Abstract: An alternating current/direct current input device includes an appliance input socket and an information and communications technology (ICT) device. The ICT device is powered by the appliance input socket. The appliance input socket includes a ground contact, a positive electrode contact, a negative electrode contact, and a signal switch. A contact depth of the signal switch in the appliance input socket is less than a contact depth of the positive electrode contact or the negative electrode contact in the appliance input socket. The signal switch is configured to generate a control signal when a direct current connector is separated from the appliance input socket. The control signal can be used to enable the ICT device to disconnect the appliance input socket from a conductive electrode of the direct current connector after the ICT device enters a no load state.

Abstract: The invention provides processes of purifying a peptide including a GCC agonist sequence selected from the group consisting of SEQ ID NOs: 1-251 described herein. The processes include a solvent exchange step before a freeze-drying (lyophilization) step.

Abstract: An inspection system is disclosed. In one embodiment, the inspection system includes an interferometer sub-system configured to acquire an interferogram of a sample. The inspection system may further include a controller communicatively coupled to the interferometer sub-system. The controller is configured to: receive the interferogram from the interferometer sub-system; generate a phase map of the sample based on the received interferogram, wherein the phase map includes a plurality of pixels; select a sub-set of pixels of the plurality of pixels of the phase map to be used for phase unwrapping procedures; perform one or more phase unwrapping procedures on the sub-set of pixels of the phase map to generate an unwrapped phase map; and generate a surface height map of the sample based on the unwrapped phase map.

Abstract: A test circuitry and a method for testing the same and a test system are provided. The test circuitry includes: a test signal input end, configured to input an initial test signal; a signal output end, configured to output a target test signal; and a signal shaping circuitry coupled to the test signal input end and the signal output end, configured to remove a noise signal from the initial test signal to obtain the target test signal.

Abstract: An alternating current/direct current input device includes an appliance input socket and an information and communications technology (ICT) device. The ICT device is powered by the appliance input socket. The appliance input socket includes a ground contact, a positive electrode contact, a negative electrode contact, and a signal switch. A contact depth of the signal switch in the appliance input socket is less than a contact depth of the positive electrode contact or the negative electrode contact in the appliance input socket. The signal switch is configured to generate a control signal when a direct current connector is separated from the appliance input socket. The control signal can be used to enable the ICT device to disconnect the appliance input socket from a conductive electrode of the direct current connector after the ICT device enters a no load state.

Abstract: An inspection system is disclosed. In one embodiment, the inspection system includes an interferometer sub-system configured to acquire an interferogram of a sample. The inspection system may further include a controller communicatively coupled to the interferometer sub-system. The controller is configured to: receive the interferogram from the interferometer sub-system; generate a phase map of the sample based on the received interferogram, wherein the phase map includes a plurality of pixels; select a sub-set of pixels of the plurality of pixels of the phase map to be used for phase unwrapping procedures; perform one or more phase unwrapping procedures on the sub-set of pixels of the phase map to generate an unwrapped phase map; and generate a surface height map of the sample based on the unwrapped phase map.

Abstract: A method for constructing a meshed model and a discrete chromatography of eight primary color HSB color space is provided. By a meshed digital model and a discrete algorithm of color space, the color value and the color distribution in any point, line, surface and space area in the HSB color space can be quickly obtained based on color values of eight primary colors and coordinate values of mesh points in the HSB color space, thereby (i) realizing the full color gamut discrete chromatography of the HSB color space, (ii) realizing the visualization of the full color gamut of the color space, and (iii) improving the work efficiency of color matching.

Abstract: The present disclosure relates to a method and system for performing aging process on the transistor in the display panel. A method for performing aging process on a transistor in a display panel, comprising: obtaining an initial characteristic curve of the transistor; determining an initial cutoff voltage range of the transistor according to the obtained initial characteristic curve; determining a gate-source voltage and a drain-source voltage required by the transistor according to the initial cutoff voltage range, so as to increase an cutoff voltage range of the transistor; and performing aging process on the transistor according to the determined required gate-source voltage and drain-source voltage.

Abstract: Embodiments provide a positioning method, an assistant site, and a system, to improve positioning accuracy of a mobile terminal. The method according to the embodiments of the present invention includes: generating, by an assistant site, a downlink assisted positioning signal; and sending, by the assistant site, the downlink assisted positioning signal to a mobile terminal. The downlink assisted positioning signal can enable a base station to determine position information of the mobile terminal based on a measurement result obtained by the mobile terminal by measuring the downlink assisted positioning signal.

Abstract: A method for constructing a meshed model and a discrete chromatography of eight primary color HSB color space is provided. By a meshed digital model and a discrete algorithm of color space, the color value and the color distribution in any point, line, surface and space area in the HSB color space can be quickly obtained based on color values of eight primary colors and coordinate values of mesh points in the HSB color space, thereby (i) realizing the full color gamut discrete chromatography of the HSB color space, (ii) realizing the visualization of the full color gamut of the color space, and (iii) improving the work efficiency of color matching.

