Patents by Inventor Vivek R.
Vivek R. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230081180Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: ApplicationFiled: September 13, 2022Publication date: March 16, 2023Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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Publication number: 20230063480Abstract: A network device may detect an error associated with a packet based on error information being generated from processing the packet at a layer of a network stack. The network device may determine, based on detecting the error, metadata associated with the packet. The network device may generate telemetry data to include the metadata. The network device may provide the telemetry data to a network analyzer for policy enforcement.Type: ApplicationFiled: October 17, 2022Publication date: March 2, 2023Inventors: Vivek R., Reji THOMAS, Jimmy JOSE
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SYSTEMS AND METHODS FOR MEASURING RADIATED THERMAL ENERGY DURING AN ADDITIVE MANUFACTURING OPERATION
Publication number: 20220388249Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.Type: ApplicationFiled: June 14, 2022Publication date: December 8, 2022Applicant: Sigma Labs, Inc.Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro -
Patent number: 11517984Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.Type: GrantFiled: November 6, 2018Date of Patent: December 6, 2022Assignee: SIGMA LABS, INC.Inventors: Lars Jacquemetton, Vivek R. Dave, Mark J. Cola, Glenn Wikle, R. Bruce Madigan
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Patent number: 11509534Abstract: A network device may detect an error associated with a packet based on error information being generated from processing the packet at a layer of a network stack. The network device may determine, based on detecting the error, metadata associated with the packet. The network device may generate telemetry data to include the metadata. The network device may provide the telemetry data to a network analyzer for policy enforcement.Type: GrantFiled: October 23, 2019Date of Patent: November 22, 2022Assignee: Juniper Networks, Inc.Inventors: Vivek R., Reji Thomas, Jimmy Jose
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Patent number: 11478854Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.Type: GrantFiled: August 7, 2020Date of Patent: October 25, 2022Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
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SYSTEMS AND METHODS FOR MEASURING RADIATED THERMAL ENERGY DURING AN ADDITIVE MANUFACTURING OPERATION
Publication number: 20220324056Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.Type: ApplicationFiled: June 22, 2022Publication date: October 13, 2022Applicant: Sigma Labs, Inc.Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye -
Patent number: 11458576Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.Type: GrantFiled: November 6, 2018Date of Patent: October 4, 2022Assignee: SIGMA LABS, INC.Inventors: Lars Jacquemetton, Vivek R. Dave, Mark J. Cola, Glenn Wikle, R. Bruce Madigan
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Publication number: 20220257173Abstract: In general, this disclosure describes techniques for automatically predicting and visualizing a future development of a skin condition of a patient. In some examples, a computing system is configured to estimate, based on sensor data, a skin-condition type for a skin condition on an affected area of a body of a patient; determine, based on the sensor data and the estimated skin-condition type, modeling data indicative of a typical development of the skin-condition type; generate, based on the sensor data and the modeling data, a 3-dimensional (3-D) model indicative of a predicted future development of the skin condition over time; generate extended reality (XR) imagery of the affected area of the body of the patient overlaid with the 3-D model; and output the XR imagery.Type: ApplicationFiled: February 17, 2021Publication date: August 18, 2022Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
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Publication number: 20220262004Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.Type: ApplicationFiled: November 24, 2021Publication date: August 18, 2022Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
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Systems and methods for measuring radiated thermal energy during an additive manufacturing operation
Patent number: 11390035Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.Type: GrantFiled: September 18, 2019Date of Patent: July 19, 2022Assignee: SIGMA LABS, INC.Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro -
Patent number: 11372770Abstract: Methods for determining cache activity and for optimizing cache reclamation are performed by systems and devices. A cache entry access is determined at an access time, and a data object of the cache entry for a current time window is identified that includes a time stamp for a previous access and a counter index. A conditional counter operation is then performed on the counter associated with the index to increment the counter when the time stamp is outside the time window or to maintain the counter when the time stamp is within the time window. A counter index that identifies another counter for a previous time window where the other counter value was incremented for the previous cache entry access causes the other counter to be decremented. A cache configuration command to reclaim, or additionally allocate space to, the cache is generated based on the values of the counters.Type: GrantFiled: September 9, 2020Date of Patent: June 28, 2022Assignee: MICROSOFT TECHNOLOGY LICENSING, LLCInventors: Junfeng Dong, Ajay Kalhan, Manoj A. Syamala, Vivek R. Narasayya, Changsong Li, Shize Xu, Pankaj Arora, John M. Oslake, Arnd Christian König, Jiaqi Liu
