Patents by Inventor Vivek R.
Vivek R. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240126227Abstract: The present disclosure relates to a building management system (BMS) comprising one or more field equipment controllers, and at least one containerized engine configured within a server to control the one or more field equipment controllers.Type: ApplicationFiled: October 12, 2023Publication date: April 18, 2024Inventors: Siva Naga Babu Kammela, Donald A Gottschalk, JR., Daniel R Gottschalk, Anand Bongale, Pranay Joshi, Deepak V. Uppal, Vivek V. Gupta, Peter J. Hazelberg
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Publication number: 20240092016Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.Type: ApplicationFiled: November 17, 2023Publication date: March 21, 2024Applicant: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, R. Bruce Madigan, MArk J. Cola, Martin S. Piltch
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Patent number: 11931956Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: GrantFiled: September 13, 2022Date of Patent: March 19, 2024Assignee: DIVERGENT TECHNOLOGIES, INC.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Publication number: 20240085336Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: ApplicationFiled: April 19, 2023Publication date: March 14, 2024Applicant: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Patent number: 11926684Abstract: A cast film inducing a bimodal ethylene-based polymer having a high density fraction (HDF) from 3.0% to 10.0%, an I10/I2 ratio from 5.5 to 7.0, a short chain branching distribution (SCBD) less than or equal to 10° C., a density from 0.910 g/cc to 0.920 g/cc, and a melt index (I2) from 1.0 g/10 mins to 8.0 g/10 mins.Type: GrantFiled: June 13, 2019Date of Patent: March 12, 2024Assignee: Dow Global Technologies LLCInventors: Kyle E. Hart, Mehmet Demirors, Timothy W. Gambrel, Philip P. Fontaine, Vivek Kalihari, Hrishikesh R. Munj, Jon W. Hobson, Rajen M. Patel
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Patent number: 11925561Abstract: There are provided herein methods and products resulting therefrom. The methods include attaching a pre-fabricated porous ingrowth structure to a substrate by applying heat, or creating and bonding an in-situ-formed porous ingrowth structure from beads on a substrate by applying heat. In some embodiments, an oxidized metal surface of the substrate is diffusion hardened during the heating process. In some embodiments, a vacuum is applied during the heating process. In some embodiments, pressure is applied during the heating process. Also provided herein are assemblies for compressing the pre-fabricated porous ingrowth structure or the beads onto the substrate during the heating process.Type: GrantFiled: August 1, 2022Date of Patent: March 12, 2024Assignees: Smith & Nephew, Inc., Smith & Nephew Orthopaedics AG, Smith & Nephew Asia Pacific Pte. LimitedInventors: Marcus L. Scott, Vivek D. Pawar, Carolyn L. Weaver, Daniel A Heuer, Roger R. Dees, Jr., Forrest A. James, Matthew J. Quick
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Publication number: 20240069995Abstract: Techniques for providing a standardized interface that is configured to provide application developers with ways for interacting with different wide area network controllers. A standardized interface may include an application programming interface (API) server that can receive a connectivity request associated with an application that is to be hosted on an application orchestration system. The API server may determine, based at least in part on the connectivity request, a vendor network to be used by the application to send traffic to a remote service. Based at least in part on determining the vendor network, the API server may translate the connectivity request into a first format that is understandable by a controller of the vendor network. The API server may also provide the connectivity request in the first format to the controller of the vendor network such that a path through the vendor network can be determined.Type: ApplicationFiled: August 31, 2022Publication date: February 29, 2024Inventors: Saswat Praharaj, Fabio R. Maino, Alberto Rodriguez Natal, Ram Dular Singh, Vivek Agarwal
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Publication number: 20240073069Abstract: Circuit for wake-up receivers are provide. In some embodiments, the wake-up receivers include self-mixers that receive a gate bias voltage. Some of the self-mixers are single ended and some are differential. In some embodiments, the wake-up receivers include a matching network that is connected to the input of the self-mixer. In some embodiments, the wake-up receivers include a low frequency path connected to the output of the self-mixer. In some embodiments, the wake-up receivers include a high frequency path connected to the output of the self-mixer. In some embodiments, the wake-up receivers are configured to receive an encoded bit stream. In some embodiments, the wake-up receivers are configured to wake-up another receiver.Type: ApplicationFiled: October 25, 2023Publication date: February 29, 2024Inventors: Vivek Mangal, Peter R. Kinget
