Patents by Inventor Vivek R.

Vivek R. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230081180
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Application
    Filed: September 13, 2022
    Publication date: March 16, 2023
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20230063480
    Abstract: A network device may detect an error associated with a packet based on error information being generated from processing the packet at a layer of a network stack. The network device may determine, based on detecting the error, metadata associated with the packet. The network device may generate telemetry data to include the metadata. The network device may provide the telemetry data to a network analyzer for policy enforcement.
    Type: Application
    Filed: October 17, 2022
    Publication date: March 2, 2023
    Inventors: Vivek R., Reji THOMAS, Jimmy JOSE
  • Publication number: 20220388249
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Application
    Filed: June 14, 2022
    Publication date: December 8, 2022
    Applicant: Sigma Labs, Inc.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Patent number: 11517984
    Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: December 6, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: Lars Jacquemetton, Vivek R. Dave, Mark J. Cola, Glenn Wikle, R. Bruce Madigan
  • Patent number: 11509534
    Abstract: A network device may detect an error associated with a packet based on error information being generated from processing the packet at a layer of a network stack. The network device may determine, based on detecting the error, metadata associated with the packet. The network device may generate telemetry data to include the metadata. The network device may provide the telemetry data to a network analyzer for policy enforcement.
    Type: Grant
    Filed: October 23, 2019
    Date of Patent: November 22, 2022
    Assignee: Juniper Networks, Inc.
    Inventors: Vivek R., Reji Thomas, Jimmy Jose
  • Patent number: 11478854
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: August 7, 2020
    Date of Patent: October 25, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20220324056
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: June 22, 2022
    Publication date: October 13, 2022
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Patent number: 11458576
    Abstract: This disclosure describes an additive manufacturing method that includes monitoring a temperature of a portion of a build plane during an additive manufacturing operation using a temperature sensor as a heat source passes through the portion of the build plane; detecting a peak temperature associated with one or more passes of the heat source through the portion of the build plane; determining a threshold temperature by reducing the peak temperature by a predetermined amount; identifying a time interval during which the monitored temperature exceeds the threshold temperature; identifying, using the time interval, a change in manufacturing conditions likely to result in a manufacturing defect; and changing a process parameter of the heat source in response to the change in manufacturing conditions.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: October 4, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: Lars Jacquemetton, Vivek R. Dave, Mark J. Cola, Glenn Wikle, R. Bruce Madigan
  • Publication number: 20220257173
    Abstract: In general, this disclosure describes techniques for automatically predicting and visualizing a future development of a skin condition of a patient. In some examples, a computing system is configured to estimate, based on sensor data, a skin-condition type for a skin condition on an affected area of a body of a patient; determine, based on the sensor data and the estimated skin-condition type, modeling data indicative of a typical development of the skin-condition type; generate, based on the sensor data and the modeling data, a 3-dimensional (3-D) model indicative of a predicted future development of the skin condition over time; generate extended reality (XR) imagery of the affected area of the body of the patient overlaid with the 3-D model; and output the XR imagery.
    Type: Application
    Filed: February 17, 2021
    Publication date: August 18, 2022
    Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
  • Publication number: 20220262004
    Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.
    Type: Application
    Filed: November 24, 2021
    Publication date: August 18, 2022
    Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
  • Patent number: 11390035
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.
    Type: Grant
    Filed: September 18, 2019
    Date of Patent: July 19, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro
  • Patent number: 11372770
    Abstract: Methods for determining cache activity and for optimizing cache reclamation are performed by systems and devices. A cache entry access is determined at an access time, and a data object of the cache entry for a current time window is identified that includes a time stamp for a previous access and a counter index. A conditional counter operation is then performed on the counter associated with the index to increment the counter when the time stamp is outside the time window or to maintain the counter when the time stamp is within the time window. A counter index that identifies another counter for a previous time window where the other counter value was incremented for the previous cache entry access causes the other counter to be decremented. A cache configuration command to reclaim, or additionally allocate space to, the cache is generated based on the values of the counters.
