Abstract: Methods of operating memory include generating a data value indicative of a level of a property sensed from a data line while applying potentials to control gates of memory cells of more than one string of series-connected memory cells connected to that data line. Methods of operating memory further include generating data values indicative of levels of a property sensed from data lines while applying potentials to control gates of memory cells of strings of series-connected memory cells connected to those data lines, performing a logical operation on a set of data values comprising those data values, and determining a potential to be applied to control gates of different memory cells of those strings of series-connected memory cells in response to an output of the logical operation on the set of data values.

Abstract: Apparatus and methods of operating a memory include storing a value of an attribute of a feature vector to a pair of memory cells by programming each of the memory cells to a respective data state of three or more data states, searching for an exact match to a particular value of the attribute by applying respective voltage levels to control gates of the memory cells to activate both memory cells only when the value of the attribute is the particular value, and searching for an inexact match to the particular value of the attribute by applying respective voltage levels to control gates of the memory cells to activate both memory cells when the value of the attribute is within a range of possible values of the attribute including the particular value.

Abstract: Methods and apparatus for pattern matching are disclosed. In at least one embodiment, pattern checking is accomplished by reading a page of memory, and comparing the read page with the pattern to be searched in a logic operation. In at least one other embodiment, a pattern to be searched is stored in registers where each bit of the pattern is stored using two register entries and each bit of the array data is stored using two cells of the array.

Abstract: Devices, systems and methods for operating a memory device facilitating a neural network in a memory device are disclosed. In at least one embodiment, the memory device is operated having a feed-ward neural network operating scheme. In at least one other embodiment, memory cells are operated to emulate a number of neural models to facilitate one or more neural network operating characteristics in the memory device.

Abstract: Methods for operating memory cells include applying a respective minterm, comprising a plurality of variables, to control gates of series strings of memory cells, each series string programmed as a plurality of pairs of complementary memory cells such that certain ones of the plurality of variables are enabled, and logically combining each of the minterms into a logic function output. Memories include a plurality of memory cells configured in series strings of memory cells, wherein each series string of memory cells is configured to provide a minterm comprising a plurality of variables, each variable enabled responsive to a state of an associated, respective memory cell.

Abstract: Methods for storing a feature vector, as well as related comparison units and systems. One such method involves programming a string of memory cells of memory to store do not care data as at least a portion of a value of an attribute of the feature vector.

Abstract: Methods of searching and methods of programming a memory are provided. In one such method of searching, a determination is made as to whether an attribute of a data feature vector programmed in a memory matches within a particular range of values of a same attribute of an input feature vector provided to the memory. In at least some embodiments, the determination is made by applying a pair of gate voltages to a pair of memory cells storing the value of the attribute of the data feature vector.

Abstract: Methods for programming, methods for operating, and memories are disclosed. One such method for programming includes programming a group of memory cells such that a series string of memory cells of the group of memory cells is programmed to provide a logical function responsive to an input minterm whose variables are coupled to respective, associated memory cells.

Abstract: Low power DRAM (LPDRAM) memory devices for communication with a non-volatile memory coupled to the LPDRAM memory device, and systems containing such LPDRAM and non-volatile memory facilitate configuring the LPDRAM memory device using routines stored on the non-volatile memory.

Abstract: Methods of operating electronic systems having a memory include reading indications of memory block quality from a plurality of memory blocks of the memory in which a memory defect has been detected, wherein a value of the indication of memory block quality stored in a respective memory block of the plurality of memory blocks indicates a type of memory defect detected in the respective memory block, and, in response to the values of the indications of memory block quality, deeming a first portion of memory blocks of the plurality of memory blocks as usable, allocating a second portion of memory blocks of the plurality of memory blocks for storing only data of a particular type, and indicating a third portion of memory blocks of the plurality of memory blocks as defective.

Abstract: Methods and apparatus utilizing indications of memory cell density facilitate management of memory density of a memory device. By permitting each of a plurality of portions of a memory array of the memory device to be assigned a corresponding memory cell density determined through an evaluation of those portions of the memory array, better performing portions of the memory array may not be hindered by lesser performing portions of the memory array.

Abstract: Non-volatile memory devices and methods of their operation are provided. One such non-volatile memory device has an interface and a control circuit. The non-volatile memory device is adapted to identify itself as a boot memory in response to receiving an interrogation request on the interface.

Abstract: A system having a non-volatile memory device has a plurality of memory cells that are organized into memory blocks. Blocks can operate in either a multiple bit per cell mode or a single bit per cell mode. A processor controls the system and selects blocks to operate in the multiple bit per cell mode and single bit per cell mode. One dedicated memory block is capable of operating only in the single bit per cell mode. If the dedicated memory block is found to be defective, a defect-free block can be remapped to that dedicated memory block location to act only in the single bit per cell mode.

Abstract: Memory, systems and devices are disclosed where a non-volatile memory device (such as a Flash memory device) is paired with a LPDRAM memory device or array and configures the LPDRAM by utilizing routines stored in the non-volatile memory executing on a controller or state machine of the either the LPDRAM or non-volatile memory. This allows the configuration of the LPDRAM to be self contained and occur under local control of the controller or state machine of the non-volatile memory (or LPDRAM) utilizing these pre-stored LPDRAM configuration routines, eliminating the need for the system designer to have to account for and configure the LPDRAM and its specific configuration and/or routines with the system processor or operating system.

Abstract: The present disclosure includes methods, devices, modules, and systems for reducing noise in semiconductor devices. One method embodiment includes applying a reset voltage to a control gate of a semiconductor device for a period of time. The method further includes sensing the state of the semiconductor device after applying the reset voltage.

Abstract: Memory devices and methods are disclosed. One such method compares input data to stored data in a memory device and includes applying a first weight factor to a first string of memory cells coupled to a data line, where a first bit of the stored data is stored in the first string of memory cells; applying a second weight factor to a second string of memory cells coupled to the data line, where a second bit of the stored data is stored in the second string of memory cells; comparing a first bit of input data to the first bit of the stored data while the first weight factor is applied to the first string of memory cells; and comparing a second bit of the input data to the second bit of the stored data while the second weight factor is applied to the second string of memory cells.

Abstract: Methods of programming a memory and memories are disclosed. In at least one embodiment, a memory is programmed by determining a pretarget threshold voltage for a selected cell, wherein the pretarget threshold voltage is determined using pretarget threshold voltage values for at least one neighbor cell of the selected cell.

Abstract: In one or more of the disclosed embodiments, memory cells in a memory device are refreshed upon an indication of a fatigue condition. In one such embodiment, controller monitors behavior parameters of the cells and determines if any of the parameters are outside of a normal range set for each one, thus indicating a fatigue condition. If any cell indicates a fatigue condition, the data from the block of cells indicating the fatigue is moved to another block. In one embodiment, an error detection and correction process is performed on the data prior to being written into another memory block.

Abstract: Systems comprising an array of memory cells organized into a plurality of erasable physical blocks, the address of physical block associated with an array of memory cells having a predetermined logical erase block size, wherein at least of the logical erase block size is smaller than another logical erase block size and a processor that selects the storage of data among different logical erase blocks in the array of memory cells based upon programmable and predetermined criteria.

Abstract: Methods of programming a memory and memories are disclosed. In at least one embodiment, a memory is programmed by determining a pretarget threshold voltage for a selected cell, wherein the pretarget threshold voltage is determined using pretarget threshold voltage values for at least one neighbor cell of the selected cell.