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Publication number: 20220086731Abstract: In one aspect, a method of a multi-tenancy router to manage a wireless network comprising executing on a processor the steps of: with a port-based multi-tenancy router, assigning a set of different behaviors to different ports for wireless network access management of a wireless network; determining, with at least one computer processor, a set of behaviors related to a user of one or more wireless networks; generating a list of the currently-available ports of the multi-tenancy router; and assigning one or more behaviors each port of the list of currently-available ports.Type: ApplicationFiled: August 3, 2021Publication date: March 17, 2022Inventors: deependra TEWARI, vivek r kumar
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Publication number: 20220075731Abstract: Methods for determining cache activity and for optimizing cache reclamation are performed by systems and devices. A cache entry access is determined at an access time, and a data object of the cache entry for a current time window is identified that includes a time stamp for a previous access and a counter index. A conditional counter operation is then performed on the counter associated with the index to increment the counter when the time stamp is outside the time window or to maintain the counter when the time stamp is within the time window. A counter index that identifies another counter for a previous time window where the other counter value was incremented for the previous cache entry access causes the other counter to be decremented. A cache configuration command to reclaim, or additionally allocate space to, the cache is generated based on the values of the counters.Type: ApplicationFiled: September 9, 2020Publication date: March 10, 2022Inventors: Junfeng DONG, Ajay KALHAN, Manoj A. SYAMALA, Vivek R. NARASAYYA, Changsong LI, Shize XU, Pankaj ARORA, John M. OSLAKE, Arnd Christian KÖNIG, Jiaqi LIU
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Patent number: 11267047Abstract: Various ways in which material property variations of raw materials used in additive manufacturing can be identified and accounted for are described. In some embodiments, the raw material can take the form of powdered metal. The powdered metal can have any number of variations including the following: particle size variation, contamination, particle composition and particle shape. Prior to utilizing the powders in an additive manufacturing operation, the powders can be inspected for variations. Variations and inconsistencies in the powder can also be identified by monitoring an additive manufacturing with one or more sensors. In some embodiments, the additive manufacturing process can be adjusted in real-time to adjust for inconsistencies in the powdered metal.Type: GrantFiled: January 11, 2019Date of Patent: March 8, 2022Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola
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Patent number: 11260454Abstract: A system and a corresponding method of correcting temperature data from a non-imaging optical sensor involve collecting temperature data generated using the optical sensor. The temperature data describes temperature changes across a surface of a material during an additive manufacturing operation in which the material is heated by a heat source. The method includes estimating a size of a hot spot corresponding to a hottest region formed on the surface by the heat source; and estimating a size of a heated region corresponding to a locus of points within the field of view that contribute to the temperature data. The method further includes correcting the temperature data based on the estimated sizes of the hot spot and the heated region.Type: GrantFiled: November 6, 2018Date of Patent: March 1, 2022Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola
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Publication number: 20220001497Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.Type: ApplicationFiled: July 14, 2021Publication date: January 6, 2022Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, Mark J. Cola
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Publication number: 20210404886Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: ApplicationFiled: July 9, 2021Publication date: December 30, 2021Applicant: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Patent number: 11210793Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.Type: GrantFiled: February 12, 2021Date of Patent: December 28, 2021Assignee: Optum Technology, Inc.Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
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Publication number: 20210379666Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.Type: ApplicationFiled: August 23, 2021Publication date: December 9, 2021Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch