Abstract: An electroluminescent display includes: a pixel region including devices arranged therein and adapted to emit light in response to a data signal; a scan driver adapted to supply a switching signal to a gate electrode of a first switching device; a data driver adapted to supply data information to a source electrode of the first switching device; a conductive power supply line adapted to supply a first power supply voltage to the pixel region, and an electromagnetic shield adapted to shield electromagnetic waves having electric or magnetic field characteristics. The electromagnetic shield is adapted to generate a second power supply voltage having a polarity opposite to that of the first power supply voltage.

Abstract: An SRAM cell having a latch circuit including two inverters coupled in a chain format. Each inverter is coupled to power through a transistor, and the transistor is turned off when data is written to the SRAM. As a result, the data is easily written to the SRAM cell without data collision since performance of the latch circuit is degraded. Such SRAM cell may be used in a flat panel display to temporarily store digital signals corresponding to data signals for displaying video.

Abstract: A weld checking apparatus for a laser welding machine having a welding head triggering laser beam to a welding object includes an auxiliary flash intercepting plate removably mounted on a flexible arm installed on the welding head to intercept a flash generated during a laser welding process, a weld-checking/eye-protecting glass assembly disposed on a center portion of the auxiliary flash intercepting plate to display a weld portion in an enlarged scale during the welding process while intercepting the flash by being opened and closed in synchronization with a laser beam trigger speed of the welding head, and an open/close control part for generating a trigger pulse and an open/close pulse synchronized with the trigger pulse and for providing the open/close pulse to the weld-checking/eye-protecting glass through the electric cable 50 to open and close the weld-checking/eye-protecting glass assembly.

Abstract: A system and method automatically analyzes and manages loss factor data of test processes in which a great number of IC devices are tested as a lot with a number of testers. The lot contains a predetermined number of identical IC devices, and the lot test process is performed sequentially according to a predetermined number of test cycles. The system include a means for verifying test results for each of the test cycles and for determining whether or not a re-test is to be performed and an IC device loading/unloading means for loading IC devices to be tested and contained in the lot to a test head and for unloading the tested IC devices from the test head by sorting the tested IC devices according to the test results.

Abstract: A method for testing semiconductor devices includes loading a customer tray with semiconductor devices to be tested in a loader. The devices are moved from the customer tray into a test tray via a buffer tray of a loader buffer. The tested semiconductor devices are classified into high and low quality semiconductor devices. The classified semiconductor devices are unloaded from the test tray to the customer tray of an unloader via an unloader buffer. If the customer tray is not empty, the semiconductor devices are tested. If the customer tray is empty, the number of semiconductor devices in the buffer tray buffer is counted and compared with the number of semiconductor devices that can be tested simultaneously, typically either 64 or 128. If the number of semiconductor devices in the buffer tray is greater than the tester capacity, the semiconductor devices in the buffer tray are tested.

Abstract: In a pixel circuit of an organic EL display device, a gate of a driving transistor is coupled to a gate of a compensating transistor, which is configured to operate as a diode. A precharge voltage is applied to the gate of the driving transistor while a selection signal is applied to a previous scan line, so that the compensating transistor is biased in a forward direction to apply a data voltage on the gate of the drive transistor. The driving transistor may be electrically isolated from the organic EL element (OLED) while precharging, so as to prevent the OLED from emitting a light using the precharge voltage. In addition, the driving transistor may be electrically isolated from the OLED while the data voltage is being charged, so as to prevent the OLED from emitting a light.

Abstract: The present invention is directed to a semiconductor memory device and method of operating the same. In case where fail normal word lines of normal word lines from a normal memory block to which fail memory cells are connected is substituted by redundant word lines of a redundant memory block, the redundant word lines to replace the fail normal word lines are set in the redundant memory block. If the fail normal word lines are selected when the device is operated, the fail normal word lines and the redundant word lines are activated at the same time to increase capacitance of a capacitor connected to the sense amplifier. Therefore, it is possible to increase the exactness of a read operation or a refresh operation and improve reliability of a device operation, by increasing a comparable margin of the sense amplifier.

Abstract: An electrical testing method for a semiconductor package for detecting defects of sockets mounted on a device under test (DUT) board is provided. A tester performs electrical test, accumulates electrical test results, and compares the accumulated results to reference values. The result of the comparison decides whether a plurality of sockets mounted on the DUT board can be used or not. The decision results are transmitted to a handler so that the socket having the defects is not used on the DUT board.

Abstract: A buffer circuit includes first to sixth transistors. The first transistor is coupled between a first power source and a first node, and has a gate for receiving a first signal having a first signal level. The second transistor is coupled between the first node and a second power source, and has a gate for receiving a second signal having a second signal level, which is an inverse of the first signal level. The third transistor has a gate coupled to the first node, and is coupled between the first power source and a second node. The fourth transistor is coupled between the second node and the second power source, and has a gate for receiving the first signal. The fifth transistor has a gate coupled to the second node, and is coupled between the first power source and an output end. The sixth transistor has a gate coupled to the first node, and is coupled between the output end and the second power source. In addition, a capacitance is formed between the gate of the sixth transistor and the output end.

