Abstract: The invention discloses a method for identifying frostbite condition of grain seeds using the spectral feature wavebands of the grain seed embryo hyperspectral images. At first, hyperspectral image of the grain seed in the embryo side is collected, and the hyperspectral image in the embryo region of the grain seed is obtained. Then the average spectra is calculated and the wavebands containing noise are eliminated, the spectral feature wavebands are extracted by using related algorithm and the spectra value corresponding with the waveband is obtained. Next, the feature waveband spectral value and the category label of the known frostbite category grain seed are input into the classification model for obtaining the optimal training classification model. Finally, the feature waveband spectral value of each unknown frostbite category grain seed is input into the established model, the frostbite condition of seed is identified.

Abstract: A three-dimensional reconstruction system and a three-dimensional reconstruction method, the system includes: a carrier device which includes a rotatable support and a carrier arranged on the rotatable support, the rotatable support is provided with a rotational axis; a data acquisition device spaced apart from the carrier and configured to collect reflective light data of an object on the carrier when the rotatable support rotates to a corresponding angle and to obtain single-visual-angle data of the object at the corresponding angle; and a data processing device connected with the data acquisition device and configured to perform three-dimensional reconstruction according to the single-visual-angle data and a reconstruction algorithm.

Abstract: An interferometer and an imager may include a tunable light source, a beam splitter, a digital imager, and a processor system. The tunable light source may be configured to emit a beam. The beam splitter may be configured to direct the beam toward a sample with a floor surface and a raised surface feature. The digital imager may be configured to receive a reflected beam and to generate an image based on the reflected beam. The reflected beam may be a coherent addition of a first reflection of the beam off a reference plate and a second reflection of the beam off the raised surface feature and third reflection of the beam off the floor surface. The processor system may be coupled to the digital imager and may be configured to determine a distance between the reference surface and the feature surface based on the image.

Abstract: Examples disclosed herein generally relate to systems and methods for detecting the size of a particle in a fluid. In one example, a system for imaging a particle includes a first imaging device. The first imaging device includes a lens and a digital detector. The system further includes a laser source. He laser source is configured to emit a first laser beam and a second laser beam. The digital detector is configured to accumulate a metric of an intensity of an accumulated light that passes through the lens. The accumulated light is scattered from the particle. The accumulated light includes light from the first laser beam and the second laser beam.

Abstract: A measurement apparatus (10) for measuring a wavefront aberration of an imaging optical system (12) includes (i) a measurement wave generating module (24) which generates a measurement wave (26) radiated onto the optical system and which includes an illumination system (30) illuminating a mask plane (14) with an illumination radiation (32), as well as coherence structures (36) arranged in the mask plane, and (ii) a wavefront measurement module (28) which measures the measurement wave after passing through the optical system and determines from the measurement result, with an evaluation device (46), a deviation of the wavefront of the measurement wave from a desired wavefront. The evaluation device (46) determines an influence of an intensity distribution (70) of the illumination radiation in the region of the mask plane on the measurement result and, when determining the deviation of the wavefront, utilizes the influence of the intensity distribution.

Abstract: In some examples, a system receives a first image of a circuit board produced by a first production stage, and compares the first image to a second image of the circuit board acquired at a second production stage for the circuit board. The system indicates an anomaly with the circuit board based on the comparing.

Abstract: Various embodiments include an exemplary design of a high-temperature condensation particle counter (HT-CPC) having particle-counting statistics that are greatly improved over prior art systems since the sample flow of the disclosed HT-CPC is at least eight times greater than the prior art systems. In one embodiment, the HT-CPC includes a saturator block to accept directly a sampled particle-laden gas flow, a condenser block located downstream and in fluid communication with the saturator block, an optics block located downstream and in fluid communication with the condenser block, and a makeup-flow block having a concentric-tube design located in fluid communication with and between the condenser block and the optics block. The makeup-flow block being configured to reduce volatile contents from re-nucleating in the optics block. Other designs and apparatuses are disclosed.

Abstract: A method of determining the transmittance of a transparent article (250) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected or emitted by reference surface (80) with an intensity measuring device (400), positioning the transparent article (250) over the reference surface (80), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the transparent article (250) that is reflected or emitted by a region (110) of the reference surface (80) that is covered by the transparent article (250) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.

Abstract: A method for evaluating a leadframe surface includes positioning a leadframe on a measurement apparatus at a first predetermined distance relative to an end portion of a light source of an optical sensor; irradiating a predetermined area on a surface of the leadframe with light having a single predetermined wavelength from the light source; receiving, with a light receiver of the optical sensor, reflected light from the predetermined area on the surface of the leadframe, and converting the reflected light into an electric signal; determining a reflection intensity value of the predetermined area on the surface of the leadframe based on the electric signal; and calculating a reflection ratio of the predetermined area on the surface of the leadframe based on the reflection intensity value and a predetermined reference reflection intensity value associated with the light source.

