Patents by Inventor Vivek R.
Vivek R. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Systems and methods for measuring radiated thermal energy during an additive manufacturing operation
Patent number: 11390035Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.Type: GrantFiled: September 18, 2019Date of Patent: July 19, 2022Assignee: SIGMA LABS, INC.Inventors: R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Darren Beckett, Alberto M. Castro -
Patent number: 11372770Abstract: Methods for determining cache activity and for optimizing cache reclamation are performed by systems and devices. A cache entry access is determined at an access time, and a data object of the cache entry for a current time window is identified that includes a time stamp for a previous access and a counter index. A conditional counter operation is then performed on the counter associated with the index to increment the counter when the time stamp is outside the time window or to maintain the counter when the time stamp is within the time window. A counter index that identifies another counter for a previous time window where the other counter value was incremented for the previous cache entry access causes the other counter to be decremented. A cache configuration command to reclaim, or additionally allocate space to, the cache is generated based on the values of the counters.Type: GrantFiled: September 9, 2020Date of Patent: June 28, 2022Assignee: MICROSOFT TECHNOLOGY LICENSING, LLCInventors: Junfeng Dong, Ajay Kalhan, Manoj A. Syamala, Vivek R. Narasayya, Changsong Li, Shize Xu, Pankaj Arora, John M. Oslake, Arnd Christian König, Jiaqi Liu
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Publication number: 20220086731Abstract: In one aspect, a method of a multi-tenancy router to manage a wireless network comprising executing on a processor the steps of: with a port-based multi-tenancy router, assigning a set of different behaviors to different ports for wireless network access management of a wireless network; determining, with at least one computer processor, a set of behaviors related to a user of one or more wireless networks; generating a list of the currently-available ports of the multi-tenancy router; and assigning one or more behaviors each port of the list of currently-available ports.Type: ApplicationFiled: August 3, 2021Publication date: March 17, 2022Inventors: deependra TEWARI, vivek r kumar
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Publication number: 20220075731Abstract: Methods for determining cache activity and for optimizing cache reclamation are performed by systems and devices. A cache entry access is determined at an access time, and a data object of the cache entry for a current time window is identified that includes a time stamp for a previous access and a counter index. A conditional counter operation is then performed on the counter associated with the index to increment the counter when the time stamp is outside the time window or to maintain the counter when the time stamp is within the time window. A counter index that identifies another counter for a previous time window where the other counter value was incremented for the previous cache entry access causes the other counter to be decremented. A cache configuration command to reclaim, or additionally allocate space to, the cache is generated based on the values of the counters.Type: ApplicationFiled: September 9, 2020Publication date: March 10, 2022Inventors: Junfeng DONG, Ajay KALHAN, Manoj A. SYAMALA, Vivek R. NARASAYYA, Changsong LI, Shize XU, Pankaj ARORA, John M. OSLAKE, Arnd Christian KÖNIG, Jiaqi LIU
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Patent number: 11267047Abstract: Various ways in which material property variations of raw materials used in additive manufacturing can be identified and accounted for are described. In some embodiments, the raw material can take the form of powdered metal. The powdered metal can have any number of variations including the following: particle size variation, contamination, particle composition and particle shape. Prior to utilizing the powders in an additive manufacturing operation, the powders can be inspected for variations. Variations and inconsistencies in the powder can also be identified by monitoring an additive manufacturing with one or more sensors. In some embodiments, the additive manufacturing process can be adjusted in real-time to adjust for inconsistencies in the powdered metal.Type: GrantFiled: January 11, 2019Date of Patent: March 8, 2022Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola
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Patent number: 11260454Abstract: A system and a corresponding method of correcting temperature data from a non-imaging optical sensor involve collecting temperature data generated using the optical sensor. The temperature data describes temperature changes across a surface of a material during an additive manufacturing operation in which the material is heated by a heat source. The method includes estimating a size of a hot spot corresponding to a hottest region formed on the surface by the heat source; and estimating a size of a heated region corresponding to a locus of points within the field of view that contribute to the temperature data. The method further includes correcting the temperature data based on the estimated sizes of the hot spot and the heated region.Type: GrantFiled: November 6, 2018Date of Patent: March 1, 2022Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola
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Publication number: 20220001497Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.Type: ApplicationFiled: July 14, 2021Publication date: January 6, 2022Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, Mark J. Cola
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Publication number: 20210404886Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: ApplicationFiled: July 9, 2021Publication date: December 30, 2021Applicant: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Patent number: 11210793Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.Type: GrantFiled: February 12, 2021Date of Patent: December 28, 2021Assignee: Optum Technology, Inc.Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
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Publication number: 20210379666Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.Type: ApplicationFiled: August 23, 2021Publication date: December 9, 2021Applicant: Sigma Labs, Inc.Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
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Patent number: 11182360Abstract: Systems, methods, and computer-executable instructions for reorganizing a physical layout of data of a database a database. A workload is selected from previously executed database operations. A total resource consumption of the previously executed database operations and of the workload is determined. The total resource consumption of the workload is more than a predetermined threshold of the total resource consumption of the previously executed database operations. Optimization operations for the database are determined using the workload. A cloned database of the database is created. The optimization operations are executed on the cloned database. A database operation is received for the database. The database operation is executed on the database and the cloned database. The performance of the cloned database is verified as being improved compared to the performance of the database based on the executing of the database operation on the database and the cloned database.Type: GrantFiled: January 14, 2019Date of Patent: November 23, 2021Assignee: Microsoft Technology Licensing, LLCInventors: Sudipto Das, Vivek R Narasayya, Gaoxiang Xu, Surajit Chaudhuri, Andrija Jovanovic, Miodrag Radulovic
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Patent number: 11164391Abstract: In general, embodiments of the present invention provide methods, apparatuses, systems, computing devices, computing entities, and/or the like for performing mixed reality processing using at least one of depth-based partitioning of a point cloud capture data object, object-based partitioning of a point cloud capture data object, mapping a partitioned point cloud capture data object to detected objects of a three-dimensional scan data object, performing noise filtering on point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects, and performing geometrically-aware object detection using point cloud capture data objects based at least in part on geometric inferences from three-dimensional scan data objects.Type: GrantFiled: February 12, 2021Date of Patent: November 2, 2021Assignee: Optum Technology, Inc.Inventors: Yash Sharma, Vivek R. Dwivedi, Anshul Verma
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Patent number: 11135654Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.Type: GrantFiled: May 18, 2018Date of Patent: October 5, 2021Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
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Patent number: 11138266Abstract: Systems and techniques for leveraging query executions to improve index recommendations are described herein. In an example, a machine learning model is adapted to receive a first query plan and a second query plan for performing a query with a database, where the first query plan is different from the second query plan. The machine learning model may be further adapted to determine execution cost efficiency between the first query plan and the second query plan. The machine learning model is trained using relative execution cost comparisons between a set of pairs of query plans for the database. The machine learning model is further adapted to output a ranking of the first query plan and second query plan, where the first query plan and second query plan are ranked based on execution cost efficiency.Type: GrantFiled: February 21, 2019Date of Patent: October 5, 2021Assignee: Microsoft Technology Licensing, LLCInventors: Bailu Ding, Sudipto Das, Surajit Chaudhuri, Vivek R Narasayya, Ryan Marcus, Lin Ma, Adith Swaminathan
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Patent number: 11115326Abstract: In one aspect, a method of a multi-tenancy router to manage a wireless network comprising executing on a processor the following steps. With a port-based multi-tenancy router, assign a set of different behaviors to different ports for wireless network access management of a wireless network. With at least one computer processor, a set of behaviors related to a user of one or more wireless networks are determined. A list of the currently-available ports of the multi-tenancy router is generated. One or more behaviors of each port of the list of currently-available ports are assigned.Type: GrantFiled: February 13, 2016Date of Patent: September 7, 2021Inventors: Deependra Tewari, Vivek R. Kumar
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Publication number: 20210231709Abstract: A multi-sensor, real-time, in-process current and voltage estimation system is disclosed including sensors, affiliated hardware, and data processing algorithms that allow accurate estimation of currents and voltages from magnetic and electric field measurements, respectively. Aspects of the system may be embodied in a detector that is readily attachable to conductors of an energized system for contactless current and/or voltage sensing of the conductors without requiring the conductors to be disconnected from the energized system.Type: ApplicationFiled: December 4, 2020Publication date: July 29, 2021Inventors: Vivek R. Dave, Felix Loske, Enger Knop, Lutz Tröger, Alan E. Casallas, Jeffrey H. Lang
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Patent number: 11072043Abstract: The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.Type: GrantFiled: March 21, 2017Date of Patent: July 27, 2021Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola
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Patent number: 11073431Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.Type: GrantFiled: November 8, 2019Date of Patent: July 27, 2021Assignee: SIGMA LABS, INC.Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
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Publication number: 20210126830Abstract: A network device may detect an error associated with a packet based on error information being generated from processing the packet at a layer of a network stack. The network device may determine, based on detecting the error, metadata associated with the packet. The network device may generate telemetry data to include the metadata. The network device may provide the telemetry data to a network analyzer for policy enforcement.Type: ApplicationFiled: October 23, 2019Publication date: April 29, 2021Inventors: Vivek R., Reji THOMAS, Jimmy JOSE
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Patent number: 10970490Abstract: A conversation for simulation by an artificial intelligence-based tutor is automatically generated. The conversation relates to content on which the artificial intelligence-based tutor is being trained. The automatically generating the conversation includes automatically generating inputs from a simulated student regarding the content, and automatically generating on behalf of the artificial intelligence-based tutor expected responses to the inputs generated from the simulated student. The conversation is provided as an output to be input to the artificial intelligence-based tutor for simulation by the artificial intelligence-based tutor.Type: GrantFiled: May 16, 2019Date of Patent: April 6, 2021Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Saubhik Kundu, Rajesh Barri, Vivek R. Pratap, Rishi Arora, Saugata Das, Tarannum M. Landge