Abstract: A charge pump includes a first node configured to receive a first voltage and a second node coupled to the first node through a first transistor. The second node is configured to output a voltage having a greater voltage magnitude than the first voltage. A first capacitor is coupled to a third node, and a fourth node is configured to receive a first clock signal. The third node is disposed between a drain of the first transistor and the fourth node. A leaky circuit device is coupled in parallel with the first capacitor for draining charges of a first polarity away from the second node.

Abstract: A charge pump has at least one charge pump stage. Each charge pump stage includes at least one NMOS device. The at least one NMOS device has a deep N-well (DNW), and is coupled to at least one capacitor, an input node, and an output node. The input node is arranged to receive an input signal. The at least one capacitor is arranged to store electrical charges. The charge pump stage is configured to supply the electrical charges to the output node, and the DNW is arranged to float for a positive pump operation.

Abstract: A method of making a level shifter includes coupling a driver stage between an input end and an output end, the driver stage comprising a first transistor and a second transistor. An inverter having an input is coupled with the input end. A third transistor having a gate end is coupled with an output of the inverter, the third transistor having a terminal coupled to a pumped voltage (VPP). Additionally, the method includes coupling a fourth transistor with the output end, the fourth transistor having a terminal coupled to the pumped voltage. A fifth transistor is coupled with the input end, the fifth transistor having a terminal coupled to the third and fourth transistors. A sixth transistor is coupled with the input end, the sixth transistor having a terminal.

Abstract: A memory circuit includes a group of memory arrays and at least one redundancy bit line. The group of memory arrays includes a first memory array coupled with a first input/output (IO) interface and a second memory array coupled with a second IO interface. The at least one redundancy bit line is configured to selectively repair the group of memory arrays.

Abstract: A voltage reference circuit with temperature compensation includes a power supply, a first reference voltage supply, a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, a second NMOS transistor, a resistor connected to the second NMOS source and ground. The voltage reference circuit also includes a second reference voltage supply, a third PMOS transistor, a fourth PMOS transistor, a third NMOS transistor, a fourth NMOS transistor, and a fifth NMOS transistor with a drain connected to the source of the fourth NMOS transistor, a source connected to the ground, and a gate connected to the first reference voltage output.

Abstract: A level shifter includes an input end being capable of receiving an input voltage signal. The input voltage signal includes a first state transition from a first voltage state to a second voltage state. An output end can output an output voltage signal having a second state transition from a third voltage state to the second voltage state corresponding to the first state transition of the input voltage signal. A driver stage is coupled between the input end and the output end. The driver stage includes a first transistor and a second transistor. Substantially immediately from a time corresponding to about a mean of voltage levels of the first voltage state and the second voltage state, the second voltage state is substantially free from being applied to a gate of the first transistor so as to substantially turn off the first transistor.

Abstract: A device comprises an address storage device. A first circuit includes a first flash memory, configured to sequentially receive first and second addresses and store the first address in the address storage device. The first circuit has a first set of control inputs for causing the first circuit to perform a first operation from the group consisting of read, program and erase on a cell of the first flash memory corresponding to a selected one of the first and second addresses. A second circuit includes a second flash memory, configured to receive the second address. The second circuit has a second set of control inputs for causing the second circuit to read data from a cell of the second flash memory corresponding to the second address while the first operation is being performed.

Abstract: A voltage reference circuit with temperature compensation includes a power supply, a reference voltage supply, a first PMOS transistor with its source connected to the power supply voltage, a second PMOS transistor with its source connected to the power supply and its gate and drain connected to the first PMOS gate, a first NMOS transistor with its gate and drain connected the first PMOS drain, a second NMOS transistor with its drain connected to the second PMOS drain and its gate connected with the first NMOS gate to the reference voltage supply, a resistor connected to the second NMOS source and ground, and an op-amp with its inverting input and its output connected the first NMOS source and its non-inverting input connected to the ground. In another aspect, a voltage reference circuit output is coupled to an NMOS gate in saturation mode connected to another voltage reference circuit.

Abstract: A method of operating a charge pump of a phase-lock assistant circuit includes determining a first relative timing relationship of a phase of a data signal to a phase of a first phase clock. A second relative timing relationship of the phase of the data signal to a phase of a second phase clock is determined, and the first and second phase clocks have a 45° phase difference. An up signal and a down signal are generated in response to the first relative timing relationship and the second relative timing relationship. The charge pump circuit is driven according to the up signal and the down signal.

Abstract: A device comprises an address storage device. A first circuit includes a first flash memory, configured to sequentially receive first and second addresses and store the first address in the address storage device. The first circuit has a first set of control inputs for causing the first circuit to perform a first operation from the group consisting of read, program and erase on a cell of the first flash memory corresponding to a selected one of the first and second addresses. A second circuit includes a second flash memory, configured to receive the second address. The second circuit has a second set of control inputs for causing the second circuit to read data from a cell of the second flash memory corresponding to the second address while the first operation is being performed.