Abstract: A carrier lifetime measurement method for measuring a lifetime of carriers in a measurement target object includes an irradiation step of irradiating a DUT 10 serving as a measurement target object with measurement light and stimulus light subjected to intensity modulation using a plurality of frequencies, an outputting step of outputting a detection signal by detecting an intensity of reflected light from the DUT 10 or transmitted light through the DUT 10, and a generation step of detecting a phase delay of the detection signal with respect to a modulation signal including a frequency in association with a concentration of impurities in a measurement target region of the plurality of frequencies and generating image data indicating a distribution of lifetimes of carriers in the DUT 10 on the basis of the phase delay.

Abstract: A method and system for automated in-line inspection of optically transparent material is disclosed herein. The method includes illuminating a top and bottom surface of the optically transparent material with at least one sheet of light and then generating an image based on light that is received by an imaging device. The image that is generated may either be a bright field image or a dark field image.

Abstract: An inspection system is disclosed. The inspection system includes a shared memory configured to receive image data from a defect inspection tool and a controller communicatively coupled to the shared memory. The controller includes a host image module configured to apply one or more general-purpose defect-inspection algorithms to the image data using central-processing unit (CPU) architectures, a results module configured to generate inspection data for defects identified by the host image module, and secondary image module(s) configured to apply one or more targeted defect-inspection algorithms to the image data. The secondary image module(s) employ flexible sampling of the image data to match a data processing rate of the host image module within a selected tolerance. The flexible sampling of the image data is adjusted responsive to the inspection data generated by the results module and the host image module.

Abstract: Systems and methods in which multi-dimensional metric monitoring is used with respect to multi-wavelength scattering for smoke detection are described. A multi-dimensional metric may dynamically track a slope of a relationship between scattered light of multiple wavelengths of scattered light being monitored. A multi-dimensional metric monitoring smoke detection algorithm may utilize multi-dimensional thresholds with respect to monitoring of the multi-dimensional metric for initiating a fire alarm and resetting the fire alarm. An optical measuring chamber utilized for providing multi-wavelength scattering signals utilized in deriving a multi-dimensional metric for smoke detection may be configured for wide-scattering-angle signal collection, such as using a light trapping sub-chamber having a light-guide diaphragm assembly configured for wide-scattering-angle signal collection.

Abstract: An optical waveguide 15 includes a substrate 19, a core layer 12, a support 20, and a suppressing portion. The core layer 12 includes a light propagating portion 10 and a diffraction grating portion 11. The diffraction grating portion 11 includes a fine line pattern formed therein. The support 20 is made from a material having a smaller refractive index than a refractive index of the core layer 12. The support 20 supports the core layer 12 with respect to the substrate 19. The suppressing portion suppresses deformation of fine lines 13 that form the fine line pattern. The support 20 is not provided in an entire region between the light propagating portion 10 and the substrate 19 in a cross-section perpendicular to a longitudinal direction of the core layer 12 at least at a position in the longitudinal direction.

Abstract: A measuring device is provided for measuring the absorption of gases. The measuring device (1) includes a radiation source (2), a first detector element (3), a second detector element (9) and a reflector array (4). The reflector array (4) defines a first optical path (5) between the radiation source (2) and the first detector element (3) and defines a second optical path (10) between the radiation source (2) and the second detector element (9). The first optical path (5) has at least two points of intersection with itself and the second detector element (9) is arranged outside of a first plane which is defined by the radiation source (2) and two points of intersection (6) of the first optical path (5).

Abstract: A device for detecting the profile of a tread includes a light source, a mask configured for receiving a light emission of the light source and permeable to the light emission in correspondence of a slit provided therein. The slit is configured for generating, when traversed by the light emission, a light curtain. At least one image-acquisition device is configured for acquiring a projection of the light curtain on a tread, and a data-processing unit is operatively connected to the image-acquisition device for reception of image data acquired thereby.

Abstract: The present invention provides a system for measuring concentrations of trace gases in gas mixtures using the absorption spectroscopy method. The system comprising an optical cell containing a gas mixture, a continuous-wave tunable laser, a detector system for measuring an absorption of laser light by the gas in the optical cell, and a processor to conduct an absorption spectroscopy analysis of the gas mixture based on light intensity measured by the detector system at one or more laser frequencies.

Abstract: Projection device switches and projects a plurality of types of pattern images in a unit of projection frame. Imaging device images object to which the pattern image is projected and generates image data. Measurement device discriminates whether each imaging frame is a key frame of the image data obtained by capturing one of the pattern images or a blended frame of the image data obtained by capturing a plurality of the pattern images switched during an exposure period of one frame, and performs measurement based on a space coding method by using at least the image data of the key frame.

Abstract: The invention of the present application relates to a system for accurately measuring fine-dust precursors. Among apparatuses that measure concentrations of NOx and SOx which are precursors of fine dust by use of tunable diode laser absorption spectroscopy (TDLAS), an apparatus that can control a temperature of a measurement cell equipped with prism-type multi-passes by using thermoelectric elements without vibration is provided.

Abstract: A specimen holding and positioning apparatus operable to substantially non-movably maintain a specimen (e.g., an excised tissue specimen) in a fixed or stable orientation with respect to the apparatus during imaging operations (e.g., x-ray imaging), transport (e.g., from a surgery room to a pathologist's laboratory), and the like for use in facilitating accurate detection and diagnosis of cancers and/or other abnormalities of the specimen.