Abstract: A charge pump includes a first node configured to receive a first voltage and a second node coupled to the first node through a first transistor. The second node is configured to output a voltage having a greater voltage magnitude than the first voltage. A first capacitor is coupled to a third node, and a fourth node is configured to receive a first clock signal. The third node is disposed between a drain of the first transistor and the fourth node. A leaky circuit device is coupled in parallel with the first capacitor for draining charges of a first polarity away from the second node.

Abstract: A regulator for regulating a charge pump is provided. The regulator includes a comparator having a first input end capable of receiving a first voltage and a second input end capable of receiving a second voltage for determining enabling or disabling the charge pump. The first voltage is associated with an output voltage of the charge pump. The second voltage is associated with an internal power voltage and a reference voltage Vref.

Abstract: An integrated circuit includes a first current source. A second current source is electrically coupled with the first current source via a conductive line. A switch circuit is coupled between the first current source and the second current source. A first circuit is coupled between a first node and a second node. The first node is disposed between the first current source and the switch circuit. The second node is coupled with the first current source. The first circuit is configured for substantially equalizing voltages on the first node and the second node. A second circuit is coupled between a third node and a fourth node. The third node is disposed between the second current source and the switch circuit. The fourth node is disposed coupled with the second current source. The second circuit is configured for substantially equalizing voltages on the third node and the fourth node.

Abstract: Some embodiments regard a circuit comprising: a first circuit configured to lock a frequency of an output clock to a frequency of a reference clock; a second circuit configured to align an input signal to a phase clock of the output clock; a third circuit configured to use a first set of phase clocks of the output clock and a second set of phase clocks of the output clock to improve alignment of the input signal to the phase clock of the output clock; and a lock detection circuit configured to turn on the first circuit when the frequency of the output clock is not locked to the frequency of the reference clock; and to turn off the first circuit and to turn on the second circuit and the third circuit when the frequency of the output clock is locked to the frequency of the reference clock.

Abstract: Some embodiments regard a circuit comprising: a high voltage transistor providing a resistance; an amplifier configured to receive a current and to convert the current to a first voltage that is used in a loop creating the current; and an automatic level control circuit that, based on an AC amplitude of the first voltage, adjusts a second voltage at a gate of the high voltage transistor and thereby adjusts the resistance and the first voltage; wherein the automatic level control circuit is configured to adjust the first voltage toward the first reference voltage if the first voltage differs from a first reference voltage.

Abstract: An integrated circuit includes a first PMOS transistor, where its drain is arranged to be coupled to a voltage output, and its source is coupled to the drain of a second PMOS transistor. The source of the second PMOS transistor is arranged to be coupled to a high power supply voltage. The source and drain of a MOS capacitor are coupled to the source of the first PMOS transistor. The drain of an NMOS transistor is coupled to the drain of the first PMOS transistor. The integrated circuit is configured to receive a voltage input to generate the voltage output having a maximum voltage higher than the voltage input. The gate oxide layer thickness of the MOS capacitor is less than that of the first PMOS transistor.

Abstract: Some embodiments regard a circuit comprising: a first circuit configured to lock a frequency of an output clock to a frequency of a reference clock; a second circuit configured to align an input signal to a phase clock of the output clock; a third circuit configured to use a first set of phase clocks of the output clock and a second set of phase clocks of the output clock to improve alignment of the input signal to the phase clock of the output clock; and a lock detection circuit configured to turn on the first circuit when the frequency of the output clock is not locked to the frequency of the reference clock; and to turn off the first circuit and to turn on the second circuit and the third circuit when the frequency of the output clock is locked to the frequency of the reference clock.

Abstract: A voltage regulator includes an output stage electrically coupled with an output end of the voltage regulator. The output stage includes at least one transistor having a bulk and a drain. At least one back-bias circuit is electrically coupled with the bulk of the at least one transistor. The at least one back-bias circuit is configured to provide a bulk voltage, such that the bulk and the drain of the at least one transistor are reverse biased during a standby mode of a memory array that is electrically coupled with the voltage regulator.

Abstract: Embodiments described herein are related to a counter. In some embodiments, the counter can be used as a divider, e.g., in a fractional PLL. In some embodiments, the counter (e.g., the main counter or counter C) includes a first counter (e.g., counter C1) and a second counter (e.g., counter C2), which, together with the first counter C1, perform the counting function for counter C. For example, if counter C is to count to the value N, then counter C1 counts, e.g., to N1, and counter C2 counts to N2 where N=N1+N2. For counter C1 to count to N1, N1 is loaded to counter C1. Similarly, for counter C2 to count to N2, N2 is loaded to counter C2. While counter C1 counts (e.g., to N1), N2 can be loaded to counter C2. After counter C1 finishes counting to N1, N2, if loaded, is available for counter C2 to start counting to this N2. Counters C1 and C2 can alternately count and thus provide continuous counting for counter C. Other embodiments and exemplary applications are also disclosed.

Abstract: Some embodiments regard a circuit comprising: a high voltage transistor providing a resistance; an amplifier configured to receive a current and to convert the current to a first voltage that is used in a loop creating the current; and an automatic level control circuit that, based on an AC amplitude of the first voltage, adjusts a second voltage at a gate of the high voltage transistor and thereby adjusts the resistance and the first voltage; wherein the automatic level control circuit is configured to adjust the first voltage toward the first reference voltage if the first voltage differs from a first reference voltage.

