Abstract: A memory device includes a memory array comprising a plurality of planes, a plurality of voltage generation systems, and a controller. Each voltage generation system of the plurality of voltage generation systems is electrically coupled to a corresponding plane of the plurality of planes. The controller is configured to turn on each voltage generation system of the plurality of voltage generation systems in response to a first command to access a first plane of the plurality of planes. The controller is configured to operate the voltage generation system of the plurality of voltage generation systems corresponding to the first plane of the plurality of planes at a first clock frequency, and operate the remaining voltage generation systems of the plurality of voltage generation systems corresponding to the other planes of the plurality of planes at a second clock frequency less than the first clock frequency.

Abstract: Systems and methods of dynamically calibrating memory control signals during increase of wordline voltage for memory technologies subject to charge loss are disclosed. In one aspect, an exemplary method may comprise using an internal node, such as a wordline regulator output or return feedback line or a replica of the wordline, as proxy for the local wordline voltage. In one or more further embodiments, the proxy signal may be converted to digital signal or code and even determined in the background before the signal is needed for calibration. As a function of the disclosed technology, calibration of memory control signals, such as pass voltage and wordline read-verify voltage, may be performed during increase of the wordlines voltage with no impact or penalty on read/program time.

Abstract: An electronic device includes: a clock booster configured to generate a boosted intermediate voltage greater than a source voltage, wherein the clock booster includes: a controller capacitor configured to store energy for providing a control signal, wherein the control signal is for controlling charging operations to generate the boosted intermediate voltage based on the source voltage, and a booster capacitor configured to store energy according to the control signal for providing the boosted intermediate voltage; and a secondary booster operatively coupled to the clock booster, the secondary booster configured to generate an output voltage based on the boosted intermediate voltage, wherein the output voltage is greater than both the source voltage and the boosted intermediate voltage.

Abstract: Systems and methods of dynamically calibrating memory control signals during increase of wordline voltage for memory technologies subject to charge loss are disclosed. In one aspect, an exemplary method may comprise using an internal node, such as a wordline regulator output or return feedback line or a replica of the wordline, as proxy for the local wordline voltage. In one or more further embodiments, the proxy signal may be converted to digital signal or code and even determined in the background before the signal is needed for calibration. As a function of the disclosed technology, calibration of memory control signals, such as pass voltage and wordline read-verify voltage, may be performed during increase of the wordlines voltage with no impact or penalty on read/program time.

Abstract: A voltage generation system might include a resistive voltage divider having a first resistance connected between its output and a first feedback node and a second resistance connected between the first feedback node and a first voltage node, a capacitive voltage divider having a first capacitance connected between its output and a second feedback node and a second capacitance connected between the second feedback node and the first voltage node, a comparator having an input connected to the second feedback node, and a voltage generation circuit configured to generate a voltage level at its output responsive to an output of the comparator and to a clock signal, wherein the first feedback node is selectively connected to the second feedback node and selectively connected to a second voltage node, wherein the first resistance is selectively connected to the first feedback node, and wherein the second resistance is selectively connected to the first voltage node.

Abstract: Methods of operating a memory, and apparatus having a configuration to perform similar methods, might include connecting an access line of a plurality of access lines to an output of a voltage generation system and isolating the access line from an output of a voltage regulator, determining whether a particular voltage level of the voltage generation system makes a particular transition from a voltage level lower than a threshold to a voltage level higher than the threshold after connecting the access line to the output of the voltage generation system, and connecting the access line to the output of the voltage regulator in response to determining that the particular voltage level of the voltage generation system made the particular transition.

Abstract: Devices and techniques are disclosed herein to compensate for variance in one or more electrical parameters across multiple signal lines of an array of memory cells. A compensation circuit can provide a bias signal to a first one of the multiple signal lines, the bias signal having an overdrive voltage greater than a target voltage by a selected increment for a selected overdrive period according to a functional compensation profile.

Abstract: Disclosed are systems and methods of dynamically calibrating a memory control voltage more accurately. According to disclosed implementations, a memory control voltage such as Vpass or Vwlry may be calibrated during memory operation as a function of the change in slope of total string current, even during increase in the wordline voltage. In one exemplary method, the wordlines are increased in sequence from a start voltage to an end voltage in steps, slope change is measured at every step, the measured slope change is compared against a threshold, and an adjusted memory control voltage is determined as a function of a wordline voltage at which the change in slope reaches the threshold. As such, memory control voltage may be determined and dynamically calibrated with less sensitivity to operating parameters such as temperature, pattern, and/or time of programming.

Abstract: Devices and techniques are disclosed herein to provide a high-voltage bias signal in a standby state of the storage system without exceeding a limited maximum standby current allowance of the storage system. The high-voltage bias signal can enable a string driver circuit in the standby state to couple a global word line to a local word line, to provide a bias to, or sink a voltage from, a pillar of a string of memory cells of the storage system in the standby state, such as to reduce read disturbances in the storage system.

Abstract: Apparatus, systems, and methods are disclosed, including a charge pump having a pumping function that includes multiple pump stages connected in series. Each pump stage includes a capacitor node coupled to a capacitive element, a low-voltage device including a dielectric layer having a threshold voltage, and an output node coupled to the capacitor node through the low-voltage device. The charge pump also includes a common discharge circuit coupled between a reference voltage and a common node. The charge pump also includes multiple high-voltage diodes, each coupled between the output node of a respective pump stage and the common node. The common discharge circuit includes a current source configured to supply a current to the output nodes when the pumping function of the charge pump is disabled.

Abstract: An electronic device comprises a multi-chip package including multiple memory dice that include a memory array, charging circuitry, polling circuitry and a control unit. The charging circuitry is configured to perform one or more memory events in a high current mode using a high current level or in a low current mode using a lower current level. The polling circuitry is configured to poll a power status node common to the multiple memory dice to determine availability of the high current mode. The control unit is configured to operate the charging circuitry in the high current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is available, and operate the charging circuitry in the low current mode to perform the one or more memory events when the polling circuitry indicates that the high current mode is unavailable.

Abstract: Method of operating an integrated circuit device might include applying a first voltage level to a first conductor while applying a second voltage level to a second conductor, applying a third voltage level to the first conductor while applying a fourth voltage level to the second conductor, and applying a fifth voltage level to the first conductor while applying the second voltage level to the second conductor. The second voltage level might correspond to a target voltage level for the second conductor. A difference between the third voltage level and the first voltage level might have a polarity opposite the polarity of a difference between the fourth voltage level and the second voltage level, and the same polarity of a difference between the fifth voltage level and the first voltage level. The fifth voltage level might correspond to a target voltage level for the first conductor.

Abstract: Apparatus and methods are disclosed for providing a bias. A main diode has first and second terminals that connect to a high voltage (HV) line and to an HV regulated line, respectively. The main diode provides a voltage on the HV regulated line lower than a voltage of the HV line. A first current mirror provides a first current. The current mirror connects to the first terminal of the main diode and the HV regulated line. A second current mirror provides a second current. The second current mirror connects to the HV line, the first current mirror, and a low-voltage (LV) line. An impedance is between the LV line and the HV regulated line. A voltage differential between the HV regulated line and the LV line below a low-voltage threshold, and a voltage differential between the HV regulated line and the HV line above the low-voltage threshold are provided.

Abstract: A memory device includes a memory array, a plurality of voltage generation systems, and a controller. The memory array includes a plurality of planes. Each voltage generation system of the plurality of voltage generation systems is electrically coupled to a corresponding plane of the plurality of planes. The controller is configured to turn on each voltage generation system of the plurality of voltage generation systems in response to a first command to access a first plane of the plurality of planes.

Abstract: A memory device includes a conductive line coupled to access addressable storage locations of the memory device. The memory device includes a circuit with a line driver with an access device for the conductive line. A control circuit sets a gate of the access device to an initial overdrive bias voltage to drive a drain of the access device to an initial voltage while the access device control circuit is not connected to the conductive line via another conductive line. The control circuit floats the gate voltage of the access device and connects the control circuit to the conductive line via the other conductive line. The floating initial overdrive voltage does not drop when the initial voltage of the control circuit drops to a final voltage under load conditions. The overdrive can result in a steeper program slope, and a controllable program pulse width or programming time (tPROG).

Abstract: An electronic device includes: a clock booster configured to generate a boosted intermediate voltage greater than a source voltage, wherein the clock booster includes: a controller capacitor configured to store energy for providing a gate signal, wherein the gate signal is for controlling charging operations to generate the boosted intermediate voltage based on the source voltage, and a booster capacitor configured to store energy according to the gate signal for providing the boosted intermediate voltage, wherein the booster capacitor has greater capacitance level than the controller capacitor; and a secondary booster operatively coupled to the clock booster, the secondary booster configured to generate an output voltage based on the boosted intermediate voltage, wherein the output voltage is greater than both the source voltage and the boosted intermediate voltage.

Abstract: An electronic device includes: a clock booster circuit configured to store charges on doubler capacitors therein, wherein each doubler capacitor is connected to a corresponding clock signal; secondary booster circuit including booster capacitors that are each coupled to one of the doubler capacitors, the secondary booster circuit configured to provide one or more stage outputs based on boosting the charges stored on the doubler capacitors; and connecting switches that each connect one of the doubler capacitors to one of the booster capacitors during recycling durations, wherein the recycling duration occurs after generating the one or more stage outputs; wherein the clock signals correspond to a state during the recycling duration.

Abstract: Devices and techniques are disclosed herein to provide a high-voltage bias signal in a standby state of the storage system without exceeding a limited maximum standby current allowance of the storage system. The high-voltage bias signal can enable a string driver circuit in the standby state to couple a global word line to a local word line, to provide a bias to, or sink a voltage from, a pillar of a string of memory cells of the storage system in the standby state, such as to reduce read disturbances in the storage system.

Abstract: Disclosed are systems and methods of dynamically calibrating a memory control voltage more accurately. According to disclosed implementations, a memory control voltage such as Vpass or Vwlrv may be calibrated during memory operation as a function of the change in slope of total string current, even during increase in the wordline voltage. In one exemplary method, the wordlines are increased in sequence from a start voltage to an end voltage in steps, slope change is measured at every step, the measured slope change is compared against a threshold, and an adjusted memory control voltage is determined as a function of a wordline voltage at which the change in slope reaches the threshold. As such, memory control voltage may be determined and dynamically calibrated with less sensitivity to operating parameters such as temperature, pattern, and/or time of programming.

Abstract: Devices and techniques are disclosed herein to compensate for variance in one or more electrical parameters across multiple signal lines of an array of memory cells. A compensation circuit can provide a bias signal to a first one of the multiple signal lines, the bias signal having an overdrive voltage greater than a target voltage by a selected increment for a selected overdrive period according to a functional compensation profile.