Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor.

Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.

Abstract: A method and apparatus for testing or diagnosing faults in a scan-based integrated circuit using a unified self-test and scan-test technique. The method and apparatus comprises using a unified test controller to ease prototype debug and production test. The unified test controller further comprises using a capture clock generator and a plurality of domain clock generators each embedded in a clock domain to perform self-test or scan-test. The capture clocks generated by the capture clock generator are used to guide at-speed or reduced-speed self-test (or scan-test) within each clock domain. The frequency of these capture clocks can be totally unrelated to those of system clocks controlling the clock domains. This unified approach allows designers to test or diagnose stuck-type and non-stuck-type faults with a low-cost DFT (design-for-test) tester or a low-cost DFT debugger. A computer-aided design (CAD) method is further developed to realize the method and synthesize the apparatus.

Abstract: A memory circuit power management system and method are provided. In use, an interface circuit is in communication with a plurality of memory circuits and a system. The interface circuit is operable to interface the memory circuits and the system for autonomously performing a power management operation in association with at least a portion of the memory circuits.

Abstract: A memory circuit power management system and method are provided. An interface circuit is in communication with a plurality of memory circuits and a system.

Abstract: A method of harvesting vibrational energy is provided. This method involves generating a high magnetic flux density field within a current induction conductor such as an induction coil. The high magnetic flux density field is generated between two same pole magnets. The high magnetic flux density field may be displaced relative to the current induction conductor with vibrational energy. These displacements then cause the current induction conductor to be energized. The two same pole magnets are mounted between piezoelectric transducer (PZT) materials. These PZT materials generate an electric potential when the PZT materials are subject to the mechanical stresses of the vibrational energy. The electrical energy translated from the vibrational energy through both the energized current induction conductor and stress PZT materials may then be used to power a power circuitry or be stored for later use.

Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.

Abstract: A memory circuit power management system and method are provided. In use, an interface circuit is in communication with a plurality of memory circuits and a system. The interface circuit is operable to interface the memory circuits and the system for autonomously performing a power management operation in association with at least a portion of the memory circuits.

Abstract: A memory circuit power management system and method are provided. An interface circuit is in communication with a plurality of memory circuits and a system.

Abstract: A memory subsystem is provided including an interface circuit adapted for coupling with a plurality of memory circuits and a system. The interface circuit is operable to interface the memory circuits and the system for emulating at least one memory circuit with at least one aspect that is different from at least one aspect of at least one of the plurality of memory circuits. Such aspect includes a signal, a capacity, a timing, and/or a logical interface.

Abstract: A system and method are provided. In use, at least one of a plurality of memory circuits is identified. In association with the at least one memory circuit, a power saving operation is performed and the communication of a signal thereto is delayed.

Abstract: A memory subsystem is provided including an interface circuit adapted for communication with a system and a majority of address or control signals of a first number of memory circuits. The interface circuit includes emulation logic for emulating at least one memory circuit of a second number.

Abstract: A memory subsystem is provided including an interface circuit adapted for communication with a system and a majority of address or control signals of a first number of memory circuits. The interface circuit includes emulation logic for emulating at least one memory circuit of a second number.

Abstract: A memory subsystem is provided including an interface circuit adapted for communication with a system and a majority of address or control signals of a first number of memory circuits. The interface circuit includes emulation logic for emulating at least one memory circuit of a second number.

Abstract: A memory subsystem is provided including an interface circuit adapted for communication with a system and a majority of address or control signals of a first number of memory circuits. The interface circuit includes emulation logic for emulating at least one memory circuit of a second number.

Abstract: A memory circuit system and method are provided. An interface circuit is capable of communication with a plurality of memory circuits and a system. In use, the interface circuit is operable to interface the memory circuits and the system for reducing command scheduling constraints of the memory circuits.

Abstract: A system and method are provided for adjusting the timing of signals associated with a memory system. A memory controller is provided. Additionally, at least one memory module is provided. Further, at least one interface circuit is provided, the interface circuit capable of adjusting timing of signals associated with one or more of the memory controller and the at least one memory module.

Abstract: In a wireless transmission method, an input data signal corresponding to a serial combination of a first transmit data signal and a second transmit data signal is received. The first and second transmit data signals are phase-modulated with different first and second spreading code signals to produce first and second DSSS transmit signals, which are serially output as a baseband transmit signal that is up-converted to a selected wireless transmission frequency range. The first and second phase-modulated signals are serially output as a baseband transmit signal. In a wireless reception method, an input receive signal is down-converted to a baseband receive signal corresponding to a serial combination of first and second time-interleaved DSSS receive signals in a baseband frequency range. The first and second DSSS receive signals are phase-demodulated with different first and second de-spreading code signals to produce first and second receive data signals.

Abstract: Multiprotocol multiplex wireless communication apparatus and methods are described. These apparatus and methods are capable of simultaneously communicating with multiple wireless environments in accordance with different wireless communications protocols. In particular, these apparatus and methods are capable of transmitting and receiving multiplex signals that include constituent data-carrying signals that conform to different wireless communications protocols.

Abstract: An apparatus and method are provided for communicating with a plurality of physical memory circuits. In use, at least one virtual memory circuit is simulated where at least one aspect (e.g. power-related aspect, etc.) of such virtual memory circuit(s) is different from at least one aspect of at least one of the physical memory circuits. Further, in various embodiments, such simulation may be carried out by a system (or component thereof), an interface circuit, etc.