Abstract: A semiconductor device includes a first cell in a first row, wherein the first row extends in a first direction, the first cell having a first cell height measured in a second direction perpendicular to the first direction. The semiconductor device further includes a second cell in the first row, wherein the second cell has a second cell height measured in the second direction, the second cell height is less than the first cell height. The second cell includes a first active region having a first width measured in the second direction, and a second active region having a second width measured in the second direction, wherein the second width is different from the first width.

Abstract: By determining the lethality rate to Meloidogyne incognita and Caenorhabditis elegans, it was found that the methylmalonic acid has a better nematicidal effect on the Caenorhabditis elegans, with the LC50 being 13.11 and 1.20 for the Meloidogyne incognita and the Caenorhabditis elegans, respectively. After compounding the methylmalonic acid with betaine, the LC50 was 2.85 and 0.27 for the Meloidogyne incognita and the Caenorhabditis elegans, respectively. Meanwhile, the methylmalonic acid also has an inhibiting effect on Pseudomonas solanacearum and Erwinia carotovora. The preparation of the methylmalonic acid provides a new choice for preparing novel biocontrol agents against the root-knot nematodes.

Abstract: An integrated circuit device includes: a first fin structure disposed on a substrate in a first direction; a second fin structure disposed on the substrate and aligned in the first direction; a third fin structure disposed on the substrate and aligned in the first direction; and a first conductive line aligned in a second direction arranged to wrap a first portion, a second portion, and a third portion of the first fin structure, the second fin structure and the third fin structure, respectively. Each of the first fin structure, the second fin structure and the third fin structure has a same type dopant. A first distance between the first fin structure and the second fin structure is different from a second distance between the second fin structure and the third fin structure.

Abstract: Systems and methods for conducting critical dimension metrology are disclosed. According to certain embodiments, a charged particle beam apparatus generates a beam for imaging a first area and a second area. Measurements are acquired corresponding to a first feature in the first area, and measurements are acquired corresponding to a second feature in the second area. The first area and the second area are at separate locations on a sample. A combined measurement is calculated based on the measurements of the first feature and the measurements of the second feature.

Abstract: A method for preparing a perovskite solar cell is disclosed, which comprises the following steps: providing a first electrode; forming an active layer on the first electrode; and forming a second electrode on the active layer. Herein, the active layer can be prepared by the following steps: mixing a perovskite precursor and a solvent mixture to form a precursor solution, wherein the solvent mixture comprises a first solvent and a second solvent, the first solvent is selected from the group consisting of ?-butyrolactone (GBL), dimethyl sulfoxide (DMSO), 2-methylpyrazine (2-MP), dimethylformamide (DMF), 1-methyl-2-pyrrolidone (NMP), dimethylacetamide (DMAc) and a combination thereof, and the second solvent is an alcohol; and coating the first electrode with the precursor solution and heating the precursor solution to form the active layer.

Abstract: Described herein is a method for training a denoising model. The method includes obtaining a first set of simulated images based on design patterns. The simulated images may be clean and can be added with noise to generate noisy simulated images. The simulated clean and noisy images are used as training data to generate a denoising model.

Abstract: A semiconductor device includes a semiconductor substrate, a semiconductor fin extending from the semiconductor substrate, a gate structure extending across the semiconductor fin, and source/drain semiconductor layers on opposite sides of the gate structure. The source/drain semiconductor layers each have a first thickness over a top side of the semiconductor fin and a second thickness over a lateral side of the semiconductor fin. The first thickness and the second thickness have a difference smaller than about 20 percent of the first thickness.

Abstract: An improved method and apparatus for enhancing an inspection image in a charged-particle beam inspection system. An improved method for enhancing an inspection image comprises acquiring a first image and a second image of multiple stacked layers of a sample that are taken with a first focal point and a second focal point, respectively, associating a first segment of the first image with a first layer among the multiple stacked layers and associating a second segment of the second image with a second layer among the multiple stacked layers, updating the first segment based on a first reference image corresponding to the first layer and updating the second segment based on a second reference image corresponding to the second layer, and combining the updated first segment and the updated second segment to generate a combined image including the first layer and the second layer.

Abstract: A method includes following steps. A silicon germanium layer is formed on a substrate. A surface layer of the silicon germanium layer is oxidized to form an interfacial layer comprising silicon oxide and germanium oxide. The interfacial layer is nitridated. A metal gate structure is formed over the nitridated interfacial layer.

Abstract: A method for sending a multicast packet provided in embodiments of this application includes: a first network device obtains a first multicast packet, where the first multicast packet includes a bit string bit string and an identifier of a network slice, the bit string corresponds to a second network device, and the network slice corresponds to a multicast service of the second network device. The first network device obtains, based on the bit string and the identifier of the network slice, a first interface corresponding to the network slice. The first network device sends the first multicast packet to the second network device by using the first interface.

