Abstract: Reducing the runtime overhead needed for testing of an integrated circuit design. A determination may be made of parameters that clock routing and data routing in an integrated circuit are dependent upon. A determination is made of whether the parameters are suitable for compaction, such as by determining whether the parameters are utilized in only one of clock routing or data routing. The parameters suitable for compaction are defined or redefined into at least one proxy compacted parameter. A timing analysis for the integrated circuit is performed using the proxy compacted parameter instead of performing the timing analysis using the parameters suitable for compaction.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integrated circuit to create a parameterized model of the integrated circuit for a plurality of paths using a plurality of timing corners to calculate a timing value for each of the plurality of paths, each of the plurality of timing corners representing a set of timing performance parameters. The method further comprises determining at least one worst timing corner from the parameterized model for each of the plurality of paths based on the initial statistical static timing analysis and calculated timing value for each of the plurality of paths. The method also comprises performing a subsequent analysis of the integrated circuit using the at least one worst timing corner.

Abstract: A method, system, and computer program product to characterize and adaptively instantiate timing abstracts to perform timing analysis of an integrated circuit include generating an adaptable timing abstract for one or more macro models of a macro, the macro including two or more primitives of a component of the integrated circuit, the adaptable timing abstract being a parameterized timing model with at least one aspect represented by two or more models, and estimating requirements for the timing analysis, the requirements including accuracy, runtime, or memory requirements. Selecting a specific timing abstract, obtained by setting parameters of the adaptable timing abstract, is to perform the timing analysis based on the requirements.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: In an approach for determining voltage and frequency pairs, the computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies at least a nominal voltage, a nominal clock signal, and a voltage range associated with the integrated circuit design. The computer receives a number n that defines the number of at least one alternate voltage within the voltage range. The computer analyzes the identified integrated circuit based on the received number n for each number n for at least one alternate voltage within the voltage range. The computer calculates a nominal slack. The computer calculates one or more clock periods based on the calculated nominal slack. The computer provides a report based on the calculated one or more clock periods.

Abstract: Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

Abstract: In an approach for addressing process and voltage points across voltage and process space, a computer identifies an integrated circuit design. The computer identifies a timing model associated with the identified integrated circuit design. The computer identifies a minimum set of voltage/process pairs associated with the integrated circuit design. The computer identifies a number n that defines the number of finite differencing operations to be performed for the identified minimum set of voltage/process pairs. The computer performs a single statistical static timing analysis with multi-corner projection for the identified integrated circuit based on the received number n that provides a finite difference for each number of finite differencing operations to be performed based on n for the identified minimum set of voltage/process pairs. The computer performs addressing based on the performed statistical static timing analysis. The computer provides a report.

Abstract: Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

Abstract: System and methods for achieving a timing closure in a design of an integrated circuit in presence of manufacturing variation. The method includes running a timing engine of a statistical timing analysis tool performing at least one optimization to fix at least one violation of at least one timing quantity at an integrated circuit location. The method includes choosing at least one optimization to apply and finding at least one failing timing quantity, where the quantity is failing due to at least one source of variability which the optimization would impact. The optimization is applied to at least one section of the path leading to the failing timing quantity, where the section contributes to the source of variability. Statistical sensitivity information in canonical form guides the optimization by providing a fully parameterized canonical form of the identified timing violations.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: A method, system, and computer program product to characterize and adaptively instantiate timing abstracts to perform timing analysis of an integrated circuit include generating an adaptable timing abstract for one or more macro models of a macro, the macro including two or more primitives of a component of the integrated circuit, the adaptable timing abstract being a parameterized timing model with at least one aspect represented by two or more models, and estimating requirements for the timing analysis, the requirements including accuracy, runtime, or memory requirements. Selecting a specific timing abstract, obtained by setting parameters of the adaptable timing abstract, is to perform the timing analysis based on the requirements.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integrated circuit to create a parameterized model of the integrated circuit for a plurality of paths using a plurality of timing corners to calculate a timing value for each of the plurality of paths, each of the plurality of timing corners representing a set of timing performance parameters. The method further comprises determining at least one worst timing corner from the parameterized model for each of the plurality of paths based on the initial statistical static timing analysis and calculated timing value for each of the plurality of paths. The method also comprises performing a subsequent analysis of the integrated circuit using the at least one worst timing corner.

Abstract: Systems and methods compute a mean timing value of an integrated circuit design for variables using a first timing calculation of relatively higher accuracy; and calculate a first timing value of the integrated circuit design for the variables, using a second timing calculation having a relatively lower accuracy. Such systems and methods calculate second timing values of the integrated circuit design for additional sets of variables using the second timing calculation; and calculate finite differences of each of the second timing values to the first timing value. Thus, these systems and methods calculate a statistical sensitivity of the first timing value to the additional sets of variables based on the finite differences. Further, such systems and methods calculate a statistical sensitivity of the mean timing value to the additional sets of values based on the statistical sensitivity of the first timing value to the additional sets of values.

Abstract: Various embodiments include approaches for analyzing a set of travel pathways for a priority vehicle. In some cases, an approach includes: obtaining data indicating a location of the priority vehicle and a location of a destination for the priority vehicle; ranking each of a set of paths between the location of the priority vehicle and the location of the destination based upon a travel time for the priority vehicle along the set of paths; and sending instructions to vehicles on a highest-ranked path in the set of paths to initiate providing a right-of-way to the priority vehicle, wherein vehicles closer to the destination along the highest-ranked path are instructed to change a corresponding position prior to vehicles farther from the destination along the highest-ranked path.

Abstract: In an approach for determining navigation routes, a computer identifies an emergency situation and a corresponding location. The computer identifies an emergency service based on the identified emergency situation and the corresponding location. The computer identifies an emergency treatment provider based on the identified emergency situation and the corresponding location. The computer determines a navigation route based on respective locations of the identified emergency situation, the identified emergency service, and the identified emergency treatment provider. The computer identifies one or more incoming devices on the determined navigation route. The computer determines an alternate navigation route for the identified one or more incoming devices, wherein the determined alternate navigation route reduces travel on the determined navigation route.

Abstract: Design methods and systems disclosed use a process window-aware timing analysis of an integrated circuit (IC) chip design for improved accuracy. Specifically, a process distribution for the design is defined and divided into process windows. Timing parameter adjustment factors are assigned to the process windows. A timing analysis is performed in order to acquire an initial solution for a timing parameter (e.g., delay, slack or slew). For each specific process window, this initial solution is adjusted by the predetermined timing parameter adjustment factor assigned to that specific process window. The adjusted solutions for the different process windows account for process window-to-process window variations in the widths of distribution of a process parameter (e.g., leakage power) and can be used to predict whether IC chips manufactured according the IC chip design will meet established timing requirements (e.g., required arrival times (RATs)) regardless of where they fall within the process distribution.