    Type: Grant
    Filed: September 9, 2020
    Date of Patent: June 28, 2022
    Assignee: MICROSOFT TECHNOLOGY LICENSING, LLC
    Inventors: Junfeng Dong, Ajay Kalhan, Manoj A. Syamala, Vivek R. Narasayya, Changsong Li, Shize Xu, Pankaj Arora, John M. Oslake, Arnd Christian König, Jiaqi Liu
  • Publication number: 20220086731
    Abstract: In one aspect, a method of a multi-tenancy router to manage a wireless network comprising executing on a processor the steps of: with a port-based multi-tenancy router, assigning a set of different behaviors to different ports for wireless network access management of a wireless network; determining, with at least one computer processor, a set of behaviors related to a user of one or more wireless networks; generating a list of the currently-available ports of the multi-tenancy router; and assigning one or more behaviors each port of the list of currently-available ports.
    Type: Application
    Filed: August 3, 2021
    Publication date: March 17, 2022
    Inventors: deependra TEWARI, vivek r kumar
  • Publication number: 20220075731
    Abstract: Methods for determining cache activity and for optimizing cache reclamation are performed by systems and devices. A cache entry access is determined at an access time, and a data object of the cache entry for a current time window is identified that includes a time stamp for a previous access and a counter index. A conditional counter operation is then performed on the counter associated with the index to increment the counter when the time stamp is outside the time window or to maintain the counter when the time stamp is within the time window. A counter index that identifies another counter for a previous time window where the other counter value was incremented for the previous cache entry access causes the other counter to be decremented. A cache configuration command to reclaim, or additionally allocate space to, the cache is generated based on the values of the counters.
    Type: Application
    Filed: September 9, 2020
    Publication date: March 10, 2022
    Inventors: Junfeng DONG, Ajay KALHAN, Manoj A. SYAMALA, Vivek R. NARASAYYA, Changsong LI, Shize XU, Pankaj ARORA, John M. OSLAKE, Arnd Christian KÖNIG, Jiaqi LIU
  • Patent number: 11267047
    Abstract: Various ways in which material property variations of raw materials used in additive manufacturing can be identified and accounted for are described. In some embodiments, the raw material can take the form of powdered metal. The powdered metal can have any number of variations including the following: particle size variation, contamination, particle composition and particle shape. Prior to utilizing the powders in an additive manufacturing operation, the powders can be inspected for variations. Variations and inconsistencies in the powder can also be identified by monitoring an additive manufacturing with one or more sensors. In some embodiments, the additive manufacturing process can be adjusted in real-time to adjust for inconsistencies in the powdered metal.
    Type: Grant
    Filed: January 11, 2019
    Date of Patent: March 8, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola
  • Patent number: 11260454
    Abstract: A system and a corresponding method of correcting temperature data from a non-imaging optical sensor involve collecting temperature data generated using the optical sensor. The temperature data describes temperature changes across a surface of a material during an additive manufacturing operation in which the material is heated by a heat source. The method includes estimating a size of a hot spot corresponding to a hottest region formed on the surface by the heat source; and estimating a size of a heated region corresponding to a locus of points within the field of view that contribute to the temperature data. The method further includes correcting the temperature data based on the estimated sizes of the hot spot and the heated region.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: March 1, 2022
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola
  • Publication number: 20220001497
    Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.
    Type: Application
    Filed: July 14, 2021
    Publication date: January 6, 2022
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, Mark J. Cola
  • Publication number: 20210404886
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: July 9, 2021
    Publication date: December 30, 2021
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Patent number: 11210793
    Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.
    Type: Grant
    Filed: February 12, 2021
    Date of Patent: December 28, 2021
    Assignee: Optum Technology, Inc.
    Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
  • Publication number: 20210379666
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: August 23, 2021
    Publication date: December 9, 2021
    Applicant: Sigma Labs, Inc.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch