Abstract: Transistor bodies are biased to modify delay in clock buffers.

Abstract: A clock generating apparatus is provided that includes a first phase lock loop device powered by an analog (or fixed) power supply voltage and a second phase lock loop device powered by the analog power supply voltage and a digital power supply voltage. The second phase lock loop device to output a clock signal having an adaptive frequency based on the digital power supply voltage.

Abstract: According to some embodiments, scan cell designs are provided for a double-edge-triggered flip-flop.

Abstract: On-die voltage and/or frequency detectors. For one aspect, an adaptive frequency clock generation circuit includes a droop detector to detect a supply voltage level and to cause the frequency of an on-die clock signal to be adjusted accordingly.

Abstract: According to some embodiments, a clock signal having an adaptive frequency is provided.

Abstract: According to some embodiments, a plurality of ring oscillators are associated with a generation and/or distribution of a clock signal.

Abstract: Transistor bodies are biased to modify delay in clock buffers.

Abstract: A method and chip design are provided for reducing power consumption. A first functional block having a phase logic circuit may be provided in a first area of a chip. A second functional block having an edge-triggered circuit may be provided in a second area of the chip. Edge-triggered circuits within the second functional block may be replaced with dual edge-triggered circuits. Phase logic circuits may be clocked by a full frequency clock signal and dual edge-triggered circuits may be clocked by a half-frequency clock signal.

Abstract: On-die voltage and/or frequency detectors. For one aspect, an adaptive frequency clock generation circuit includes a droop detector to detect a supply voltage level and to cause the frequency of an on-die clock signal to be adjusted accordingly.

Abstract: On-die voltage and/or frequency detectors. For one aspect, an adaptive frequency clock generation circuit includes a droop detector to detect a supply voltage level and to cause the frequency of an on-die clock signal to be adjusted accordingly.

Abstract: According to some embodiments, scan cell designs are provided for a double-edge-triggered flip-flop.

Abstract: According to some embodiments, a clock signal having an adaptive frequency is provided.

Abstract: In a bypass mode, a tester may bypass the core and input/output phase locked loops (PLLs) utilized by a processor to develop internal clock signals. External, tester-generated, phase shifted clock signals may be used to generate aligned high frequency signals to replace those generated by the phase locked loops. A plurality of phase shifted, tester generated clock signals may be subjected to an exclusive OR operation for generating input/output and core clock replacement signals. The clock signals received from the tester may also be aligned. Thus, a variety of skews may be compensated before entering the bypass mode. In some embodiments of the present invention, the core and I/O PLL clocks are used to establish alignment in a set-up phase and in other embodiments, the core and I/O PLL need not be utilized at all to generate appropriate internal clock signals from an external tester.

Abstract: A VCO phase lock loop system may include a first voltage controlled oscillator that provides a first oscillation signal relative to a first frequency and a second voltage controlled oscillator that provide a second oscillation signal relative to a second frequency. A loop filter capacitor may be associated with both the first voltage controlled oscillator and the second voltage controlled oscillator. A selection device may enable components associated with the either one of the voltage controlled oscillators while disabling components associated with the other one of the voltage controlled oscillators.

Abstract: According to some embodiments, a plurality of ring oscillators are associated with a generation and/or distribution of a clock signal.

Abstract: A circuit for generating and distributing highly accurate and stable clocks on a large integrated die is described. A Digital De-skew System is used to help prevent metastability and dither, provide a wide controllable delay range, and alternate sampling of phase detectors.

Abstract: A skew measure circuit, an exclusion circuit, and an up/down counter are connected to form a skew detection circuit. The skew measure circuit asserts a first output signal if a first input clock leads a second input clock, and asserts a second output signal if the second clock leads the first clock. The exclusion circuit provides first and second digital pulse signals that represent the outputs of the skew measure circuit. The exclusion circuit also prevents the states of these pulse signals from changing, so long as the skew measure circuit is experiencing metastability. The up/down counter's count is incremented in response to the first pulse signal and decremented in response to the other pulse signal.

Abstract: A synchronizing apparatus is provided in a high frequency system. The synchronizing apparatus includes a loop control circuit, a voltage controlled oscillator coupled to the loop control circuit, a matched current amplifier coupled to the voltage controlled oscillator, and a duty cycle control buffer connect to the matched circuit amplifier.

Abstract: A dual VCO phase lock loop system is provided that includes a first voltage controlled oscillator that provides a first oscillation signal relative to a first frequency and a second voltage controlled oscillator that provides a second oscillation signal relative to a second frequency. A loop filter capacitor may be associated with both the first voltage controlled oscillator and the second voltage controlled oscillator. A selection device may enable components associated with the either one of the voltage controlled oscillators while disabling components associated with the other one of the voltage controlled oscillators.

Abstract: In a processing system, a glitch protection circuit receives a strobe signal and a data receiver captures a data signal in response to an output from the glitch protection circuit. Several embodiments are disclosed. In a first embodiment, a glitch protection circuit generates an output that represents a logical multiplication of a strobe signal with a delayed version of itself. In another embodiment, a pair of glitch protection circuits each sense a strobe transition and become dormant until its partner senses a strobe transition. The pair operates in a toggling fashion.