Abstract: A decontamination pad includes an adsorptive/absorptive knitted activated-carbon layer exposed on a first surface, an activated-carbon fabric attached to the other surface of the knitted layer and backed up an impermeable layer. The activated carbon is saturated with a non-hazardous CWA decontamination solvent as nonspecific means of decontaminating equipment and open-wounds is provided. The pad is packaged in a sealed, disposable plastic packet. The pad is thus a simple and immediate means of personal decontamination by applying the exposed surface of the knitted layer to the surface to be decontaminated.

Abstract: A decontamination pad includes an adsorptive/absorptive knitted activated-carbon layer exposed on a first surface, an activated-carbon fabric attached to the other surface of the knitted layer and backed up an impermeable layer. The activated carbon is saturated with a non-hazardous CWA decontamination solvent as nonspecific means of decontaminating equipment and open-wounds is provided. The pad is packaged in a sealed, disposable plastic packet. The pad is thus a simple and immediate means of personal decontamination by applying the exposed surface of the knitted layer to the surface to be decontaminated.

Abstract: An apparatus to enable an automobile driver to see above oversized vehicles and other obstacles with a periscope that attaches to the roof and windshield (or side window) of a motor vehicle, a sleeve mechanism that permits extension and rotation of the device, placement at the top of the windshield (or side window) that permits easy viewing, a powerful magnet and roof latch that secures the scope to the vehicle, and an optional zoom function that permits enlargement of a sighted object.: A preferred embodiment includes sturdy, weather-proof construction, availability in many colors, pre-assembly, and easy attachment.

Abstract: The invention relates to a method for testing a memory device with the memory device being able to be operated in a normal operating mode and a test mode and encompassing an output driver, input driver, and data pads. The method includes the steps of communicating test input data to be used for a test to the memory device, performing a test using the test input data in order to obtain test output data, the test data read out being passed via an output driver, at least one data pad, and an input driver, wherein the input drivers and output drivers are switched during the test in such a way as to enable data to be simultaneously read from and written to the memory device, and creating a data test result from the test output data. Furthermore, the invention relates to a memory device and a system for testing a memory device.

Abstract: Provided herein are duplex oligonucleotide complexes which can be administered to a cell, tissue or organism to silence a target gene without the aid of a transfection reagent(s). The duplex oligonucleotide complexes of the disclosure include a conjugate moiety that facilitates delivery to a cell, tissue or organism.

Abstract: Methods and compositions for making nucleoside phosphoramidites and nucleic acids, including mono-, di-, and polynucleotides, comprising a linker covalently attached to a levulinyl moiety are provided. A levulinyl-protected linking moiety affords an orthogonal approach to modifying a polynucleotide during or after solid phase synthesis with a molecule of interest, for example, a conjugate or a dye.

Abstract: A method for testing semiconductor memory modules in which data are stored in banks with an addressable matrix structure containing rows and columns. Defect addresses of the defect locations in the banks are transmitted in compressed form to an external test device. The rows and/or the columns are subdivided into regions. The defects occurring in the respective region are counted row by row and/or column by column. The number of defects in each region is compared row by row and/or column by column with a threshold value, and the comparison results are transmitted as additional information row by row and/or column by column together with the defect addresses to a test device.

Abstract: A comparison method compares the address of a memory cell with a known address of a faulty memory cell in a semiconductor memory module. The module is subdivided into banks and has an address structure in which each address is associated with a bank that is organized in rows and columns and is defined by a row address, a column address and a bank address. Not only the row address is determined, but also the column address and the bank address when a memory access occurs. A bank is activated with a bank selection signal, and the access to a valid address of a faulty memory cell is indicated by an enable register.

Abstract: A system for testing an integrated circuit at a plurality of locations with a plurality of test modes includes a sequence of test-mode storage devices, each of which has an input and an output. The sequence includes at least first and second test-mode storage devices located at corresponding first and second locations on the integrated circuit and configured to store first and second test modes. The first test-mode storage device is configured to perform a shift operation by providing the first test-mode at its output. The second test-mode storage device has its input connected to the output of the first test-mode storage device. This second device is configured to perform the shift operation by receiving, at its input, the first test mode and providing, at its output, the second test-mode.

Abstract: Ultrasonic solvent cleaning processes can effectively decontaminate sensitive equipment. The disclosed decontamination liquids meet the following criteria: a. It is compatible with a wide range of sensitive equipment—the performance of electronic and optical equipment is not affected by immersion in decontamination liquid. b. The principal chemical warfare agents of concern are sufficiently soluble in decontamination liquid for it to be an effective decontamination medium. c. The principal chemical warfare agents of concern are quantitatively removed from solution in decontamination liquid by activated carbon. When agent contaminated decontamination liquid is passed through a bed of activated carbon, the agent adsorbs onto the activated carbon, resulting in agent free decontamination liquid that can be recycled and reused. d. It is nonflammable, nontoxic, and environmentally acceptable.

Abstract: The present invention is a method for producing an implant for a corneal pocket assay by introducing a solution into a perforated plate or member, allowing the solution to form pellets, and removing the pellets from the perforations. The present invention also includes a method for performing a corneal pocket assay for testing a putative pharmaceutically active agent into laboratory animals by placing a pellet into the corneal pocket of the laboratory animal, introducing a pharmaceutically active agent into the laboratory animal, and evaluating the pharmaceutical activity of the agent. The present invention also includes pellets and implants for use in a corneal pocket assay produced by the methods of the present invention. The present invention includes a plate for forming an implant for a corneal pocket assay. The present invention also discloses a method of making pills and pills produced thereby.

Abstract: An integrated circuit for analyzing the waveform of an input signal includes a first storage circuit and a second storage circuit that are each supplied with the input signal. The first and second storage circuits are controlled by a clock signal. The first storage circuit is used to store a state for the input signal when the clock signal has a rising edge. The second storage circuit is used to store a state for the input signal when the clock signal has a falling edge. An evaluation circuit compares the states of the input signal that are stored in the first and second storage circuits during a selected time span. The comparison can be used to decide whether the input signal assumes periodic fluctuations or an approximately permanently static value during the time span.

Abstract: An integrated circuit includes a data processing unit, a buffer memory, and a setting memory. The buffer memory performs the function of registers for storing data for the processing unit. The buffer memory is connected to the setting memory. The setting memory can be written to through the buffer memory.

Abstract: The invention relates to an integrated test circuit in an integrated circuit for testing a plurality of internal voltages. A switching device is provided to select one of the internal voltages in accordance with a selection signal for the purpose of testing, and a comparator device is provided in order to compare a measurement voltage, dependent on the selected internal voltage, with an externally provided reference voltage. An error signal is output as a result of the comparison.

Abstract: The invention relates to a semi-conductor component (2a, 2b), and a process for reading test data, whereby the process comprises the steps: (a) Reading test data generated during a semi-conductor component test procedure from at least one test data register (102a) of a semi-conductor component (2a), (b) Storing the test data in at least one useful data memory cell on the semi-conductor component (2a), and (c) Reading the test data from the at least one useful data memory cell.

Abstract: The invention relates to a method for testing a memory device with the memory device being able to be operated in a normal operating mode and a test mode and comprising output driver, input driver, and data pads. The method comprises the steps of communicating test input data to be used for a test to the memory device, performing a test using the test input data in order to obtain test output data, the test data read out being passed via an output driver, at least one data pad, and an input driver, wherein the input drivers and output drivers are switched during the test in such a way as to enable data to be simultaneously read from and written to the memory device, and creating a data test result from the test output data. Furthermore, the invention relates to a memory device and a system for testing a memory device.

Abstract: The present invention provides a method for making a heating element adhered to a substrate by applying a photocurable composition to a flexible substrate in a pattern having one or more grid lines. The photocurable composition is curable into an electrically conductive layer and volatile organic compounds are present in an amount of less than about 10% of the total weight of the photocurable composition. After the pattern is deposited on the substrate it is cured by illuminating the photocurable composition with light for a sufficient period of time to cure the photocurable composition. In another embodiment of the invention heating elements made by the method of the invention are provided.

Abstract: A circuit configuration for driving a programmable link has a drive circuit for the selection and blowing of the fuse, and also a shift register, by which an activation signal can be fed to the drive circuit. In order to provide the data to be blown, in a preferred embodiment, a volatile memory cell may be provided. The present circuit configuration enables the blowing of fuses and thus repair of defective memory cells in mass memories even after encapsulation of a chip having the mass memory. Moreover, the shift register described effectively prevents impermissibly high currents from being able to occur as a result of simultaneous blowing of too many fuses.

Abstract: The present invention provides a method for making a heating element adhered to a substrate by applying a photocurable composition to a flexible substrate in a pattern having one or more grid lines. The photocurable composition is curable into an electrically conductive layer and volatile organic compounds are present in an amount of less than about 10% of the total weight of the photocurable composition. After the pattern is deposited on the substrate it is cured by illuminating the photocurable composition with light for a sufficient period of time to cure the photocurable composition. In another embodiment of the invention heating elements made by the method of the invention are provided.

Abstract: The invention relates to an integrated test circuit in an integrated circuit for testing a plurality of internal voltages. A switching device is provided to select one of the internal voltages in accordance with a selection signal for the purpose of testing, and a comparator device is provided in order to compare a measurement voltage, dependent on the selected internal voltage, with an externally provided reference voltage. An error signal is output as a result of the comparison.