Abstract: A regulator for regulating a charge pump is provided. The regulator includes a comparator having a first input end capable of receiving a first voltage and a second input end capable of receiving a second voltage for determining enabling or disabling the charge pump. The first voltage is associated with an output voltage of the charge pump. The second voltage is associated with an internal power voltage and a reference voltage Vref.

Abstract: A method of operating a charge pump of a phase-lock assistant circuit includes determining a first relative timing relationship of a phase of a data signal to a phase of a first phase clock. A second relative timing relationship of the phase of the data signal to a phase of a second phase clock is determined, and the first and second phase clocks have a 45° phase difference. An up signal and a down signal are generated in response to the first relative timing relationship and the second relative timing relationship. The charge pump circuit is driven according to the up signal and the down signal.

Abstract: Integrated circuits such as memory arrays are coupled to a bi-directional charge pump that includes an input circuit and output circuit, and one or more pump stages coupled between the input circuit and the output circuit of the bi-directional charge pump. The output circuit includes a diode having an input and output and a transistor connected to the output of the diode and a ground potential. The input of the diode is electrically connected to the pump stages in a configuration that allows the charge pump to apply a positive or negative voltage to the memory array or other load.

Abstract: A circuit including a first circuit configured to receive an input signal and first, third and fifth phase clocks of a clock, and generate a first early signal indicating the clock is earlier than the input signal and a first late signal indicating the clock is later than the input signal. The circuit further includes a second circuit configured to receive an input signal and second, a fourth and sixth phase clocks of the clock, and generate a second early signal indicating the clock is earlier than the input signal and a second late signal indicating the clock is later than the input signal. The circuit further includes a third circuit configured to generate a first increase signal. The circuit further includes a fourth circuit configured to generate a first decrease signal.

Abstract: An integrated circuit includes a first PMOS transistor, where its drain is arranged to be coupled to a voltage output, and its source is coupled to the drain of a second PMOS transistor. The source of the second PMOS transistor is arranged to be coupled to a high power supply voltage. The source and drain of a MOS capacitor are coupled to the source of the first PMOS transistor. The drain of an NMOS transistor is coupled to the drain of the first PMOS transistor. The integrated circuit is configured to receive a voltage input to generate the voltage output having a maximum voltage higher than the voltage input. The gate oxide layer thickness of the MOS capacitor is less than that of the first PMOS transistor.

Abstract: A memory circuit includes a group of memory arrays and at least one redundancy bit line. The group of memory arrays includes a first memory array coupled with a first input/output (IO) interface and a second memory array coupled with a second IO interface. The at least one redundancy bit line is configured to selectively repair the group of memory arrays.

Abstract: A regulator for regulating a charge pump is provided. The regulator includes a comparator having a first input end capable of receiving a first voltage and a second input end capable of receiving a second voltage for determining enabling or disabling the charge pump. The first voltage is associated with an output voltage of the charge pump. The second voltage is associated with an internal power voltage and a reference voltage Vref.

Abstract: Integrated circuits such as memory arrays are coupled to a bi-directional charge pump that includes an input circuit and output circuit, and one or more pump stages coupled between the input circuit and the output circuit of the bi-directional charge pump. The output circuit includes a diode having an input and output and a transistor connected to the output of the diode and a ground potential. The input of the diode is electrically connected to the pump stages in a configuration that allows the charge pump to apply a positive or negative voltage to the memory array or other load.

Abstract: A FLASH memory cell includes a control gate over a floating gate over a substrate. A wall line and an erase gate each is disposed adjacent to a respective sidewall of the control gate. A first source/drain (S/D) region is disposed in the substrate and adjacent to a sidewall of the wall line. A second S/D region is disposed in the substrate and adjacent to the sidewall of the floating gate. A method of operating the FLASH memory cell includes applying a first voltage level to the control gate. A second voltage level is applied to the word line. The second voltage level is lower than the first voltage level. A third voltage level is applied to the first S/D region. A fourth voltage level is applied to the second S/D region. The fourth voltage level is higher than the third voltage level. The erase gate is electrically floating.

Abstract: A circuit including a first circuit configured to receive an input signal and first, third and fifth phase clocks of a clock, and generate a first early signal indicating the clock is earlier than the input signal and a first late signal indicating the clock is later than the input signal. The circuit further includes a second circuit configured to receive an input signal and second, a fourth and sixth phase clocks of the clock, and generate a second early signal indicating the clock is earlier than the input signal and a second late signal indicating the clock is later than the input signal. The circuit further includes a third circuit configured to generate a first increase signal. The circuit further includes a fourth circuit configured to generate a first decrease signal.