Patents by Inventor Shuhei Yamaguchi

Shuhei Yamaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130078432
    Abstract: The pattern forming method of the invention includes (i) forming a film using an actinic ray-sensitive or radiation-sensitive resin composition containing a resin (P) having a repeating unit (a) represented by the following general formula (I), a compound (B) capable of generating an organic acid upon irradiation with actinic rays or radiation, and a nitrogen-containing organic compound (NA) having a group capable of leaving by the action of an acid, (ii) exposing the film, and (iii) developing the film after the exposure using a developer including an organic solvent to form a negative type pattern, in the general formula (I), R0 represents a hydrogen atom or a methyl group, and each of R1, R2, and R3 independently represents a linear or branched alkyl group.
    Type: Application
    Filed: September 13, 2012
    Publication date: March 28, 2013
    Applicant: FUJIFILM CORPORATION
    Inventors: Hidenori TAKAHASHI, Shuhei YAMAGUCHI, Shohei KATAOKA, Michihiro SHIRAKAWA, Fumihiro YOSHINO, Shoichi SAITOH
  • Publication number: 20130078426
    Abstract: An actinic ray-sensitive or radiation-sensitive resin composition capable of forming a hole pattern which has an ultrafine pore diameter (for example, 60 nm or less) and has an excellent cross-sectional shape with excellent local pattern dimensional uniformity; and a resist film, a pattern forming method, a method for preparing an electronic device, and an electronic device, each using the same, are provided.
    Type: Application
    Filed: September 11, 2012
    Publication date: March 28, 2013
    Applicant: FUJIFILM CORPORATION
    Inventors: Kosuke KOSHIJIMA, Hidenori TAKAHASHI, Shuhei YAMAGUCHI, Kei YAMAMOTO
  • Publication number: 20130034706
    Abstract: The present invention relates to a pattern forming method comprising: (1) forming a film by using an actinic ray-sensitive or radiation-sensitive resin composition containing a resin (P) of which the polarity increases by the action of an acid and thereby the solubility in a developer containing an organic solvent decreases and a compound (B) which generates an acid which is represented by the following general formula (I) by irradiation with actinic rays or radiation; (2) exposing the film; and (3) forming a negative-type pattern by developing with a developer which contains an organic solvent, the actinic ray-sensitive or radiation-sensitive resin composition and the resist film which are used in the method, a method for preparing an electronic device and the electronic device.
    Type: Application
    Filed: July 2, 2012
    Publication date: February 7, 2013
    Applicant: FUJIFILM CORPORATION
    Inventor: Shuhei YAMAGUCHI
  • Publication number: 20120311845
    Abstract: An annular caulking-fastened component to be fastened to a counterpart component by caulking includes a notch formed in an inner peripheral edge portion at one end side in a center axis direction, the notch being to be fixed to the counterpart component by caulking; and at least one of an inner-peripheral stepped portion formed between an inner peripheral surface and the inner peripheral edge portion and outward from the inner peripheral surface in a radial direction and an end-face stepped portion formed between an end face at one end side in the center axis direction and the inner peripheral edge portion and from the end face toward the other end side in the center axis direction.
    Type: Application
    Filed: June 8, 2011
    Publication date: December 13, 2012
    Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Makoto Taniguchi, Yuki Kurosaki, Yoshihiko Ukai, Jun Kamitake, Jo Kayahana, Shuhei Yamaguchi, Katsuaki Makino
  • Publication number: 20120273924
    Abstract: Provided are an actinic-ray- or radiation-sensitive resin composition that excels in the sensitivity, roughness characteristics and exposure latitude, and a method of forming a pattern using the same. The composition includes (A) a resin that when acted on by an acid, is decomposed to thereby increase its solubility in an alkali developer, and (B) a compound that when exposed to actinic rays or radiation, is decomposed to thereby generate an acid, the compound being any of compounds of general formula (1-1) below.
