Controller for an electron microscope

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Description

FIG. 1 is a top, rear, left side perspective view of a controller for an electron microscope embodying our new design;

FIG. 2 is a bottom, front, right side perspective view thereof;

FIG. 3 is a top, front, right side perspective view thereof;

FIG. 4 is a front elevation view thereof;

FIG. 5 is a rear elevation view thereof;

FIG. 6 is a left side elevation view thereof;

FIG. 7 is a right side elevation view thereof;

FIG. 8 is a top plan view thereof;

FIG. 9 is a bottom plan view thereof; and,

FIG. 10 is an enlarged view of the selected portion 10 in FIG. 2.

The dash-dash broken lines shown in the drawings depict portions of the controller for an electron microscope that form no part of the claimed design. The dot-dash broken lines represent boundaries of the enlarged portions and form no part of the claimed design.

Claims

The ornamental design for a controller for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D600727 September 22, 2009 Apotheloz
D623209 September 7, 2010 Matuschek
D637638 May 10, 2011 Noda
D638045 May 17, 2011 Noda
D651226 December 27, 2011 Nagakubo
D1019609 March 26, 2024 Tian
Patent History
Patent number: D1051199
Type: Grant
Filed: Feb 15, 2023
Date of Patent: Nov 12, 2024
Assignee: TowardPi (Beijing) Medical Technology Ltd. (Beijing)
Inventors: Hai Li (Beijing), Xin Li (Beijing), Ziding Han (Beijing), Xiao Wang (Beijing)
Primary Examiner: Maria J. Edwards
Assistant Examiner: Dina Michelle Hoeynck
Application Number: 29/884,702
Classifications
Current U.S. Class: Element Or Attachment (D16/136)