Abstract: Embodiments of the invention are directed to a computer-implemented method of determining timing constraints of a first component-under-design (CUD). The computer-implemented method includes accessing, using a processor, a plurality of timing constraint requirements configured to be placed on the first CUD by one or more second CUDs, wherein each of the plurality of timing constraint requirements is specifically designed for the CUD. The processor is used to perform a comparative analysis of each of the plurality of timing constraints to identify a single timing constraint that satisfies each of the plurality of timing constraints.

Abstract: Embodiments of the invention are directed to a computer-implemented method of determining timing constraints of a first component-under-design (CUD). The computer-implemented method includes accessing, using a processor, a plurality of timing constraint requirements configured to be placed on the first CUD by one or more second CUDs, wherein each of the plurality of timing constraint requirements is specifically designed for the CUD. The processor is used to perform a comparative analysis of each of the plurality of timing constraints to identify a single timing constraint that satisfies each of the plurality of timing constraints.

Abstract: According to one embodiment, a method, computer system, and computer program product for creating a plurality of process parameters in a circuit design is provided. The present embodiment of the invention may include receiving one parasitic extraction per layer of a circuit is used to obtain a resistance base factor and a capacitance base factor. The embodiment may further include performing Monte Carlo simulations to determine distributions of capacitance and resistance for each metal layer of the circuit, and creating scalars that scale each of the resistance base factor and the capacitance base factor to a minimum and maximum process limit. Additionally, the embodiment may include defining at least one delay corner using the created scalars, and receiving the results of one or more timing analyses performed using the resistance base factor and the capacitance base factor, and the defined delay corner to determine a delay variability per layer.

Abstract: Systems and methods for improving timing closure of new and existing IC chips by breaking at least one parameter of interest into two or more partial parameters. More specifically, a method is provided for that includes propagating at least one timing analysis run for a semiconductor product. The method further includes identifying at least one parameter of interest used in the at least one timing analysis run. The method further includes splitting the at least one parameter into two parts comprising a controlled part and an uncontrolled part. The method further includes correlating or anti-correlating the controlled part with another parameter used in the at least one timing analysis run. The method further includes projecting timing using the correlation or anti-correlation between the controlled part and the another parameter and using the uncontrolled part of the at least one parameter.

Abstract: A system and method of performing variable accuracy incremental timing analysis in integrated circuit development includes generating a timing graph for interconnected components. The timing graph represents each pin as a node and each interconnection as an arc. A first node or arc is selected. First-level timing values are obtained for the first node or arc using a first timing model that provides a first level of accuracy. n timing models with corresponding n levels of accuracy are pre-selected. The first-level timing values are copied as second-level timing values and as timing values for every other one of the n levels of accuracy for the first node or arc. A second node or arc downstream from the first node or arc is selected. Second-level timing values for the second node or arc are obtained using a second timing model that provides a second level of accuracy.

Abstract: A system and method of performing variable accuracy incremental timing analysis in integrated circuit development includes generating a timing graph for interconnected components. The timing graph represents each pin as a node and each interconnection as an arc. A first node or arc is selected. First-level timing values are obtained for the first node or arc using a first timing model that provides a first level of accuracy. n timing models with corresponding n levels of accuracy are pre-selected. The first-level timing values are copied as second-level timing values and as timing values for every other one of the n levels of accuracy for the first node or arc. A second node or arc downstream from the first node or arc is selected. Second-level timing values for the second node or arc are obtained using a second timing model that provides a second level of accuracy.

Abstract: A system and method to perform timing analysis in integrated circuit development involves defining an integrated circuit design as nodes representing components of the integrated circuit design that are interconnected by edges representing wires. Sequentially connected nodes define a path. Statistical variables are defined for a canonical delay model of each node and edge of the integrated circuit design and define a first set of conditions. The method includes performing a statistical static timing analysis to obtain an arrival time at each node as a sum of the canonical delay models for nodes and edges that precede the node in the path of the node, obtaining a projected arrival time at a second set of conditions for the node by scaling the arrival time for the node using scale factors that represent the second set of conditions and using a transformation matrix, and providing the integrated circuit design for fabrication.

Abstract: A system and method to perform timing analysis in integrated circuit development involves defining an integrated circuit design as nodes representing components of the integrated circuit design that are interconnected by edges representing wires. Sequentially connected nodes define a path. Statistical variables are defined for a canonical delay model of each node and edge of the integrated circuit design and define a first set of conditions. The method includes performing a statistical static timing analysis to obtain an arrival time at each node as a sum of the canonical delay models for nodes and edges that precede the node in the path of the node, obtaining a projected arrival time at a second set of conditions for the node by scaling the arrival time for the node using scale factors that represent the second set of conditions and using a transformation matrix, and providing the integrated circuit design for fabrication.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integrated circuit to create a parameterized model of the integrated circuit for a plurality of paths using a plurality of timing corners to calculate a timing value for each of the plurality of paths, each of the plurality of timing corners representing a set of timing performance parameters. The method further comprises determining at least one worst timing corner from the parameterized model for each of the plurality of paths based on the initial statistical static timing analysis and calculated timing value for each of the plurality of paths. The method also comprises performing a subsequent analysis of the integrated circuit using the at least one worst timing corner.