    Type: Application
    Filed: December 22, 2011
    Publication date: November 1, 2012
    Applicant: FUJIFILM Corporation
    Inventors: Tomoki Matsuda, Akinori Shibuya, Yoko Tokugawa, Shuhei Yamaguchi, Mitsuhiro Fujita
  • Publication number: 20120264054
    Abstract: Provided is a pattern forming method that is excellent in resolving power such as pre-bridging dimension, a roughness performance such as line edge roughness, and development time dependency, and an actinic-ray-sensitive or radiation-sensitive resin composition and a resist film used for the pattern forming method. The pattern forming method includes (1) forming a film using an actinic-ray-sensitive or radiation-sensitive resin composition that contains a resin (A) and a compound (B) which has a polymerizable group and generates an acid by being irradiated with actinic rays or radiations; (2) exposing the film; and (3) developing the exposed film using a developer that contains an organic solvent, wherein a pattern formed in this method is a negative pattern.
    Type: Application
    Filed: February 15, 2012
    Publication date: October 18, 2012
    Applicant: FUJIFILM CORPORATION
    Inventor: Shuhei YAMAGUCHI
  • Publication number: 20120237874
    Abstract: According to one embodiment, an actinic-ray- or radiation-sensitive resin composition includes any of the compounds (A) of general formula (I) below that when exposed to actinic rays or radiation, generates an acid and a resin (B) whose rate of dissolution into an alkali developer is increased by the action of an acid. (The characters used in general formula (I) have the meanings mentioned in the description.
    Type: Application
    Filed: May 31, 2012
    Publication date: September 20, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Shuhei Yamaguchi, Akinori Shibuya
  • Publication number: 20120219913
    Abstract: Provided is a pattern forming method that is excellent in roughness performance such as line width roughness and exposure latitude, and an actinic-ray-sensitive or radiation-sensitive resin composition and a resist film used for the pattern forming method. The pattern forming method includes (1) forming a film using an actinic-ray-sensitive or radiation-sensitive resin composition containing a resin that includes 65 mol % or more of a repeating unit having a group which generates a polar group by being degraded by the action of an acid based on all repeating units in the resin and at least one kind of repeating unit represented by the following General Formula (I) or (II), (2) exposing the film, and (3) developing the exposed film using a developer that contains an organic solvent.
    Type: Application
    Filed: February 27, 2012
    Publication date: August 30, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Shohei KATAOKA, Hidenori TAKAHASHI, Shuhei YAMAGUCHI, Shoichi SAITOH, Michihiro SHIRAKAWA, Fumihiro YOSHINO
  • Publication number: 20120207978
    Abstract: An object of the present invention is to provide an actinic-ray-sensitive or radiation-sensitive resin composition which is significantly excellent in terms of exposure latitude, is capable of forming a favorable rectangular pattern profile, and exhibits low dissolution of the components into an immersion liquid when performing immersion exposure, and a resist film and a pattern forming method each using the same composition. The actinic-ray-sensitive or radiation-sensitive resin composition contains (A) a compound represented by formula (I) and capable of generating an acid upon irradiation of actinic-rays or radiations, and (B) a resin capable of increasing the solubility in an alkaline developer by the action of an acid.
    Type: Application
    Filed: February 9, 2012
    Publication date: August 16, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Akinori SHIBUYA, Shuhei YAMAGUCHI, Kunihiko KODAMA, Kenji WADA, Tomoki MATSUDA
  • Publication number: 20120164573
    Abstract: An actinic-ray-sensitive or radiation-sensitive resin composition capable of forming a pattern having excellent critical dimension uniformity (CDU) in the line width, and a pattern forming method using the same are provided. The actinic-ray-sensitive or radiation-sensitive resin composition of the present invention includes (A) a resin containing a repeating unit having a specific lactone structure and a repeating unit having a specific monocyclic alicyclic structure, which increases a solubility in an alkaline developer by the action of an acid, and (B) a compound having a specific structure, which generates an acid upon irradiation with an actinic-ray or a radiation.
    Type: Application
    Filed: December 12, 2011
    Publication date: June 28, 2012
    Applicant: FUJIFILM Corporation
    Inventors: Naohiro Tango, Yusuke Iizuka, Akinori Shibuya, Shuhei Yamaguchi, Shohei Kataoka
  • Publication number: 20120156617
    Abstract: According to one embodiment, an actinic-ray- or radiation-sensitive resin composition includes any of the compounds of general formula (I) below, a compound that when exposed to actinic rays or radiation, generates an acid and a hydrophobic resin. (The characters used in general formula (I) have the meanings mentioned in the description.
    Type: Application
    Filed: August 27, 2010
    Publication date: June 21, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Shohei Kataoka, Akinori Shibuya, Shuhei Yamaguchi, Hisamitsu Tomeba
  • Publication number: 20120129100
    Abstract: An actinic ray-sensitive or radiation-sensitive resin composition including: (PA) a compound having a proton acceptor functional group and undergoing decomposition upon irradiation with an actinic ray or radiation to generate a compound reduced in or deprived of proton acceptor property or changed to be acidic from being proton acceptor-functioning, wherein a molar extinction coefficient ? of the compound (PA) at a wavelength of 193 nm as measured in acetonitrile solvent is 55,000 or less, and a pattern forming method using the composition are provided.
    Type: Application
    Filed: August 17, 2010
    Publication date: May 24, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Akinori Shibuya, Shuhei Yamaguchi, Shohei Kataoka, Michihiro Shirakawa, Takayuki Kato, Naohiro Tango
  • Publication number: 20120107628
    Abstract: Provided is a composite nanometal paste which, when a layer of the paste interposed between upper and lower bodies is sintered in an inert gas under no load until the layer turns to a metal layer, attains a shear bond strength between the upper and lower bodies of 10 MPa or higher. The composite nanometal paste contains, as metallic components, composite metallic nanoparticles comprising metal cores with an average particle diameter of X (nm) and an organic coating layer formed around the circumference, metallic nanofiller particles having an average particle diameter of d (nm), and metallic filler particles having an average particle diameter of D (nm), and satisfies the first relation X<d<D and the second relation X<d<100 (nm).
    Type: Application
    Filed: April 27, 2010
    Publication date: May 3, 2012
    Applicants: TOYOTA JIDOSHA KABUSHIKI KAISHA, APPLIED NANOPARTICLE LABORATORY CORPORATION
    Inventors: Teruo Komatsu, Yoshinori Shibata, Hideo Nakamura, Masashi Furukawa, Ryosuke Gomi, Mitsuhiro Kanou, Tsukasa Sugie, Narutaka Kasuya, Shuhei Yamaguchi, Toshitaka Ishizaki, Tadashi Oshima, Hisaaki Takao, Naotoshi Tominaga
  • Patent number: 8168370
    Abstract: A lithographic printing plate precursor includes a support; and an image forming layer formed from a photosensitive composition, wherein the photosensitive composition includes: a photopolymerization initiator; a polymerizable compound; and a binder polymer including a graft chain, and the graft chain is a hydrophilic graft chain including a hydrophilic group.
    Type: Grant
    Filed: March 25, 2008
    Date of Patent: May 1, 2012
    Assignee: FUJIFILM Corporation
    Inventor: Shuhei Yamaguchi
  • Patent number: 8148044
    Abstract: A positive photosensitive composition includes at least one compound that when exposed to actinic rays or radiation, generates any of the sulfonic acids of general formula (I) and a resin whose solubility in an alkali developer is increased by the action of an acid, wherein each of X1 and X2 independently represents a fluorine atom or a fluoroalkyl group, R1 represents a group with a polycyclic structure, provided that the polycyclic structure may have a substituent, and R2 represents a hydrogen atom, a chain alkyl group, a monocyclic alkyl group, a group with a polycyclic structure or a monocyclic aryl group, provided that each of the chain alkyl group, monocyclic alkyl group, polycyclic structure and monocyclic aryl group may have a substituent, and provided that R1 and R2 may be bonded to each other to thereby form a polycyclic structure.
