Abstract: Systems and methods for improving timing closure of new and existing IC chips by breaking at least one parameter of interest into two or more partial parameters. More specifically, a method is provided for that includes propagating at least one timing analysis run for a semiconductor product. The method further includes identifying at least one parameter of interest used in the at least one timing analysis run. The method further includes splitting the at least one parameter into two parts comprising a controlled part and an uncontrolled part. The method further includes correlating or anti-correlating the controlled part with another parameter used in the at least one timing analysis run. The method further includes projecting timing using the correlation or anti-correlation between the controlled part and the another parameter and using the uncontrolled part of the at least one parameter.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integrated circuit to create a parameterized model of the integrated circuit for a plurality of paths using a plurality of timing corners to calculate a timing value for each of the plurality of paths, each of the plurality of timing corners representing a set of timing performance parameters. The method further comprises determining at least one worst timing corner from the parameterized model for each of the plurality of paths based on the initial statistical static timing analysis and calculated timing value for each of the plurality of paths. The method also comprises performing a subsequent analysis of the integrated circuit using the at least one worst timing corner.

Abstract: Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

Abstract: Systems and methods for improving timing closure of new and existing IC chips by breaking at least one parameter of interest into two or more partial parameters. More specifically, a method is provided for that includes propagating at least one timing analysis run for a semiconductor product. The method further includes identifying at least one parameter of interest used in the at least one timing analysis run. The method further includes splitting the at least one parameter into two parts comprising a controlled part and an uncontrolled part. The method further includes correlating or anti-correlating the controlled part with another parameter used in the at least one timing analysis run. The method further includes projecting timing using the correlation or anti-correlation between the controlled part and the another parameter and using the uncontrolled part of the at least one parameter.

Abstract: Systems and methods for improving timing closure of new and existing IC chips by breaking at least one parameter of interest into two or more partial parameters. More specifically, a method is provided for that includes propagating at least one timing analysis run for a semiconductor product. The method further includes identifying at least one parameter of interest used in the at least one timing analysis run. The method further includes splitting the at least one parameter into two parts comprising a controlled part and an uncontrolled part. The method further includes correlating or anti-correlating the controlled part with another parameter used in the at least one timing analysis run. The method further includes projecting timing using the correlation or anti-correlation between the controlled part and the another parameter and using the uncontrolled part of the at least one parameter.

Abstract: In an approach for determining navigation routes, a computer identifies an emergency situation and a corresponding location. The computer identifies an emergency service based on the identified emergency situation and the corresponding location. The computer identifies an emergency treatment provider based on the identified emergency situation and the corresponding location. The computer determines a navigation route based on respective locations of the identified emergency situation, the identified emergency service, and the identified emergency treatment provider. The computer identifies one or more incoming devices on the determined navigation route. The computer determines an alternate navigation route for the identified one or more incoming devices, wherein the determined alternate navigation route reduces travel on the determined navigation route.

Abstract: The computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: A design and timing model for at least one circuit path of at least a portion of an IC design is loaded into a computer. At least one canonical clock variable associated with the model is defined; it includes at least one source of variation. The computer is used to perform an SSTA of the at least one circuit path, based on the design and timing model and the at least one canonical clock variable, to obtain slack canonical data. A clock period is projected, based on the slack canonical data, such that a cycle time canonical is projected to a different space than a logic canonical. Results of the SSTA and the projected clock period are output to determine performance compliance. Efficient operation of the computer is enhanced by analyzing a slack vector in a single timing run, loaded once, and multithreading timing propagation.

Abstract: Creating by a computer an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: In an approach for addressing process and voltage points across voltage and process space, a computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies a minimum set of voltage/process pairs associated with the integrated circuit design. The computer identifies a number n that defines the number of finite differencing operations to be performed for the identified minimum set of voltage/process pairs. The computer performs a single statistical static timing analysis with multi-corner projection for the identified integrated circuit based on the received number n that provides a finite difference for each number of finite differencing operations to be performed based on n for the identified minimum set of voltage/process pairs. The computer performs addressing based on the performed statistical static timing analysis. The computer provides a report.

Abstract: A design and timing model for at least one circuit path of at least a portion of an IC design is loaded into a computer. At least one canonical clock variable associated with the model is defined; it includes at least one source of variation. The computer is used to perform an SSTA of the at least one circuit path, based on the design and timing model and the at least one canonical clock variable, to obtain slack canonical data. A clock period is projected, based on the slack canonical data, such that a cycle time canonical is projected to a different space than a logic canonical. Results of the SSTA and the projected clock period are output to determine performance compliance. Efficient operation of the computer is enhanced by analyzing a slack vector in a single timing run, loaded once, and multithreading timing propagation.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.