Abstract: A data transmission update technique for use in a low power mode and/or a low activity mode of a computer system or a portion thereof is provided. When in the low power mode and/or the low activity mode, the technique initiates a testing of data transmissions, the results of which are used to adjust the timing of data receipt such that accurate and timely date communications are facilitated.

Abstract: A method for quantifying effects of resonance in an integrated circuit's power distribution network is provided. The power distribution network includes a first power supply line and a second power supply line to provide power to the integrated circuit. Test ranges are selected for two test parameters, reference voltage potential of a receiver and data transmission frequency of the integrated circuit. At each combination of the two test parameters, bit patterns are transmitted by the integrated circuit to the receiver. A comparison is made between the transmitted bits and the received bits to determine whether the transmitted bits were correctly received. The comparison may be used to determine and report a range of values for the reference voltage potential and data transmission frequency that allow the transmitted bits to be correctly received.

Abstract: A technique for adjusting a communication system involves a plurality of links where each link includes a data line adapted to transmit a data signal and a clock line adapted to transmit a clock signal. A test circuit connects to the plurality of links where the test circuit tests at least one of the plurality of links. The test circuit includes an adjustment circuit arranged to generate an adjustable clock signal from the clock signal of the one of the plurality of links based on an offset where the adjustment circuit adjusts a timing of the adjustable clock signal relative to the data signal of the one of the plurality of links. The test circuit is adapted to perform a round-robin testing of the plurality of the links.

Abstract: A low-complexity, high accuracy model of a CPU power distribution system has been developed. The model includes models of multiple power converters that input to a board model. The board model then inputs to a package model. Finally, the package model inputs to a chip model. The model provides a high degree of accuracy with an acceptable simulation time.

Abstract: A method and apparatus for post-fabrication calibration and adjustment of a phase locked loop leakage current is provided. The calibration and adjustment system includes an adjustment circuit that adjusts a leakage current offset circuit to compensate for the leakage current of a capacitor. The capacitor connects to a control voltage of the phase locked loop. Such control of the leakage current in the phase locked loop allows a designer to achieve a desired phase locked loop operating characteristic after the phase locked loop has been fabricated. A representative value of the amount of compensation desired in the leakage current may be stored and subsequently read to adjust the phase locked loop.

Abstract: A system and method are provided for sensing a physical stimulus of an integrated circuit. The system and method operate with one or more active thermal sensors embedded in the die of an integrated circuit to provide highly accurate die temperature measurements. The system and method are able to monitor and control the die temperature of the integrated circuit to avoid an integrated circuit malfunction due to an undesirable temperature condition.

Abstract: A system and method of adjusting a sense amplifier to compensate for the process-type of the sense amplifier includes determining a process-type of the sense amplifier. An amplification control parameter is provided to the sense amplifier. The amplification control parameter is adjusted to adjust the sense amplifier according to the process-type of the sense amplifier.

Abstract: A low-complexity, high accuracy model of a CPU anti-resonance system has been developed. The model includes a simulated load model, a simulated transistor that simulates the performance of a high frequency capacitor, and a simulated capacitor that simulates the performance of an intrinsic capacitance of a section of the microprocessor. All of the elements of the model are connected in parallel.

Abstract: A method and apparatus for adjusting clock skew involves sensing a temperature at a location on an integrated circuit. A temperature sensor indicates a temperature value of the location on the integrated circuit. The temperature value is monitored, and a tunable buffer is adjusted dependent on the monitoring. The tunable buffer is used to adjust clock skew.

Abstract: A system and method of determining an in-situ signal path delay on an integrated circuit. The system and method includes inputting a first signal to a first input node of a first signal path and inputting a second signal to a second input node of a reference signal path. A phase of the first signal output from a first output node of the first signal path is compared to a phase of the second signal output from a second output node of the reference signal path. A phase error signal is output.

Abstract: A controller and method are provided for monitoring and controlling a temperature of an integrated circuit to inhibit damage from a thermal problem. The controller and method allow for individual temperature thresholds for each of one or more temperature sensors. Digital filtering of values received from temperature sensors is also provided. A variety of actions can be selected for execution upon a determination of an over-temperature condition of the integrated circuit, including assert an over-temperature pin, assert an over-temperature bit in an error register of said controller, assert an over-temperature bit in an error register of said microprocessor, issue an over-temperature interrupt to a service bus of said integrated circuit, cause a trap, slow an operating frequency of said integrated circuit, stop said integrated circuit, and do nothing.

Abstract: A temperature monitoring technique that eliminates the need for bipolar devices. In one embodiment of the present invention, a long-channel MOS transistor is configured in a diode connection to sense change in temperature. The diode drives a linear regulator and an oscillator. The oscillator in turn drives a counter, which counts pulses for a fixed period of time. The system clock on the chip is used as a temperature-independent frequency to generate a count. The temperature-dependent frequency is counted for a fixed number of system clock cycles. The present invention eliminates band gap circuitry currently used in most thermal sensing devices to provide a temperature-independent reference.

Abstract: An invention is provided for an adaptive keeper circuit. The adaptive keeper circuit includes a first keeper transistor having a first terminal in electrical communication with a power supply and a second terminal in electrical communication with an internal dynamic node. In addition, a second keeper transistor is included that is configured in parallel to the first keeper transistor. The second keeper transistor also has a first terminal in electrical communication with the power supply. The second keeper transistor can be added to the first keeper transistor using a feedback bit line, which is configured to control current flow between the second keeper transistor and the internal dynamic node based on a state of the feedback bit line. The state of the feedback bit line is based on a process corner characteristic of the die. Additional keeper transistors and corresponding feedback bit lines can be added to the keeper circuit to increase flexibility.

Abstract: An apparatus and method are provided for sensing a physical stimulus of an integrated circuit. The apparatus and method allow for accurate die temperature measurements of the integrated circuit and are able to provide a highly accurate die temperature measurement without the need for an independent voltage source or current source.

Abstract: An invention is disclosed for a process monitor based keeper scheme for dynamic circuits. A semiconductor die having a process monitor based keeper scheme of the embodiments of the present invention generally includes a plurality of dynamic circuits, each having an adaptive keeper circuit capable of being adjusted based on a bit code. In addition, a plurality of process monitors is included. Each process monitor is disposed within a corresponding die block, which defines a local area of the die. The process monitors are capable of detecting process corner data for the corresponding die block. In communication with each process monitor and the plurality of dynamic circuits is a test processor unit. The test processor unit obtains process corner data for each die block from the process monitor disposed within the die block, and provides a bit code based on the process corner data to the dynamic circuits disposed within the die block.

Abstract: A system and method of adjusting a sense amplifier includes providing an amplification control parameter to the sense amplifier. A temperature of the sense amplifier is monitored and the amplification control parameter to the sense amplifier is adjusted according to the temperature of the sense amplifier.

Abstract: A SSTL memory interface pre-driver stage that uses a voltage regulator to generate a ‘virtual’ ground reference voltage is provided. The ‘virtual’ ground voltage reference, being greater than a zero volt ground voltage, allows low voltage transistors to be used, thereby improving interface performance and decreasing system power consumption. The pre-driver stage uses a biasing circuit to bias the voltage regulator, formed by a transistor arranged in a source follower configuration, to generate the ‘virtual’ ground reference voltage off which a voltage translator stage of the pre-driver stage operates to generate an output of the pre-driver stage.

Abstract: A method for reducing a magnitude of a rate of current change of an integrated circuit is provided. The method uses a plurality of transistors controlled by a finite state machine, such as a counter, to gradually reduce current sourced from a power supply. Further, the finite state machine is controlled by a micro-architectural stage that determines when the integrated circuit needs to be powered down.

Abstract: A system and method of adjusting an I/O receiver includes providing an amplification control parameter to the I/O receiver. A temperature of the I/O receiver is monitored and the amplification control parameter to the I/O receiver is adjusted according to the temperature of the I/O receiver.

Abstract: A computer system uses a power distribution network arranged to propagate at least one voltage potential to an integrated circuit. A resonance detector is arranged to detect a power supply resonance. A damping circuit is operatively connected to the resonance detector and the power distribution network. The damping circuit resides external to the integrated circuit and dampens the power supply resonance under control of the resonance detector.