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Patent number: 11902096Abstract: A network device may detect an error associated with a packet based on error information being generated from processing the packet at a layer of a network stack. The network device may determine, based on detecting the error, metadata associated with the packet. The network device may generate telemetry data to include the metadata. The network device may provide the telemetry data to a network analyzer for policy enforcement.Type: GrantFiled: October 17, 2022Date of Patent: February 13, 2024Assignee: Juniper Networks, Inc.Inventors: Vivek R., Reji Thomas, Jimmy Jose
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Patent number: 11864089Abstract: Implementations disclosed describe systems and methods that include establishing, by a wireless device, a communication link with a wireless access point (AP) device over an operating channel, the wireless AP device providing a single-band access within a first frequency band; time-multiplexing, by the wireless device, transmitting beacons or probes within a second frequency band with communicating with the wireless AP device over the operating channel within the first frequency band; and configuring the beacons or probes to advertise, to other wireless devices in the second frequency band, availability of connection to the wireless AP device over the operating channel within the first frequency band.Type: GrantFiled: December 2, 2021Date of Patent: January 2, 2024Assignee: Cypress Semiconductor CorporationInventors: Vivek R. Vellore, Prashant Kota
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Patent number: 11858207Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.Type: GrantFiled: February 21, 2023Date of Patent: January 2, 2024Assignee: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
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Publication number: 20230316564Abstract: The present disclosure provides for devices, systems and methods for precise human head positioning in space. The present disclosure provides for control of precise human head positioning in space with use of drawing lines generated via a facial recognition computer software and positioning of sensors with permanent identification markings onto the human head according to those markings.Type: ApplicationFiled: March 29, 2022Publication date: October 5, 2023Inventors: Albert Y. Davydov, Vivek R. Kumar, Shivang Rakesh Trivedi
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Publication number: 20230280375Abstract: A multi-sensor, real-time, in-process current and voltage estimation system is disclosed including sensors, affiliated hardware, and data processing algorithms that allow accurate estimation of currents and voltages from magnetic and electric field measurements, respectively. Aspects of the system may be embodied in a detector that is readily attachable to conductors of an energized system for contactless current and/or voltage sensing of the conductors without requiring the conductors to be disconnected from the energized system.Type: ApplicationFiled: January 4, 2023Publication date: September 7, 2023Inventors: Vivek R. Dave, Felix Loske, Enger Knop, Lutz Tröger, Alan E. Casallas, Jeffrey H. Lang
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Patent number: 11734927Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.Type: GrantFiled: November 24, 2021Date of Patent: August 22, 2023Assignee: Optum Technology, Inc.Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
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Patent number: 11692876Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: GrantFiled: July 9, 2021Date of Patent: July 4, 2023Assignee: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Publication number: 20230202100Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.Type: ApplicationFiled: February 21, 2023Publication date: June 29, 2023Applicant: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
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Patent number: 11674904Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.Type: GrantFiled: June 29, 2020Date of Patent: June 13, 2023Assignee: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
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Publication number: 20230180105Abstract: Implementations disclosed describe systems and methods that include establishing, by a wireless device, a communication link with a wireless access point (AP) device over an operating channel, the wireless AP device providing a single-band access within a first frequency band; time-multiplexing, by the wireless device, transmitting beacons or probes within a second frequency band with communicating with the wireless AP device over the operating channel within the first frequency band; and configuring the beacons or probes to advertise, to other wireless devices in the second frequency band, availability of connection to the wireless AP device over the operating channel within the first frequency band.Type: ApplicationFiled: December 2, 2021Publication date: June 8, 2023Applicant: Cypress Semiconductor CorporationInventors: Vivek R. Vellore, Prashant Kota
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Publication number: 20230127650Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.Type: ApplicationFiled: August 25, 2022Publication date: April 27, 2023Applicant: SIGMA ADDITIVE SOLUTIONS, INC.Inventors: Lars Jacquemetton, Vivek R. Dave, Mark J. Cola, Glenn Wikle, R. Bruce Madigan
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Patent number: 11607875Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.Type: GrantFiled: August 23, 2021Date of Patent: March 21, 2023Assignee: Sigma Additive Solutions, Inc.Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch