transmitted by the second beam splitter and the first sub-laser beam reflected by the second beam splitter to a spectrometer for measuring concentrations the mixed gases.

Abstract: A device to detect defects in a finished surface by analyzing images thereof taken under lighting of different colors includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, and a light source assembly. The processor connects to a camera assembly, and preprocesses images obtained of the long side surfaces, of the width side surfaces, and of the chamfered side surfaces of the product to detect any defects of these surfaces of the product.

Abstract: A measuring method includes measuring a displacement A1, placing an imaging unit 20 at a position where the imaging unit is allowed to image a measurement mark MI and imaging the measurement mark M1. In the measuring of the displacement A1, the displacement A1 of a surface of a combined substrate, which is composed of two sheets of substrates bonded to each other, on a side of the imaging unit 20 at a position where the measurement mark M1 for position deviation measurement, which is provided within the combined substrate, is placed is measured. In the imaging of the measurement mark M1, the measurement mark M1 is imaged by the imaging unit 20 while putting the measurement mark M1 in focus by moving a focal position back and forth with respect to a focal position which is previously set based on the displacement A1.

Abstract: The purpose of this invention is to make it possible to efficiently and accurately detect a reticle defect at an earlier stage in a manufacturing process. The inspection device according to this invention uses the results of comparing die images of wafers that have had patterns transferred thereto using the same reticle after subjecting the die images to averaging processing and the results of comparing the die images without subjecting the same to averaging processing to distinguish a random defect signal caused by a huge defect, or the like, and having an extremely high brightness from a repeated defect signal, and only extracts repeated defects with higher accuracy.

Abstract: Instruments, systems, and methods for measuring optical density of microbiological samples are provided. In particular, optical density instruments providing improved safety, efficiency, comfort, and convenience are provided. Such optical density instruments include a handheld portion and a base station. The optical density instruments may be used in systems and methods for measuring optical density of biological samples.

Abstract: Systems for electroplating seal inspection may include a module configured to support a seal for inspection. The module may include a set of supports positioned to contact an interior rim of the seal. The module may be configured to rotate the seal about a central axis. The system may also include a detector positioned on the module. The detector may be positioned to scan an exterior surface of the seal.

Abstract: A device for measuring the inner size of a shoe includes a measuring unit including a sensor inserted into the shoe so as to measure the distance up to the inner surface of the shoe, a driving unit capable of rotating the measuring unit around a preset rotation axis, and a frame for supporting the driving unit.

Abstract: According to an embodiment of a specimen inspection apparatus, the specimen inspection apparatus may comprise: a radiation unit; a reflection unit; a focus adjusting unit; a reception unit; and a control unit. The specimen inspection apparatus may comprise: a radiation unit for emitting a terahertz wave; a reflection unit for changing the path of a terahertz wave emitted from the radiation unit; a focus adjusting unit for forming an irradiation region on a specimen according to the path of the terahertz wave; a reception unit for receiving individual terahertz waves obtained by reflection, by the specimen, of the terahertz wave irradiated onto the first region; and a control unit for controlling the distance between at least two elements among the plurality of elements, and detecting whether the specimen is defective, according to the reflectivity difference between the terahertz waves.

Abstract: Metal oxide gel particles, may be prepared with a desired particle size, by preparing a low-temperature aqueous metal nitrate solution containing hexamethylene tetramine as a feed solution; and causing the feed solution to flow through a first tube and exit the first tube as a first stream at a first flow rate, so as to contact a high-temperature nonaqueous drive fluid. The drive fluid flows through a second tube at a second flow rate. Shear between the first stream and the drive fluid breaks the first stream into particles of the metal nitrate solution, and decomposition of hexamethylene tetramine converts metal nitrate solution particles into metal oxide gel particles. A metal oxide gel particle size is measured optically, using a sensor device directed at a flow of metal oxide gel particles within the stream of drive fluid.

Abstract: Provided are an apparatus for processing a substrate and a method for measuring a temperature of the substrate. The apparatus for processing the substrate includes a temperature measurement part and a light-transmitting shield plate. The temperature measurement part includes a light source, a light receiving part configured to receive reflected light reflected by the substrate or the shield plate among the light irradiated from the light source, and a radiant light emitted from the substrate to measure a quantity of the reflected light and an intensity of the radiant light and a temperature calculation part configured to calculate the temperature of the substrate, to which a contamination level of the shield plate is reflected, by using the quantity of the reflected light and the intensity of the radiant light.

Abstract: According to one embodiment, an optical imaging apparatus includes: an image-forming optical portion, a wavelength selection portion, and an imaging portion. The image-forming optical portion forms an image of an object by means of light beams that include a first wavelength and a second wavelength different from the first wavelength. The first wavelength selection portion has wavelength selection regions. The wavelength selection regions are an anisotropic wavelength selection opening having a different distribution of the wavelength selection regions depending on a direction along a first axis and a direction along a second axis. The imaging portion is configured to simultaneously acquire an image of the first light beam and the second light beam.

