Abstract: A buffered memory module includes a buffer circuit mounted and a plurality of memory devices mounted on the first surface of the board, the memory devices being electrically connected to the buffer circuit. The memory module also includes a plurality of test pads located on a second surface of the board and electrically connected to the buffer circuit.

Abstract: Memory interface systems include one or more channel lines that couple a memory to a memory controller such that the channel line(s) are responsive to a terminal voltage that is independent of supply voltages for the memory and the memory controller. Because the memory interface system uses a terminal voltage that is independent of the supply voltages of the memory and the memory controller, the interface system may be unaffected by voltage differences between the memory supply voltage and the memory controller supply voltage.

Abstract: A memory system having a stub-bus configuration transmits a free-running clock through the same path as data signals. A single clock domain is employed for both read and write operations. For both operations, the read or write clock signal is routed through the same transmission path as the data, thereby increasing system transfer rates by maximizing the window of data validity. In this manner, data bus utilization is increased due to the elimination of a need for a preamble interval for the strobe signal, and pin count on the memory module connectors is therefore reduced.

Abstract: A multi-chip package includes first through Nth semiconductor chips, each of which includes an input/output pad, an input/output driver coupled to the input/output pad, and an internal circuit. Each of the first through Nth semiconductor chips includes an internal pad for coupling the internal input/output driver and the internal circuit. The input/output pad of the first semiconductor chip directly receives an input/output signal via a corresponding pin of the multi-chip package. The second through Nth semiconductor chips indirectly receive the input/output signal via the internal pads coupled to each other. The multi-chip package can improve signal compatibility by maintaining a parasitic load of a pin to at least the level of a single chip, when a signal is transmitted to the pin at high speed.

Abstract: Embodiments of the invention include a stacked board-on-chip (BOC) package having a mirroring structure and a dual inline memory module (DIMM) on which the stacked BOC package is mounted. A bottom surface of a first semiconductor chip faces a bottom surface of a second semiconductor chip. An interposer electrically connects first and second packages, respectively comprising the first and second semiconductor chips, to each other. The DIMM is obtained by electrically connecting BOC packages to each other on upper and lower substrates of a printed circuit board. Since a height of the stacked BOC packages is greater than a height of a conventional stacked BOC package, the DIMM has a minimum stub length and an optimal topology. Hence, the DIMM can have a signal with excellent fidelity by reducing a load upon a signal line, and installation or wiring of components within the DIMM 300 requires less effort.

Abstract: A memory system system includes a single in-line memory module (SIMM) which contains a memory device and a signal transmission line connected between the memory device and a connection terminal, and a dual in-line memory module (DIMM) which contains two memory devices and a signal transmission line connected between the two memory devices and a connection terminal. A length of the signal transmission line of the SIMM is longer than a length of the signal transmission line of the DIMM. The load of the memory device of the SIMM is less than the load of memory devices of the DIMM, and the longer length of the signal transmission line of the SIMM increases a signal delay time of the SIMM to compensate for the different loads of the SIMM and DIMM memory devices. The longer length of the signal transmission line of the SIMM may further compensate for a signal transmission line connected between the first and second sockets which receive the SIMM and DIMM, respectively.

Abstract: Embodiments of the present invention may include an integrated circuit module structure for a high-density mounting. An embodiment may include a wiring board, having a mounting space with a mounting length determined in a first direction and a mounting width determined in a second direction, on at least one surface thereof, and a plurality of integrated circuit packages having a package mounting combination length longer than the mounting length of the wiring board. An embodiment may also have some packages among the plurality of integrated circuit packages mounted directly on the mounting space, while other packages are mounted indirectly on the mounting space. The present embodiment may have packages that are overlapped horizontally and vertically distant from one another. Embodiments allow a plurality of chips or packages to be mounted in a limited area without changing a form factor of integrated circuit module even when integrated circuit chip or package size increases.

Abstract: A memory module, including a plurality of semiconductor memory devices for writing and reading m-bit parallel data; and a buffer for converting n-bit serial data into the m-bit parallel data to output to the plurality of semiconductor memory devices, converting the m-bit parallel data into the n-bit serial data to output to a first external portion during a normal operation, buffering 2n-bit parallel data to output to the plurality of semiconductor memory devices, and buffering the m-bit parallel data to output to a second external portion during a test operation.

Abstract: The semiconductor memory system includes a memory controller, N system data buses, and first through P-th memory module groups. The N system data buses are connected to the memory controller and respectively have a width of M/N bits. The first through P-th memory module groups are connected to the N system data buses and respectively have N memory modules. In each of the first through P-th memory module groups, a different one of the N system data buses is connected to each of the N memory modules, and each of the N system data buses has a data bus width of M/N bits. The first through P-th memory module groups are operated in response to first through P-th corresponding chip select signals. M is the bit-width of an entire system data bus of the semiconductor memory system. The N system data buses are wired such that data transmission times are the same from each N memory modules that operate in response to the same chip select signal to the memory controller.

Abstract: Multi-chip package includes first through Nth semiconductor chips, each of which includes an input/output pad, an input/output driver coupled to the input/output pad, and an internal circuit. Each of the first through Nth semiconductor chips includes an internal pad for coupling the internal input/output driver and the internal circuit. The internal pads of the first through Nth semiconductor chips are coupled to each other such as via a common pad installed at a substrate. The input/output pad of the first semiconductor chip directly receives an input/output signal transmitted via a corresponding pin of the multi-chip package. The second through Nth semiconductor chips indirectly receive the input/output signal via the internal pads coupled to each other. The multi-chip package can improve signal compatibility by maintaining a parasitic load of a pin to at least the level of a single chip, when a signal is transmitted to the pin at high speed.

Abstract: For ODT (on-die termination) control within a memory module system, just one pin from the memory controller is used for sending command signals indicating an activated one of the memory devices. The activated memory device includes components that are turned on for generating the ODT control signal for controlling an ODT circuit of inactivated memory device(s). The components for generating an ODT control signal within the inactivated memory devices are turned off for minimized power consumption.

Abstract: A circuit board and a method of manufacturing the same are disclosed. Embodiments of the circuit board may include a dielectric substrate, a first via structure comprising a first via-hole, which is defined through the dielectric substrate, and a plurality of first vias that are formed on an inner wall of the first via-hole and to connect a plurality of signal patterns positioned on the upper and lower surfaces of the dielectric substrate.

Abstract: Embodiments are described in which a stacked arrangement of integrated circuit packages comprises a dummy substrate comprising an embedded discrete or distributed capacitor connected to first and/or second power voltages, or an embedded termination register connected to one or more clock, control, address, and/or data signals(s).

Abstract: A test apparatus capable of detecting input/output (I/O) circuit characteristics of a semiconductor device by analyzing an eye mask generated in the test apparatus and the waveform of a test signal output from the I/O circuit of the semiconductor device. The test apparatus includes an eye mask generator that generates an eye mask in synchronization with one or more clock signals of opposite phase to each other, an error detector that receives the eye mask from the eye mask generator and compares the test signal with the eye mask to determine whether an error occurs in the semiconductor device, and an error signal output unit that receives an error detection signal from the error detector and generates an error signal in response to the error detection signal.

Abstract: A multi-chip package includes first through Nth semiconductor chips, each of which includes an input/output pad, an input/output driver coupled to the input/output pad, and an internal circuit. Each of the first through Nth semiconductor chips includes an internal pad for coupling the internal input/output driver and the internal circuit. The internal pads of the first through Nth semiconductor chips are coupled to each other such as via a common pad installed at a substrate. The input/output pad of the first semiconductor chip directly receives an input/output signal from a corresponding pin of the multi-chip package. The second through Nth semiconductor chips indirectly receive the input/output signal via the internal pads coupled to each other.

Abstract: The present invention discloses a memory module and a method of arranging a signal line of the same.

Abstract: In the memory module, a buffer is disposed on one of at least two circuit boards in the memory module. The buffer is for buffering signals for memory chips on at least two circuit boards in the memory module.

Abstract: A transmission circuit that conducts signals between integrated circuit devices includes a first driver circuit that generates a first transmit signal in response to first and second input signals, the first transmit signal being transmitted from the integrated circuit device. A first conductive line is electrically coupled to the first driver circuit and conducts the first transmit signal. A second driver circuit generates a second transmit signal in response to the first transmit signal and a third input signal, the second transmit signal being transmitted from the integrated circuit device. A second conductive line is electrically coupled to the second driver circuit and conducts the second transmit data signal. Related methods are also disclosed.

Abstract: A semiconductor memory device capable of determining an operation mode by using states of data pins, and an operation mode determining method for the same are disclosed. The semiconductor memory device includes at least one MRS input pad, at least one data input pad, and an operation mode determining circuit. The operation mode determining circuit generates an operation mode determining signal, when an MRS command input through the MRS input pad corresponds to a predetermined MRS command and data signals input through the data input pad or pads include a predetermined combination. Accordingly, the efficiency in the manufacturing and producing processes may be improved by determining the operation mode of the semiconductor memory device in a module assembly process.

Abstract: We describe and claim an error detecting memory module and method. The module comprises a plurality of memory devices, each memory device to receive an address signal and a command signal from a memory controller, and to detect an error in the address and command signals responsive to an input parity signal. In an embodiment, each memory device is adapted to provide an output parity signal to the memory controller responsive to the detection.