Abstract: Systems and methods for reducing delays between successive write and read accesses in multi-bank memory devices are provided. Computer circuits modify the relative timing between addresses and data of write accesses, reducing delays between successive write and read accesses. Memory devices that interface with these computer circuits use posted write accesses to effectively return the modified relative timing to its original timing before processing the write access.

Abstract: A DRAM device includes an ECC generator/checker that generates ECC syndromes corresponding to items of data stored in the DRAM device. The DRAM device also includes an ECC controller that causes the ECC syndromes to be stored in the DRAM device. The ECC controller also causes a flag bit having a first value to be stored in the DRAM device when a corresponding ECC syndrome is stored. The ECC controller changes the flag bit to a second value whenever the corresponding data bits are modified, this indicating that the stored syndrome no longer corresponds to the stored data. In such case, the ECC controller causes a new ECC syndrome to be generated and stored, and the corresponding flag bit is reset to the first value. The flag bits may be checked in this manner during a reduced power refresh to ensure that the stored syndromes correspond to the stored data.

Abstract: Multi-port memory having an additional control bus for passing commands between ports have individual ports that can be configured to respond to a command received from an external control bus or to a command received from the additional control bus. This facilitates various combinations of ports to vary the bandwidth or latency of the memory to facilitate tailoring performance characteristics to differing applications.

Abstract: A DRAM memory device includes several banks of memory cells each of which are divided into first and second sets of memory cells. The memory cells in the first set can be refreshed at a relatively slow rate to reduce the power consumed by the DRAM device. Error checking and correcting circuitry in the DRAM device corrects any data retention errors in the first set of memory cells caused by the relatively slow refresh rate. The memory cells in the second set are refreshed at a normal rate, which is fast enough that data retention errors do not occur. A mode register in the DRAM device may be programmed to select the size of the second set of memory cells.

Abstract: Systems, devices and methods are disclosed. In an embodiment of one such device, an embodiment of a memory device includes a command decoder that is operable to decode received write enable, row address strobe and column address strobe signals to place the memory device in at least one reduced power state despite the absence of either a clock enable signal or a chip select signal. The command decoder performs this function by decoding the write enable, row address strobe and column address strobe signals in combination with at least one address signal received by the memory device. The command decoder can also decode a no operation command, which differs from the at least one reduced power state by only the state of the write enable signal. As a result, when the at least one reduced power state is terminated by a transition of the write enable signal, the memory device automatically transitions to a no operation mode.

Abstract: Disclosed are methods and devices, among which is a device that includes a pattern-recognition processor. In some embodiments, the pattern-recognition processor includes a first block of feature cells coupled to a decoder via a first plurality of local input conductors, a first block-disabling circuit, and a plurality of global input conductors. The pattern-recognition processor further includes a second block of feature cells coupled to the decoder via a second plurality of local input conductors, a second block-disabling circuit, and the plurality of global input conductors.

Abstract: Disclosed are methods and systems, among which is a system that includes a pattern-recognition processor, a central processing unit (CPU) coupled to the pattern-recognition processor via a pattern-recognition bus, and memory coupled to the CPU via a memory bus. In some embodiments, the pattern-recognition bus and the memory bus form about the same number of connections to the pattern-recognition processor and the memory, respectively.

Abstract: Disclosed are methods and devices, among which is a device that includes a pattern-recognition processor. The pattern-recognition processor may include a matching-data reporting module, which may have a buffer and a match event table. The buffer may be coupled to a data stream and configured to store at least part of the data stream, and the match event table may be configured to store data indicative of a buffer location corresponding with a start of a search criterion being satisfied.

Abstract: Systems, devices and methods are disclosed. In an embodiment of one such device, an embodiment of a memory device includes a command decoder that is operable to decode received write enable, row address strobe and column address strobe signals to place the memory device in at least one reduced power state despite the absence of either a clock enable signal or a chip select signal. The command decoder performs this function by decoding the write enable, row address strobe and column address strobe signals in combination with at least one address signal received by the memory device. The command decoder can also decode a no operation command, which differs from the at least one reduced power state by only the state of the write enable signal. As a result, when the at least one reduced power state is terminated by a transition of the write enable signal, the memory device automatically transitions to a no operation mode.

Abstract: An improved architecture and method for operating a PCRAM integrated circuit is disclosed which seeks to minimize degradation in the resistance of the phase change material in the cells. When an attempt is made during a write command to write a data state to a bit which already has that data state, such matching data states are identified and writing to those bits is precluded during the write command. In one embodiment, both the incoming data to be written to a bit and the data currently present at that bit address are latched. These latched data are then compared (e.g., with an XOR gate) to determine which bits have a matching data state. The results of this comparison are used as an enable signal to the write (column) driver in the PCRAM memory array, with the effect that only data bits having different data state are written, while data bits having a matching data state are not needlessly re-written.

Abstract: A memory device includes a configurable address register having a first set of input buffers coupled to a first set on address bus terminals and a second set of input buffers coupled to a second set of address bus terminals. In a first addressing configuration, address signals are simultaneously applied to the address bus terminals in the first and second sets, and they are simultaneously stored in respective address registers. In a second addressing configuration, a plurality of sets of address signals are sequentially applied to the address bus terminals in only the first set of address bus terminals. Each set of address signals is then stored in a different address register.

