Controller for an electron microscope
The dash-dash broken lines shown in the drawings depict portions of the controller for an electron microscope that form no part of the claimed design. The dot-dash broken lines represent boundaries of the enlarged portions and form no part of the claimed design.
Claims
The ornamental design for a controller for an electron microscope, as shown and described.
Type: Grant
Filed: Feb 15, 2023
Date of Patent: Nov 12, 2024
Assignee: TowardPi (Beijing) Medical Technology Ltd. (Beijing)
Inventors: Hai Li (Beijing), Xin Li (Beijing), Ziding Han (Beijing), Xiao Wang (Beijing)
Primary Examiner: Maria J. Edwards
Assistant Examiner: Dina Michelle Hoeynck
Application Number: 29/884,702