Abstract: An E-fuse circuit comprising: an E-fuse group, comprising a plurality of E-fuse sections, wherein each one of the E-fuse sections comprises a plurality of E-fuses; a multi-mode latch circuit, configured to receive an input signal to generate a first output signal in a burn in mode, and configured to receive an address to be compared to generate a second output signal in a normal mode; a first logic circuit group, configured to receive a first part of bits of the first output signal to generate a control signal in the burn in mode; and a second logic circuit group, configured to receive the control signal and a second part of bits of the first output signal to generate a selection signal in the burn in mode, to select which one of the E-fuse sections is activated.

Abstract: Methods of operating a number of memory devices are disclosed. A method may include adjusting a count of a refresh address counter of at least one memory device of a number of memory devices such that the count of the refresh address counter of the at least one memory device is offset from a count of a refresh address counter of at least one other memory device of the number of memory devices. The method may also include receiving, at each of the number of memory devices, a refresh command. Further, the method may include refreshing, at each of the number of memory devices, a row of memory cells indicated by the count of an associated refresh address counter. Related systems and memory modules are also described.

Abstract: A memory system includes a first substrate including a first signal terminal and a second signal terminal electrically connected to a bus, a first circuit in which a first switching element and a first resistor are connected in series between a first terminal and a second terminal, the first terminal connected to the first signal terminal, a second circuit in which a second switching element and a second resistor are connected in series between a third terminal and a fourth terminal, the third terminal connected to the second signal terminal, a first memory electrically connected to the second terminal, a second memory electrically connected to the fourth terminal, and a controller electrically connected to the bus and configured to control the first and second switching elements.

Abstract: The present disclosure includes apparatuses and methods related to performing logical operations using sensing circuitry. An example apparatus comprises an array of memory cells and sensing circuitry coupled to the array of memory cells. The sensing circuitry includes a primary latch and a secondary latch. The primary latch is coupled to a pair of complementary sense lines and selectively coupled to a pair of adjacent complementary sense lines. The secondary latch is selectively coupled to the primary latch. The primary latch and secondary latch are configured to shift a data value between the pair of adjacent complementary sense lines and the primary latch. The primary latch and secondary latch are configured to shift the data value from the pair of adjacent complementary sense lines without activating a row line.

Abstract: A method for programming a non-volatile memory (NVM) and an integrated circuit is disclosed. In an embodiment an integrated circuit includes a memory plane organized into rows and columns of memory words, each memory word comprising memory cells and each memory cell including a state transistor having a control gate and a floating gate and write circuitry configured to program a selected memory word during a programming phase by applying a first nonzero positive voltage to control gates of the state transistors of the memory cells that do not belong to the selected memory word.

Abstract: The disclosure relates to a storage device, a controller and a method for operating a controller. The controller described in embodiments of the disclosure may include a word line grouping circuit configured to group a plurality of word lines in a semiconductor memory device into a plurality of word line groups based on program time information on program times of the respective word lines. Also, the controller may include a super page configuration circuit configured to configure a plurality of super pages including some of the word lines, based on word line group information on the word line groups. Embodiments of the disclosure may provide a storage device, a controller and a method for operating a controller, capable of minimizing program performance degradation that may occur due to deviations in program time among word lines.

Abstract: A random bit cell includes a selection transistor, a first P-type transistor, and a second P-type transistor. The selection transistor has a first terminal coupled to a source line, a second terminal coupled to a common node, and a control terminal coupled to a word line. The first P-type transistor has a first terminal coupled to the common node, a second terminal coupled to a first bit line, and a floating gate. The second P-type transistor has a first terminal coupled to the common node, a second terminal coupled to a second bit line, and a floating gate. During an enroll operation, one of the first P-type transistor and the second P-type transistor is programmed by channel hot electron injection.

Abstract: A computer-implemented method, according to one embodiment, includes: detecting that a calibration of a first page group has been triggered, and evaluating a hierarchical page mapping to determine whether the first page group correlates to one or more other page groups in non-volatile memory. In response to determining that the first page group does correlate to one or more other page groups in the non-volatile memory, a determination is made as to whether to promote at least one of the one or more other page groups for calibration. In response to determining to promote at least one of the one or more other page groups for calibration, the first page group and the at least one of the one or more other page groups are calibrated. Moreover, each of the page groups includes one or more pages in non-volatile memory.

Abstract: A memory device stores data for a host device. In one approach, a method includes: selecting, by the memory device, a first mode of operation for a host interface that implements a communication protocol for communications between the memory device and the host device. The host interface is configured to implement the communication protocol using a mode selected by the memory device from one of several available modes. In response to selecting the first mode, resources of the memory device are configured to customize the host interface for operation in the first mode.

Abstract: A method of operating a resistive memory device to increase a read margin includes applying a write pulse to a memory cell such that the memory cell is programmed to a target resistance state, and applying a post-write pulse to the memory cell to increase a resistance of the memory cell that is in the target resistance state, the post-write pulse being applied as a single pulse having at least n stepped voltage levels, n being an integer equal to or more than 2, and an n-th stepped voltage level of the post-write pulse is set to be lower than a minimum threshold voltage level of the target resistance state that is changed by an (n?1)-th stepped voltage level of the post-write pulse.

Abstract: According to one embodiment, in a semiconductor device, the first pull-up circuit is connected to a third node and to a fourth node. The third node is a node between a drain of the first transistor with a first conductivity type and a source of the second transistor with the first conductivity type. The fourth node is a node between a drain of the third transistor with the first conductivity type, and a source of the fourth transistor with the first conductivity type and a source of the fifth transistor with the first conductivity type. The first pull-down circuit is connected to a fifth node and to a sixth node. The fifth node is a node between a drain of the first transistor with a second conductivity type and a source of the second transistor with the second conductivity type.

Abstract: The present technology includes a memory system and a method of operating the memory system. The memory system includes a memory device including an interface circuit, the interface circuit storing first system data, and a semiconductor memory; and a controller configured to output a read enable signal and a first read command for the first system data to the memory device. The semiconductor memory transfers a data strobe signal to the interface circuit in response to the read enable signal, the interface circuit reads the first system data in response to the first read command and transmits the read first system data to the controller in synchronization with the data strobe signal.

Abstract: A memory device includes a driver that drives a data line connected with an external device, an internal ZQ manager that generates an internal ZQ start signal, a selector that selects one of the internal ZQ start signal and a ZQ start command from the external device, based on a ZQ mode, a ZQ calibration engine that generates a ZQ code by performing ZQ calibration in response to a selection result of the selector, and a ZQ code register that loads the ZQ code onto the driver in response to a ZQ calibration command from the external device.

Abstract: A data reading error is reduced. A memory cell array in a storage device includes a write word line, a read word line, a write bit line, a read bit line, a source line, and a gain cell. For example, a read transistor in the gain cell can include a metal oxide in a channel formation region. A cancel circuit is electrically connected to the read bit line. The cancel circuit has a function of supplying, to the read bit line, current for canceling leakage current supplied to the read bit line from the gain cell in a non-selected state. In read operation, a potential change of the read bit line due to leakage current is compensated for by the current from the cancel circuit, so that a data reading error is reduced.

Abstract: A memory device having fault detection functionality for improving functional safety and a control system including the memory device are provided. The memory device includes a first memory cell array configured to store input data and output the input data as output data and a second memory cell array configured to store bit values of a row address and a column address of the first memory cell array in which the input data is stored, and output the bit values of the row address and the column address as an internal row address and an internal column address. The row/column address designating a read operation may be compared to the internal row/column address, and an address comparison signal as a result of the comparison may be output. The address comparison signal may provide fault detection functionality for a data error of an automotive electronic system.

Abstract: Nonvolatile memory (e.g. phase change memory) devices, systems, and methods that minimize energy expenditure and wear while providing greatly improved error rate with respect to marginal bits are disclosed and described.

Abstract: A memory device includes a first data driver configured to send a first data according to a first clock signal; a first data port electrically coupled to the first data driver, the first data port configured to receive the first data; a second data driver configured to send a second data according to a second clock signal, wherein the second clock signal does not match the first clock signal; and a second data port electrically coupled to the second data driver, the second data port configured to receive the second data.

Abstract: A memory controller for performing soft decoding according to a Cell Difference Probability (CDP) calculated based on a cell distribution controls a memory device. The memory controller for controlling the memory device, the memory controller comprising: an error corrector configured to correct an error in read data received from the memory device; a command generator configured to output, in response to failing an error correction operation of the error corrector, a cell distribution detection command for detecting threshold voltage distributions of memory cells included in the memory device; and a read voltage controller configured to determine, based on cell distribution detection data that the memory device provides in response to the cell distribution detection command, a number of read voltages for a read operation to be performed in the memory device and an interval between neighboring ones among the read voltages.

Abstract: A storage device includes a first layer extending in a first direction, a second layer extending in a second direction intersecting the first direction, a third layer extending in a third direction intersecting the first and second directions, a first transistor including a first gate electrode electrically connected to the second layer, a first selection transistor having a first end electrically connected to the third layer and a second end electrically connected to the second layer, a first cell including a first element electrically connected between the first and second layers and to a node of the second layer that is between the first gate electrode of the first transistor and the second end of the first selection transistor, and a circuit turning on the first selection transistor to electrically connect the first cell to the third layer during a write operation performed on the first cell.

Abstract: An apparatus for generating a magnetic field including permanent magnets arranged in a plane, each magnet being spatially separated along the plane from the adjacent magnet by a predetermined spacing, each magnet having a magnetic polarity opposed to the polarity of the adjacent magnet such that a magnetic field of adjacent magnets is oriented substantially perpendicular to the plane and in opposite directions, each magnet being spatially separated in the plane from the adjacent magnet by a nonmagnetic material. A method for programming a magnetic device or sensor device using the apparatus is also described.