Patents by Inventor Vivek R.

Vivek R. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10786948
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: November 18, 2015
    Date of Patent: September 29, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20200290154
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: March 26, 2020
    Publication date: September 17, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Patent number: 10769123
    Abstract: Provided are methods and systems for generating physical database design tuning recommendations. Given a workload, the system analyzes the workload to identify and recommend a set of rowstore and columnstore indexes optimal for the performance of the workload. The system is designed to estimate the size of the columnstore index (at the granularity of each column) without actually building the index, estimate the improvement in query performance that each columnstore index would result in when built, and automatically derive the workload used for the physical design tuning task by analyzing stored query execution history data. This automatic workload derivation is orthogonal to columnstores and can be used even when columnstore indexes are not being used.
    Type: Grant
    Filed: June 28, 2017
    Date of Patent: September 8, 2020
    Assignee: MICROSOFT TECHNOLOGY LICENSING, LLC
    Inventors: Sudipto Das, Bolin Ding, Vivek R. Narasayya, Manoj A. Syamala, Jingjing Wang, Gaoxiang Xu
  • Publication number: 20200272667
    Abstract: Systems and techniques for leveraging query executions to improve index recommendations are described herein. In an example, a machine learning model is adapted to receive a first query plan and a second query plan for performing a query with a database, where the first query plan is different from the second query plan. The machine learning model may be further adapted to determine execution cost efficiency between the first query plan and the second query plan. The machine learning model is trained using relative execution cost comparisons between a set of pairs of query plans for the database. The machine learning model is further adapted to output a ranking of the first query plan and second query plan, where the first query plan and second query plan are ranked based on execution cost efficiency.
    Type: Application
    Filed: February 21, 2019
    Publication date: August 27, 2020
    Inventors: Bailu Ding, Sudipto Das, Surajit Chaudhuri, Vivek R Narasayya, Ryan Marcus, Lin Ma, Adith Swaminathan
  • Publication number: 20200249099
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: November 8, 2019
    Publication date: August 6, 2020
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Patent number: 10717264
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: July 21, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell
  • Publication number: 20200226109
    Abstract: Systems, methods, and computer-executable instructions for reorganizing a physical layout of data of a database a database. A workload is selected from previously executed database operations. A total resource consumption of the previously executed database operations and of the workload is determined. The total resource consumption of the workload is more than a predetermined threshold of the total resource consumption of the previously executed database operations. Optimization operations for the database are determined using the workload. A cloned database of the database is created. The optimization operations are executed on the cloned database. A database operation is received for the database. The database operation is executed on the database and the cloned database. The performance of the cloned database is verified as being improved compared to the performance of the databased based on the executing of the database operation on the database and the cloned database.
    Type: Application
    Filed: January 14, 2019
    Publication date: July 16, 2020
    Inventors: Sudipto Das, Vivek R. Narasayya, Gaoxiang Xu, Surajit Chaudhuri, Andrija Jovanovic, Miodrag Radulovic
  • Patent number: 10685020
    Abstract: In some embodiments, the disclosed subject matter involves a server query optimizer for parametric query optimization (PQO) to address the problem of finding and reusing a relatively small number of query plans that can achieve good plan quality across multiple instances of a parameterized query. An embodiment processes query instances on-line and ensures (a) tight, bounded cost sub-optimality for each instance, (b) low optimization overheads, and (c) only a small number of plans need to be stored. A plan re-costing based approach is disclosed to provide good performance on all three metrics. Other embodiments are described and claimed.
    Type: Grant
    Filed: June 2, 2017
    Date of Patent: June 16, 2020
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Surajit Chaudhuri, Anshuman Dutt, Vivek R Narasayya
  • Patent number: 10639745
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: May 5, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20200101671
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Application
    Filed: September 18, 2019
    Publication date: April 2, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Publication number: 20200066560
    Abstract: A method of purging a substrate carrier at a load port includes: opening a door of a substrate carrier that is delivered to a load port; spraying the substrate carrier with a gas flow responsive to the opening the door; mapping substrates within the substrate carrier to generate a substrate map; determining a process purge state based on the substrate map; and activating one or more inter-substrate nozzle arrays and one or more curtain nozzle arrays using a predefined spray status configuration for the process purge state.
