Abstract: Provided is a flow analyzer and a flow analysis method each of which makes it possible to stably and continuously measure a sample. The flow analyzer and the flow analysis method each include: a marker introducing device (2) which is for introducing a marker into a tube (3); and a marker detecting device (5) which detects the marker and outputs a detection signal to an analyzing device (4), the analyzing device (4) acquiring analysis data on the basis of the detection signal.

Abstract: An exemplary embodiment of the present invention provides a foreign substance inspection system for a display unit, including: a lighting unit configured to provide incident light to a display unit having an organic light emitting display panel; and a foreign substance detecting unit configured to receive incident light that is reflected by the display unit and detect whether a foreign substance is introduced into the display unit.

Abstract: A can lid inspection device includes an illuminator to illuminate a can lid. A camera includes a lens holding cylinder. A pedestal base includes a circular inspection hole formed at a center. The pedestal base mounts the camera to position the lens holding cylinder. A support pole includes a lower end to fix the illuminator and an upper portion supporting the pedestal base. A camera positioning jig includes a ring-shaped body. A flange portion protrudes from an outer peripheral surface of the ring-shaped body. An outer diameter portion of the ring-shaped body fits in the inspection hole. The inner diameter portion of the ring-shaped body fits the lens holding cylinder. An illumination center calibration jig detachably mounts on a lower surface of the illuminator and has a mark indicating a center of the illuminator. An analysis device analyzes an image of the can lid captured by the camera.

Abstract: A device for measuring two-dimensional flicker of the present application includes a plurality of two-dimensional sensors having a partial readout function of reading out only a pixel value of some of photoelectric conversion elements included in set partial readout regions, among a plurality of photoelectric conversion elements. In the device for measuring two-dimensional flicker, a plurality of measurement regions are set two-dimensionally on a measurement target object. Each pixel in the plurality of measurement regions is individually acquired, by setting each of the plurality of partial readout regions of the plurality of two-dimensional sensors in each of a plurality of partial imaging regions obtained by dividing an entire imaging region including entirely the measurement target object. A flicker value of the plurality of measurement regions is individually obtained based on each pixel value in the plurality of measurement regions.

Abstract: A gas sensor (2) distinguishes between a target gas and a contaminant and includes a light source (8), a measurement volume (4), a detector (22), and an adaptable filter system (20) with a first optical filter and a second optical filter. The filter system switches between a first composite state, with both filters in a reference state, a second composite state, with the first filter in a first reference state and the second filter in a second measurement state, a third composite state with the first filter in a first measurement state and the second filter in a second reference state, and a fourth composite state, with both filters in a measurement state. The gas sensor detects a target gas and makes a determination as to a presence of the contaminant by comparing the respective detector signals, generated during at least three of the composite states, with each other.

Abstract: A method of determining the transmittance of a contact lens (200) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected by ocular surface (100) with an intensity measuring device (400), positioning the contact lens (200) in direct contact with the ocular surface (100), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the contact lens (200) that is reflected a region (110) of the ocular surface (100) that is covered by the contact lens (200) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.

Abstract: A method of calibrating an optical detector includes installing a calibration system within at least one sensing volume of the optical detector, filling a chamber of the calibration system with a material to achieve a known obscuration, and measuring an obscuration of the material within the chamber.

Abstract: An inspection system may include an illumination source to generate an illumination beam, illumination optics to direct the illumination beam to a sample at an off-axis angle along an illumination direction, and collection optics to collect scattered light from the sample in a dark-field mode, where the scattered light from the sample includes surface haze associated with light scattered from a surface of the sample, and where at least a at least a portion of the surface haze has elliptical polarizations. The system may further include pupil-plane optics to convert the polarizations of the surface haze across the pupil to linear polarization that is aligned parallel to a selected haze orientation direction. The system may include a linear polarizer to reject the surface haze aligned parallel to this haze orientation direction and a detector to generate a dark-field image of the sample based on light passed by the linear polarizer.

Abstract: The invention relates to an optical measuring method for three-dimensionally capturing the surface of an object by means of an optical capturing unit, wherein the optical capturing unit is moved relative to the object during a first measurement time period, the object is illuminated by the capturing unit with an illumination beam having a light intensity, height images are captured by the capturing unit in succession at a capturing frequency, at least some of the captured height images during the measurement time period are added to form a total height image and the total height image is displayed, and the light intensity and/or the capturing frequency are controlled during the measurement time period by control signals, the control signals being produced at time intervals during the measurement time period and each control signal being produced on the basis of at least one sensor signal of a temperature sensor.

Abstract: An optical scanning system includes a first radiating source capable of outputting a first source light beam, a second radiating source capable of outputting a second source light beam, a first time-varying beam reflector configured to direct the first source light beam and the second source light beam toward the sample, a scan lens configured to focus the first source light beam and the second source light beam reflected by the first time-varying beam reflector onto the sample, and a compound ellipsoidal collector configured to direct light scattered from the sample toward a scattered radiation detector. The optical scanning system causes one of the first or second source light beams to be directed towards a sample at an incident angle. The first light beam has a first wavelength, the second light beam has a second wavelength, and the first wavelength and the second wavelength are not the same.

Abstract: This inspection device comprises: image-capturing unit obtaining an evaluation workpiece image that is captured with a plurality of predetermined illumination light emission patterns; image area setting unit setting a plurality of image areas associated with a plurality of different labels; optimization calculation unit generating a first index of which the output value increases as a difference between an image area associated with a non-defective label and a defective label increases, and a second index of which the output value increases as a difference or contrast between the image areas associated with the non-defective label increases, and calculates an illumination light emission pattern for inspection such that the first index becomes larger and the second index becomes smaller; and determination unit performing image processing on an inspection workpiece image captured with the illumination light emission pattern for inspection, and determines a pass/fail label of a workpiece to be inspected.

Abstract: A sensor probe assembly includes a probe, and a sensor assembly coupled to the probe. The sensor assembly measures a physical or electrical characteristic of a surface that the probe is near to or in contact with. The sensor assembly is symmetrically disposed around a center axis of the probe.

Abstract: A system, device and method for deployment of one or more dust accumulation sensors receives a baseline measurement associated with no accumulation of dust in a target environment, receives a time-elapsed measurement associated with positive accumulation of dust in the target environment, determines a quantity of accumulated dust in the target environment based on the baseline measurement and the time-elapsed measurement, generates a spatial dust deposition distribution for the target environment based on the determined quantity of accumulated dust and determines a deployment for one or more dust accumulation sensors for the target environment based on the spatial dust deposition distribution.

Abstract: Disclosed are a device and method for detecting a subsurface defect of an optical component. According to the device and method, a spectral confocal technology, a laser scattering technology and a laser-induced ultrasonic technology are combined, excitation laser and detection laser are simultaneously focused to different depths of the optical component through a dispersion lens set, the excitation laser generates a transient thermal expansion effect on a subsurface of the optical component, the detection laser is used for observing and analyzing ultrasonic vibration of the subsurface defect under an action of the thermal expansion effect, and spatial distribution information and scattered spectral information of scattered light at a position of the subsurface defect are acquired by the spectral confocal technology. The device and method are suitable for nondestructive testing of a finished product of an ultra-precise optical component with a strict requirement on the subsurface defect.

Abstract: The present invention provides a welding seam tracking sensor, which belongs to the technical field of sensors, and alleviates the problem of detection performance reduction of a sensor. The welding seam tracking sensor comprises a sensor housing, a protection cover and a protection sheet; the protection cover is mounted on the bottom of the sensor housing, an air inlet is provided on the upper surface of the protection cover, and a blowing hole is provided on the bottom of the sensor housing. The air inlet and the blowing hole is closely connected; there is a visual hole and a laser hole in the bottom of the protection cover, a transverse slot is formed inside the protection cover, a socket is opened on the side wall of the protection cover, the protection sheet is inserted into the slot through the socket.

Abstract: An optical test system and corresponding method disclosed herein provides highly accurate test data for both sides of a lens simultaneously and efficiently to analyze the surface topography and/or geometric parameters of a lens or lens system. More particularly, the optical test system and corresponding method moves the lens in test plane to align a plurality of points of a test pattern on a lens surface with a vertical axis while probes aligned with the vertical axis and on opposing sides of the lens simultaneously collect wavelength-specific data for both lens surfaces. The optical test system uses the collected wavelength-specific data to produce a surface topography and/or the associated lens geometric parameters for each lens surface.

Abstract: A method and a device for detecting plastic foreign objects with low chromaticity difference in shredded tobacco through online pulse spectral imaging are provided. The method includes three steps: negative pressure thin-layer loading of shredded tobacco, pulse line-scanning identification of shredded tobacco, and positive pressure online elimination of foreign objects. Loose shredded tobacco is formed into a fixed and continuous thin layer on a surface of a conveying cylinder under the effect of a negative pressure adsorption force. The surface of the conveying cylinder is coded by areas. An LED linear array light source containing characteristic wavelengths of plastics with low chromaticity difference emits optical pulses, and a line-scanning camera is used to obtain characteristic signals of the plastic foreign objects with low chromaticity difference efficiently in real time.

Abstract: An inspection system having a light source, a mirror sensor, and an image sensor. The mirror assembly is aligned with the camera; the light is reflected from the container to the camera, and the camera creates multiple images of the container at a viewing angle. The multiple images are analyzed to detect defects.

Abstract: A semiconductor inspection tool system is disclosed. The system comprises a first illumination setup for generating at least one first illumination radiation and for directing the at least one first illumination radiation to at least one bonding region non-filled volume formed between two layers of a multi-layer stack. The system also comprises a second illumination setup being for generating at least one second illumination radiation and for directing the at least one second illumination radiation at multi-layer stack edges. The second illumination radiation is configured for illuminating at least a normal edge of at least two layers, the second illumination setup has different radiation parameters than the first illumination setup. The system further includes a bonding region sensor unit for collecting reflected electromagnetic radiation from a bonding region volume and generating at least one sensing data being indicative of the bonding region.

Abstract: In one embodiment, a substrate imaging apparatus includes: a rotary holding unit that holds and rotates a substrate; a mirror member having a reflecting surface that opposes an end face of the substrate and a peripheral portion of a back surface of the substrate held by the rotary holding unit, the reflecting surface being inclined with respect to a rotation axis of the rotary holding unit; and a camera having an imaging device that receives both first light and second light through a lens, the first light coming from a peripheral portion of a front surface of the substrate held by the rotary holding unit, and the second light being a reflected light of second light which comes from the end face of the substrate held by the rotary holding unit and is reflected by the reflecting surface.