Abstract: A method for determining the location of an object on a touch panel is provided. Initially, a pulse of terahertz radiation is transmitted through a touch panel, which formed of a dielectric material such that the pulse generates a evanescent field in a region adjacent to a touch surface of the touch panel. A reflected pulse is generated by an object located within the region adjacent to the touch surface of the touch panel, and a position of the object on the touch surface of the touch panel is triangulated at least in part from the reflected pulse.

Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

Abstract: An architecture for testing a plurality of circuits on an integrated circuit is described. The architecture includes a TAP Linking Module located between test pins on the integrated circuit and 1149.1 Test Access Ports (TAP) of the plurality of circuits to be tested. The TAP Linking Module operates in response to 1149.1 scan operations from a tester connected to the test pins to selectively switch between 1149.1 TAPs to enable test access between the tester and plurality of circuits. The TAP Linking Module's 1149.1 TAP switching operation is based upon augmenting 1149.1 instruction patterns to affix an additional bit or bits of information which is used by the TAP Linking Module for performing the TAP switching operation.

Abstract: A method for determining the position of a target is provided. Several emitted pulses of terahertz radiations are emitted from a phased array (which has several transceivers) in consecutive cycles (typically). These emitted pulses are generally configured to be reflected by a target so as to be received by the phased array within a scan range (which includes a digitization window with several sampling periods). Output signals from each of the transceivers are then combined to generate a combined signal for each cycle. The combined signal in each sampling period within the digitization window for emitted pulses is averaged to generate an averaged signal for each sampling period within the digitization window. These averaged signals are then digitized.

Abstract: Traditionally, pipelined continuous-time (CT) sigma-delta modulators (SDM) have been difficult to build due at least in part to the difficulties in calibrating the pipeline. Here, however, a pipelined CT SDM is provided that has an architecture that is conducing to being calibrated. Namely, the system includes a digital filter and other features that can be adjusted to account for input imbalance errors and well as quantization leakage noise.

Abstract: At very high frequencies, generally above 100 GHz, the performance of traditional radio frequency (RF) circuitry begins to significantly limit performance. An example is the hybrid coupler, which can have a relatively narrow 90° bandwidth in these frequency ranges. Here, however, a branch-line hybrid coupler (which has been integrated into a quadrature downconversion mixer) has been modified. Namely, an adjustable impedance network has been coupled to isolation port (which has traditionally been terminated) to substantially increase the tuning range and expand the bandwidth of the quadrature mixer within these very high frequency ranges.

Abstract: An architecture for testing a plurality of circuits on an integrated circuit is described. The architecture includes a TAP Linking Module located between test pins on the integrated circuit and 1149.1 Test Access Ports (TAP) of the plurality of circuits to be tested. The TAP Linking Module operates in response to 1149.1 scan operations from a tester connected to the test pins to selectively switch between 1149.1 TAPs to enable test access between the tester and plurality of circuits. The TAP Linking Module's 1149.1 TAP switching operation is based upon augmenting 1149.1 instruction patterns to affix an additional bit or bits of information which is used by the TAP Linking Module for performing the TAP switching operation.

Abstract: A method of designing an analog integrated circuit (IC), a parasitic constraint analyzer and a method of determining a layout of an analog IC complies with parasitic constraints. In one embodiment, the method of designing an analog IC includes: (1) creating a schematic of an analog integrated circuit based on a set of specifications, (2) attaching parasitic constraints to the schematic, (3) creating a layout of the analog integrated circuit based on the schematic including the parasitic constraints, (4) extracting parasitic values from parasitic elements of the layout and (5) comparing the extracted parasitic values with the parasitic constraints to verify compliance therewith.

Abstract: Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

Abstract: Traditionally, pipelined continuous-time (CT) sigma-delta modulators (SDM) have been difficult to build due at least in part to the difficulties in calibrating the pipeline. Here, however, a pipelined CT SDM is provided that has an architecture that is conducing to being calibrated. Namely, the system includes a digital filter and other features that can be adjusted to account for input imbalance errors and well as quantization leakage noise.

Abstract: In some developing interconnect technologies, such as chip-to-chip optical interconnect or metal waveguide interconnects, misalignment can be a serious issue. Here, however, a interconnect that uses an on-chip directional antenna (which operates in the sub-millimeter range) to form a radio frequency (RF) interconnect through a dielectric waveguide is provided. This system allows for misalignment while providing the increased communication bandwidth.

Abstract: In some developing interconnect technologies, such as chip-to-chip optical interconnect or metal waveguide interconnects, misalignment can be a serious issue. Here, however, a interconnect that uses an on-chip directional antenna (which operates in the sub-millimeter range) to form a radio frequency (RF) interconnect through a dielectric waveguide is provided. This system allows for misalignment while providing the increased communication bandwidth.

Abstract: Transmission lines employing transmission line units or elements within integrated circuits (ICs) are well-known. Typically, different heights for these transmission line units can vary the characteristics of the cell (and transmission line), and there is typically a tradeoff between impedance and space (layout) specifications. Here, a transmission line is provided, which is generally comprised of elements of the same general width, but having differing or tapered heights that allow for impedance adjustments for high frequency applications (i.e., 160 GHz). For example, a transmission line that is coupled to a balun, with the transmission line units decreasing in height near the balun's center tap to adjust the impedance of the transmission line for the balun, is shown.

Abstract: Microelectronics have now developed to the point where radiation within the terahertz frequency range can be generated and used. Here, an integrated circuit or IC is provided that includes a phased array radar system, which uses terahertz radiation. In order to accomplish this, several features are employed; namely, a lower frequency signal is propagated to transceivers, which multiplies the frequency up to the desired frequency range. To overcome the losses from the multiplication, an injection locked voltage controlled oscillator (ILVCO) is used, and a high frequency power amplifier (PA) can then be used to amplify the signal for transmission.

Abstract: At very high frequencies, generally above 100 GHz, the performance of traditional radio frequency (RF) circuitry begins to significantly limit performance. An example is the hybrid coupler, which can have a relatively narrow 90° bandwidth in these frequency ranges. Here, however, a branch-line hybrid coupler (which has been integrated into a quadrature downconversion mixer) has been modified. Namely, an adjustable impedance network has been coupled to isolation port (which has traditionally been terminated) to substantially increase the tuning range and expand the bandwidth of the quadrature mixer within these very high frequency ranges.

Abstract: An embodiment of the invention provides a single-ended polar transmitting circuit. The single-ended polar transmitting circuit comprises a DAC, a differential-to-single-ended converter, a GmC filter and a load. The GmC filter comprises two gain stages, two filters, two switching devices, a translinear loop and a current mirror. When a second clock signal is high, a first current is conducted through the load, a second switching device and a second gain stage. When a first clock signal is high, a second current is conducted through a first switching device and the second gain stage. The first gain stage has a transconductance Gm1 and the second gain stage has a transconductance Gm2. The bandwidth of the GmC filter is approximately equal to the square root of the quantity (Gm1*Gm2)/(C1*C2). The bandwidth of the GmC filter is substantially a constant value.

Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

Abstract: Embodiments of the invention provide a system and method for chip to chip communications in electronic circuits. A router or switch receives data packets at input port ASICs. A routing table on the input port ASIC or on a routing ASIC is used to identify a destination port ASIC based upon header information in the data packet. The data packet is transmitted from the input port ASIC to the destination port ASIC using millimeter wave signals that are transmitted across a waveguide or a wireless interface.

Abstract: An architecture for testing a plurality of circuits on an integrated circuit is described. The architecture includes a TAP Linking Module located between test pins on the integrated circuit and 1149.1 Test Access Ports (TAP) of the plurality of circuits to be tested. The TAP Linking Module operates in response to 1149.1 scan operations from a tester connected to the test pins to selectively switch between 1149.1 TAPs to enable test access between the tester and plurality of circuits. The TAP Linking Module's 1149.1 TAP switching operation is based upon augmenting 1149.1 instruction patterns to affix an additional bit or bits of information which is used by the TAP Linking Module for performing the TAP switching operation.