    Type: Application
    Filed: October 29, 2019
    Publication date: February 27, 2020
    Inventors: Subramaniam V. Iyer, Dharma Ratnam Srichurnam, Devendrappa Holeyannavar, Douglas MacLeod, Kenneth Carpenter, Naveen Kumar, Vivek R. Rao, Patrick Pannese
  • Patent number: 10520372
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: June 7, 2019
    Date of Patent: December 31, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20190384830
    Abstract: Generally discussed herein are devices, systems, and methods for database management. A method may include determining a first hyperloglog (HLL) sketch of a first column of data, determining a second HLL sketch of a second column of data, estimating an inclusion coefficient based on the first and second HLL sketches, and performing operations on the first column of data or the second column of data in response to determining the inclusion coefficient is greater than, or equal to, a specified threshold.
    Type: Application
    Filed: June 14, 2018
    Publication date: December 19, 2019
    Inventors: Azade Nazi, Bolin Ding, Vivek R. Narasayya, Surajit Chaudhuri
  • Publication number: 20190384844
    Abstract: Systems, methods, and computer-executable instructions for creating a query execution plan for a query of a database includes receiving, from the database, a set of previously executed query execution plans for the query. Each previously-executed query execution plans includes subplans. Each subplan indicates a tree of physical operators. Physical operators that executed in the set of previously-executed query execution plans are determined. For each physical operator, an execution cost based is determined. Invalid physical operators from the previously-executed query execution plans that are invalid for the database are removed. Equivalent subplans from the previously-executed query execution plans are identified based on physical properties and logical expressions of the subplans. A constrained search space is created based on the equivalent subplans. A query execution plan for the query is constructed from the constrained search space based on the execution cost.
    Type: Application
    Filed: June 14, 2018
    Publication date: December 19, 2019
    Inventors: Bailu Ding, Sudipto Das, Wentao Wu, Surajit Chaudhuri, Vivek R. Narasayya
  • Patent number: 10510570
    Abstract: Embodiments of the present invention provide systems, apparatus, and methods for purging a substrate carrier. Embodiments include a frame configured to sit proximate to a load port door without interfering with operation of a factory interface or equipment front end module robot; one or more inter-substrate nozzle arrays supported by the frame and configured to spray gas into a substrate carrier; and one or more curtain nozzle arrays supported by the frame and configured to spray gas across an opening of the substrate carrier. Numerous additional aspects are disclosed.
    Type: Grant
    Filed: October 22, 2015
    Date of Patent: December 17, 2019
    Assignee: Applied Materials, Inc.
    Inventors: Subramaniam V. Iyer, Dharma Ratnam Srichurnam, Devendrappa Holeyannavar, Douglas MacLeod, Kenneth Carpenter, Naveen Kumar, Vivek R. Rao, Patrick Pannese
  • Patent number: 10503704
    Abstract: Techniques for tenant performance isolation in a multiple-tenant database management system are described. These techniques may include providing a reservation of server resources. The server resources reservation may include a reservation of a central processing unit (CPU), a reservation of Input/Ouput throughput, and/or a reservation of buffer pool memory or working memory. The techniques may also include a metering mechanism that determines whether the resource reservation is satisfied. The metering mechanism may be independent of an actual resource allocation mechanism associated with the server resource reservation.
    Type: Grant
    Filed: August 31, 2016
    Date of Patent: December 10, 2019
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Vivek R. Narasayya, Sudipto Das, Feng Li, Manoj A. Syamala, Hyunjung Park, Surajit Chaudhuri, Badrish Chandramouli
  • Patent number: 10479020
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: November 19, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Publication number: 20190323903
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: June 7, 2019
    Publication date: October 24, 2019
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20190255654
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: February 21, 2019
    Publication date: August 22, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20190210353
    Abstract: This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.
    Type: Application
    Filed: December 27, 2018
    Publication date: July 11, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Alberto Castro, Glenn Wikle, Lars Jacquemetton, Peter Campbell