Abstract: A memory cell is protected against current or voltage spikes. The cell includes a group of redundant data storage nodes for the storage of information in at least one pair of complementary nodes. The cell further includes circuitry for restoring information to its initial state following a current or voltage spike which modifies the information in one of the nodes of the pair using the information stored in the other node. The data storage nodes of each pair in the cell are implanted on opposite sides of an opposite conductivity type well from one another within a region of a substrate defining the boundaries of the memory cell.

Abstract: An array of ROM cells, each formed of a transistor having a first drain or source region connected to a bit line connecting several transistors in a first direction, the gates of the different transistors being connected to word lines in a second direction perpendicular to the first one, the array comprising a repetition of an elementary pattern extending over three lines in each direction and comprising nine transistors arranged so that each of the lines of the elementary pattern comprises two cells, two neighboring transistors of each pattern in the first direction sharing a same second region connected to a ground line and being connected to different bit lines from a word line to the other.

Abstract: A circuit includes a memory cell having a high voltage supply node and a low voltage supply node. Power multiplexing circuitry is provided to selectively apply one of a first set of voltages and a second set of voltages to the high and low voltage supply nodes of the cell in dependence upon a current operational mode of the cell. If the cell is in active read or write mode, then the multiplexing circuitry selectively applies the first set of voltages to the high and low voltage supply nodes. Conversely, if the cell is in standby no-read or no-write mode, then the multiplexing circuitry selectively applies the second set of voltages to the high and low voltage supply nodes. The second set of voltages are offset from the first set of voltages. More particularly, a low voltage in the second set of voltages is higher than a low voltage in the first set of voltages, and wherein a high voltage in the second set of voltages is less than a high voltage in the first set of voltages.

Abstract: A memory circuit has a high voltage and low voltage supply nodes. One of a first and second sets of voltages is selectively applied to the supply nodes of the memory circuit in dependence upon memory operational mode. If in active read/write mode, then the first set of voltages is selectively applied. Conversely, if in standby no-read/no-write mode, then the second set of voltages is selectively applied. A low voltage in the second set of voltages is greater than a low voltage in the first set of voltages by a selected one of a plurality of low offset voltages, and a high voltage in the second set of voltages is less than a high voltage in the first set of voltages by a selected one of a plurality of high offset voltages. The offset voltages are provided by diode-based circuits that are selectively active. Selective activation is provided by either selectably blowable fuse elements or selectively activated switching elements.

Abstract: The invention relates to a device, and also to a corresponding method of implementation, for SRAM memory information storage, powered by a voltage VDD and comprising: an array of base cells organised in base columns, and at least one mirror column of mirror cells, liable to simulate the behaviour of the cells in a base column, The invention is characterised in that the device further comprises: Emulation means, in a mirror column, of the most restricting cell in a base column, Means for varying the mirror power supply voltage (VDDMMOCK) for the mirror column, and Means for copying the mirror power supply voltage in the emulated base column.

Abstract: A memory device of SRAM type has a memory plan constituted by base memory cells organized in lines and in columns. Each cell of a column is connected between two bit lines which are precharged during a reading operation. Circuitry is provided for generating a precharge voltage of the bit lines which is less than a nominal supply voltage of the device.

Abstract: A memory cell stores information in the form of a first logic level and a second logic level that are complementary to each other. The memory cell includes a first storage circuit and a second storage circuit for storing the first logic level and the second logic level. The first and second storage circuits each have a respective input and output. An isolation circuit provides electrical isolation of the input of the first storage device from the output of the second storage device, except during access to the first and second storage circuits.

Abstract: Bit lines (BL0, BL0R, BL1, BL1R, . . . ) of a ROM memory array with differential detection reading are arranged within two overlaid metallization levels so as to increase the read reliability of binary values stored in the array. The ROM array is divided into matrix segments (100, 101, . . . ) aligned parallel to the bit lines. The bit lines are shifted horizontally and/or vertically within transition regions (T) located between the segments of matrix, by effecting circular permutations between the positions of the bit lines that are divided up into groups of four.

Abstract: The multivibrator is protected against current or voltage spikes and includes a first data transfer port that receives, as input, multivibrator input data, and a first/master latch cell connected on the output side of the first transfer port. A second/slave latch cell is included, and a second data transfer port is placed between the first and second latch cells. Each latch cell includes a set of redundant data storage nodes. The transfer ports each circuits/devices for writing data separately into each storage node.

Abstract: An embodiment of the invention relate to a memory device including a memory plane composed of memory cells located at the intersection of lines and columns, and a dummy path designed to output a signal to activate read amplifiers arranged at the bottom of the columns in the memory plane, said dummy path including dummy memory cells connected between two dummy bit lines means of selecting at least one dummy cell designed to discharge at least one of the dummy bit lines, and control means connected to the two dummy bit lines to generate said activation signal, characterised in that said device includes means of programming the number of selected cells to discharge at least said dummy bit line, to adjust the time at which said activation signal is output.

Abstract: A multivibrator circuit includes a first data transfer port that receives, as input, multivibrator input data, a first, master, latch cell connected on the output side of the first transfer port, a second, slave, latch cell, and a second data transfer port placed between the first and second latch cells, each latch cell comprising a set of redundant data storage nodes. The transfer ports each include circuitry for writing data separately into each storage node.

Abstract: A content addressable memory (CAM) includes first and second memory circuits and a comparison circuit. The first memory circuit includes first and second sets of transistors for the storage of first and second compare data. The second memory circuit includes first and second sets of transistors for the storage of enabling or disabling data. The comparison circuit includes first and second sets of comparison transistors which respectively provide for the comparison of the first and second compare data with first and second input data under the control of an output signal from the second memory circuit. The transistors of the first and second sets of transistors of the memory circuits each includes a transistor of a first conductivity type and a transistor of a second conductivity type. The transistors of the second conductivity type are formed on the same first active zone of the semiconductor substrate.

Abstract: An embodiment of the invention relates to a circuit for distributing an initial signal, comprising an input node receiving the initial signal, a plurality of terminal nodes each providing at least one resulting signal to a circuit component, and different connection branches between the input node and the plurality of terminal nodes, to which a plurality of intermediate nodes is connected, wherein connection branch is duplicated, so that each node among the input node and the intermediate nodes comprises two inputs and two outputs allowing double propagation of the initial signal towards the terminal nodes through duplicated connection branches, each terminal node terminal node receiving two input signals, images of the initial signal and providing the resulting initial signal: an image of the input signals if said input signals are identical, or inactive, if the input signals are different from each other.

Abstract: A memory circuit with an error correcting system comprising an address bus (102), an input data bus (108), and an output data bus (115), the circuit comprising a memory having an address bus (113), a data bus (114) and an error correcting circuit comprising an encoder (107). A first address register (104) is connected to the input address bus of the circuit for successively storing addresses corresponding to memory write operations only. A second data register (105) is connected to the input data bus of the circuit (108) for storing data transmitted to the encoder (107). Circuits make it possible to introduce a one-cycle shift into the memory writes, without modifying reads, giving the encoder more time to compute error correcting codes.

Abstract: A bistable circuit includes a first inverter and a capacitive inversion circuit having one input coupled to an output of the first inverter. The capacitive inversion circuit includes a second inverter and a capacitive circuit parallel-coupled to the input and an output of the capacitive inversion circuit. The bistable circuit also includes a switch to isolate the output of the capacitive inversion circuit from an input of the first inverter when the switch receives an active validation signal or, if not, to couple the output of the capacitive inversion circuit to the input of the first inverter.

Abstract: A Content Addressable Memory (CAM) circuit includes memory cells preferably formed as two memory cells each having internal nodes. A compare circuit is operative with the memory cells. A common terminal (VPL) exists for the memory cells. Capacitors are added between the internal nodes of each of the memory cells and common terminal for memory cell stability.

Abstract: A memory circuit includes a plurality of storage cells (100) arranged in rows and columns thus forming a storage matrix. The storage cells (100) corresponding to the same bit line (21-23) are divided into several groups (60-61) of cells for the same column, these groups having their own biasing circuit (200) in order to act on the difference between the logic level low voltage and the substrate voltage of the link transistors. When a storage cell is not selected, the biasing circuit makes the voltage between source/drain and substrate equal to a negative voltage in order to minimize the leakage current. During a read operation, the substrate voltage and the source/drain voltage are brought back to the same level such that a maximum current will flow when the link transistor is conducting.

Abstract: An integrated dynamic random access memory element includes two cells for the storage of two respective bits. A source region and a drain region are included. Each cell comprises a field-effect transistor having a gate and an intermediate portion which extend between the source and drain regions. A channel is provided in the intermediate portion of the transistor for each cell. A polarization electrode is placed between the respective intermediate portions of the two transistors. This polarization electrode is capacitively coupled to the intermediate portion of each transistor and is used to store the first and second bits.

Abstract: A multivibrator includes a first data transfer port that receives, as input, multivibrator input data. A first, master, latch cell is connected on the output side of the first transfer port. A second, slave, latch cell is connected thereto through a second data transfer port placed between the first and second latch cells. Each latch cell includes a set of redundant data storage nodes for storing information in at least one pair of complementary nodes and circuitry for restoring information in its initial state, after a current or voltage spike has modified the information in one of the nodes of the said pair, on the basis of the information stored in the other node. The nodes of each pair are implanted opposite one another in a zone of a substrate defining the latch cell.

Abstract: An array of ROM cells, each formed of a transistor having a first drain or source region connected to a bit line connecting several transistors in a first direction, the gates of the different transistors being connected to word lines in a second direction perpendicular to the first one, the array comprising a repetition of an elementary pattern extending over three lines in each direction and comprising nine transistors arranged so that each of the lines of the elementary pattern comprises two cells, two neighboring transistors of each pattern in the first direction sharing a same second region connected to a ground line and being connected to different bit lines from a word line to the other.