Abstract: A memory device includes a configurable address register having a first set of input buffers coupled to a first set on address bus terminals and a second set of input buffers coupled to a second set of address bus terminals. In a first addressing configuration, address signals are simultaneously applied to the address bus terminals in the first and second sets, and they are simultaneously stored in respective address registers. In a second addressing configuration, a plurality of sets of address signals are sequentially applied to the address bus terminals in only the first set of address bus terminals. Each set of address signals is then stored in a different address register.

Abstract: An improved architecture and method for operating a PCRAM integrated circuit is disclosed which seeks to minimize degradation in the resistance of the phase change material in the cells. When an attempt is made during a write command to write a data state to a bit which already has that data state, such matching data states are identified and writing to those bits is precluded during the write command. In one embodiment, both the incoming data to be written to a bit and the data currently present at that bit address are latched. These latched data are then compared (e.g., with an XOR gate) to determine which bits have a matching data state. The results of this comparison are used as an enable signal to the write (column) driver in the PCRAM memory array, with the effect that only data bits having different data state are written, while data bits having a matching data state are not needlessly re-written.

Abstract: An improved architecture and method for operating a PCRAM integrated circuit is disclosed which seeks to minimize degradation in the resistance of the phase change material in the cells. When an attempt is made during a write command to write a data state to a bit which already has that data state, such matching data states are identified and writing to those bits is precluded during the write command. In one embodiment, both the incoming data to be written to a bit and the data currently present at that bit address are latched. These latched data are then compared (e.g., with an XOR gate) to determine which bits have a matching data state. The results of this comparison are used as an enable signal to the write (column) driver in the PCRAM memory array, with the effect that only data bits having different data state are written, while data bits having a matching data state are not needlessly re-written.

Abstract: Systems, devices and methods are disclosed. In an embodiment of one such device, an embodiment of a memory device includes a command decoder that is operable to decode received write enable, row address strobe and column address strobe signals to place the memory device in at least one reduced power state despite the absence of either a clock enable signal or a chip select signal. The command decoder performs this function by decoding the write enable, row address strobe and column address strobe signals in combination with at least one address signal received by the memory device. The command decoder can also decode a no operation command, which differs from the at least one reduced power state by only the state of the write enable signal. As a result, when the at least one reduced power state is terminated by a transition of the write enable signal, the memory device automatically transitions to a no operation mode.

Abstract: A memory device includes a configurable address register having a first set of input buffers coupled to a first set on address bus terminals and a second set of input buffers coupled to a second set of address bus terminals. In a first addressing configuration, address signals are simultaneously applied to the address bus terminals in the first and second sets, and they are simultaneously stored in respective address registers. In a second addressing configuration, a plurality of sets of address signals are sequentially applied to the address bus terminals in only the first set of address bus terminals. Each set of address signals is then stored in a different address register.

Abstract: A DRAM device includes an ECC generator/checker that generates ECC syndromes corresponding to items of data stored in the DRAM device. The DRAM device also includes an ECC controller that causes the ECC syndromes to be stored in the DRAM device. The ECC controller also causes a flag bit having a first value to be stored in the DRAM device when a corresponding ECC syndrome is stored. The ECC controller changes the flag bit to a second value whenever the corresponding data bits are modified, this indicating that the stored syndrome no longer corresponds to the stored data. In such case, the ECC controller causes a new ECC syndrome to be generated and stored, and the corresponding flag bit is reset to the first value. The flag bits may be checked in this manner during a reduced power refresh to ensure that the stored syndromes correspond to the stored data.

Abstract: A DRAM memory device includes several banks of memory cells each of which are divided into first and second sets of memory cells. The memory cells in the first set can be refreshed at a relatively slow rate to reduce the power consumed by the DRAM device. Error checking and correcting circuitry in the DRAM device corrects any data retention errors in the first set of memory cells caused by the relatively slow refresh rate. The memory cells in the second set are refreshed at a normal rate, which is fast enough that data retention errors do not occur. A mode register in the DRAM device may be programmed to select the size of the second set of memory cells.

Abstract: An improved architecture and method for operating a PCRAM integrated circuit is disclosed which seeks to minimize degradation in the resistance of the phase change material in the cells. When an attempt is made during a write command to write a data state to a bit which already has that data state, such matching data states are identified and writing to those bits is precluded during the write command. In one embodiment, both the incoming data to be written to a bit and the data currently present at that bit address are latched. These latched data are then compared (e.g., with an XOR gate) to determine which bits have a matching data state. The results of this comparison are used as an enable signal to the write (column) driver in the PCRAM memory array, with the effect that only data bits having different data state are written, while data bits having a matching data state are not needlessly re-written.

Abstract: A memory device includes a configurable address register having a first set of input buffers coupled to a first set on address bus terminals and a second set of input buffers coupled to a second set of address bus terminals. In a first addressing configuration, address signals are simultaneously applied to the address bus terminals in the first and second sets, and they are simultaneously stored in respective address registers. In a second addressing configuration, a plurality of sets of address signals are sequentially applied to the address bus terminals in only the first set of address bus terminals. Each set of address signals is then stored in a different address register.