Abstract: The present application discloses a circuit board and a method for manufacturing the same, and a terminal test device. The circuit board includes a base substrate, and a plurality of conductive lines on the base substrate, each of the plurality of conductive lines having one end configured to be connected with a signal output bus of a signal generator and the other end configured to be connected with a terminal. A fuse is connected in series in each conductive line, and a breaking current IT of the fuse, a maximum operating current I of the conductive line and a fault current IF of the conductive line satisfy: I<IT?IF, where the breaking current IT of the fuse is a minimum current that causes the fuse to open.

Abstract: A display substrate and a manufacturing method thereof, and a display device are provided. The display substrate includes: a voltage conducting layer, at least part of which is in a display area; a voltage connecting terminal in a peripheral circuit area, and a conductive lead in the peripheral circuit area. The conductive lead includes: a first annular portion, a second annular portion, and a plurality of bridging portions. The first annular portion is connected to the voltage conducting layer, the second annular portion surrounds the first annular portion and connected to the voltage connecting terminal, and a first end and a second end of each bridging portion are connected to the first annular portion and the second annular portion respectively. The resistance value between two ends of each bridging portion is negatively correlated to the resistance value between the second end of the bridging portion and the voltage connecting terminal.

Abstract: A defect detection circuit and a defect detection method for a light-emitting element, a display driving device, a display device, and a defect detection method for the display device are provided. The defect detection circuit includes a power source signal adjustment sub-circuit, a data signal adjustment sub-circuit, a first initial signal adjustment sub-circuit, a second initial signal adjustment sub-circuit and a storage capacitor connected to a control end of a driving transistor. The storage capacitor is configured to control the driving transistor to be turned off under the effect of a power source signal, a data signal and an initial signal, to enable the second initial signal adjustment sub-circuit to apply the initial signal to a light-emitting sub-circuit, thereby to enable the light-emitting sub-circuit to emit light. The display driving device includes the defect detection circuit.

Abstract: The present disclosure belongs to the field of display technology, and particularly relates to a test circuit, a display substrate, a test method of a display substrate and a display apparatus. The test circuit includes a signal generating device and a plurality of output channels that are mutually independent. Each output channel includes a signal line configured to transmit a test signal. The signal generating device is coupled to the plurality of output channels, and is configured to provide, to each of at least one of the plurality of output channels, the test signal corresponding to an impedance of the signal line in the output channel, and provide the test signal to the signal line in the output channel.

Abstract: A detecting apparatus and method, repairing apparatus and method, and repairing system of AMOLED display device are provided. The detecting apparatus includes: an illuminating device for sequentially illuminating a plurality of detection regions of a screen of the AMOLED display device, the screen being divided into the plurality of detection regions, each of the detection regions including at least one light-emitting unit; a current detecting device for acquiring a detection current which is a sum of driving currents of the light-emitting unit in the detection region being illuminated; and a judging device for judging whether the detection region corresponding to the detection current is a defective region according to the detection current. The apparatus can detect luminance uniformity of the AMOLED display device. The detection efficiency is high, the detection standard is unified and the detection accuracy is high.

Abstract: A set of measurement voltages having different voltage values are subsequently inputted to a measurement voltage input terminal of the pixel driving circuit, a light emitting state of a light emitting device under each measurement voltage is detected, and it is determined whether a storage capacitor in the pixel driving circuit is normal based on the light emitting state of the light emitting device.

Abstract: The present disclosure relates to a method and system for performing aging process on the transistor in the display panel. A method for performing aging process on a transistor in a display panel, comprising: obtaining an initial characteristic curve of the transistor; determining an initial cutoff voltage range of the transistor according to the obtained initial characteristic curve; determining a gate-source voltage and a drain-source voltage required by the transistor according to the initial cutoff voltage range, so as to increase an cutoff voltage range of the transistor; and performing aging process on the transistor according to the determined required gate-source voltage and drain-source voltage.

Abstract: The present disclosure provides a signal loading method and a signal generator. The signal loading method includes: loading a first pair of voltage signals to at least one pair of separate signal channels for a time period, respectively, wherein the first pair of voltage signals have a first voltage difference therebetween; and determining whether a short circuit occurs in the at least one pair of signal channels within the time period, and if it is determined that no short circuit occurs in the at least one pair of signal channels within the time period, loading a second pair of voltage signals having a second voltage difference therebetween to the at least one pair of signal channels at the end of the time period. The second voltage difference is greater than the first voltage difference.

Abstract: The present disclosure relates to a power supply device for a display panel, a manufacturing method, a power supplying method, and a display device. The power supply device may include: a first line surrounding the display panel and electrically connected to sub-pixels of the display panel; at least one first power supply terminal disposed at a first side of the display panel and connected to a first line segment of the first line located at the first side of the display panel; at least one second power supply terminal connected to a second line segment of the first line located at a second side of the display panel to compensate for a voltage drop of the first power supply terminal on the first line. The first side and the second side of the display panel are opposite sides of the display panel.

