Abstract: Design methods and systems disclosed use a process window-aware timing analysis of an integrated circuit (IC) chip design for improved accuracy. Specifically, a process distribution for the design is defined and divided into process windows. Timing parameter adjustment factors are assigned to the process windows. A timing analysis is performed in order to acquire an initial solution for a timing parameter (e.g., delay, slack or slew). For each specific process window, this initial solution is adjusted by the predetermined timing parameter adjustment factor assigned to that specific process window. The adjusted solutions for the different process windows account for process window-to-process window variations in the widths of distribution of a process parameter (e.g., leakage power) and can be used to predict whether IC chips manufactured according the IC chip design will meet established timing requirements (e.g., required arrival times (RATs)) regardless of where they fall within the process distribution.

Abstract: The method includes identifying, by one or more computer processors, a location that corresponds to an integrated circuit chip on a wafer. The method further includes identifying, by one or more computer processors, an on-chip variation of the integrated circuit chip. The method further includes determining, by one or more computer processes, a desired voltage for the integrated circuit chip based upon the identified on-chip variation of the integrated circuit chip. The method further includes adjusting, by one or more computer processors, the voltage of the integrated circuit chip via a voltage regulated on the integrated circuit chip based upon the determined desired voltage.

Abstract: A method for controlling a circuit, the method comprises performing a first timing analysis of an digital integrated design, identifying a critical path in the digital integrated design that is dependent on a parameter, modifying the digital integrated design by inserting a first delay inducing circuit, running a second timing analysis on the modified digital integrated design to determine whether a delay induced by the first delay inducing circuit meets a timing requirement of the digital integrated design, and saving the delay induced by the first delay inducing circuit with an association to the parameter in a timing library responsive to determining that the delay induced by the first delay inducing circuit meets the timing requirement of the digital integrated design.

Abstract: Disclosed are a system and method that control integrated circuit chip temperature using frequency scaling based on predetermined temperature-frequency settings. During integrated circuit chip operation, a controller causes a variable clock signal generator to adjust the frequency of a clock signal that coordinates operations of an integrated circuit chip based on the temperature of the integrated circuit chip and on predetermined temperature-frequency settings. The temperature-frequency settings are predetermined in order to ensure that the frequency of the clock signal, as adjusted, remains sufficiently high to meet a chip performance specification, but sufficiently low to prevent the temperature from rising above a predetermined maximum temperature in order to limit power consumption. Also disclosed is a method of generating such temperature-frequency settings during timing analysis.

Abstract: Methods and systems receive an integrated circuit design into a computerized device and perform an analysis of the integrated circuit design to identify characteristics of physical features of portions of the integrated circuit design. Such methods and systems determine whether to look up sensitivity of a timing value of a portion of the integrated circuit design to manufacturing process variables, voltage variables, and temperature variables (PVT variables) by: evaluating relationships between the characteristics of physical features of the portion of the integrated circuit design to generate an indicator value; and, based on whether the indicator value is within a table usage filter value range, either: calculating the sensitivity of the timing value to the PVT variables; or looking up a previously determined sensitivity of the timing value to the PVT variables from a look-up table.

Abstract: Systems and methods compute a mean timing value of an integrated circuit design for variables using a first timing calculation of relatively higher accuracy; and calculate a first timing value of the integrated circuit design for the variables, using a second timing calculation having a relatively lower accuracy. Such systems and methods calculate second timing values of the integrated circuit design for additional sets of variables using the second timing calculation; and calculate finite differences of each of the second timing values to the first timing value. Thus, these systems and methods calculate a statistical sensitivity of the first timing value to the additional sets of variables based on the finite differences. Further, such systems and methods calculate a statistical sensitivity of the mean timing value to the additional sets of values based on the statistical sensitivity of the first timing value to the additional sets of values.

Abstract: Methods and systems receive an integrated circuit design into a computerized device and perform an analysis of the integrated circuit design to identify characteristics of physical features of portions of the integrated circuit design. Such methods and systems determine whether to look up sensitivity of a timing value of a portion of the integrated circuit design to manufacturing process variables, voltage variables, and temperature variables (PVT variables) by: evaluating relationships between the characteristics of physical features of the portion of the integrated circuit design to generate an indicator value; and, based on whether the indicator value is within a table usage filter value range, either: calculating the sensitivity of the timing value to the PVT variables; or looking up a previously determined sensitivity of the timing value to the PVT variables from a look-up table.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integrated circuit to create a parameterized model of the integrated circuit for a plurality of paths using a plurality of timing corners to calculate a timing value for each of the plurality of paths, each of the plurality of timing corners representing a set of timing performance parameters. The method further comprises determining at least one worst timing corner from the parameterized model for each of the plurality of paths based on the initial statistical static timing analysis and calculated timing value for each of the plurality of paths. The method also comprises performing a subsequent analysis of the integrated circuit using the at least one worst timing corner.

Abstract: A method, system, and computer program product to perform dynamic voltage frequency scaling of an integrated circuit include performing statistical timing analysis using a canonical form of a clock, the canonical form of the clock being a function of variability in voltage. Obtaining a canonical model expressing timing slack at each test location of the integrated circuit is as a function of one or more sources of variability, one of the one or more sources of variability being voltage, and performing the dynamic voltage-frequency scaling based on selecting at least one of a clock period and the voltage using the canonical model.

Abstract: Systems and methods compute a mean timing value of an integrated circuit design for variables using a first timing calculation of relatively higher accuracy; and calculate a first timing value of the integrated circuit design for the variables, using a second timing calculation having a relatively lower accuracy. Such systems and methods calculate second timing values of the integrated circuit design for additional sets of variables using the second timing calculation; and calculate finite differences of each of the second timing values to the first timing value. Thus, these systems and methods calculate a statistical sensitivity of the first timing value to the additional sets of variables based on the finite differences. Further, such systems and methods calculate a statistical sensitivity of the mean timing value to the additional sets of values based on the statistical sensitivity of the first timing value to the additional sets of values.

Abstract: Disclosed are a system and method that control integrated circuit chip temperature using frequency scaling based on predetermined temperature-frequency settings. During integrated circuit chip operation, a controller causes a variable clock signal generator to adjust the frequency of a clock signal that coordinates operations of an integrated circuit chip based on the temperature of the integrated circuit chip and on predetermined temperature-frequency settings. The temperature-frequency settings are predetermined in order to ensure that the frequency of the clock signal, as adjusted, remains sufficiently high to meet a chip performance specification, but sufficiently low to prevent the temperature from rising above a predetermined maximum temperature in order to limit power consumption. Also disclosed is a method of generating such temperature-frequency settings during timing analysis.

Abstract: Statistically modeling timing in a digital circuit through the use of canonical form models, where some terms of the form represent sources of variation sensitive to only a subset of timing regions of the circuit. When propagating the form through regions through which some set of terms in the model is not sensitive, those terms are collapsed by placing them in a cache and replacing them in the form with a single combined term that references the cached terms.

Abstract: The method includes identifying, by one or more computer processors, a location that corresponds to an integrated circuit chip on a wafer. The method further includes identifying, by one or more computer processors, an on-chip variation of the integrated circuit chip. The method further includes determining, by one or more computer processes, a desired voltage for the integrated circuit chip based upon the identified on-chip variation of the integrated circuit chip. The method further includes adjusting, by one or more computer processors, the voltage of the integrated circuit chip via a voltage regulated on the integrated circuit chip based upon the determined desired voltage.

Abstract: Systems and methods for modeling multi-patterning variability with statistical timing analysis during IC fabrication are described. The method may be provided implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions operable to define at least one source of variation in an integrated circuit design. The programming instructions further operable to model the at least one source of variation for at least two patterns in at least one level of the integrated circuit design as at least two sources of variability respectively.

Abstract: Systems and methods for avoiding restrictions on cell placement in a hierarchical design of integrated circuits with multi-patterning requirements are described. The method may be provided implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions operable to assign a color to each pattern shape in a first cell, assign a color to each pattern shape in a second cell, characterize quantities of interest for each pattern shape in the first cell, determine that the colors assigned in the first cell are all one to one mappable to the colors assigned in the second cells, characterize quantities of interest for each pattern shape in the second cell using the quantities of interest characterized for the first cell, and model the quantities of interest for the first cell and the second cell.

Abstract: As disclosed herein, a method, executed by a computer, for integrated circuit timing variability reduction includes loading a netlist that corresponds to a chip design, where the chip design includes one or more circuits and a plurality of post-fill features, traversing a portion of the netlist corresponding to a circuit, determining a post-fill environment for the circuit from a plurality of post-fill features, and modeling a timing variance for the circuit based on the post-fill environment. The method may also include changing one or more post-fill features to achieve a targeted delay. The method may include generating a report of circuit timing and timing variances. One or more circuits can be concurrently traversed. The timing variance can be modeled with the use of a scaling factor for a standard timing variance. A computer system and computer program product corresponding to the method are also disclosed herein.

Abstract: Disclosed is a system that periodically increases the supply voltage applied to a power rail of an integrated circuit chip that is incorporated into a product, thereby compensating for age-dependent changes in a performance parameter sensitivity (e.g., in a delay sensitivity). In this system, the chip comprises at least a memory, an age monitor, a voltage selector and a power rail. The memory stores an age/voltage table. The age monitor automatically measures the age of the chip. Based on the age and using the age/voltage table, the voltage selector selects a specific supply voltage and outputs a voltage selection signal to an adjustable voltage regulator, which can apply (e.g., automatically or on-demand) that specific supply voltage to the power rail. Also disclosed is a method for regulating the power supplied to an integrated circuit chip, which is incorporated into a product, and a method for generating an age/voltage table.

Abstract: Systems and methods for improving timing closure of new and existing semiconductor products by balancing sensitivities. More specifically, a method is provided for that includes defining at least one set of correlated parameters for a semiconductor product, the at least one set of correlated parameters comprising a first parameter and a second parameter. The method further includes measuring performance of embedded devices within the semiconductor product. The method further includes closing timing of the semiconductor product using the measured performance of the semiconductor product. The closing the timing of the semiconductor product comprises calculating a sensitivity to the first parameter based on the measured performance of the embedded devices within the semiconductor product and balancing the sensitivity to the first parameter with a sensitivity to a second parameter such that timing degradation is shifted from the first parameter to the second parameter.

Abstract: Systems and methods are provided for extracting parasitics in a design of an integrated circuit with multi-patterning requirements. The method includes determining resistance solutions and capacitance solutions. The method further includes performing parasitic extraction of the resistance solutions and the capacitance solutions to generate mean values for the resistance solutions and the capacitance solutions. The method further includes capturing a multi-patterning source of variation for each of the resistance solutions and the capacitance solutions during the parasitic extraction. The method further includes determining a sensitivity for each captured source of variation to a respective vector of parameters. The method further includes determining statistical parasitics by multiplying each of the resistance solutions and the capacitance solutions by the determined sensitivity for each respective captured source of variation.

Abstract: A plurality of digital circuits are manufactured from an identical circuit design. A power controller is operatively connected to the digital circuits, and a non-transitory storage medium is operatively connected to the power controller. The digital circuits are classified into different voltage bins, and each of the voltage bins has a current leakage limit. Each of the digital circuits has been previously tested to operate within a corresponding current leakage limit of a corresponding voltage bin into which each of the digital circuits has been classified. The non-transitory storage medium stores boundaries of the voltage bins as speed-binning test data. The power controller controls power-supply signals applied differently for each of the digital circuits based on which bin each of the digital circuit has been classified and the speed-binning test data.