Abstract: Reducing the runtime overhead needed for testing of an integrated circuit design. A determination may be made of parameters that clock routing and data routing in an integrated circuit are dependent upon. A determination is made of whether the parameters are suitable for compaction, such as by determining whether the parameters are utilized in only one of clock routing or data routing. The parameters suitable for compaction are defined or redefined into at least one proxy compacted parameter. A timing analysis for the integrated circuit is performed using the proxy compacted parameter instead of performing the timing analysis using the parameters suitable for compaction.

Abstract: According to one embodiment, a method, computer system, and computer program product for creating a plurality of process parameters in a circuit design is provided. The present embodiment of the invention may include receiving one parasitic extraction per layer of a circuit is used to obtain a resistance base factor and a capacitance base factor. The embodiment may further include performing Monte Carlo simulations to determine distributions of capacitance and resistance for each metal layer of the circuit, and creating scalars that scale each of the resistance base factor and the capacitance base factor to a minimum and maximum process limit. Additionally, the embodiment may include defining at least one delay corner using the created scalars, and receiving the results of one or more timing analyses performed using the resistance base factor and the capacitance base factor, and the defined delay corner to determine a delay variability per layer.

Abstract: Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

Abstract: Systems and methods for improving timing closure of new and existing IC chips by breaking at least one parameter of interest into two or more partial parameters. More specifically, a method is provided for that includes propagating at least one timing analysis run for a semiconductor product. The method further includes identifying at least one parameter of interest used in the at least one timing analysis run. The method further includes splitting the at least one parameter into two parts comprising a controlled part and an uncontrolled part. The method further includes correlating or anti-correlating the controlled part with another parameter used in the at least one timing analysis run. The method further includes projecting timing using the correlation or anti-correlation between the controlled part and the another parameter and using the uncontrolled part of the at least one parameter.

Abstract: According to one embodiment, a method, computer system, and computer program product for creating a plurality of process parameters in a circuit design is provided. The present embodiment of the invention may include receiving one parasitic extraction per layer of a circuit is used to obtain a resistance base factor and a capacitance base factor. The embodiment may further include performing Monte Carlo simulations to determine distributions of capacitance and resistance for each metal layer of the circuit, and creating scalars that scale each of the resistance base factor and the capacitance base factor to a minimum and maximum process limit. Additionally, the embodiment may include defining at least one delay corner using the created scalars, and receiving the results of one or more timing analyses performed using the resistance base factor and the capacitance base factor, and the defined delay corner to determine a delay variability per layer.

Abstract: In an approach for determining navigation routes, a computer identifies an emergency situation and a corresponding location. The computer identifies an emergency service based on the identified emergency situation and the corresponding location. The computer identifies an emergency treatment provider based on the identified emergency situation and the corresponding location. The computer determines a navigation route based on respective locations of the identified emergency situation, the identified emergency service, and the identified emergency treatment provider. The computer identifies one or more incoming devices on the determined navigation route. The computer determines an alternate navigation route for the identified one or more incoming devices, wherein the determined alternate navigation route reduces travel on the determined navigation route.

Abstract: Systems and methods for improving timing closure of new and existing IC chips by breaking at least one parameter of interest into two or more partial parameters. More specifically, a method is provided for that includes propagating at least one timing analysis run for a semiconductor product. The method further includes identifying at least one parameter of interest used in the at least one timing analysis run. The method further includes splitting the at least one parameter into two parts comprising a controlled part and an uncontrolled part. The method further includes correlating or anti-correlating the controlled part with another parameter used in the at least one timing analysis run. The method further includes projecting timing using the correlation or anti-correlation between the controlled part and the another parameter and using the uncontrolled part of the at least one parameter.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: The computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: According to one embodiment, a method, computer system, and computer program product for creating a plurality of process parameters in a circuit design is provided. The present embodiment of the invention may include receiving one parasitic extraction per layer of a circuit is used to obtain a resistance base factor and a capacitance base factor. The embodiment may further include performing Monte Carlo simulations to determine distributions of capacitance and resistance for each metal layer of the circuit, and creating scalars that scale each of the resistance base factor and the capacitance base factor to a minimum and maximum process limit. Additionally, the embodiment may include defining at least one delay corner using the created scalars, and receiving the results of one or more timing analyses performed using the resistance base factor and the capacitance base factor, and the defined delay corner to determine a delay variability per layer.

Abstract: A design and timing model for at least one circuit path of at least a portion of an IC design is loaded into a computer. At least one canonical clock variable associated with the model is defined; it includes at least one source of variation. The computer is used to perform an SSTA of the at least one circuit path, based on the design and timing model and the at least one canonical clock variable, to obtain slack canonical data. A clock period is projected, based on the slack canonical data, such that a cycle time canonical is projected to a different space than a logic canonical. Results of the SSTA and the projected clock period are output to determine performance compliance. Efficient operation of the computer is enhanced by analyzing a slack vector in a single timing run, loaded once, and multithreading timing propagation.