    Type: Grant
    Filed: October 29, 2009
    Date of Patent: April 3, 2012
    Assignee: Fujifilm Corporation
    Inventors: Shuhei Yamaguchi, Tomotaka Tsuchimura, Yuko Tada
  • Publication number: 20120076996
    Abstract: Provided is a resist composition, including (A) a resin that when acted on by an acid, is decomposed to thereby increase its solubility in an alkali developer, (B) a compound that when exposed to actinic rays or radiation, generates an acid, the compound being any of those of general formulae (I) and (II) below, (C) a resin containing at least either a fluorine atom or a silicon atom, and (D) a mixed solvent containing a first solvent and a second solvent, at least either the first solvent or the second solvent exhibiting a normal boiling point of 200° C. or higher.
    Type: Application
    Filed: September 27, 2011
    Publication date: March 29, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Kei YAMAMOTO, Yusuke IIZUKA, Akinori SHIBUYA, Shuhei YAMAGUCHI
  • Publication number: 20120077131
    Abstract: According to one embodiment, a method of forming a pattern includes the step of applying an actinic-ray- or radiation-sensitive resin composition on a substrate so as to form a film, the step of selectively exposing the film through a mask and the step of developing the exposed film with the use of a developer containing an organic solvent, wherein the actinic-ray- or radiation-sensitive resin composition contains a resin (A) whose polarity is increased by the action of an acid so that the solubility of the resin in the developer containing an organic solvent is decreased, a photoacid generator (B) that when exposed to actinic rays or radiation, generates an acid containing a fluorine atom and a solvent (C), and wherein the photoacid generator (B) is contained in the composition in a ratio of 8 to 20 mass % based on the total solids of the composition.
    Type: Application
    Filed: June 3, 2010
    Publication date: March 29, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Yuichiro Enomoto, Shinji Tarutani, Akinori Shibuya, Shuhei Yamaguchi
  • Publication number: 20120015302
    Abstract: An actinic ray-sensitive or radiation-sensitive resin composition includes: (A) a resin capable of increasing a solubility of the resin (A) in an alkali developer by an action of an acid; and (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation, wherein (B) the compound capable of generating an acid upon irradiation with an actinic ray or radiation is contained in an amount of 10 to 30 mass % based on the entire solid content of the actinic ray-sensitive or radiation-sensitive resin composition, and a pattern forming method uses the composition.
    Type: Application
    Filed: March 26, 2010
    Publication date: January 19, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Naohiro Tango, Michihiro Shirakawa, Mitsuhiro Fujita, Shuhei Yamaguchi, Akinori Shibuya, Shohei Kataoka
  • Publication number: 20120009522
    Abstract: An actinic ray-sensitive or radiation-sensitive resin composition, wherein when a film having a film thickness of 100 nm is formed from the actinic ray-sensitive or radiation-sensitive resin composition, the film has a transmittance of 55 to 80% for light at a wavelength of 193 nm, and a pattern forming method using the composition are provided.
    Type: Application
    Filed: March 30, 2010
    Publication date: January 12, 2012
    Applicant: FUJIFILM CORPORATION
    Inventors: Takayuki Kato, Hiroshi Saegusa, Kaoru Iwato, Shuji Hirano, Yusuke Iizuka, Shuhei Yamaguchi, Akinori Shibuya
  • Patent number: 7989141
    Abstract: A lithographic printing plate precursor includes a support; and an image forming layer formed from a photosensitive composition, wherein the photosensitive composition includes: a photopolymerization initiator; a polymerizable compound; and a binder polymer including a graft chain, and the graft chain is a hydrophilic graft chain including a hydrophilic group.
    Type: Grant
    Filed: March 25, 2008
    Date of Patent: August 2, 2011
    Assignee: FUJIFILM Corporation
    Inventor: Shuhei Yamaguchi