Electric contact

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a top, front and left side perspective view of an electric contact;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is an enlarged view of the section thereof as indicated in FIG. 1;

FIG. 9 is an enlarged view of the section thereof as indicated in FIG. 2;

FIG. 10 is an enlarged view of the section thereof as indicated in FIG. 3;

FIG. 11 is an enlarged left side elevational view thereof;

FIG. 12 is an enlarged right side elevational view thereof;

FIG. 13 is an enlarged view of the section thereof as indicated in FIG. 6;

FIG. 14 is an enlarged view of the section thereof as indicated in FIG. 7;

FIG. 15 is an enlarged view of the section thereof as indicated in FIG. 9; and,

FIG. 16 is a cross-sectional view thereof, taken along section line 16-16 of FIG. 15.

The broken lines shown in the drawings illustrate portions of the electric contact that form no part of the claimed design. The long dash-short dash lines represent the boundary between claimed and unclaimed design and form no part of the claimed design.

Claims

The ornamental design for an electric contact, as shown and described.

Referenced Cited
U.S. Patent Documents
2319610 May 1943 Lake
D595235 June 30, 2009 Koushiro
D765602 September 6, 2016 Nasu
D769747 October 25, 2016 Teranishi
D776552 January 17, 2017 Teranishi
D873685 January 28, 2020 Nasu
D894025 August 25, 2020 Kaida
D1051865 November 19, 2024 Ahn
20080170048 July 17, 2008 Hua
20180340957 November 29, 2018 Teranishi
20190383858 December 19, 2019 Yamamoto
Foreign Patent Documents
112302613 January 2024 TW
Other references
  • Altra probe pin, posted Nov. 28, 2022 [online], [retrieved Aug. 14, 2025]. Retrieved from internet, https://www.altra.net/products/probe (Year: 2022).
  • Smiths Interconnector kelvin probes, posted Dec. 5, 2021 [online], [retrieved Aug. 14, 2025]. Retrieved from internet, https://www.smithsinterconnect.com/products/semiconductor-test/wlcsp-probe-heads/kelvin-probessolution/ (Year: 2021).
  • SW Test workshop, posted Jun. 4, 2017 [online], [retrieved Aug. 14, 2025]. Retrieved from internet, https://www.swtest.org/swtw_library/2017proc/PDF/ (Year: 2017).
  • Xurui Precision semiconductor test probes, posted Apr. 19, 2025 [online], [retrieved Aug. 14, 2025]. Retrieved from internet, https://www.pogopin-probe.com/semiconductor-probes/ (Year: 2025).
Patent History
Patent number: D1106975
Type: Grant
Filed: May 23, 2023
Date of Patent: Dec 23, 2025
Assignee: Kabushiki Kaisha Nihon Micronics (Musashino)
Inventors: Kazunori Ninomiya (Tokyo), Minako Takase (Tokyo)
Primary Examiner: George D. Kirschbaum
Assistant Examiner: Denis Houyoux
Application Number: 29/876,515