Patents by Inventor Vivek R.

Vivek R. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240126227
    Abstract: The present disclosure relates to a building management system (BMS) comprising one or more field equipment controllers, and at least one containerized engine configured within a server to control the one or more field equipment controllers.
    Type: Application
    Filed: October 12, 2023
    Publication date: April 18, 2024
    Inventors: Siva Naga Babu Kammela, Donald A Gottschalk, JR., Daniel R Gottschalk, Anand Bongale, Pranay Joshi, Deepak V. Uppal, Vivek V. Gupta, Peter J. Hazelberg
  • Publication number: 20240092016
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: November 17, 2023
    Publication date: March 21, 2024
    Applicant: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, MArk J. Cola, Martin S. Piltch
  • Patent number: 11931956
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: September 13, 2022
    Date of Patent: March 19, 2024
    Assignee: DIVERGENT TECHNOLOGIES, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20240085336
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Application
    Filed: April 19, 2023
    Publication date: March 14, 2024
    Applicant: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Patent number: 11926684
    Abstract: A cast film inducing a bimodal ethylene-based polymer having a high density fraction (HDF) from 3.0% to 10.0%, an I10/I2 ratio from 5.5 to 7.0, a short chain branching distribution (SCBD) less than or equal to 10° C., a density from 0.910 g/cc to 0.920 g/cc, and a melt index (I2) from 1.0 g/10 mins to 8.0 g/10 mins.
    Type: Grant
    Filed: June 13, 2019
    Date of Patent: March 12, 2024
    Assignee: Dow Global Technologies LLC
    Inventors: Kyle E. Hart, Mehmet Demirors, Timothy W. Gambrel, Philip P. Fontaine, Vivek Kalihari, Hrishikesh R. Munj, Jon W. Hobson, Rajen M. Patel
  • Patent number: 11925561
    Abstract: There are provided herein methods and products resulting therefrom. The methods include attaching a pre-fabricated porous ingrowth structure to a substrate by applying heat, or creating and bonding an in-situ-formed porous ingrowth structure from beads on a substrate by applying heat. In some embodiments, an oxidized metal surface of the substrate is diffusion hardened during the heating process. In some embodiments, a vacuum is applied during the heating process. In some embodiments, pressure is applied during the heating process. Also provided herein are assemblies for compressing the pre-fabricated porous ingrowth structure or the beads onto the substrate during the heating process.
    Type: Grant
    Filed: August 1, 2022
    Date of Patent: March 12, 2024
    Assignees: Smith & Nephew, Inc., Smith & Nephew Orthopaedics AG, Smith & Nephew Asia Pacific Pte. Limited
    Inventors: Marcus L. Scott, Vivek D. Pawar, Carolyn L. Weaver, Daniel A Heuer, Roger R. Dees, Jr., Forrest A. James, Matthew J. Quick
  • Publication number: 20240069995
    Abstract: Techniques for providing a standardized interface that is configured to provide application developers with ways for interacting with different wide area network controllers. A standardized interface may include an application programming interface (API) server that can receive a connectivity request associated with an application that is to be hosted on an application orchestration system. The API server may determine, based at least in part on the connectivity request, a vendor network to be used by the application to send traffic to a remote service. Based at least in part on determining the vendor network, the API server may translate the connectivity request into a first format that is understandable by a controller of the vendor network. The API server may also provide the connectivity request in the first format to the controller of the vendor network such that a path through the vendor network can be determined.
    Type: Application
    Filed: August 31, 2022
    Publication date: February 29, 2024
    Inventors: Saswat Praharaj, Fabio R. Maino, Alberto Rodriguez Natal, Ram Dular Singh, Vivek Agarwal
  • Publication number: 20240073069
    Abstract: Circuit for wake-up receivers are provide. In some embodiments, the wake-up receivers include self-mixers that receive a gate bias voltage. Some of the self-mixers are single ended and some are differential. In some embodiments, the wake-up receivers include a matching network that is connected to the input of the self-mixer. In some embodiments, the wake-up receivers include a low frequency path connected to the output of the self-mixer. In some embodiments, the wake-up receivers include a high frequency path connected to the output of the self-mixer. In some embodiments, the wake-up receivers are configured to receive an encoded bit stream. In some embodiments, the wake-up receivers are configured to wake-up another receiver.