Abstract: An inspection system is disclosed. In one embodiment, the inspection system includes an interferometer sub-system configured to acquire an interferogram of a sample. The inspection system may further include a controller communicatively coupled to the interferometer sub-system. The controller is configured to: receive the interferogram from the interferometer sub-system; generate a phase map of the sample based on the received interferogram, wherein the phase map includes a plurality of pixels; select a sub-set of pixels of the plurality of pixels of the phase map to be used for phase unwrapping procedures; perform one or more phase unwrapping procedures on the sub-set of pixels of the phase map to generate an unwrapped phase map; and generate a surface height map of the sample based on the unwrapped phase map.

Abstract: The present disclosure belongs to the field of display technology, and particularly relates to a test circuit, a display substrate, a test method of a display substrate and a display apparatus. The test circuit includes a signal generating device and a plurality of output channels that are mutually independent. Each output channel includes a signal line configured to transmit a test signal. The signal generating device is coupled to the plurality of output channels, and is configured to provide, to each of at least one of the plurality of output channels, the test signal corresponding to an impedance of the signal line in the output channel, and provide the test signal to the signal line in the output channel.

Abstract: The invention provides processes of purifying a peptide including a GCC agonist sequence selected from the group consisting of SEQ ID NOs: 1-251 described herein. The processes include a solvent exchange step before a freeze-drying (lyophilization) step.

Abstract: A display substrate and a manufacturing method thereof, and a display device are provided. The display substrate includes: a voltage conducting layer, at least part of which is in a display area; a voltage connecting terminal in a peripheral circuit area, and a conductive lead in the peripheral circuit area. The conductive lead includes: a first annular portion, a second annular portion, and a plurality of bridging portions. The first annular portion is connected to the voltage conducting layer, the second annular portion surrounds the first annular portion and connected to the voltage connecting terminal, and a first end and a second end of each bridging portion are connected to the first annular portion and the second annular portion respectively.

Abstract: The invention provides processes of purifying a peptide including a GCC agonist sequence selected from the group consisting of SEQ ID NOs: 1-251 described herein. The processes include a solvent exchange step before a freeze-drying (lyophilization) step.

Abstract: A defect detection circuit and a defect detection method for a light-emitting element, a display driving device, a display device, and a defect detection method for the display device are provided. The defect detection circuit includes a power source signal adjustment sub-circuit, a data signal adjustment sub-circuit, a first initial signal adjustment sub-circuit, a second initial signal adjustment sub-circuit and a storage capacitor connected to a control end of a driving transistor. The storage capacitor is configured to control the driving transistor to be turned off under the effect of a power source signal, a data signal and an initial signal, to enable the second initial signal adjustment sub-circuit to apply the initial signal to a light-emitting sub-circuit, thereby to enable the light-emitting sub-circuit to emit light. The display driving device includes the defect detection circuit.

Abstract: A light-emitting diode (LED) device (e.g., AlGaInP LED) includes a transparent substrate, an epitaxial structure defining an isolation trench and an epitaxial structure, an insulating passivation layer, a P electrode and an N electrode. The epitaxial structure is disposed above the transparent substrate. The isolation trench divides the epitaxial structure into a first portion and a second portion. The at least one through hole extends through the first portion. At least a portion of the insulating passivation layer is disposed in the isolation trench. The P electrode is disposed above the first portion of the epitaxial structure and in the at least one through hole. The N electrode is disposed above the second portion of the epitaxial structure. A top surface of the P electrode is horizontally aligned with a top surface of the N electrode.

Abstract: A display substrate includes: a display driving signal line; and at least one set of testing pads, wherein each set of the testing pads includes: a plurality of light-on testing pads arranged successively and connected to the display driving signal line; and two pin-miss testing pads electrically connected to one another while not connected to the display driving signal line.

Abstract: A detecting apparatus and method, repairing apparatus and method, and repairing system of AMOLED display device are provided. The detecting apparatus includes: an illuminating device for sequentially illuminating a plurality of detection regions of a screen of the AMOLED display device, the screen being divided into the plurality of detection regions, each of the detection regions including at least one light-emitting unit; a current detecting device for acquiring a detection current which is a sum of driving currents of the light-emitting unit in the detection region being illuminated; and a judging device for judging whether the detection region corresponding to the detection current is a defective region according to the detection current. The apparatus can detect luminance uniformity of the AMOLED display device. The detection efficiency is high, the detection standard is unified and the detection accuracy is high.

Abstract: A remote power unit for providing direct current power to a remote power receiver in a direct current power system is provided. A residual current protection circuit comprises a first switch, which opens a positive voltage rail, and a second switch, which open a negative voltage rail. A first current sensor measures a first residual current between the first switch and the remote power receiver, while the first switch is closed and the second switch is opened. A second current sensor measures a second residual current between the second switch and the remote power receiver, while the second switch is closed and the first switch is open. A controller detects a residual current event, if the first residual current and/or the second residual current are above a residual current threshold.