Abstract: The present application discloses a circuit board and a method for manufacturing the same, and a terminal test device. The circuit board includes a base substrate, and a plurality of conductive lines on the base substrate, each of the plurality of conductive lines having one end configured to be connected with a signal output bus of a signal generator and the other end configured to be connected with a terminal. A fuse is connected in series in each conductive line, and a breaking current IT of the fuse, a maximum operating current I of the conductive line and a fault current IF of the conductive line satisfy: I<IT?IF, where the breaking current IT of the fuse is a minimum current that causes the fuse to open.

Abstract: A light-emitting diode (LED) device (e.g., AlGaInP LED) includes a transparent substrate, an epitaxial structure defining an isolation trench and an epitaxial structure, an insulating passivation layer, a P electrode and an N electrode. The epitaxial structure is disposed above the transparent substrate. The isolation trench divides the epitaxial structure into a first portion and a second portion. The at least one through hole extends through the first portion. At least a portion of the insulating passivation layer is disposed in the isolation trench. The P electrode is disposed above the first portion of the epitaxial structure and in the at least one through hole. The N electrode is disposed above the second portion of the epitaxial structure. A top surface of the P electrode is horizontally aligned with a top surface of the N electrode.

Abstract: The invention provides processes of purifying a peptide including a GCC agonist sequence selected from the group consisting of SEQ ID NOs: 1-251 described herein. The processes include a solvent exchange step before a freeze-drying (lyophilization) step.

Abstract: The present disclosure relates to a method of electrically aging a PMOS thin film transistor. The method includes applying a first voltage Vg with an amplitude of A volts to a gate of the PMOS thin film transistor; applying a second voltage Vs with an amplitude of (A?40) to (A?8) volts to a source of the PMOS thin film transistor; and applying a third voltage Vd with an amplitude of (A?80) to (A?16) volts to a drain of the PMOS thin film transistor. Application of the first voltage Vg, the second voltage Vs and the third voltage Vd is maintained for a predetermined time period, and Vd?Vs<0. In this way, reduction of a leakage current of the PMOS thin film transistor is achieved without changing a structural design of the thin film transistor.

Abstract: An apparatus includes a disk locked clock system and a feedforward microactuator compensator. The disk locked clock system is configured to estimate a timing error and generate a timing error signal. The feedforward microactuator compensator is configured to generate a microactuator compensation signal, without use of a vibration sensor signal, in response to the timing error signal.

Abstract: Human proximity detection techniques for wireless communication devices are described. In one embodiment, for example, an apparatus may comprise a memory and logic, at least a portion of the logic comprised in circuitry coupled to the memory, the logic to perform a connection establishment procedure to establish a wireless link with a human proximity reporting (HPR) device, identify heart rate information comprised in a human proximity report received from the HPR device via the wireless link, determine an initial HPR state based on the heart rate information, and select an initial operating mode for a feature of a human proximity monitoring (HPM) device based on the initial HPR state. Other embodiments are described and claimed.

Abstract: A display substrate includes: a display driving signal line; and at least one set of testing pads, wherein each set of the testing pads includes: a plurality of light-on testing pads arranged successively and connected to the display driving signal line; and two pin-miss testing pads electrically connected to one another while not connected to the display driving signal line.

Abstract: The invention provides processes of purifying a peptide including a GCC agonist sequence selected from the group consisting of SEQ ID NOs: 1-251 described herein. The processes include a solvent exchange step before a freeze-drying (lyophilization) step.

Abstract: An apparatus includes a frequency analyzer circuitry, filter circuitry, and voice coil motor (VCM) control circuitry. The frequency analyzer circuitry is configured to detect one or more dominant frequencies of a position error signal (PES). The filter circuitry is configured to identify one or more filters in response to detecting the one or more dominant frequencies, apply the one or more identified filters to at least one of a microactuator control signal and PES, and generate a VCM compensation signal in response to the filtered PES or the microactuator control signal. The VCM control circuitry is configured to generate a VCM control signal in response to the VCM compensation signal.

Abstract: An apparatus includes a disk locked clock system and a feedforward microactuator compensator. The disk locked clock system is configured to estimate a timing error and generate a timing error signal. The feedforward microactuator compensator is configured to generate a microactuator compensation signal, without use of a vibration sensor signal, in response to the timing error signal.

Abstract: An apparatus includes a microactuator controller configured to generate a microactuator control signal, a feedforward microactuator compensator configured to generate a microactuator compensation signal, and a microactuator model filter configured to filter a modified microactuator control signal. The microactuator compensation signal is configured to be injected into the microactuator control signal to generate the modified microactuator control signal. The microactuator model filter generates a filtered modified microactuator control signal and injects the filtered modified microactuator control signal into a position error signal to generate a modified position error signal.