Abstract: A system and method for observing bi-directional information transmitted between two integrated circuits is disclosed. The bi-directional information is transmitted on first and second communication links between a first and a second integrated circuit. The second integrated circuit includes a first data port electrically coupled to the first and second communication links. A second data port of the second integrated circuit is electrically coupled to the first communication link at the first data port of the second integrated circuit. The second data port is capable of electrical connection with an analyzing device. A third data port of the second integrated circuit is electrically coupled to the second communication link at the first data port of the second integrated circuit. A third communication link electrically couples the third data port of the second integrated circuit to a first data port of a third integrated circuit.