Abstract: Some embodiments regard a circuit comprising: a high voltage transistor providing a resistance; an amplifier configured to receive a current and to convert the current to a first voltage that is used in a loop creating the current; and an automatic level control circuit that, based on an AC amplitude of the first voltage, adjusts a second voltage at a gate of the high voltage transistor and thereby adjusts the resistance and the first voltage; wherein the automatic level control circuit is configured to adjust the first voltage toward the first reference voltage if the first voltage differs from a first reference voltage.

Abstract: An integrated circuit includes a first current source. A second current source is electrically coupled with the first current source via a conductive line. A switch circuit is coupled between the first current source and the second current source. A first circuit is coupled between a first node and a second node. The first node is disposed between the first current source and the switch circuit. The second node is coupled with the first current source. The first circuit is configured for substantially equalizing voltages on the first node and the second node. A second circuit is coupled between a third node and a fourth node. The third node is disposed between the second current source and the switch circuit. The fourth node is disposed coupled with the second current source. The second circuit is configured for substantially equalizing voltages on the third node and the fourth node.

Abstract: A memory circuit includes a first group of memory arrays including a first memory array coupled with a first input/output (IO) interface and a second memory array coupled with a second IO interface. A second group of memory arrays include a third memory array coupled with a third input/output (IO) interface and a fourth memory array coupled with a fourth IO interface. A plurality of redundancy bit lines include at least one first redundancy bit line that is configured for selectively repairing the first group of memory arrays, and at least one second redundancy bit line that is configured for selectively repairing the second group of memory arrays.

Abstract: Some embodiments regard a circuit comprising: a high voltage transistor providing a resistance; an amplifier configured to receive a current and to convert the current to a first voltage that is used in a loop creating the current; and an automatic level control circuit that, based on an AC amplitude of the first voltage, adjusts a second voltage at a gate of the high voltage transistor and thereby adjusts the resistance and the first voltage; wherein the automatic level control circuit is configured to adjust the first voltage toward the first reference voltage if the first voltage differs from a first reference voltage.

Abstract: An integrated circuit includes a differential amplifier. The differential amplifier includes at least one output end. A circuit is coupled with the at least one output end of the differential amplifier. The circuit does not include a resistor-capacitor (RC) network and is configured for providing a negative impedance to the differential amplifier for adjusting a direct current (DC) gain of the integrated circuit.

Abstract: Commonly, read times of a memory line are slowed due to voltage overshoot and/or voltage undershoot. To eliminate these problems, a control component can manage voltage while a leakage component manages timing of voltage. This allows for a line pre-charge that produces increase read times. The control component can implement as a variable resistor that modifies value to compensate for temperature. The leakage component can include a capacitor configuration that allows voltage to pass.

Abstract: A voltage reference circuit with temperature compensation includes a power supply, a reference voltage supply, a first PMOS transistor with its source connected to the power supply voltage, a second PMOS transistor with its source connected to the power supply and its gate and drain connected to the first PMOS gate, a first NMOS transistor with its gate and drain connected the first PMOS drain, a second NMOS transistor with its drain connected to the second PMOS drain and its gate connected with the first NMOS gate to the reference voltage supply, a resistor connected to the second NMOS source and ground, and an op-amp with its inverting input and its output connected the first NMOS source and its non-inverting input connected to the ground. In another aspect, a voltage reference circuit output is coupled to an NMOS gate in saturation mode connected to another voltage reference circuit.

Abstract: A level shifter includes an input end being capable of receiving an input voltage signal. The input voltage signal includes a first state transition from a first voltage state to a second voltage state. An output end can output an output voltage signal having a second state transition from a third voltage state to the second voltage state corresponding to the first state transition of the input voltage signal. A driver stage is coupled between the input end and the output end. The driver stage includes a first transistor and a second transistor. Substantially immediately from a time corresponding to about a mean of voltage levels of the first voltage state and the second voltage state, the second voltage state is substantially free from being applied to a gate of the first transistor so as to substantially turn off the first transistor.

Abstract: Embodiments described herein are related to a counter. In some embodiments, the counter can be used as a divider, e.g., in a fractional PLL. In some embodiments, the counter (e.g., the main counter or counter C) includes a first counter (e.g., counter C1) and a second counter (e.g., counter C2), which, together with the first counter C1, perform the counting function for counter C. For example, if counter C is to count to the value N, then counter C1 counts, e.g., to N1, and counter C2 counts to N2 where N=N1+N2. For counter C1 to count to N1, N1 is loaded to counter C1. Similarly, for counter C2 to count to N2, N2 is loaded to counter C2. While counter C1 counts (e.g., to N1), N2 can be loaded to counter C2. After counter C1 finishes counting to N1, N2, if loaded, is available for counter C2 to start counting to this N2. Counters C1 and C2 can alternately count and thus provide continuous counting for counter C. Other embodiments and exemplary applications are also disclosed.

Abstract: One embodiment of the invention relates to a method for accessing a memory cell. In this method, at least one bit of the memory cell is erased. After erasing the at least one bit, a soft program operation is performed to bias the memory cell thereby improving the reliability of data stored in the memory cell. Other methods and systems are also disclosed.