Abstract: There is provided an inspection device allowing surely measuring irregular-shaped parts such as a bevel of a wafer while saving space. An inspection device 100 is provided with outer periphery illuminating units 11, 111 for illuminating an outer peripheral region AP of a wafer WA being a target, and an outer periphery imaging unit that images the outer peripheral region AP of the wafer WA. The outer periphery illuminating units 11, 111 have arcuate illuminating units 11a, 111a that are arranged along a partial region of a circumference CI centered on a reference axis SA and illuminate a predetermined region A1 on the reference axis SA, and the reference axis SA of the arcuate illuminating units 11a, 111a extends in a direction crossing the tangent direction along which an outer peripheral part UA of the wafer WA extends.

Abstract: Methods, systems, and devices for decoding an angle-cut key are provided. A probe is positioned at a first position relative to the angle-cut key. A first depth reading is performed on the angle-cut key. The probe is displaced to a plurality of subsequent positions and performing a plurality of subsequent depth readings on the angle-cut key. A key map of the angle-cut key is generated based on comparisons performed on a set of depth readings, the set of depth readings comprising the first depth reading and the plurality of subsequent depth readings. A signal indicative of the key map is output.

Abstract: A light-emitting element array includes multiple light-emission instruction units arranged in a first direction; a first light-emitting element group row including light-emitting element groups each including a multiple light-emitting elements such that the light-emitting element groups are arranged in a direction intersecting the first direction; a second light-emitting element group row including light-emitting element groups each including a multiple light-emitting elements such that the second light-emitting element group row is arranged along the first light-emitting element group row in the first direction; and a multiple wiring lines that connect the multiple light-emission instruction units to the light-emitting element groups in the first light-emitting element group row and the light-emitting element groups in the second light-emitting element group row to provide a light-emission instruction.

Abstract: An occurrence space 32A which is provided in a light shielding space 3A shielded from light from an outside and into which a detection target flows, a first light emitting unit 61A and a second light emitting unit that emit detection light along a first light emitting-side optical axis 611A and a second light emitting-side optical axis toward an occurrence space 32A, a light receiving unit that receives scattered light generated when detection light emitted from the first light emitting unit 61A and the second light emitting unit is scattered by a detection target flowing into the occurrence space 32A along a light receiving-side optical axis intersecting the first light emitting-side optical axis 611A and the second light emitting-side optical axis, and a smoke detection unit cover-side inclined portion 43A that primarily reflects the detection light emitted from the first light emitting unit 61A and the second light emitting unit in a direction intersecting a plane defined by the first light emitting-side o

Abstract: A light projecting device comprises a flat light guide plate and a light source that introduces light into the light guide plate from a side peripheral surface thereof. A plurality of concave parts are formed on one plate surface of the light guide plate, and the light entering the light guide plate reflects off the concave parts while spreading out, and the light is emitted outside from the other plate surface of the light guide plate. Each concave part is formed by a smooth concave curved surface. A tangential angle that is an angle between a tangential line at an opening edge of the concave part and the plate surface is set to be ?50° and ?85° in a cross-sectional shape of the concave part cut by a plane that is both perpendicular to the plate surface and passing through the center of the concave part.

Abstract: The present disclosure provides a detection system for detecting matter and distinguishing specific matter from other matter. The detection system comprises at least one light source arranged to emit one or more light beams having a known wavelength or wavelength range. Further, the detection system comprises at least one optical element configured to direct the one or more light beams onto a plurality of locations within an area of interest including the matter. The detection system also comprises a detector for detecting intensities of the one or more light beams reflected at the plurality of locations within the area of interest including the matter. In addition, the detection system comprises an outcome determination system. The system is arranged to obtain information indicative of at least a portion of a shape of at least some of the matter based on detected light intensities of the one or more light beams reflected at the plurality of locations.

Abstract: A shape generation unit generates three-dimensional data of an adjustment workpiece by synthesizing a plurality of pieces of profile data generated corresponding to each position in a Y1 direction due to relative movement of the adjustment workpiece having a spherical surface in a movement direction A of an imaging head corresponding to the Y1 direction. A sphere information calculation unit calculates a parameter of the spherical surface defined by a plurality of points included in the three-dimensional data. A distortion amount calculation unit calculates a distortion amount of the spherical surface based on the parameter. A correction value calculation unit calculates at least one of a first rotation angle correction value about an X2 axis and a second rotation angle correction value about a Z2 axis in the plurality of pieces of profile data constituting the three-dimensional data so as to reduce the distortion amount.