Abstract: One illustrative method disclosed herein includes forming a mandrel structure above a semiconductor substrate, performing an oxidation process to oxidize at least a portion of the mandrel structure so as to thereby define oxidized regions on the mandrel structure, removing the oxidized regions to thereby defined a reduced thickness mandrel structure, forming a plurality of fins on the reduced thickness mandrel structure and performing an etching process to selectively remove at least a portion of the reduced thickness mandrel structure so as to thereby expose at least a portion of each of the fins.

Abstract: Data reliability testing for a magnetic tape drive is conducted separately for the channels of a magnetic tape drive which write and read tracks of a multiple track magnetic tape. Memory stores testing data representing data separately written to tracks of a multiple track magnetic tape; each of a plurality of read channels reads data sensed by a tape head from a separate track of a magnetic tape; and error processing logic detects differences between data from each of a plurality of the read channels, and stored testing data of the memory representing data written to the same separate tracks.