    Type: Application
    Filed: October 25, 2023
    Publication date: February 29, 2024
    Inventors: Vivek Mangal, Peter R. Kinget
  • Patent number: 11902096
    Abstract: A network device may detect an error associated with a packet based on error information being generated from processing the packet at a layer of a network stack. The network device may determine, based on detecting the error, metadata associated with the packet. The network device may generate telemetry data to include the metadata. The network device may provide the telemetry data to a network analyzer for policy enforcement.
    Type: Grant
    Filed: October 17, 2022
    Date of Patent: February 13, 2024
    Assignee: Juniper Networks, Inc.
    Inventors: Vivek R., Reji Thomas, Jimmy Jose
  • Patent number: 11864089
    Abstract: Implementations disclosed describe systems and methods that include establishing, by a wireless device, a communication link with a wireless access point (AP) device over an operating channel, the wireless AP device providing a single-band access within a first frequency band; time-multiplexing, by the wireless device, transmitting beacons or probes within a second frequency band with communicating with the wireless AP device over the operating channel within the first frequency band; and configuring the beacons or probes to advertise, to other wireless devices in the second frequency band, availability of connection to the wireless AP device over the operating channel within the first frequency band.
    Type: Grant
    Filed: December 2, 2021
    Date of Patent: January 2, 2024
    Assignee: Cypress Semiconductor Corporation
    Inventors: Vivek R. Vellore, Prashant Kota
  • Patent number: 11858207
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Grant
    Filed: February 21, 2023
    Date of Patent: January 2, 2024
    Assignee: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Publication number: 20230316564
    Abstract: The present disclosure provides for devices, systems and methods for precise human head positioning in space. The present disclosure provides for control of precise human head positioning in space with use of drawing lines generated via a facial recognition computer software and positioning of sensors with permanent identification markings onto the human head according to those markings.
    Type: Application
    Filed: March 29, 2022
    Publication date: October 5, 2023
    Inventors: Albert Y. Davydov, Vivek R. Kumar, Shivang Rakesh Trivedi
  • Publication number: 20230280375
    Abstract: A multi-sensor, real-time, in-process current and voltage estimation system is disclosed including sensors, affiliated hardware, and data processing algorithms that allow accurate estimation of currents and voltages from magnetic and electric field measurements, respectively. Aspects of the system may be embodied in a detector that is readily attachable to conductors of an energized system for contactless current and/or voltage sensing of the conductors without requiring the conductors to be disconnected from the energized system.
    Type: Application
    Filed: January 4, 2023
    Publication date: September 7, 2023
    Inventors: Vivek R. Dave, Felix Loske, Enger Knop, Lutz Tröger, Alan E. Casallas, Jeffrey H. Lang
  • Patent number: 11734927
    Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.
    Type: Grant
    Filed: November 24, 2021
    Date of Patent: August 22, 2023
    Assignee: Optum Technology, Inc.
    Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
  • Patent number: 11692876
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: July 9, 2021
    Date of Patent: July 4, 2023
    Assignee: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20230202100
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: February 21, 2023
    Publication date: June 29, 2023
    Applicant: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 11674904
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Grant
    Filed: June 29, 2020
    Date of Patent: June 13, 2023
    Assignee: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Publication number: 20230180105
    Abstract: Implementations disclosed describe systems and methods that include establishing, by a wireless device, a communication link with a wireless access point (AP) device over an operating channel, the wireless AP device providing a single-band access within a first frequency band; time-multiplexing, by the wireless device, transmitting beacons or probes within a second frequency band with communicating with the wireless AP device over the operating channel within the first frequency band; and configuring the beacons or probes to advertise, to other wireless devices in the second frequency band, availability of connection to the wireless AP device over the operating channel within the first frequency band.
    Type: Application
    Filed: December 2, 2021
    Publication date: June 8, 2023
    Applicant: Cypress Semiconductor Corporation
    Inventors: Vivek R. Vellore, Prashant Kota
  • Publication number: 20230127650
    Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.
    Type: Application
    Filed: August 25, 2022
    Publication date: April 27, 2023
    Applicant: SIGMA ADDITIVE SOLUTIONS, INC.
    Inventors: Lars Jacquemetton, Vivek R. Dave, Mark J. Cola, Glenn Wikle, R. Bruce Madigan
  • Patent number: 11607875
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Grant
    Filed: August 23, 2021
    Date of Patent: March 21, 2023
    Assignee: Sigma Additive Solutions, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch