Abstract: A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards) need be duplicated, rather than the loading lanes or sorters of the handler, the test apparatus can be conveniently compact. Further, while testing semiconductor devices on one site or one test board, semiconductor devices in another site or on another test board can be sorted according to the test result. This enables the reduction or elimination of tester idle time to optimize the efficiency of the test apparatus.

Abstract: An electroluminescent display includes: a pixel region including devices arranged therein and adapted to emit light in response to a data signal; a scan driver adapted to supply a switching signal to a gate electrode of a first switching device; a data driver adapted to supply data information to a source electrode of the first switching device; a conductive power supply line adapted to supply a first power supply voltage to the pixel region, and an electromagnetic shield adapted to shield electromagnetic waves having electric or magnetic field characteristics. The electromagnetic shield is adapted to generate a second power supply voltage having a polarity opposite to that of the first power supply voltage.

Abstract: A Si-based diode (10, 10?, 100) is formed by epitaxially depositing a Si-based diode structure on a silicon substrate. The Si-based diode structure includes a Si-based pn junction (16, 16?, 18, 18?, 30, 32, 160, 161) having a backward diode current-voltage characteristic in which the forward tunneling current is substantially smaller than the backward tunneling current at comparable voltage levels. In some embodiments, the Si-based pn junction includes at least one non-silicon or silicon alloy layer such as at least one SiGe layer (16, 16?, 160, 161). In some embodiments, at least one delta doping (30, 32) is disposed on the silicon substrate in or near the pn junction, that together with the Si-based pn junction define an electrical junction having the backward diode current-voltage characteristic. A large area detector array may include a plurality of such Si-based diodes (10, 10?, 100).

Abstract: A scan driver includes a plurality of stages coupled to each other in series, each of the stages configured to receive a clock signal, a clock bar signal, and an input signal, wherein each stage includes a first circuit that is configured to store a first voltage and a second voltage in response to the input signal and one of the clock signal or the clock bar signal, the first voltage and the second voltage each corresponding to a voltage of the input signal, and provide a first output signal that corresponds to the second voltage in response to the second voltage and the other of the clock signal or the clock bar signal.

Abstract: An emission driver may include a first signal processor adapted to receive a clock signal, an input signal and an inverse input signal, and to generate a first output signal, a second signal processor adapted to receive the first output signal, an inverse clock signal and negative feedback signals, and to generate a second output signal, a third signal processor adapted to receive the second output signal and the input signal, and to generate a third output signal that is an inverse signal to the second output signal, and a fourth signal processor adapted to receive the third output signal, and to generate a fourth output signal that is an inverse of the third output signal based on the third output signal, wherein the negative feedback signals include the third output signal and the fourth output signal.

Abstract: An emission driver may include a first signal processor adapted to receive a clock signal, an input signal and an inverse input signal, and generate a first output signal, a second signal processor adapted to receive the first output signal, an inverse clock signal and negative feedback signals, and generate a second output signal, a third signal processor adapted to receive the second output signal and the input signal, and generate a third output signal that is an inverse of the second output signal based on the input signal, a fourth signal processor adapted to receive the second output signal, and generate a fourth output signal based on the second output signal, the fourth output signal being an inverse signal of the third output signal, and a fifth signal processor adapted to receive the fourth output signal and output a fifth output signal based on a stored predetermined voltage.

Abstract: An emission driver may include a first signal processor adapted to receive a clock signal, an input signal and an inverse input signal, and to generate a first output signal, a second signal processor adapted to receive the first output signal, an inverse clock signal and negative feedback signals, and to generate a second output signal, a third signal processor adapted to receive the second output signal and the input signal, and to generate a third output signal that is an inverse of the second output signal, a fourth signal processor adapted to receive the third output signal, and to generate a fourth output signal that is an inverse of the third output signal, and a fifth signal processor adapted to receive the fourth output signal, and to output a fifth output signal that is an inverse of the fourth output signal, wherein the negative feedback signals include the fourth and fifth output signals.

Abstract: An organic light emitting diode display, including pixel circuits coupled to respective data lines and scan lines, a data driver configured to supply data signals to the data lines, and a scan driver configured to provide scan signals to the scan lines, wherein the scan driver includes at least one decoder including a plurality of NOR gates, the decoder configured to provide a first plurality of signals, and a plurality of NAND gates coupled to respective scan lines, the NAND gates being configured to perform a NAND operation on the first plurality of signals and to provide scan signals to the scan lines, wherein all transistors in each of the NOR gates and each of the NAND gates are a same type of MOS transistor.

Abstract: A logic gate includes a first driver to receive an input signal, and to control a connection between a first power source and a first node in correspondence with the input signal, a second driver coupled to the first node and a second power source, and to control a voltage of the first node, a third driver to control a connection between an output terminal and the first power source in correspondence with the voltage of the first node, a control transistor to control a connection between the third driver and the second power source, a fourth driver to control a connection between a gate electrode of the control transistor and the second power source, and a second capacitor between a first electrode of the control transistor and the gate electrode of the control transistor, wherein the transistors are a same type of MOS transistor.

Abstract: A logic gate includes a first driver connected to a first power source, a first control transistor connected between a first node and a second power source to control a voltage of the first node, a second driver connected between a gate electrode of the first control transistor and the second power source, a third driver connected between the first power source and the second power source, a second control transistor connected between the third driver and the second power source, and having a first electrode connected to an output terminal, and a fourth driver arranged between a gate electrode of the second control transistor and the second power source, wherein the first control transistor, the second control transistor and each transistor of the first driver, the second driver, the third driver and the fourth driver are PMOS transistors.

Abstract: A method and system for testing a semiconductor device is disclosed. The method provides an integrated test program defined by a plurality of test items, and a test program defined by a sub-set of the test items. Test data is derived by batch sample testing of the semiconductor device, and an error rate for a test item is computed and then compared to a reference data value. On the basis of the comparison between the error rate and the reference data value, the test program may be modified in real-time.

Abstract: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.

Abstract: A buffer circuit includes first to sixth transistors. The first transistor is coupled between a first power source and a first node, and has a gate for receiving a first signal having a first signal level. The second transistor is coupled between the first node and a second power source, and has a gate for receiving a second signal having a second signal level, which is an inverse of the first signal level. The third transistor has a gate coupled to the first node, and is coupled between the first power source and a second node. The fourth transistor is coupled between the second node and the second power source, and has a gate for receiving the first signal. The fifth transistor has a gate coupled to the second node, and is coupled between the first power source and an output end. The sixth transistor has a gate coupled to the first node, and is coupled between the output end and the second power source. In addition, a capacitance is formed between the gate of the sixth transistor and the output end.

Abstract: A system for providing an adaptive antenna system in a mobile communications device is disclosed. An array of antenna elements is provided. A sensing component is disposed along a surface of the mobile communications device, proximal to the array of antenna elements. A processor component is communicatively coupled to the sensing component. An implementation element is communicatively coupled to the processor component, and to the array of antenna elements. The sensor component generates data characterizing the proximity of a foreign object to the array of antenna elements; which the processing component uses to determine a configuration for the array of antenna elements. The implementation element modifies the array of antenna elements, responsive to the configuration determined by the processor component.

Abstract: A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.

Abstract: An integrated circuit package system including a ribbon bond interconnect is provided, having a semiconductor device with at least one pad thereon. An external connection is provided. A heavy ribbon is provided and bonded to the external connection and to the pad on the semiconductor device.

Abstract: Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.

Abstract: Provided is an optical module used in a communication system employing a radio over fiber (ROF) technology delivering a radio frequency (RF) signal through an optical fiber. The optical module includes: an optical device; a signal line for transporting a radio frequency (RF) signal input from an external circuit to the optical device; and a resistor separately disposed from the signal line and having one end connected with the optical device, wherein the input impedance seen from the signal line is matched by the resistor. A bias voltage supplied to operate the optical device is applied through an inductor connected to the signal line between the optical device and a filter. Here, the filter formed by a pattern of the signal line prevents the bias voltage from being supplied to the external circuit. In order to amplify the RF signal input from the external circuit, an amplifier may be connected between the external circuit and the filter.

Abstract: A system on panel (SOP)-type emission driving device of an organic light emitting display device. The emission driving device includes an odd emission control line controller having a plurality of flip-flops for outputting emission control signals to odd emission control lines, and an even line controller having a plurality of flip-flops for outputting emission control signals to even emission control lines. Each of the flip-flops alternately receives a clock signal and an inverted clock signal for causing the flip-flip to output an emission control signal. In one embodiment, each flip-flop includes nine PMOS transistors and two capacitors.

Abstract: Disclosed is a mileage providing system and method on a wireless network. When a user is connected through a wired network or a wireless network and requests transmission of predetermined contents, the system transmits the contents including a mileage module to a user terminal. After this, the mileage module is executed on the user terminal to which the contents are downloaded, a request of mileage provision is input through the mileage module, and the system provides mileages for contents downloading to the user. According to the present invention, management and provision of mileages for the contents downloading to the user terminal from a service provider through a wireless network is performed in real-time.