Abstract: Embodiments of the present disclosure provide systems and methods for enhancing the semiconductor manufacturing yield. Embodiments of the present disclosure provide a yield improvement system. The system comprises a training tool configured to generate training data based on receipt of one or more verified results of an inspection of a first substrate. The system also comprises a point determination tool configured to determine one or more regions on a second substrate to inspect based on the training data, weak point information for the second substrate, and an exposure recipe for a scanner of the second substrate.

Abstract: An integrated circuit (IC) configurable to perform adaptive thermal ceiling control in a per-functional-block manner, an associated main circuit, an associated electronic device and an associated thermal control method are provided. The IC may include a plurality of hardware circuits arranged to perform operations of a first functional block, and at least one thermal control circuit. At least one temperature sensor is coupled with the first functional block to detect temperature and to generate at least one temperature sensing result of the first functional block.

Abstract: The present invention provides an apparatus of electron beam comprising an electron gun with a pinnacle limiting plate having at least one current-limiting aperture. The pinnacle limiting plate is located between a bottom (or lowest) anode and a top (or highest) condenser within the electron gun. A current (ampere) of the electron beam that has passed through the current-limiting aperture remains the same (unchanged) after the electron beam travels through the top condenser and an electron optical column and arrives at a sample space. Electron-electron interaction of the electron beam is thus reduced.

Abstract: An integrated circuit device includes: a first fin structure disposed on a substrate in a first direction; a second fin structure disposed on the substrate and aligned in the first direction; a third fin structure disposed on the substrate and aligned in the first direction; and a first conductive line aligned in a second direction arranged to wrap a first portion, a second portion, and a third portion of the first fin structure, the second fin structure and the third fin structure, respectively. Each of the first fin structure, the second fin structure and the third fin structure has a same type dopant. A first distance between the first fin structure and the second fin structure is different from a second distance between the second fin structure and the third fin structure.

Abstract: A distributed system, such as a distributed storage system in a virtualized computing environment and having storage nodes arranged in a cluster, is provided by management server with a transition period between non-encryption and encryption modes of operation. The transition period enables all of the nodes to complete a transition from the non-encryption mode of operation to the encryption mode of operation, without loss of data-in-transit (DIT). An auto-remediation feature is provided by the management server to the cluster, so as to fix inconsistent state(s) of one or more nodes in the cluster.

Abstract: A height measurement method includes obtaining an image including a target object and a pose of a camera used when the image is photographed, obtaining pixel coordinates of at least two key skeleton points of the target object in the image, obtaining three-dimensional coordinates of the key skeleton points based on the pose of the camera and the pixel coordinates of the key skeleton points, and determining height data of the target object based on the three-dimensional coordinates of the at least two key skeleton points.

Abstract: Data writing methods and computing devices are provided. An example data writing method is applied to a computer system, and the computer system includes a file system and a flash memory-based storage system. The example data writing method includes obtaining a target logical address, where the target logical address is an address allocated from a first logical block to target data to be written into the flash memory-based storage system, the first logical block is one of multiple logical blocks in the file system, and the flash memory-based storage system includes multiple physical blocks. It is determined that the target logical address belongs to the first logical block. The target data is written into a first physical block based on a correspondence between the first logical block and the first physical block, where the first physical block is one of the multiple physical blocks.

Abstract: A server for knowledge recommendation for defect review. The server includes a processor electronically coupled to an electronic storage device storing a plurality of knowledge files related to wafer defects. The processor is configured to execute a set of instruction to cause the server to: receive a request for knowledge recommendation for inspecting an inspection image from a defect classification server; search for a knowledge file in the electronic storage device that matches the inspection image; and transmit the search result to the defect classification server.

Abstract: Disclosed is an intelligent anti-seismic device for a shallow foundation ancient building, which may include a land, a foundation base and an ancient building body, foundation pit is excavated on a surface of the land, a plurality of piles are arranged on an inner wall of the foundation pit, a foundation side beam is integrally formed by pouring on tops of the plurality of piles, a first earthquake proof mechanism capable of being lifted and lowered is fixed on a top of the foundation side beam, a well-shaped base is integrally formed on the inner wall of the foundation pit, a second earthquake proof mechanism is fixed on a surface of the well-shaped base, a frame is fixed on both tops of the first earthquake proof mechanism and the second earthquake proof mechanism, a grillage beam is integrally formed on an inner wall of the frame.

Abstract: An improved apparatus and method for extracting pattern contour information from an inspection image in a multiple charged-particle beam inspection system are disclosed. An improved method for extracting pattern contour information from an inspection image comprises identifying, from an inspection image obtained from a charged-particle beam inspection system, a first pattern and a second pattern that partially overlap in the inspection image. The method also comprises generating a first separation image by removing an image area corresponding to the second pattern from the inspection image. The first separation image includes the first pattern of which a first part is removed when removing the image area corresponding to the second pattern. The method also comprises updating the first separation image to include image data representing the removed first part of the first pattern based on a first reference image corresponding to the first pattern.