Abstract: An analog-to-digital converter (ADC) circuit comprises one or more most-significant-bit (MSB) capacitors having first ends connected to a voltage comparator and one or more least-significant-bit (LSB) capacitors having first ends connected to the comparator. The circuit further comprises a first switching circuit for each MSB capacitor, configured to selectively connect the second end of the respective MSB capacitor to (a) an input voltage, for sampling, (b) a ground reference, during portions of a conversion phase, and (c) a first conversion reference voltage, for other portions of the conversion phase. The circuit still further comprises a second switch circuit, for each LSB capacitor, configured to selectively connect the second end of the respective LSB capacitor between (d) the ground reference, during portions of the conversion phase, and (e) a second conversion reference voltage, for other portions of the conversion phase, the second conversion reference voltage differing from the first.

Abstract: An analog-to-digital converter (ADC) circuit comprises one or more most-significant-bit (MSB) capacitors having first ends connected to a voltage comparator and one or more least-significant-bit (LSB) capacitors having first ends connected to the comparator. The circuit further comprises a first switching circuit for each MSB capacitor, configured to selectively connect the second end of the respective MSB capacitor to (a) an input voltage, for sampling, (b) a ground reference, during portions of a conversion phase, and (c) a first conversion reference voltage, for other portions of the conversion phase. The circuit still further comprises a second switch circuit, for each LSB capacitor, configured to selectively connect the second end of the respective LSB capacitor between (d) the ground reference, during portions of the conversion phase, and (e) a second conversion reference voltage, for other portions of the conversion phase, the second conversion reference voltage differing from the first.

Abstract: In accordance with an embodiment, a method for monitoring a data converter configured to convert data using a calibration determined by a calibration data record includes calibrating the data converter in order to determine a corresponding multiplicity of time associated calibration data records at a multiplicity of different times; and determining a state of the data converter based on comparing at least one of the multiplicity of time associated calibration data records with a comparison data record.

Abstract: Sampling circuits and methods for sampling are provided. In a first operating phase, sampling capacitors are coupled to inputs, and in a second operating phase, to a common-mode signal.

Abstract: A method includes: receiving a reflected radar signal including a first radar chirp signal during a first chirp time period and a second radar chirp signal during a second chirp time period; downconverting the reflected radar signal to form a baseband signal; adding a DC offset to the baseband signal to form a DC offset baseband signal, adding the DC offset including adding a first DC offset to the baseband signal during the first chirp time period, and adding a second DC offset to the baseband signal during the second chirp time period, where the first DC offset is different from the second DC offset; and digitizing the DC offset baseband signal using an analog-to-digital converter to form a digitized baseband signal.

Abstract: In some examples, an integrated circuit device includes a sampling switch configured to sample an input signal. The integrated circuit device also includes a first evaluation unit configured to receive the sampled input signal from the sampling switch and evaluate the sampled input signal. The integrated circuit device further includes a second evaluation unit configured to receive the sampled input signal from the sampling switch and evaluate the sampled input signal. The sampling switch is configured to deliver the sampled input signal to the first evaluation unit and deliver the sampled input signal to the second evaluation unit.

Abstract: Sampling circuits and methods for sampling are provided. In a first operating phase, sampling capacitors are coupled to inputs, and in a second operating phase, to a common-mode signal.

Abstract: In accordance with an embodiment, a method includes: receiving a reflected radar signal including a first radar chirp signal during a first chirp time period and a second radar chirp signal during a second chirp time period; downconverting the reflected radar signal to form a baseband signal; adding a DC offset to the baseband signal to form a DC offset baseband signal, adding the DC offset including adding a first DC offset to the baseband signal during the first chirp time period, and adding a second DC offset to the baseband signal during the second chirp time period, where the first DC offset is different from the second DC offset; and digitizing the DC offset baseband signal using an analog-to-digital converter to form a digitized baseband signal.

Abstract: A circuit having capacitors, and corresponding method. A circuit and corresponding methods are provided. A controller causes a first capacitor to be connected to an input connection in a first operating phase, charge to be transferred from the first capacitor to a second capacitor in a second operating phase and charge to be transferred from the second capacitor to a processing circuit in a third operating phase. The input connection and the second capacitor belong to different voltage domains.

Abstract: A switched-capacitor analog-to-digital converter (ADC) includes: a main digital-to-analog converter (DAC) circuit; a comparator coupled to the main DAC circuit and configured to determine whether the input to the comparator exceeds a pre-determined threshold; and a supplementary DAC circuit coupled to the main DAC circuit, wherein the switched-capacitor ADC is configured to operate in at least one of a first mode or a second mode, wherein in the first mode for measuring an offset of the switched-capacitor ADC, the supplementary DAC circuit is configured to shift a voltage at an output of the main DAC circuit by a first value having a first polarity, and wherein in the second mode for measuring a full-scale gain error of the switched-capacitor ADC, the supplementary DAC circuit is configured to shift the voltage at the output of the main DAC circuit by a second value having a second polarity opposite the first polarity.

Abstract: In accordance with an embodiment, a method of monitoring a data converter includes determining a multiplicity of time-associated linearity parameters that describe a linearity of the data converter at a multiplicity of different times, and determining a state of the data converter based on comparing at least one linearity parameter of the multiplicity of time-associated linearity parameters with a comparison parameter.

Abstract: A circuit having capacitors, and corresponding method. A circuit and corresponding methods are provided. A controller causes a first capacitor to be connected to an input connection in a first operating phase, charge to be transferred from the first capacitor to a second capacitor in a second operating phase and charge to be transferred from the second capacitor to a processing circuit in a third operating phase. The input connection and the second capacitor belong to different voltage domains.

Abstract: A method and an apparatus for determining the suitability of a test delay value between comparator decisions of a comparator circuit of an asynchronous successive approximation analog/digital converter and a method for determining an optimized delay value of a comparator of an asynchronous successive approximation analog/digital converter are provided.

Abstract: Sampling circuits and methods for sampling are provided. In a first operating phase, sampling capacitors are coupled to inputs, and in a second operating phase, to a common-mode signal.

Abstract: In accordance with an embodiment, a method for calibrating at least two analog-to-digital converters includes feeding an analog predefined signal to the at least two analog-to-digital converters; converting the analog predefined signal into at least two converter-associated digital values using the at least two analog-to-digital converters, wherein the converting is based on a received clock signal; and adapting a converter-specific time delay based on the at least two converter-associated digital values.

Abstract: Measurement apparatuses and methods are described. A measurement input is coupled with a first terminal of a capacitance via a first switch, and a reference voltage is coupled with the first terminal of the capacitance via a second switch. A measurement circuit is coupled to a second terminal of said capacitance.

Abstract: A circuit for processing an input-signal voltage, and including an input capacitance coupled between an input node of the circuit and a sense node of a comparator; a reference capacitance coupled to the sense node of the comparator; and a common mode switch coupled between the sense node and a reference node of the comparator. The circuit is configured to have the input capacitance set to a reference input voltage while the common mode switch is closed, and the input node set to the input-signal voltage while the common mode switch is open. The reference capacitance includes a plurality of capacitances, at least one of which is provided as a switched capacitance that is selectively controllable to configure the plurality of capacitances. A switched capacitance controller is configured to control the switched capacitance so as to compensate, at the sense node, a comparator offset voltage.

Abstract: In some examples, an integrated circuit device includes a sampling switch configured to sample an input signal. The integrated circuit device also includes a first evaluation unit configured to receive the sampled input signal from the sampling switch and evaluate the sampled input signal. The integrated circuit device further includes a second evaluation unit configured to receive the sampled input signal from the sampling switch and evaluate the sampled input signal. The sampling switch is configured to deliver the sampled input signal to the first evaluation unit and deliver the sampled input signal to the second evaluation unit.

Abstract: In accordance with an embodiment, a method for monitoring a data converter configured to convert data using a calibration determined by a calibration data record includes calibrating the data converter in order to determine a corresponding multiplicity of time associated calibration data records at a multiplicity of different times; and determining a state of the data converter based on comparing at least one of the multiplicity of time associated calibration data records with a comparison data record.

Abstract: In accordance with an embodiment, a method of monitoring a data converter includes determining a multiplicity of time-associated linearity parameters that describe a linearity of the data converter at a multiplicity of different times, and determining a state of the data converter based on comparing at least one linearity parameter of the multiplicity of time-associated linearity parameters with a comparison parameter.