Abstract: A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.

Abstract: The present disclosure relates to a power supply device for a display panel, a manufacturing method, a power supplying method, and a display device. The power supply device may include: a first line surrounding the display panel and electrically connected to sub-pixels of the display panel; at least one first power supply terminal disposed at a first side of the display panel and connected to a first line segment of the first line located at the first side of the display panel; at least one second power supply terminal connected to a second line segment of the first line located at a second side of the display panel to compensate for a voltage drop of the first power supply terminal on the first line. The first side and the second side of the display panel are opposite sides of the display panel.

Abstract: A system includes a controller with one or more processors and memory configured to store one or more sets of program instructions. The one or more processors are configured to execute the one or more sets of program instructions. The one or more sets of program instructions are configured to cause the one or more processors to apply filtering to a semiconductor wafer map; separate the filtered semiconductor wafer map into a plurality of dies; generate a set of die comparison statistics for the plurality of dies; generate at least one excursion map by applying at least one inspection threshold to the set of die comparison statistics; and detect at least one excursion within the at least one excursion map.

Abstract: The present disclosure provides a signal loading method and a signal generator. The signal loading method includes: loading a first pair of voltage signals to at least one pair of separate signal channels for a time period, respectively, wherein the first pair of voltage signals have a first voltage difference therebetween; and determining whether a short circuit occurs in the at least one pair of signal channels within the time period, and if it is determined that no short circuit occurs in the at least one pair of signal channels within the time period, loading a second pair of voltage signals having a second voltage difference therebetween to the at least one pair of signal channels at the end of the time period. The second voltage difference is greater than the first voltage difference.

Abstract: A substrate, a panel, a detection device and an alignment detection method are provided. The substrate includes first signal connection pins arranged in parallel side by side and at least one first alignment detection pin, wherein the at least one first alignment detection pin is located on at least one side of the first signal connection pins in an arrangement direction of the first signal connection pins, and arranged in parallel with the first signal connection pins.

Abstract: An alternating current/direct current input device includes an appliance input socket and an information and communications technology (ICT) device. The ICT device is powered by the appliance input socket. The appliance input socket includes a ground contact, a positive electrode contact, a negative electrode contact, and a signal switch. A contact depth of the signal switch in the appliance input socket is less than a contact depth of the positive electrode contact or the negative electrode contact in the appliance input socket. The signal switch is configured to generate a control signal when a direct current connector is separated from the appliance input socket. The control signal can be used to enable the ICT device to disconnect the appliance input socket from a conductive electrode of the direct current connector after the ICT device enters a no load state.

Abstract: A test circuitry and a method for testing the same and a test system are provided. The test circuitry includes: a test signal input end, configured to input an initial test signal; a signal output end, configured to output a target test signal; and a signal shaping circuitry coupled to the test signal input end and the signal output end, configured to remove a noise signal from the initial test signal to obtain the target test signal.

Abstract: Embodiments provide a positioning method, an assistant site, and a system, to improve positioning accuracy of a mobile terminal. The method according to the embodiments of the present invention includes: generating, by an assistant site, a downlink assisted positioning signal; and sending, by the assistant site, the downlink assisted positioning signal to a mobile terminal. The downlink assisted positioning signal can enable a base station to determine position information of the mobile terminal based on a measurement result obtained by the mobile terminal by measuring the downlink assisted positioning signal.

Abstract: A system includes a controller with one or more processors and memory configured to store one or more sets of program instructions. The one or more processors are configured to execute the one or more sets of program instructions. The one or more sets of program instructions are configured to cause the one or more processors to apply filtering to a semiconductor wafer map; separate the filtered semiconductor wafer map into a plurality of dies; generate a set of die comparison statistics for the plurality of dies; generate at least one excursion map by applying at least one inspection threshold to the set of die comparison statistics; and detect at least one excursion within the at least one excursion map.

Abstract: The present application discloses a circuit board and a method for manufacturing the same, and a terminal test device. The circuit board includes a base substrate, and a plurality of conductive lines on the base substrate, each of the plurality of conductive lines having one end configured to be connected with a signal output bus of a signal generator and the other end configured to be connected with a terminal. A fuse is connected in series in each conductive line, and a breaking current IT of the fuse, a maximum operating current I of the conductive line and a fault current IF of the conductive line satisfy: I<IT?IF, where the breaking current IT of the fuse is a minimum current that causes the fuse to open.

Abstract: A display substrate and a manufacturing method thereof, and a display device are provided. The display substrate includes: a voltage conducting layer, at least part of which is in a display area; a voltage connecting terminal in a peripheral circuit area, and a conductive lead in the peripheral circuit area. The conductive lead includes: a first annular portion, a second annular portion, and a plurality of bridging portions. The first annular portion is connected to the voltage conducting layer, the second annular portion surrounds the first annular portion and connected to the voltage connecting terminal, and a first end and a second end of each bridging portion are connected to the first annular portion and the second annular portion respectively. The resistance value between two ends of each bridging portion is negatively correlated to the resistance value between the second end of the bridging portion and the voltage connecting terminal.

Abstract: A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.

Abstract: The present disclosure belongs to the field of display technology, and particularly relates to a test circuit, a display substrate, a test method of a display substrate and a display apparatus. The test circuit includes a signal generating device and a plurality of output channels that are mutually independent. Each output channel includes a signal line configured to transmit a test signal. The signal generating device is coupled to the plurality of output channels, and is configured to provide, to each of at least one of the plurality of output channels, the test signal corresponding to an impedance of the signal line in the output channel, and provide the test signal to the signal line in the output channel.

Abstract: A defect detection circuit and a defect detection method for a light-emitting element, a display driving device, a display device, and a defect detection method for the display device are provided. The defect detection circuit includes a power source signal adjustment sub-circuit, a data signal adjustment sub-circuit, a first initial signal adjustment sub-circuit, a second initial signal adjustment sub-circuit and a storage capacitor connected to a control end of a driving transistor. The storage capacitor is configured to control the driving transistor to be turned off under the effect of a power source signal, a data signal and an initial signal, to enable the second initial signal adjustment sub-circuit to apply the initial signal to a light-emitting sub-circuit, thereby to enable the light-emitting sub-circuit to emit light. The display driving device includes the defect detection circuit.

Abstract: A detecting apparatus and method, repairing apparatus and method, and repairing system of AMOLED display device are provided. The detecting apparatus includes: an illuminating device for sequentially illuminating a plurality of detection regions of a screen of the AMOLED display device, the screen being divided into the plurality of detection regions, each of the detection regions including at least one light-emitting unit; a current detecting device for acquiring a detection current which is a sum of driving currents of the light-emitting unit in the detection region being illuminated; and a judging device for judging whether the detection region corresponding to the detection current is a defective region according to the detection current. The apparatus can detect luminance uniformity of the AMOLED display device. The detection efficiency is high, the detection standard is unified and the detection accuracy is high.

Abstract: The present disclosure relates to a method and system for performing aging process on the transistor in the display panel. A method for performing aging process on a transistor in a display panel, comprising: obtaining an initial characteristic curve of the transistor; determining an initial cutoff voltage range of the transistor according to the obtained initial characteristic curve; determining a gate-source voltage and a drain-source voltage required by the transistor according to the initial cutoff voltage range, so as to increase an cutoff voltage range of the transistor; and performing aging process on the transistor according to the determined required gate-source voltage and drain-source voltage.

Abstract: The present disclosure provides a signal loading method and a signal generator. The signal loading method includes: loading a first pair of voltage signals to at least one pair of separate signal channels for a time period, respectively, wherein the first pair of voltage signals have a first voltage difference therebetween; and determining whether a short circuit occurs in the at least one pair of signal channels within the time period, and if it is determined that no short circuit occurs in the at least one pair of signal channels within the time period, loading a second pair of voltage signals having a second voltage difference therebetween to the at least one pair of signal channels at the end of the time period. The second voltage difference is greater than the first voltage difference.

Abstract: The present disclosure relates to a power supply device for a display panel, a manufacturing method, a power supplying method, and a display device. The power supply device may include: a first line surrounding the display panel and electrically connected to sub-pixels of the display panel; at least one first power supply terminal disposed at a first side of the display panel and connected to a first line segment of the first line located at the first side of the display panel; at least one second power supply terminal connected to a second line segment of the first line located at a second side of the display panel to compensate for a voltage drop of the first power supply terminal on the first line. The first side and the second side of the display panel are opposite sides of the display panel.

Abstract: The present application discloses a circuit board and a method for manufacturing the same, and a terminal test device. The circuit board includes a base substrate, and a plurality of conductive lines on the base substrate, each of the plurality of conductive lines having one end configured to be connected with a signal output bus of a signal generator and the other end configured to be connected with a terminal. A fuse is connected in series in each conductive line, and a breaking current IT of the fuse, a maximum operating current I of the conductive line and a fault current IF of the conductive line satisfy: I<IT?IF, where the breaking current IT of the fuse is a minimum current that causes the fuse to open.

Abstract: A light-emitting diode (LED) device (e.g., AlGaInP LED) includes a transparent substrate, an epitaxial structure defining an isolation trench and an epitaxial structure, an insulating passivation layer, a P electrode and an N electrode. The epitaxial structure is disposed above the transparent substrate. The isolation trench divides the epitaxial structure into a first portion and a second portion. The at least one through hole extends through the first portion. At least a portion of the insulating passivation layer is disposed in the isolation trench. The P electrode is disposed above the first portion of the epitaxial structure and in the at least one through hole. The N electrode is disposed above the second portion of the epitaxial structure. A top surface of the P electrode is horizontally aligned with a top surface of the N electrode.