Abstract: A weld checking apparatus for a laser welding machine having a welding head triggering laser beam to a welding object includes an auxiliary flash intercepting plate removably mounted on a flexible arm installed on the welding head to intercept a flash generated during a laser welding process, a weld-checking/eye-protecting glass assembly disposed on a center portion of the auxiliary flash intercepting plate to display a weld portion in an enlarged scale during the welding process while intercepting the flash by being opened and closed in synchronization with a laser beam trigger speed of the welding head, and an open/close control part for generating a trigger pulse and an open/close pulse synchronized with the trigger pulse and for providing the open/close pulse to the weld-checking/eye-protecting glass through the electric cable 50 to open and close the weld-checking/eye-protecting glass assembly.

Abstract: The present invention discloses a displacement measurement marker capable of measuring displacement of an object moving on a plane by using a line scan camera, and a displacement measurement method using the same. The displacement measurement marker according to the present invention comprises a plurality of repeatedly arranged figures having the same size and shape. Each of the figures is measurable by means of the line scan camera and is asymmetric with respect to a direction of a scan line of the line scan camera. Preferably, each of the figures is a right-angled triangle of which base is a horizontal line. According to the present invention, there are advantages in that a two-dimensional planar motion of the object can be measured from one-dimensional linear image data, and the motion of the object which moves at a high speed or on which an impact is exerted can be accurately measured.

Abstract: A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards) need be duplicated, rather than the loading lanes or sorters of the handler, the test apparatus can be conveniently compact. Further, while testing semiconductor devices on one site or one test board, semiconductor devices in another site or on another test board can be sorted according to the test result. This enables the reduction or elimination of tester idle time to optimize the efficiency of the test apparatus.

Abstract: A method and apparatus for a credit card inquiry using a high-speed cable network is disclosed.

Abstract: The method and system of the invention increase the convenience of making a call on a portable phone and improve the safety of making the call while driving a vehicle. The system includes a communication module for wireless voice and character data transmission between the hands-free system and the portable phone and provides for voice command driven use of the portable phone without requiring a physical connection. The method provides for registering the entries on the portable phone into the system and for placing a call on the portable phone using the system.

Abstract: A system for opening and closing a garage door is provided. The system includes a vehicle communication module mounted to a vehicle, and a garage communication module, the vehicle communication module and the garage communication module preferably performing bluetooth communication. On the basis of the communication of a vehicle identifier and engine state information, a garage door can be automatically opened and closed.

Abstract: The present invention discloses a displacement measurement marker capable of measuring displacement of an object moving on a plane by using a line scan camera, and a displacement measurement method using the same. The displacement measurement marker according to the present invention comprises a plurality of repeatedly arranged figures having the same size and shape. Each of the figures is measurable by means of the line scan camera and is asymmetric with respect to a direction of a scan line of the line scan camera. Preferably, each of the figures is a right-angled triangle of which base is a horizontal line. According to the present invention, there are advantages in that a two-dimensional planar motion of the object can be measured from one-dimensional linear image data, and the motion of the object which moves at a high speed or on which an impact is exerted can be accurately measured.

Abstract: A system and method automatically analyzes and manages loss factor data of test processes in which a great number of IC devices are tested as a lot with a number of testers. The lot contains a predetermined number of identical IC devices, and the lot test process is performed sequentially according to a predetermined number of test cycles. The system include a means for verifying test results for each of the test cycles and for determining whether or not a re-test is to be performed and an IC device loading/unloading means for loading IC devices to be tested and contained in the lot to a test head and for unloading the tested IC devices from the test head by sorting the tested IC devices according to the test results.

Abstract: An ortho-alkylation method of an aromatic ketone. In the method, as starting materials, the aromatic ketone is reacted with aliphatic or aromatic alkyl moiety-containing olefins in the presence of a primary amine and a transition metal catalyst as reaction catalysts, or ketimines resulting from a reaction of aromatic ketones with a primary amine are reacted with aliphatic or aromatic alkyl moiety-containing olefins in the presence of a transition metal catalyst, thereby introducing the alkyl moiety to the ortho-position of the aromatic ketone.

Abstract: There is disclosed an option function test apparatus of a semiconductor device including a function selecting means. The function selection means includes a fuse signal detecting section for sensing the state of fuse blowing, a pad signal detecting section for sensing the signal state on the probe pad for selecting its specification, which is consisted by incorporating extra probe chips into the existing probe card, and a global signal control section for receiving the output signals from said fuse signal detecting section and said pad signal detecting section to output different output signals based on its operation mode. Thus, the present invention can provide an outstanding effect of reducing additional test time and cost depending on the changes in function, since it allows a multifunction test of all of the specifications mounted on the on-chip in a wafer state.

Abstract: A manufacturing method of a light-emitting diode is provided. The light-emitting diode manufactured by the steps of coating solution containing p-type or n-type impurities on a porous silicon layer, thereby forming a p/n junction through a thermal treatment has excellent light-emitting efficiency. Also, the process is simple compared to an implantation method, and further the manufacturing is since the thermal treatment can be performed at a relatively low temperature.